{"id":"https://openalex.org/W2018656067","doi":"https://doi.org/10.1109/23.490913","title":"Soft error susceptibility and immune structures in dynamic random access memories (DRAMs) investigated by nuclear microprobes","display_name":"Soft error susceptibility and immune structures in dynamic random access memories (DRAMs) investigated by nuclear microprobes","publication_year":1996,"publication_date":"1996-04-01","ids":{"openalex":"https://openalex.org/W2018656067","doi":"https://doi.org/10.1109/23.490913","mag":"2018656067"},"language":"en","primary_location":{"id":"doi:10.1109/23.490913","doi":"https://doi.org/10.1109/23.490913","is_oa":false,"landing_page_url":"https://doi.org/10.1109/23.490913","pdf_url":null,"source":{"id":"https://openalex.org/S14279044","display_name":"IEEE Transactions on Nuclear Science","issn_l":"0018-9499","issn":["0018-9499","1558-1578"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Nuclear Science","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113311479","display_name":"M. Takai","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Takai","raw_affiliation_strings":["Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University, Toyonaka, Osaka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University, Toyonaka, Osaka, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107835931","display_name":"T. Kishimoto","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Kishimoto","raw_affiliation_strings":["Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University, Toyonaka, Osaka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University, Toyonaka, Osaka, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041415559","display_name":"Yutaka Ohno","orcid":"https://orcid.org/0000-0003-3998-4409","observed_orcids":["https://orcid.org/0000-0003-3998-4409"]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Ohno","raw_affiliation_strings":["ULSI Laboratory, Mitsubishi Electric Corporation Limited, Itami, Hyogo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ULSI Laboratory, Mitsubishi Electric Corporation Limited, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110160976","display_name":"H. Sayama","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Sayama","raw_affiliation_strings":["ULSI Laboratory, Mitsubishi Electric Corporation Limited, Itami, Hyogo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ULSI Laboratory, Mitsubishi Electric Corporation Limited, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006459713","display_name":"Kenichirou Sonoda","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Sonoda","raw_affiliation_strings":["ULSI Laboratory, Mitsubishi Electric Corporation Limited, Itami, Hyogo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ULSI Laboratory, Mitsubishi Electric Corporation Limited, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113033604","display_name":"Shin-ichi SATOH","orcid":"https://orcid.org/0000-0002-0780-6723","observed_orcids":["https://orcid.org/0000-0002-0780-6723"]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Satoh","raw_affiliation_strings":["ULSI Laboratory, Mitsubishi Electric Corporation Limited, Itami, Hyogo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ULSI Laboratory, Mitsubishi Electric Corporation Limited, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021004957","display_name":"Takashi Nishimura","orcid":"https://orcid.org/0000-0002-0435-0046","observed_orcids":["https://orcid.org/0000-0002-0435-0046"]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Nishimura","raw_affiliation_strings":["ULSI Laboratory, Mitsubishi Electric Corporation Limited, Itami, Hyogo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ULSI Laboratory, Mitsubishi Electric Corporation Limited, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071427822","display_name":"Hirokazu Miyoshi","orcid":"https://orcid.org/0000-0003-0856-8410","observed_orcids":["https://orcid.org/0000-0003-0856-8410"]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Miyoshi","raw_affiliation_strings":["ULSI Laboratory, Mitsubishi Electric Corporation Limited, Itami, Hyogo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ULSI Laboratory, Mitsubishi Electric Corporation Limited, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056213756","display_name":"A. Kinomura","orcid":"https://orcid.org/0000-0001-7824-4126","observed_orcids":["https://orcid.org/0000-0001-7824-4126"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. Kinomura","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111849980","display_name":"Y. Horino","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Horino","raw_affiliation_strings":["Osaka National Research Institute, AIST, Ikeda, Osaka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Osaka National Research Institute, AIST, Ikeda, Osaka, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081197222","display_name":"Katsushi Fujii","orcid":"https://orcid.org/0000-0002-9022-9858","observed_orcids":["https://orcid.org/0000-0002-9022-9858"]},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Fujii","raw_affiliation_strings":["Osaka National Research Institute, AIST, Ikeda, Osaka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Osaka National Research