{"id":"https://openalex.org/W2018453077","doi":"https://doi.org/10.1117/12.586933","title":"Novel pixel architecture with inherent background suppression for 3D time-of-flight imaging","display_name":"Novel pixel architecture with inherent background suppression for 3D time-of-flight imaging","publication_year":2005,"publication_date":"2005-01-17","ids":{"openalex":"https://openalex.org/W2018453077","doi":"https://doi.org/10.1117/12.586933","mag":"2018453077"},"language":"en","primary_location":{"id":"doi:10.1117/12.586933","doi":"https://doi.org/10.1117/12.586933","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.586933","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038839934","display_name":"Thierry Oggier","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Thierry Oggier","raw_affiliation_strings":["Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087071029","display_name":"R. Kaufmann","orcid":"https://orcid.org/0000-0002-8816-520X","observed_orcids":["https://orcid.org/0000-0002-8816-520X"]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Rolf Kaufmann","raw_affiliation_strings":["Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Michael Lehmann","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Michael Lehmann","raw_affiliation_strings":["Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109434641","display_name":"Bernhard B\u00fcttgen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Bernhard Buttgen","raw_affiliation_strings":["Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041055607","display_name":"Simon Neukom","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Simon Neukom","raw_affiliation_strings":["Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Michael Richter","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Michael Richter","raw_affiliation_strings":["Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Matthias Schweizer","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Matthias Schweizer","raw_affiliation_strings":["Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070442344","display_name":"Peter Metzler","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Peter Metzler","raw_affiliation_strings":["Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006433756","display_name":"Felix Lustenberger","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Felix Lustenberger","raw_affiliation_strings":["Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004994088","display_name":"Nicolas Blanc","orcid":"https://orcid.org/0000-0001-8924-9213","observed_orcids":["https://orcid.org/0000-0001-8924-9213"]},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Nicolas Blanc","raw_affiliation_strings":["Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)","institution_ids":["https://openalex.org/I135218257"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I135218257"],"apc_list":null,"apc_paid":null,"fwci":11.242,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.99607843,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"5665","issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.008299999870359898,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/time-of-flight-imaging","display_name":"time-of-flight imaging","score":0.9509999752044678},{"id":"https://openalex.org/keywords/pixel-architecture","display_name":"pixel architecture","score":0.7730000019073486},{"id":"https://openalex.org/keywords/3d-imaging","display_name":"3D imaging","score":0.6880000233650208},{"id":"https://openalex.org/keywords/depth-sensing","display_name":"depth sensing","score":0.5230000019073486},{"id":"https://openalex.org/keywords/cmos-image-sensor","display_name":"CMOS image sensor","score":0.6740000247955322},{"id":"https://openalex.org/keywords/distance-resolution","display_name":"distance resolution","score":0.6259999871253967}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.8088943958282471},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6729862093925476},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.6439019441604614},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5916600823402405},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5812199711799622},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.48171693086624146},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.46421197056770325},{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.4126182198524475},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09760412573814392},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.586933","doi":"https://doi.org/10.1117/12.586933","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.586933","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320998","display_name":"Kommission