{"id":"https://openalex.org/W2019765699","doi":"https://doi.org/10.1016/j.solidstatesciences.2012.10.020","title":"Influences of surface transition layer on switching time and coercive field of a ferroelectric thin film","display_name":"Influences of surface transition layer on switching time and coercive field of a ferroelectric thin film","publication_year":2012,"publication_date":"2012-10-30","ids":{"openalex":"https://openalex.org/W2019765699","doi":"https://doi.org/10.1016/j.solidstatesciences.2012.10.020","mag":"2019765699"},"language":"en","primary_location":{"id":"doi:10.1016/j.solidstatesciences.2012.10.020","doi":"https://doi.org/10.1016/j.solidstatesciences.2012.10.020","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.solidstatesciences.2012.10.020","pdf_url":null,"source":{"id":"https://openalex.org/S40206742","display_name":"Solid State Sciences","issn_l":"1293-2558","issn":["1293-2558","1873-3085"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid State Sciences","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061934464","display_name":"Lian Cui","orcid":"https://orcid.org/0000-0002-7040-7522","observed_orcids":["https://orcid.org/0000-0002-7040-7522"]},"institutions":[{"id":"https://openalex.org/I4210155943","display_name":"Daqing Normal University","ror":"https://ror.org/05dd1f546","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210155943"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lian Cui","raw_affiliation_strings":["Department of Physics, Daqing Normal University, Daqing 163712, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Daqing Normal University, Daqing 163712, China","institution_ids":["https://openalex.org/I4210155943"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109262275","display_name":"Xu Quan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210155943","display_name":"Daqing Normal University","ror":"https://ror.org/05dd1f546","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210155943"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Quan Xu","raw_affiliation_strings":["Department of Physics, Daqing Normal University, Daqing 163712, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Daqing Normal University, Daqing 163712, China","institution_ids":["https://openalex.org/I4210155943"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042952696","display_name":"Zhiyou Han","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210155943","display_name":"Daqing Normal University","ror":"https://ror.org/05dd1f546","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210155943"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyou Han","raw_affiliation_strings":["Department of Physics, Daqing Normal University, Daqing 163712, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Daqing Normal University, Daqing 163712, China","institution_ids":["https://openalex.org/I4210155943"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Xu Xu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210155943","display_name":"Daqing Normal University","ror":"https://ror.org/05dd1f546","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210155943"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xu Xu","raw_affiliation_strings":["Department of Physics, Daqing Normal University, Daqing 163712, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Daqing Normal University, Daqing 163712, China","institution_ids":["https://openalex.org/I4210155943"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063379036","display_name":"Jixin Che","orcid":"https://orcid.org/0009-0008-0047-7606","observed_orcids":["https://orcid.org/0009-0008-0047-7606"]},"institutions":[{"id":"https://openalex.org/I4210167232","display_name":"PLA Air Force Aviation University","ror":"https://ror.org/031g2ra50","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210167232"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"JiXin Che","raw_affiliation_strings":["Ordnance Engineering Department, Air Force Aviation University, Changchun 130022, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ordnance Engineering Department, Air Force Aviation University, Changchun 130022, China","institution_ids":["https://openalex.org/I4210167232"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109149431","display_name":"Hui-Jie Xue","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I134052481","display_name":"Harbin Normal University","ror":"https://ror.org/0270y6950","country_code":"CN","type":"education","lineage":["https://openalex.org/I134052481"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huijie Xue","raw_affiliation_strings":["Heilongjiang Key Laboratory for Low Dimensional and Mesoscopic Physics, School of Physics and electronic Engineering, Harbin Normal University, Harbin 150025, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Heilongjiang Key Laboratory for Low Dimensional and Mesoscopic Physics, School of Physics and electronic Engineering, Harbin Normal University, Harbin 150025, China","institution_ids":["https://openalex.org/I134052481"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109094968","display_name":"Tianquan L\u00fc","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianquan