{"id":"https://openalex.org/W2017817899","doi":"https://doi.org/10.1109/ursigass.2014.6929004","title":"New method for power flicker calibration based on interpolated DFT","display_name":"New method for power flicker calibration based on interpolated DFT","publication_year":2014,"publication_date":"2014-08-01","ids":{"openalex":"https://openalex.org/W2017817899","doi":"https://doi.org/10.1109/ursigass.2014.6929004","mag":"2017817899"},"language":"en","primary_location":{"id":"doi:10.1109/ursigass.2014.6929004","doi":"https://doi.org/10.1109/ursigass.2014.6929004","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ursigass.2014.6929004","pdf_url":null,"source":{"id":"https://openalex.org/S4306421111","display_name":"URSI General Assembly and Scientific Symposium","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 XXXIth URSI General Assembly and Scientific Symposium (URSI GASS)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061122409","display_name":"Sheng Dong Gao","orcid":"https://orcid.org/0000-0002-4227-3547","observed_orcids":["https://orcid.org/0000-0002-4227-3547"]},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sheng Gao","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, HaiDian District, Beijing, China","School of Automation Science and Electrical Engineering, Beihang University, Xueyuan Road No.37,Haidian District, Beijing, 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, HaiDian District, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Xueyuan Road No.37,Haidian District, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067477948","display_name":"Jing Yuan Wu","orcid":"https://orcid.org/0000-0002-3198-137X","observed_orcids":["https://orcid.org/0000-0002-3198-137X"]},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Wu","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, HaiDian District, Beijing, China","School of Automation Science and Electrical Engineering, Beihang University, Xueyuan Road No.37,Haidian District, Beijing, 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, HaiDian District, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Xueyuan Road No.37,Haidian District, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053249184","display_name":"Jin Haibin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405282447","display_name":"Beijing Orient Institute of Measurement and Test","ror":"https://ror.org/05vhdxq63","country_code":"CN","type":"facility","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301","https://openalex.org/I4405282447"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haibin Jin","raw_affiliation_strings":["Beijing Orient Institute of Measurement & Test (BOIMT), Beijing, China","Beijing Orient Institute of Measurement & Test (BOIMT), Mailbox 9628-5, Beijing 100086, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Orient Institute of Measurement & Test (BOIMT), Beijing, China","institution_ids":["https://openalex.org/I4405282447"]},{"raw_affiliation_string":"Beijing Orient Institute of Measurement & Test (BOIMT), Mailbox 9628-5, Beijing 100086, China","institution_ids":["https://openalex.org/I4405282447"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10294392,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"47","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.739300012588501,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.739300012588501,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.26030001044273376,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interpolated-dft","display_name":"interpolated DFT","score":0.8529999852180481},{"id":"https://openalex.org/keywords/asynchronous-sampling","display_name":"asynchronous sampling","score":0.6620000004768372},{"id":"https://openalex.org/keywords/power-quality","display_name":"power quality","score":0.6949999928474426},{"id":"https://openalex.org/keywords/voltage-fluctuation","display_name":"voltage fluctuation","score":0.8740000128746033}],"concepts":[{"id":"https://openalex.org/C19743564","wikidata":"https://www.wikidata.org/wiki/Q25378119","display_name":"Flicker","level":2,"score":0.8617379665374756},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6945618987083435},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6257237792015076},{"id":"https://openalex.org/C57733114","wikidata":"https://www.wikidata.org/wiki/Q1006032","display_name":"Discrete Fourier transform (general)","level":5,"score":0.5835099816322327},{"id":"https://openalex.org/C65155139","wikidata":"https://www.wikidata.org/wiki/Q5380912","display_name":"Envelope (radar)","level":3,"score":0.5214312076568604},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5175504088401794},{"id":"https://openalex.org/C151319957","wikidata":"https://www.wikidata.org/wiki/Q752739","display_name":"Asynchronous communication","level":2,"score":0.49044176936149597},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45592525601387024},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4522576332092285},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.44835126399993896},{"id":"https://openalex.org/C131770355","wikidata":"https://www.wikidata.org/wiki/Q876215","display_name":"Harmonic analysis","level":2,"score":0.4319216012954712},{"id":"https://openalex.org/C127934551","wikidata":"https://www.wikidata.org/wiki/Q1148098","display_name":"Harmonic","level":2,"score":0.42748215794563293},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.41569340229034424},{"id":"https://openalex.org/C75172450","wikidata":"https://www.wikidata.org/wiki/Q623950","display_name":"Fast Fourier transform","level":2,"score":0.41419291496276855},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.41400086879730225},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3443259000778198},{"id":"https://openalex.org/C102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","level":2,"score":0.31490522623062134},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.274855375289917},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2487773895263672},{"id":"https://openalex.org/C203024314","wikidata":"https://www.wikidata.org/wiki/Q1365258","display_name":"Fourier analysis","level":3,"score":0.2298983931541443},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20371326804161072},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1974177062511444},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.15807878971099854},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14722129702568054},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.09092235565185547},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07198423147201538},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76563020","wikidata":"https://www.wikidata.org/wiki/Q4817582","display_name":"Fractional Fourier transform","level":4,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ursigass.2014.6929004","doi":"https://doi.org/10.1109/ursigass.2014.6929004","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ursigass.2014.6929004","pdf_url":null,"source":{"id":"https://openalex.org/S4306421111","display_name":"URSI General Assembly and Scientific Symposium","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 XXXIth URSI General Assembly and Scientific Symposium (URSI GASS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320331086","display_name":"National Institute of Metrology, China","ror":"https://ror.org/05dw0p167"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2038876753","https://openalex.org/W2097660380","https://openalex.org/W2154550835","https://openalex.org/W2160685617","https://openalex.org/W4242547654"],"related_works":["https://openalex.org/W2137074843","https://openalex.org/W2033192817","https://openalex.org/W1902257246","https://openalex.org/W2391317345","https://openalex.org/W2394261106","https://openalex.org/W2145895464","https://openalex.org/W2141931946","https://openalex.org/W2157473934","https://openalex.org/W2127019783","https://openalex.org/W1549252722"],"abstract_inverted_index":{"Voltage":[0],"fluctuation":[1],"and":[2,24,56],"flicker":[3,14,29,53],"is":[4,16],"an":[5],"important":[6],"aspect":[7],"of":[8,13,21,39,80],"power":[9],"quality.":[10],"The":[11,43,78],"key":[12],"analysis":[15],"to":[17,68,88],"track":[18],"the":[19,27,48,52,57,61,70,75,81],"envelope":[20,62],"voltage":[22],"signals":[23],"then":[25],"calculate":[26],"short-term":[28],"severity.":[30],"In":[31],"this":[32],"paper,":[33],"a":[34],"new":[35,82],"method":[36,44],"on":[37],"calibration":[38,84],"flickermeters":[40],"was":[41,86],"presented.":[42],"did":[45],"not":[46],"adopt":[47],"phase-locked":[49],"loop":[50],"between":[51],"waveform":[54],"generator":[55],"DVM.":[58],"It":[59],"tracked":[60],"by":[63,74],"interpolated":[64],"discrete":[65],"Fourier":[66],"transform":[67],"eliminate":[69],"measurement":[71],"errors":[72],"caused":[73],"asynchronous":[76],"sampling.":[77],"error":[79],"flickermeter":[83],"system":[85],"estimated":[87],"be":[89],"about":[90],"10-5.":[91]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}