Institute, AIST, Ikeda, Osaka, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":2.3304,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.86811204,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":93},"biblio":{"volume":"43","issue":"2","first_page":"696","last_page":"704"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dynamic-random-access-memory","display_name":"dynamic random access memory","score":0.9279999732971191},{"id":"https://openalex.org/keywords/nuclear-microprobe","display_name":"nuclear microprobe","score":0.8840000033378601},{"id":"https://openalex.org/keywords/charge-collection-efficiency","display_name":"charge collection efficiency","score":0.8159999847412109},{"id":"https://openalex.org/keywords/radiation-effects-in-semiconductors","display_name":"radiation effects in semiconductors","score":0.6169999837875366}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.9252426028251648},{"id":"https://openalex.org/C125206250","wikidata":"https://www.wikidata.org/wiki/Q2365355","display_name":"Microprobe","level":2,"score":0.7130024433135986},{"id":"https://openalex.org/C118702147","wikidata":"https://www.wikidata.org/wiki/Q189396","display_name":"Dynamic random-access memory","level":3,"score":0.6544113159179688},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6456197500228882},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5795863270759583},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.547913670539856},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.5375608205795288},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5163199305534363},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.45166921615600586},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.4268737733364105},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33776628971099854},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1901567578315735},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1703188717365265},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.1193489134311676},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08471223711967468},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/23.490913","doi":"https://doi.org/10.1109/23.490913","is_oa":false,"landing_page_url":"https://doi.org/10.1109/23.490913","pdf_url":null,"source":{"id":"https://openalex.org/S14279044","display_name":"IEEE Transactions on Nuclear Science","issn_l":"0018-9499","issn":["0018-9499","1558-1578"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Nuclear Science","raw_type":"journal-article"},{"id":"mag:2184810036","doi":null,"is_oa":false,"landing_page_url":"http://ieeexplore.ieee.org/iel1/23/10559/00490913.pdf","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W651038632","https://openalex.org/W1966457031","https://openalex.org/W1970350948","https://openalex.org/W1990303845","https://openalex.org/W2000384634","https://openalex.org/W2003183128","https://openalex.org/W2008126959","https://openalex.org/W2010316428","https://openalex.org/W2023856022","https://openalex.org/W2031814062","https://openalex.org/W2031918342","https://openalex.org/W2035486547","https://openalex.org/W2037576944","https://openalex.org/W2038427544","https://openalex.org/W2049697354","https://openalex.org/W2056267667","https://openalex.org/W2061569249","https://openalex.org/W2070259460","https://openalex.org/W2073599793","https://openalex.org/W2075926924","https://openalex.org/W2079002591","https://openalex.org/W2081208842","https://openalex.org/W2086768222","https://openalex.org/W2097047102","https://openalex.org/W2099926376","https://openalex.org/W2118351481","https://openalex.org/W2124531635","https://openalex.org/W2129973796","https://openalex.org/W2137008230","https://openalex.org/W2138809713","https://openalex.org/W2145284858","https://openalex.org/W2163283337","https://openalex.org/W2319441532","https://openalex.org/W2467678776","https://openalex.org/W2469229085","https://openalex.org/W2509794483","https://openalex.org/W2537798805","https://openalex.org/W4285719527","https://openalex.org/W6644480176","https://openalex.org/W6992546916"],"related_works":["https://openalex.org/W2184810036","https://openalex.org/W2070259460","https://openalex.org/W2086768222","https://openalex.org/W2097047102","https://openalex.org/W2026939545","https://openalex.org/W2082393559","https://openalex.org/W6992546916","https://openalex.org/W2011956007","https://openalex.org/W2081208842","https://openalex.org/W2152643014"],"abstract_inverted_index":{"Soft":[0,29],"error":[1,30],"susceptibility":[2,31],"mapping":[3],"and":[4,40],"ion-beam-induced-current":[5],"(IBIC)":[6],"measurements":[7],"using":[8],"a":[9,13,35,68,72,78],"nuclear":[10],"microprobe":[11],"allow":[12],"quantitative":[14],"evaluation":[15],"of":[16,37],"the":[17],"charge":[18],"collection":[19,46],"which":[20],"induces":[21],"upset":[22],"in":[23,32,71],"dynamic":[24],"random":[25],"access":[26],"memories":[27],"(DRAMs).":[28],"DRAMs":[33],"as":[34],"function":[36],"local":[38],"position":[39],"structure":[41],"has":[42,62],"been":[43,63],"reviewed.":[44],"Charge":[45],"efficiency":[47],"induced":[48],"by":[49],"incident":[50],"ions":[51],"on":[52,77],"reverse-biased":[53],"n/sup":[54],"+/p":[55],"junctions":[56],"with":[57,65,67],"various":[58],"barrier":[59],"well":[60,70],"structures":[61],"compared":[64],"that":[66],"conventional":[69],"p/sup":[73,79],"-/":[74],"epitaxial":[75],"layer":[76],"+/":[80],"substrate.":[81]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}