{"id":"https://openalex.org/W2019745647","doi":"https://doi.org/10.1116/1.577407","title":"Structure and optical characterization of ZnxCd1\u2212xTe thin films prepared by the close spaced vapor transport method","display_name":"Structure and optical characterization of ZnxCd1\u2212xTe thin films prepared by the close spaced vapor transport method","publication_year":1991,"publication_date":"1991-05-01","ids":{"openalex":"https://openalex.org/W2019745647","doi":"https://doi.org/10.1116/1.577407","mag":"2019745647"},"language":"en","primary_location":{"id":"doi:10.1116/1.577407","doi":"https://doi.org/10.1116/1.577407","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.577407","pdf_url":null,"source":{"id":"https://openalex.org/S4210190837","display_name":"Journal of Vacuum Science & Technology A Vacuum Surfaces and Films","issn_l":"0734-2101","issn":["0734-2101","1520-8559"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103127033","display_name":"Jesus Gonzalez-Hernandez","orcid":"https://orcid.org/0000-0002-3724-1583","observed_orcids":["https://orcid.org/0000-0002-3724-1583"]},"institutions":[{"id":"https://openalex.org/I59361560","display_name":"Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/059sp8j34","country_code":"MX","type":"education","lineage":["https://openalex.org/I59361560"]},{"id":"https://openalex.org/I68368234","display_name":"Centro de Investigaci\u00f3n y de Estudios Avanzados del Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"J. Gonz\u00e1lez-Hern\u00e1ndez","raw_affiliation_strings":["Departamento de F\u00edsica, Centro de Investigaci\u00f3n y Estudios Avanzados, IPN, Apdo. Postal 14-740, M\u00e9xico, 07000, D. F"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departamento de F\u00edsica, Centro de Investigaci\u00f3n y Estudios Avanzados, IPN, Apdo. Postal 14-740, M\u00e9xico, 07000, D. F","institution_ids":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109200832","display_name":"O. Zelaya","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I59361560","display_name":"Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/059sp8j34","country_code":"MX","type":"education","lineage":["https://openalex.org/I59361560"]},{"id":"https://openalex.org/I68368234","display_name":"Centro de Investigaci\u00f3n y de Estudios Avanzados del Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"O. Zelaya","raw_affiliation_strings":["Departamento de F\u00edsica, Centro de Investigaci\u00f3n y Estudios Avanzados, IPN, Apdo. Postal 14-740, M\u00e9xico, 07000, D. F"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departamento de F\u00edsica, Centro de Investigaci\u00f3n y Estudios Avanzados, IPN, Apdo. Postal 14-740, M\u00e9xico, 07000, D. F","institution_ids":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043373151","display_name":"Julio Gregorio Mendoza-Alvarez","orcid":"https://orcid.org/0000-0002-1325-6465","observed_orcids":["https://orcid.org/0000-0002-1325-6465"]},"institutions":[{"id":"https://openalex.org/I59361560","display_name":"Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/059sp8j34","country_code":"MX","type":"education","lineage":["https://openalex.org/I59361560"]},{"id":"https://openalex.org/I68368234","display_name":"Centro de Investigaci\u00f3n y de Estudios Avanzados del Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"J. G. Mendoza-Alverez","raw_affiliation_strings":["Departamento de F\u00edsica, Centro de Investigaci\u00f3n y Estudios Avanzados, IPN, Apdo. Postal 14-740, M\u00e9xico, 07000, D. F"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departamento de F\u00edsica, Centro de Investigaci\u00f3n y Estudios Avanzados, IPN, Apdo. Postal 14-740, M\u00e9xico, 07000, D. F","institution_ids":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018191279","display_name":"El\u00edas L\u00f3pez-Cruz","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"E. L\u00f3pez-Cruz","raw_affiliation_strings":["Instituto de F\u00edsica, Universidad Aut\u00f3noma de Puebla, Puebla, M\u00e9xico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de F\u00edsica, Universidad Aut\u00f3noma de Puebla, Puebla, M\u00e9xico","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022481837","display_name":"David A. Pawlik","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. A. Pawlik","raw_affiliation_strings":["Energy Conversion Devices, Inc., Troy, Michigan 48084"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Energy Conversion Devices, Inc., Troy, Michigan 48084","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019577418","display_name":"David D. Allred","orcid":"https://orcid.org/0000-0001-6163-518X","observed_orcids":["https://orcid.org/0000-0001-6163-518X"]},"institutions":[{"id":"https://openalex.org/I100005738","display_name":"Brigham Young University","ror":"https://ror.org/047rhhm47","country_code":"US","type":"education","lineage":["https://openalex.org/I100005738"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. D. Allred","raw_affiliation_strings":["Physics and Astronomy Department, Brigham Young University, Provo, Utah 84602"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physics and Astronomy Department, Brigham Young University, Provo, Utah 84602","institution_ids":["https://openalex.org/I100005738"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":94},"biblio":{"volume":"9","issue":"3","first_page":"550","last_page":"553"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.5708000063896179,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.5708000063896179,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.42500001192092896,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/zinc-cadmium-telluride","display_name":"ZnCdTe","score":0.9179999828338623},{"id":"https://openalex.org/keywords/close-spaced-vapor-transport","display_name":"close-spaced