{"id":"https://openalex.org/W2020142563","doi":"https://doi.org/10.4028/www.scientific.net/amr.1038.63","title":"Characterization of Electromagnetic Properties of MID Materials for High Frequency Applications up to 67 GHz","display_name":"Characterization of Electromagnetic Properties of MID Materials for High Frequency Applications up to 67 GHz","publication_year":2014,"publication_date":"2014-09-01","ids":{"openalex":"https://openalex.org/W2020142563","doi":"https://doi.org/10.4028/www.scientific.net/amr.1038.63","mag":"2020142563"},"language":"en","primary_location":{"id":"doi:10.4028/www.scientific.net/amr.1038.63","doi":"https://doi.org/10.4028/www.scientific.net/amr.1038.63","is_oa":false,"landing_page_url":"https://doi.org/10.4028/www.scientific.net/amr.1038.63","pdf_url":null,"source":{"id":"https://openalex.org/S67425620","display_name":"Advanced materials research","issn_l":"1022-6680","issn":["1022-6680","1662-8985"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310317839","host_organization_name":"Trans Tech Publications","host_organization_lineage":["https://openalex.org/P4310317839"],"host_organization_lineage_names":["Trans Tech Publications"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Materials Research","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072125909","display_name":"Quang Huy Dao","orcid":"https://orcid.org/0000-0001-7898-7392","observed_orcids":["https://orcid.org/0000-0001-7898-7392"]},"institutions":[{"id":"https://openalex.org/I114112103","display_name":"Leibniz University Hannover","ror":"https://ror.org/0304hq317","country_code":"DE","type":"education","lineage":["https://openalex.org/I114112103"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Quang Huy Dao","raw_affiliation_strings":["Leibniz Universit\u00e4t Hannover"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Leibniz Universit\u00e4t Hannover","institution_ids":["https://openalex.org/I114112103"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065245248","display_name":"Aline Friedrich","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I114112103","display_name":"Leibniz University Hannover","ror":"https://ror.org/0304hq317","country_code":"DE","type":"education","lineage":["https://openalex.org/I114112103"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Aline Friedrich","raw_affiliation_strings":["Leibniz Universit\u00e4t Hannover"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Leibniz Universit\u00e4t Hannover","institution_ids":["https://openalex.org/I114112103"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042473372","display_name":"Bernd Geck","orcid":"https://orcid.org/0000-0002-6454-0271","observed_orcids":["https://orcid.org/0000-0002-6454-0271"]},"institutions":[{"id":"https://openalex.org/I114112103","display_name":"Leibniz University Hannover","ror":"https://ror.org/0304hq317","country_code":"DE","type":"education","lineage":["https://openalex.org/I114112103"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Bernd Geck","raw_affiliation_strings":["Leibniz Universit\u00e4t Hannover"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Leibniz Universit\u00e4t Hannover","institution_ids":["https://openalex.org/I114112103"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5072125909"],"corresponding_institution_ids":["https://openalex.org/I114112103"],"apc_list":null,"apc_paid":null,"fwci":1.5527,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.83931633,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"1038","issue":null,"first_page":"63","last_page":"68"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.6348000168800354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.6348000168800354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.08139999955892563,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.07289999723434448,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/molded-interconnect-devices","display_name":"molded interconnect devices","score":0.9279999732971191},{"id":"https://openalex.org/keywords/electromagnetic-properties","display_name":"electromagnetic properties","score":0.8159999847412109},{"id":"https://openalex.org/keywords/rf-performance","display_name":"RF performance","score":0.6650000214576721},{"id":"https://openalex.org/keywords/conduction-losses","display_name":"conduction losses","score":0.7059999704360962},{"id":"https://openalex.org/keywords/coplanar-waveguide","display_name":"coplanar waveguide","score":0.890999972820282},{"id":"https://openalex.org/keywords/broadband-characterization","display_name":"broadband characterization","score":0.8360000252723694},{"id":"https://openalex.org/keywords/high-frequency-applications","display_name":"high-frequency applications","score":0.6309999823570251}],"concepts":[{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.802120566368103},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7600072622299194},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.6856317520141602},{"id":"https://openalex.org/C3736036","wikidata":"https://www.wikidata.org/wiki/Q15525941","display_name":"Coplanar waveguide","level":3,"score":0.6848060488700867},{"id":"https://openalex.org/C509933004","wikidata":"https://www.wikidata.org/wiki/Q194163","display_name":"Broadband","level":2,"score":0.6598222255706787},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5992467403411865},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.519860565662384},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.4790683686733246},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3824092149734497},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2923261523246765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20422637462615967},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.18706756830215454},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.14559194445610046},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1399569809436798},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1386326253414154},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07628440856933594}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.4028/www.scientific.net/amr.1038.63","doi":"https://doi.org/10.4028/www.scientific.net/amr.1038.63","is_oa":false,"landing_page_url":"https://doi.org/10.4028/www.scientific.net/amr.1038.63","pdf_url":null,"source":{"id":"https://openalex.org/S67425620","display_name":"Advanced materials research","issn_l":"1022-6680","issn":["1022-6680","1662-8985"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310317839","host_organization_name":"Trans Tech Publications","host_organization_lineage":["https://openalex.org/P4310317839"],"host_organization_lineage_names":["Trans Tech Publications"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Materials Research","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320323803","display_name":"Bundesministerium f\u00fcr Wirtschaft und Energie","ror":"https://ror.org/02vgg2808"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1553692161","https://openalex.org/W2109336395","https://openalex.org/W2110132356","https://openalex.org/W2168854778","https://openalex.org/W2504699137","https://openalex.org/W4249321481","https://openalex.org/W6807750933"],"related_works":["https://openalex.org/W2107497400","https://openalex.org/W2105610996","https://openalex.org/W1987089627","https://openalex.org/W7096475852","https://openalex.org/W2043490977","https://openalex.org/W7106696216","https://openalex.org/W2550657691","https://openalex.org/W3011927791","https://openalex.org/W1836343790","https://openalex.org/W3120310753"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"results":[3],"of":[4,9,15,20,33,44,56],"the":[5,10,35,41,50,53,57,74],"research":[6],"project:":[7],"\"Characterization":[8],"radio":[11],"frequency":[12],"(RF)":[13],"properties":[14,61],"LDS-MID\"":[16],"where":[17],"RF":[18,42],"parameters":[19,39],"laser":[21],"direct":[22],"structureable":[23],"(LDS)":[24],"molded":[25],"interconnect":[26],"device":[27,46],"(MID)":[28],"materials":[29],"were":[30],"investigated.":[31],"First":[32],"all":[34],"most":[36],"important":[37],"material":[38,60,73],"influencing":[40],"performance":[43],"a":[45,63,70],"are":[47,82],"introduced.":[48],"In":[49],"next":[51],"section":[52],"broadband":[54],"characterization":[55],"metallization":[58,80],"and":[59],"using":[62],"coplanar":[64],"waveguide":[65],"(CPW)":[66],"is":[67],"described.":[68],"For":[69],"selected":[71],"LDS":[72],"conduction":[75],"losses":[76],"due":[77],"to":[78],"different":[79],"compositions":[81],"discussed":[83],"in":[84],"detail.":[85]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":4}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}