L\u00fc","raw_affiliation_strings":["Center of Condensed Matter Science and Technology, Harbin Institute of Technology, Harbin 150001, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Condensed Matter Science and Technology, Harbin Institute of Technology, Harbin 150001, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5061934464"],"corresponding_institution_ids":["https://openalex.org/I4210155943"],"apc_list":{"value":3070,"currency":"USD","value_usd":3070},"apc_paid":null,"fwci":0.735,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.66905284,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"16","issue":null,"first_page":"65","last_page":"70"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9564999938011169,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9564999938011169,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.03629999980330467,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10886","display_name":"Multiferroics and related materials","score":0.0026000000070780516,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ferroelectric-thin-films","display_name":"ferroelectric thin films","score":0.9869999885559082},{"id":"https://openalex.org/keywords/polarization-reversal","display_name":"polarization reversal","score":0.8820000290870667},{"id":"https://openalex.org/keywords/switching-time","display_name":"switching time","score":0.9490000009536743},{"id":"https://openalex.org/keywords/coercive-field","display_name":"coercive field","score":0.9990000128746033},{"id":"https://openalex.org/keywords/landau-khalatnikov-equation","display_name":"Landau-Khalatnikov equation","score":0.8569999933242798},{"id":"https://openalex.org/keywords/extrapolation-length","display_name":"extrapolation length","score":0.902999997138977}],"concepts":[{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.8171519041061401},{"id":"https://openalex.org/C126530901","wikidata":"https://www.wikidata.org/wiki/Q432635","display_name":"Coercivity","level":2,"score":0.7468396425247192},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.7276654243469238},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.6252546310424805},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.620733380317688},{"id":"https://openalex.org/C132459708","wikidata":"https://www.wikidata.org/wiki/Q744069","display_name":"Extrapolation","level":2,"score":0.6075294613838196},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.5790187120437622},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5586395263671875},{"id":"https://openalex.org/C2993308298","wikidata":"https://www.wikidata.org/wiki/Q7834414","display_name":"Transition layer","level":3,"score":0.47441691160202026},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.3945426344871521},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.22728586196899414},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.22590237855911255},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21710041165351868},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.1990312933921814},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.17159223556518555},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10892274975776672},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0750393271446228},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.solidstatesciences.2012.10.020","doi":"https://doi.org/10.1016/j.solidstatesciences.2012.10.020","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.solidstatesciences.2012.10.020","pdf_url":null,"source":{"id":"https://openalex.org/S40206742","display_name":"Solid State Sciences","issn_l":"1293-2558","issn":["1293-2558","1873-3085"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid State Sciences","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1973666930","https://openalex.org/W1976174178","https://openalex.org/W1981665258","https://openalex.org/W1987944573","https://openalex.org/W1988915770","https://openalex.org/W1996907866","https://openalex.org/W2004005802","https://openalex.org/W2012393828","https://openalex.org/W2015445221","https://openalex.org/W2018409626","https://openalex.org/W2018980446","https://openalex.org/W2019631656","https://openalex.org/W2025038721","https://openalex.org/W2029594888","https://openalex.org/W2029743158","https://openalex.org/W2031846796","https://openalex.org/W2035259344","https://openalex.org/W2038488803","https://openalex.org/W2042150638","https://openalex.org/W2042350098","https://openalex.org/W2047087883","https://openalex.org/W2050697735","https://openalex.org/W2067532688","https://openalex.org/W2078766017","https://openalex.org/W2087182062","https://openalex.org/W2089514960","https://openalex.org/W2113325987","https://openalex.org/W2131701209","https://openalex.org/W2134460705","https://openalex.org/W2166656736","https://openalex.org/W4256413432"],"related_works":["https://openalex.org/W2076712399","https://openalex.org/W2025038721","https://openalex.org/W2067532688","https://openalex.org/W2360855014","https://openalex.org/W1483052601","https://openalex.org/W3110713541","https://openalex.org/W1990847399","https://openalex.org/W1972315211","https://openalex.org/W2162097289","https://openalex.org/W2004213523"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}