vapor transport","score":0.8920000195503235},{"id":"https://openalex.org/keywords/solid-solution-films","display_name":"solid solution films","score":0.7620000243186951},{"id":"https://openalex.org/keywords/crystalline-quality","display_name":"crystal quality","score":0.8259999752044678},{"id":"https://openalex.org/keywords/substrate-temperature","display_name":"substrate temperature","score":0.7120000123977661},{"id":"https://openalex.org/keywords/argon-pressure","display_name":"argon pressure","score":0.9290000200271606},{"id":"https://openalex.org/keywords/deposition-rate","display_name":"deposition rate","score":0.9950000047683716},{"id":"https://openalex.org/keywords/grain-size","display_name":"grain size","score":0.7889999747276306},{"id":"https://openalex.org/keywords/photoluminescence","display_name":"photoluminescence","score":0.875},{"id":"https://openalex.org/keywords/optical-properties","display_name":"optical properties","score":0.5600000023841858}],"concepts":[{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.7250871658325195},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.6962116956710815},{"id":"https://openalex.org/C2776614250","wikidata":"https://www.wikidata.org/wiki/Q906733","display_name":"Cadmium zinc telluride","level":3,"score":0.620171308517456},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.6029434204101562},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5972440838813782},{"id":"https://openalex.org/C85080765","wikidata":"https://www.wikidata.org/wiki/Q614893","display_name":"Photoluminescence","level":2,"score":0.5941743850708008},{"id":"https://openalex.org/C547737533","wikidata":"https://www.wikidata.org/wiki/Q696","display_name":"Argon","level":2,"score":0.5669775605201721},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.5544947385787964},{"id":"https://openalex.org/C6110044","wikidata":"https://www.wikidata.org/wiki/Q4118086","display_name":"Cadmium telluride photovoltaics","level":2,"score":0.5177128314971924},{"id":"https://openalex.org/C57410435","wikidata":"https://www.wikidata.org/wiki/Q505668","display_name":"Chemical vapor deposition","level":2,"score":0.5115602612495422},{"id":"https://openalex.org/C535196362","wikidata":"https://www.wikidata.org/wiki/Q758","display_name":"Zinc","level":2,"score":0.4599847197532654},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.42178136110305786},{"id":"https://openalex.org/C50515024","wikidata":"https://www.wikidata.org/wiki/Q826582","display_name":"X-ray crystallography","level":3,"score":0.41419824957847595},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.39066290855407715},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2618364095687866},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2550264596939087},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.17791584134101868},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.16698282957077026},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.12017104029655457},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.09539210796356201},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1116/1.577407","doi":"https://doi.org/10.1116/1.577407","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.577407","pdf_url":null,"source":{"id":"https://openalex.org/S4210190837","display_name":"Journal of Vacuum Science & Technology A Vacuum Surfaces and Films","issn_l":"0734-2101","issn":["0734-2101","1520-8559"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films","raw_type":"journal-article"},{"id":"pmh:oai:scholarsarchive.byu.edu:facpub-2185","doi":null,"is_oa":false,"landing_page_url":"https://scholarsarchive.byu.edu/facpub/1186","pdf_url":null,"source":{"id":"https://openalex.org/S4377196308","display_name":"ScholarsArchive  (Brigham Young University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I100005738","host_organization_name":"Brigham Young University","host_organization_lineage":["https://openalex.org/I100005738"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Faculty Publications","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2050678553","https://openalex.org/W1529818470","https://openalex.org/W2315989063","https://openalex.org/W2478813909","https://openalex.org/W2067584333","https://openalex.org/W4385199001","https://openalex.org/W1995451597","https://openalex.org/W2587697005","https://openalex.org/W3194018706","https://openalex.org/W2752106233"],"abstract_inverted_index":{"Zinc":[0],"cadmium":[1],"telluride":[2],"(ZnxCd1\u2212xTe":[3],")":[4],"solid":[5],"solution":[6],"films":[7,35],"with":[8,36,43],"0\u2264x\u22640.12":[9],"were":[10],"deposited":[11],"by":[12],"the":[13,67,70,75,85],"close":[14],"spaced":[15],"vapor":[16],"transport":[17],"method":[18],"and":[19,25,47,63],"characterized":[20],"using":[21],"photoluminescence,":[22],"x-ray":[23],"diffraction,":[24],"scanning":[26],"electron":[27,78],"microscopy.":[28],"The":[29,77],"two":[30],"former":[31],"techniques":[32],"indicate":[33],"that":[34,73],"high":[37],"crystalline":[38],"quality":[39],"can":[40],"be":[41],"prepared":[42],"moderate":[44],"substrate":[45],"temperatures":[46],"low":[48],"argon":[49],"pressures.":[50],"Under":[51],"these":[52],"conditions":[53],"deposition":[54],"rates":[55],"of":[56,74],"up":[57],"to":[58,84],"1000":[59],"\u00c5/s":[60],"are":[61],"achieved":[62],"Zn":[64],"concentration":[65],"in":[66],"film":[68,86],"is":[69],"same":[71],"as":[72],"source.":[76],"micrographs":[79],"show":[80],"grain":[81],"sizes":[82],"comparable":[83],"thickness.":[87]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2016-06-24T00:00:00"}