f\u00fcr Technologie und Innovation","ror":"https://ror.org/012y9zp98"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2007873071","https://openalex.org/W2067718833","https://openalex.org/W2139451537","https://openalex.org/W6999918301","https://openalex.org/W1584643859","https://openalex.org/W4404319783","https://openalex.org/W2779071451","https://openalex.org/W2013907867","https://openalex.org/W2035449708","https://openalex.org/W2069620368"],"abstract_inverted_index":{"The":[0,17,33,226,264,280,354],"time-of-flight":[1],"(TOF)":[2],"principle":[3,8,228],"is":[4,125,295,304],"a":[5,11,96,101,157,191,241,259,270,284,287,307,326,337,367,370],"well":[6],"known":[7],"to":[9,95,108,129,156,210,276,325,346,365],"acquire":[10],"scene":[12,38],"in":[13,75,77,90,134,137,184,223,237,258,269,344],"all":[14],"three":[15],"dimensions.":[16],"advantages":[18],"of":[19,22,31,100,104,111,119,165,186,207,229,243,246,286,309,328,350],"the":[20,23,37,64,67,84,91,109,140,144,163,166,169,180,205,214,232,244,247,291,298,301,310,313,317,329,340,348,351,363,375],"knowledge":[21],"third":[24],"dimension":[25],"are":[26,235,262,267],"obvious":[27],"for":[28],"many":[29],"kinds":[30],"applications.":[32],"distance":[34,281,302],"information":[35],"within":[36],"renders":[39],"automatic":[40],"systems":[41],"more":[42],"robust":[43],"and":[44,63,219,231,316],"much":[45],"less":[46],"complex":[47],"or":[48,176],"even":[49],"enables":[50,362],"completely":[51],"new":[52,172,197,352],"solutions.":[53],"A":[54],"solid-state":[55],"image":[56],"sensor":[57,145,170,265,368],"containing":[58,374],"124":[59],"x":[60],"160":[61],"pixels":[62,124],"corresponding":[65,94],"3D-camera,":[66],"so-called":[68,121],"SwissRanger":[69,85],"camera,":[70],"has":[71,80],"already":[72],"been":[73,81],"presented":[74,222],"detail":[76],"[1].":[78],"It":[79],"shown":[82],"that":[83,136],"camera":[86],"achieves":[87],"depth":[88],"resolutions":[89],"sub-centimeter":[92],"range,":[93],"measured":[97],"time":[98,315],"resolution":[99,303,373],"few":[102,158,288],"tens":[103],"picoseconds":[105],"with":[106,240,274,290,339,369],"respect":[107],"speed":[110],"light":[112,278,293],"(c~3\u2022108":[113],"m/s).":[114],"However,":[115],"one":[116],"main":[117],"drawback":[118],"these":[120],"lock-in":[122],"TOF":[123],"their":[126],"limited":[127],"capacity":[128],"handle":[130],"background":[131,148,187,201,211,318,331],"illumination.":[132,188],"Keeping":[133],"mind":[135],"outdoor":[138],"applications":[139],"optical":[141],"power":[142,164],"on":[143,190],"originating":[146],"from":[147],"illumination":[149,202,319],"(e.g.,":[150],"sun":[151,277],"light)":[152],"may":[153],"be":[154,221],"up":[155,275],"100":[159],"times":[160],"higher":[161],"than":[162],"modulated":[167,208],"illumination,":[168],"requires":[171],"pixel":[173,198,249,342],"structures":[174,266],"eliminating":[175],"at":[177,213,251],"least":[178],"reducing":[179],"currently":[181],"experienced":[182],"restrictions":[183],"terms":[185],"Based":[189],"0.6":[192],"\u00b5m":[193],"CMOS/CCD":[194],"technology,":[195],"four":[196],"architectures":[199],"suppressing":[200],"and/or":[203],"improving":[204],"ratio":[206],"signal":[209,212],"pixel-output":[215],"level":[216],"were":[217],"developed":[218],"will":[220],"this":[224],"paper.":[225],"theoretical":[227],"operation":[230],"expected":[233],"performance":[234],"described":[236],"detail,":[238],"together":[239],"sketch":[242],"implementation":[245],"different":[248],"designs":[250],"silicon":[252],"level.":[253],"Furthermore,":[254],"test":[255],"results":[256],"obtained":[257],"laboratory":[260],"environment":[261,273],"published.":[263],"characterized":[268],"high":[271,371],"background-light":[272],"conditions.":[279],"linearity":[282],"over":[283],"range":[285],"meters":[289],"mentioned":[292],"conditions":[294],"measured.":[296],"At":[297],"same":[299],"time,":[300],"plotted":[305],"as":[306],"function":[308],"target":[311],"distance,":[312],"integration":[314],"power.":[320],"This":[321],"in-depth":[322],"evaluation":[323],"leads":[324],"comparison":[327,338],"various":[330],"suppression":[332],"approaches;":[333],"it":[334],"also":[335],"includes":[336],"traditional":[341],"structure":[343],"order":[345],"highlight":[347],"benefits":[349],"approaches.":[353],"paper":[355],"concludes":[356],"by":[357],"providing":[358],"parameter":[359],"estimations":[360],"which":[361],"outlook":[364],"build":[366],"lateral":[372],"most":[376],"promising":[377],"pixel.":[378]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2016-06-24T00:00:00"}