{"id":"https://openalex.org/W2019921952","doi":"https://doi.org/10.1016/s0039-6028(02)01157-3","title":"Atomistic morphology and structure of ethylene-chemisorbed Si(001)2\u00d71 surface","display_name":"Atomistic morphology and structure of ethylene-chemisorbed Si(001)2\u00d71 surface","publication_year":2002,"publication_date":"2002-04-01","ids":{"openalex":"https://openalex.org/W2019921952","doi":"https://doi.org/10.1016/s0039-6028(02)01157-3","mag":"2019921952"},"language":"en","primary_location":{"id":"doi:10.1016/s0039-6028(02)01157-3","doi":"https://doi.org/10.1016/s0039-6028(02)01157-3","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0039-6028(02)01157-3","pdf_url":null,"source":{"id":"https://openalex.org/S137865625","display_name":"Surface Science","issn_l":"0039-6028","issn":["0039-6028","1879-2758"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Surface Science","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078982522","display_name":"Masaru Shimomura","orcid":"https://orcid.org/0000-0002-6862-1781","observed_orcids":["https://orcid.org/0000-0002-6862-1781"]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4405286139","display_name":"Institute of Multidisciplinary Research for Advanced Materials, Tohoku University","ror":"https://ror.org/017qp9z94","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4405286139"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"M. Shimomura","raw_affiliation_strings":["Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan","institution_ids":["https://openalex.org/I201537933","https://openalex.org/I4405286139"]}]},{"author_position":"middle","author":{"id":null,"display_name":"M. Munakata","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4405286139","display_name":"Institute of Multidisciplinary Research for Advanced Materials, Tohoku University","ror":"https://ror.org/017qp9z94","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4405286139"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Munakata","raw_affiliation_strings":["Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan","institution_ids":["https://openalex.org/I201537933","https://openalex.org/I4405286139"]}]},{"author_position":"middle","author":{"id":null,"display_name":"A. Iwasaki","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I104946051","display_name":"Nihon University","ror":"https://ror.org/05jk51a88","country_code":"JP","type":"education","lineage":["https://openalex.org/I104946051"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. Iwasaki","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, Koriyama, Fukushima 963\u20108642, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, Koriyama, Fukushima 963\u20108642, Japan","institution_ids":["https://openalex.org/I104946051"]}]},{"author_position":"middle","author":{"id":null,"display_name":"M. Ikeda","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I104946051","display_name":"Nihon University","ror":"https://ror.org/05jk51a88","country_code":"JP","type":"education","lineage":["https://openalex.org/I104946051"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Ikeda","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, Koriyama, Fukushima 963\u20108642, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, Koriyama, Fukushima 963\u20108642, Japan","institution_ids":["https://openalex.org/I104946051"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026808153","display_name":"T. Abukawa","orcid":"https://orcid.org/0000-0003-3242-5428","observed_orcids":["https://orcid.org/0000-0003-3242-5428"]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4405286139","display_name":"Institute of Multidisciplinary Research for Advanced Materials, Tohoku University","ror":"https://ror.org/017qp9z94","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4405286139"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Abukawa","raw_affiliation_strings":["Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan","institution_ids":["https://openalex.org/I201537933","https://openalex.org/I4405286139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040361414","display_name":"Katsuhiro Sat\u014d","orcid":"https://orcid.org/0000-0002-5419-4344","observed_orcids":["https://orcid.org/0000-0002-5419-4344"]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4405286139","display_name":"Institute of Multidisciplinary Research for Advanced Materials, Tohoku University","ror":"https://ror.org/017qp9z94","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4405286139"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Sato","raw_affiliation_strings":["Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan","institution_ids":["https://openalex.org/I201537933","https://openalex.org/I4405286139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070812272","display_name":"Takuo Kawawa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4405286139","display_name":"Institute of Multidisciplinary Research for Advanced Materials, Tohoku University","ror":"https://ror.org/017qp9z94","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4405286139"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Kawawa","raw_affiliation_strings":["Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan","institution_ids":["https://openalex.org/I201537933","https://openalex.org/I4405286139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080386512","display_name":"Hirofumi Shimizu","orcid":"https://orcid.org/0000-0002-0915-970X","observed_orcids":["https://orcid.org/0000-0002-0915-970X"]},"institutions":[{"id":"https://openalex.org/I104946051","display_name":"Nihon University","ror":"https://ror.org/05jk51a88","country_code":"JP","type":"education","lineage":["https://openalex.org/I104946051"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Shimizu","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, Koriyama, Fukushima 963\u20108642, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, Koriyama, Fukushima 963\u20108642, Japan","institution_ids":["https://openalex.org/I104946051"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017662268","display_name":"Naoyuki Nagashima","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I104946051","display_name":"Nihon University","ror":"https://ror.org/05jk51a88","country_code":"JP","type":"education","lineage":["https://openalex.org/I104946051"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"N. Nagashima","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, Koriyama, Fukushima 963\u20108642, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, Koriyama, Fukushima 