{"id":"https://openalex.org/W2017909523","doi":"https://doi.org/10.1117/12.138074","title":"Performance of a high-frame-rate CCD imager","display_name":"Performance of a high-frame-rate CCD imager","publication_year":1992,"publication_date":"1992-08-28","ids":{"openalex":"https://openalex.org/W2017909523","doi":"https://doi.org/10.1117/12.138074","mag":"2017909523"},"language":"en","primary_location":{"id":"doi:10.1117/12.138074","doi":"https://doi.org/10.1117/12.138074","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.138074","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102093803","display_name":"Peter A. Levine","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2800295664","display_name":"RCA (United States)","ror":"https://ror.org/010k8n340","country_code":"US","type":"company","lineage":["https://openalex.org/I2800295664"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peter A. Levine","raw_affiliation_strings":["David Sarnoff Research Ctr. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"David Sarnoff Research Ctr. (United States)","institution_ids":["https://openalex.org/I2800295664"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065635040","display_name":"Donald J. Sauer","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2800295664","display_name":"RCA (United States)","ror":"https://ror.org/010k8n340","country_code":"US","type":"company","lineage":["https://openalex.org/I2800295664"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Donald J. Sauer","raw_affiliation_strings":["David Sarnoff Research Ctr. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"David Sarnoff Research Ctr. (United States)","institution_ids":["https://openalex.org/I2800295664"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068034794","display_name":"Fu-Lung Hseuh","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2800295664","display_name":"RCA (United States)","ror":"https://ror.org/010k8n340","country_code":"US","type":"company","lineage":["https://openalex.org/I2800295664"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fu-Lung Hseuh","raw_affiliation_strings":["David Sarnoff Research Ctr. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"David Sarnoff Research Ctr. (United States)","institution_ids":["https://openalex.org/I2800295664"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023469111","display_name":"Frank V. Shallcross","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2800295664","display_name":"RCA (United States)","ror":"https://ror.org/010k8n340","country_code":"US","type":"company","lineage":["https://openalex.org/I2800295664"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Frank V. Shallcross","raw_affiliation_strings":["David Sarnoff Research Ctr. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"David Sarnoff Research Ctr. (United States)","institution_ids":["https://openalex.org/I2800295664"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044350396","display_name":"Grazyna M. Meray","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2800295664","display_name":"RCA (United States)","ror":"https://ror.org/010k8n340","country_code":"US","type":"company","lineage":["https://openalex.org/I2800295664"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Grazyna M. Meray","raw_affiliation_strings":["David Sarnoff Research Ctr. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"David Sarnoff Research Ctr. (United States)","institution_ids":["https://openalex.org/I2800295664"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113120478","display_name":"Gordon C. Taylor","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2800295664","display_name":"RCA (United States)","ror":"https://ror.org/010k8n340","country_code":"US","type":"company","lineage":["https://openalex.org/I2800295664"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gordon C. Taylor","raw_affiliation_strings":["David Sarnoff Research Ctr. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"David Sarnoff Research Ctr. (United States)","institution_ids":["https://openalex.org/I2800295664"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109147884","display_name":"Gary W. Hughes","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2800295664","display_name":"RCA (United States)","ror":"https://ror.org/010k8n340","country_code":"US","type":"company","lineage":["https://openalex.org/I2800295664"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gary W. Hughes","raw_affiliation_strings":["David Sarnoff Research Ctr. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"David Sarnoff Research Ctr. (United States)","institution_ids":["https://openalex.org/I2800295664"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113536026","display_name":"John M. Pellegrino","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4389425414","display_name":"Harry Diamond Laboratories","ror":"https://ror.org/032xmxh33","country_code":"US","type":"facility","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I166416128","https://openalex.org/I2802705668","https://openalex.org/I4210154437","https://openalex.org/I4389425414"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John M. Pellegrino","raw_affiliation_strings":["Harry Diamond Labs. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Harry Diamond Labs. (United States)","institution_ids":["https://openalex.org/I4389425414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074845183","display_name":"Deborah R. Simon","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4389425414","display_name":"Harry Diamond Laboratories","ror":"https://ror.org/032xmxh33","country_code":"US","type":"facility","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I166416128","https://openalex.org/I2802705668","https://openalex.org/I4210154437","https://openalex.org/I4389425414"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Deborah R. Simon","raw_affiliation_strings":["Harry Diamond Labs. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Harry Diamond Labs. (United States)","institution_ids":["https://openalex.org/I4389425414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012758978","display_name":"Lorna J. Harrison","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4389425414","display_name":"Harry Diamond Laboratories","ror":"https://ror.org/032xmxh33","country_code":"US","type":"facility","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I166416128","https://openalex.org/I2802705668","https://openalex.org/I4210154437","https://openalex.org/I4389425414"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lorna J. Harrison","raw_affiliation_strings":["Harry Diamond Labs. