{"id":"https://openalex.org/W2019940940","doi":"https://doi.org/10.1007/s10854-009-9890-7","title":"Microstructural properties of ZnO:Sn thin films deposited by intermittent spray pyrolysis process","display_name":"Microstructural properties of ZnO:Sn thin films deposited by intermittent spray pyrolysis process","publication_year":2009,"publication_date":"2009-04-10","ids":{"openalex":"https://openalex.org/W2019940940","doi":"https://doi.org/10.1007/s10854-009-9890-7","mag":"2019940940"},"language":"en","primary_location":{"id":"doi:10.1007/s10854-009-9890-7","doi":"https://doi.org/10.1007/s10854-009-9890-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10854-009-9890-7","pdf_url":null,"source":{"id":"https://openalex.org/S189509794","display_name":"Journal of Materials Science Materials in Electronics","issn_l":"0957-4522","issn":["0957-4522","1573-482X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Materials Science: Materials in Electronics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080950809","display_name":"F. Kadi Allah","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"F. Kadi Allah","raw_affiliation_strings":["Universit\u00e9 d\u2019Oran Es-Senia, LPCM2E, Oran, Alg\u00e9rie"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universit\u00e9 d\u2019Oran Es-Senia, LPCM2E, Oran, Alg\u00e9rie","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057585250","display_name":"L. Cattin","orcid":"https://orcid.org/0000-0002-8222-5929","observed_orcids":["https://orcid.org/0000-0002-8222-5929"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"L. Cattin","raw_affiliation_strings":["IMJR, 2 rue de la Houssini\u00e8re, BP 92208, 44000, Nantes, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMJR, 2 rue de la Houssini\u00e8re, BP 92208, 44000, Nantes, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112105936","display_name":"M. Morsli","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405260337","display_name":"Universit\u00e9 de Nantes","ror":"https://ror.org/03kjmz544","country_code":"FR","type":"education","lineage":["https://openalex.org/I4405260337","https://openalex.org/I97188460"]},{"id":"https://openalex.org/I97188460","display_name":"Nantes Universit\u00e9","ror":"https://ror.org/03gnr7b55","country_code":"FR","type":"education","lineage":["https://openalex.org/I97188460"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Morsli","raw_affiliation_strings":["Facult\u00e9 des Sciences et des Techniques, Universit\u00e9 de Nantes, Nantes Atlantique Universit\u00e9s, LAMP, EA 3825, 2 rue de la Houssini\u00e8re, BP 92208, 44000, Nantes, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Facult\u00e9 des Sciences et des Techniques, Universit\u00e9 de Nantes, Nantes Atlantique Universit\u00e9s, LAMP, EA 3825, 2 rue de la Houssini\u00e8re, BP 92208, 44000, Nantes, France","institution_ids":["https://openalex.org/I4405260337","https://openalex.org/I97188460"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063535746","display_name":"A. Khelil","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. Khelil","raw_affiliation_strings":["Universit\u00e9 d\u2019Oran Es-Senia, LPCM2E, Oran, Alg\u00e9rie"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universit\u00e9 d\u2019Oran Es-Senia, LPCM2E, Oran, Alg\u00e9rie","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054606114","display_name":"Nicole I. Langlois","orcid":"https://orcid.org/0000-0002-2530-9739","observed_orcids":["https://orcid.org/0000-0002-2530-9739"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"N. Langlois","raw_affiliation_strings":["IMJR, 2 rue de la Houssini\u00e8re, BP 92208, 44000, Nantes, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMJR, 2 rue de la Houssini\u00e8re, BP 92208, 44000, Nantes, France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044623400","display_name":"J.C. B\u00e9rn\u00e8de","orcid":"https://orcid.org/0000-0002-1457-1117","observed_orcids":["https://orcid.org/0000-0002-1457-1117"]},"institutions":[{"id":"https://openalex.org/I4405260337","display_name":"Universit\u00e9 de Nantes","ror":"https://ror.org/03kjmz544","country_code":"FR","type":"education","lineage":["https://openalex.org/I4405260337","https://openalex.org/I97188460"]},{"id":"https://openalex.org/I97188460","display_name":"Nantes Universit\u00e9","ror":"https://ror.org/03gnr7b55","country_code":"FR","type":"education","lineage":["https://openalex.org/I97188460"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"J. C. Bern\u00e8de","raw_affiliation_strings":["Facult\u00e9 des Sciences et des Techniques, Universit\u00e9 de Nantes, Nantes Atlantique Universit\u00e9s, LAMP, EA 3825, 2 rue de la Houssini\u00e8re, BP 92208, 