963\u20108642, Japan","institution_ids":["https://openalex.org/I104946051"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111359713","display_name":"S. Kono","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4405286139","display_name":"Institute of Multidisciplinary Research for Advanced Materials, Tohoku University","ror":"https://ror.org/017qp9z94","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4405286139"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Kono","raw_affiliation_strings":["Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan","institution_ids":["https://openalex.org/I201537933","https://openalex.org/I4405286139"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5078982522"],"corresponding_institution_ids":["https://openalex.org/I201537933","https://openalex.org/I4405286139"],"apc_list":{"value":3340,"currency":"USD","value_usd":3340},"apc_paid":null,"fwci":1.3575,"has_fulltext":false,"cited_by_count":33,"citation_normalized_percentile":{"value":0.74233716,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"504","issue":null,"first_page":"19","last_page":"27"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12285","display_name":"Surface Chemistry and Catalysis","score":0.8003000020980835,"subfield":{"id":"https://openalex.org/subfields/1606","display_name":"Physical and Theoretical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12285","display_name":"Surface Chemistry and Catalysis","score":0.8003000020980835,"subfield":{"id":"https://openalex.org/subfields/1606","display_name":"Physical and Theoretical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.19850000739097595,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10192","display_name":"Catalytic Processes in Materials Science","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ethylene-chemisorption","display_name":"ethylene chemisorption","score":0.8259999752044678},{"id":"https://openalex.org/keywords/si-100-surface","display_name":"Si(100) surface","score":0.9319999814033508},{"id":"https://openalex.org/keywords/silicon-surface-reconstruction","display_name":"silicon surface reconstruction","score":0.5019999742507935},{"id":"https://openalex.org/keywords/c-42-reconstruction","display_name":"c(4\u00d72) reconstruction","score":0.9959999918937683},{"id":"https://openalex.org/keywords/surface-morphology","display_name":"surface morphology","score":0.5609999895095825},{"id":"https://openalex.org/keywords/photoelectron-diffraction","display_name":"photoelectron diffraction","score":0.6639999747276306}],"concepts":[{"id":"https://openalex.org/C2778597550","wikidata":"https://www.wikidata.org/wiki/Q151313","display_name":"Ethylene","level":3,"score":0.8550653457641602},{"id":"https://openalex.org/C6518042","wikidata":"https://www.wikidata.org/wiki/Q175646","display_name":"Scanning tunneling microscope","level":2,"score":0.8157920837402344},{"id":"https://openalex.org/C7070889","wikidata":"https://www.wikidata.org/wiki/Q902488","display_name":"Monolayer","level":2,"score":0.6945009827613831},{"id":"https://openalex.org/C499950583","wikidata":"https://www.wikidata.org/wiki/Q183252","display_name":"Morphology (biology)","level":2,"score":0.6165280342102051},{"id":"https://openalex.org/C33790079","wikidata":"https://www.wikidata.org/wiki/Q899417","display_name":"Chemisorption","level":3,"score":0.5675389766693115},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.5504593849182129},{"id":"https://openalex.org/C2984360167","wikidata":"https://www.wikidata.org/wiki/Q63258245","display_name":"Surface structure","level":2,"score":0.5171996355056763},{"id":"https://openalex.org/C58312451","wikidata":"https://www.wikidata.org/wiki/Q4817200","display_name":"Atom (system on chip)","level":2,"score":0.49332037568092346},{"id":"https://openalex.org/C9930424","wikidata":"https://www.wikidata.org/wiki/Q7426587","display_name":"Saturation (graph theory)","level":2,"score":0.48920416831970215},{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.4735376238822937},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.47098442912101746},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.43825969099998474},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.43206456303596497},{"id":"https://openalex.org/C150394285","wikidata":"https://www.wikidata.org/wiki/Q180254","display_name":"Adsorption","level":2,"score":0.3379785418510437},{"id":"https://openalex.org/C159467904","wikidata":"https://www.wikidata.org/wiki/Q2001702","display_name":"Chemical physics","level":1,"score":0.33225688338279724},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2779046893119812},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.22234144806861877},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.1732141673564911},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.06687664985656738},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.06250765919685364},{"id":"https://openalex.org/C161790260","wikidata":"https://www.wikidata.org/wiki/Q82264","display_name":"Catalysis","level":2,"score":0.05319264531135559},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.04464086890220642},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0039-6028(02)01157-3","doi":"https://doi.org/10.1016/s0039-6028(02)01157-3","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0039-6028(02)01157-3","pdf_url":null,"source":{"id":"https://openalex.org/S137865625","display_name":"Surface Science","issn_l":"0039-6028","issn":["0039-6028","1879-2758"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Surface Science","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1969627997","https://openalex.org/W1971902636","https://openalex.org/W1977379999","https://openalex.org/W1994418299","https://openalex.org/W2016549612","https://openalex.org/W2017986700","https://openalex.org/W2022519586","https://openalex.org/W2042419841","https://openalex.org/W2050726542","https://openalex.org/W2064488852","https://openalex.org/W2066789886","https://openalex.org/W2081082454","https://openalex.org/W2087290039","https://openalex.org/W2092677535","https://openalex.org/W2312841698","https://openalex.org/W2596967545","https://openalex.org/W4241944326"],"related_works":["https://openalex.org/W1977379999","https://openalex.org/W4241944326","https://openalex.org/W2006612718","https://openalex.org/W2312841698","https://openalex.org/W2015525990","https://openalex.org/W2087290039","https://openalex.org/W2048292987","https://openalex.org/W2078300949","https://openalex.org/W2080840430","https://openalex.org/W2050726542"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}