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Harry Diamond Labs. (United States)","institution_ids":["https://openalex.org/I4389425414"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048002614","display_name":"William B. Lawler","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4389425414","display_name":"Harry Diamond Laboratories","ror":"https://ror.org/032xmxh33","country_code":"US","type":"facility","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I166416128","https://openalex.org/I2802705668","https://openalex.org/I4210154437","https://openalex.org/I4389425414"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"William B. Lawler","raw_affiliation_strings":["Harry Diamond Labs. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Harry Diamond Labs. (United States)","institution_ids":["https://openalex.org/I4389425414"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4278,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.76707462,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1693","issue":null,"first_page":"65","last_page":"65"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.0,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ccd-detector","display_name":"CCD detector","score":0.6150000095367432},{"id":"https://openalex.org/keywords/high-frame-rate","display_name":"high frame rate","score":0.6970000267028809},{"id":"https://openalex.org/keywords/back-illuminated-ccd","display_name":"back-illuminated CCD","score":0.9139999747276306},{"id":"https://openalex.org/keywords/quantum-efficiency","display_name":"quantum efficiency","score":0.7179999947547913},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"dynamic range","score":0.9950000047683716},{"id":"https://openalex.org/keywords/dark-current","display_name":"dark current","score":0.9980000257492065},{"id":"https://openalex.org/keywords/contrast-transfer-function","display_name":"contrast transfer function","score":0.7519999742507935},{"id":"https://openalex.org/keywords/correlated-double-sampling","display_name":"correlated double sampling","score":0.9110000133514404},{"id":"https://openalex.org/keywords/readout-noise","display_name":"readout noise","score":0.9169999957084656},{"id":"https://openalex.org/keywords/esd-protection","display_name":"electrostatic discharge protection","score":0.8730000257492065},{"id":"https://openalex.org/keywords/substrate-thinning","display_name":"substrate thinning","score":0.8920000195503235}],"concepts":[{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.6714743375778198},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.6433227062225342},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6136764287948608},{"id":"https://openalex.org/C2780056265","wikidata":"https://www.wikidata.org/wiki/Q106239881","display_name":"High dynamic range","level":3,"score":0.5915322303771973},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5028273463249207},{"id":"https://openalex.org/C3261483","wikidata":"https://www.wikidata.org/wiki/Q119565","display_name":"Frame rate","level":2,"score":0.4966598153114319},{"id":"https://openalex.org/C32802771","wikidata":"https://www.wikidata.org/wiki/Q2443617","display_name":"Port (circuit theory)","level":2,"score":0.48128002882003784},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4629984498023987},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.44458550214767456},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.42797911167144775},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4233383536338806},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4217313528060913},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40219491720199585},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.22751441597938538},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21302077174186707},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14565613865852356},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.138074","doi":"https://doi.org/10.1117/12.138074","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.138074","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2038204858","https://openalex.org/W1998058744","https://openalex.org/W2039267388","https://openalex.org/W2077327905","https://openalex.org/W2057189204","https://openalex.org/W1965256040","https://openalex.org/W1547595708","https://openalex.org/W2029131067","https://openalex.org/W1580504238","https://openalex.org/W2000573087"],"abstract_inverted_index":{"Back-illuminated,":[0],"16-port":[1],"512":[2,4,23,25,129,131],"X":[3,8,24,130],"and":[5,45,82,94,104,121,159,173],"32-port":[6],"1024":[7,9],"charge":[10],"coupled":[11],"device":[12],"(CCD)":[13],"imagers":[14],"have":[15,54],"been":[16],"fabricated.":[17],"The":[18,60,86,107],"measured":[19],"performance":[20],"of":[21,69,101,116],"the":[22,99,114,128,156],"pixel":[26],"chip":[27,145],"is":[28,111],"described,":[29],"including":[30],"data":[31],"on":[32,57],"quantum":[33,96],"efficiency,":[34],"dynamic":[35,84],"range,":[36],"dark":[37],"current,":[38],"frame":[39,80,140],"rates,":[40],"uniformity,":[41],"contrast":[42],"transfer":[43],"function,":[44],"on-chip":[46],"correlated":[47],"double-":[48],"sampling":[49],"(CDS)":[50],"amplifier":[51],"noise.":[52],"We":[53],"previously":[55],"reported":[56],"these":[58],"designs.":[59],"CCD":[61],"arrays":[62],"are":[63,148],"designed":[64],"with":[65,78],"a":[66,117,168],"unique":[67],"combination":[68],"parameters":[70],"optimized":[71],"for":[72,138],"applications":[73],"requiring":[74],"high":[75,79,95,108],"resolution":[76],"combined":[77],"rates":[81],"wide":[83],"range.":[85],"imaging":[87],"registers":[88],"achieve":[89],"100%":[90],"optical":[91],"fill":[92],"factor":[93],"efficiency":[97],"through":[98],"use":[100,115],"substrate":[102],"thinning":[103],"back-side":[105],"illumination.":[106],"frame-rate":[109],"readout":[110,133,157],"obtained":[112],"by":[113],"dual":[118],"storage":[119],"register":[120],"multiple":[122],"floating-diffusion":[123],"output":[124,152],"ports":[125],"which":[126],"reduce":[127,155],"array":[132],"frequency":[134],"to":[135,154],"15":[136],"MHz":[137],"800":[139],"per":[141],"second":[142],"operation.":[143],"On-":[144],"CDS":[146],"amplifiers":[147],"included":[149],"in":[150],"each":[151],"port":[153],"noise":[158],"simplify":[160],"off-chip":[161],"analog":[162],"signal":[163],"processing.":[164],"Both":[165],"designs":[166],"include":[167],"buried":[169],"anti-blooming":[170],"drain":[171],"structure":[172],"electro":[174],"static":[175],"discharge":[176],"(ESD)":[177],"protection.":[178]},"counts_by_year":[],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2016-06-24T00:00:00"}