44000, Nantes, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Facult\u00e9 des Sciences et des Techniques, Universit\u00e9 de Nantes, Nantes Atlantique Universit\u00e9s, LAMP, EA 3825, 2 rue de la Houssini\u00e8re, BP 92208, 44000, Nantes, France","institution_ids":["https://openalex.org/I4405260337","https://openalex.org/I97188460"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5044623400"],"corresponding_institution_ids":["https://openalex.org/I4405260337","https://openalex.org/I97188460"],"apc_list":{"value":3990,"currency":"USD","value_usd":3990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.12994859,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"21","issue":"2","first_page":"179","last_page":"184"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/zno-thin-films","display_name":"ZnO thin films","score":0.8769999742507935},{"id":"https://openalex.org/keywords/sn-doping","display_name":"tin doping","score":0.8100000023841858},{"id":"https://openalex.org/keywords/spray-pyrolysis","display_name":"spray pyrolysis","score":0.8939999938011169},{"id":"https://openalex.org/keywords/microstructure","display_name":"microstructure","score":0.7450000047683716},{"id":"https://openalex.org/keywords/grain-size","display_name":"grain size","score":0.9430000185966492},{"id":"https://openalex.org/keywords/film-surface-roughness","display_name":"film roughness","score":0.7329999804496765},{"id":"https://openalex.org/keywords/optical-band-gap","display_name":"optical band gap","score":0.8389999866485596},{"id":"https://openalex.org/keywords/electrical-conductivity","display_name":"electrical conductivity","score":0.9800000190734863}],"concepts":[{"id":"https://openalex.org/C191952053","wikidata":"https://www.wikidata.org/wiki/Q15119237","display_name":"Dopant","level":3,"score":0.834506094455719},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7916614413261414},{"id":"https://openalex.org/C2988664670","wikidata":"https://www.wikidata.org/wiki/Q505668","display_name":"Spray pyrolysis","level":3,"score":0.7101925611495972},{"id":"https://openalex.org/C36759035","wikidata":"https://www.wikidata.org/wiki/Q176848","display_name":"Pyrolysis","level":2,"score":0.6528165936470032},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.6239385008811951},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.5782972574234009},{"id":"https://openalex.org/C535196362","wikidata":"https://www.wikidata.org/wiki/Q758","display_name":"Zinc","level":2,"score":0.5271204113960266},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.4560636281967163},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.3052959144115448},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.28274109959602356},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.25148898363113403},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.12823981046676636},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10494345426559448},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.050015270709991455},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10854-009-9890-7","doi":"https://doi.org/10.1007/s10854-009-9890-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10854-009-9890-7","pdf_url":null,"source":{"id":"https://openalex.org/S189509794","display_name":"Journal of Materials Science Materials in Electronics","issn_l":"0957-4522","issn":["0957-4522","1573-482X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Materials Science: Materials in Electronics","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-00468416v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-00468416","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Materials Science: Materials in Electronics, 2010, 21 (2), pp.179. ⟨10.1007/s10854-009-9890-7⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1967652077","https://openalex.org/W1971034162","https://openalex.org/W1975584401","https://openalex.org/W2009390800","https://openalex.org/W2018189908","https://openalex.org/W2018398071","https://openalex.org/W2019595256","https://openalex.org/W2029883494","https://openalex.org/W2040157690","https://openalex.org/W2046435599","https://openalex.org/W2086104209","https://openalex.org/W2117146274","https://openalex.org/W2117548356","https://openalex.org/W2160881991"],"related_works":["https://openalex.org/W2739908645","https://openalex.org/W6941363416","https://openalex.org/W2334358753","https://openalex.org/W2018398071","https://openalex.org/W2995238779","https://openalex.org/W2082572098","https://openalex.org/W4313574723","https://openalex.org/W4291464989","https://openalex.org/W4210314159","https://openalex.org/W3023901720"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-10-25T09:29:13.331239","created_date":"2016-06-24T00:00:00"}