{"id":"https://openalex.org/W2017499376","doi":"https://doi.org/10.1107/s0108767378090054","title":"High spatial resolutions of diffraction information in large-angle convergent-beam electron diffraction patterns from cross-sectional specimens of GexSi1-x/Si strained-layer superlattices","display_name":"High spatial resolutions of diffraction information in large-angle convergent-beam electron diffraction patterns from cross-sectional specimens of GexSi1-x/Si strained-layer superlattices","publication_year":1993,"publication_date":"1993-08-21","ids":{"openalex":"https://openalex.org/W2017499376","doi":"https://doi.org/10.1107/s0108767378090054","mag":"2017499376"},"language":"en","primary_location":{"id":"doi:10.1107/s0108767378090054","doi":"https://doi.org/10.1107/s0108767378090054","is_oa":true,"landing_page_url":"https://doi.org/10.1107/s0108767378090054","pdf_url":"http://journals.iucr.org/a/issues/1993/s1/00/a34996/a34996.pdf","source":{"id":"https://openalex.org/S150871906","display_name":"Acta Crystallographica Section A Foundations of Crystallography","issn_l":"0108-7673","issn":["0108-7673","1600-5724"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Acta Crystallographica Section A Foundations of Crystallography","raw_type":"journal-article"},"volume":null,"type":"conference-abstract","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"http://journals.iucr.org/a/issues/1993/s1/00/a34996/a34996.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019924793","display_name":"Xiangfeng Duan","orcid":"https://orcid.org/0000-0002-4321-6288","observed_orcids":["https://orcid.org/0000-0002-4321-6288"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"X. F. Duan","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086605801","display_name":"D Cherns","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Cherns","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5026870874","display_name":"John Wickham Steeds","orcid":"https://orcid.org/0000-0002-7358-7442","observed_orcids":["https://orcid.org/0000-0002-7358-7442"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. W. Steeds","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"49","issue":"s1","first_page":"c356","last_page":"c356"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9761000275611877,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9761000275611877,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.00989999994635582,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.007899999618530273,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/large-angle-convergent-beam-electron-diffraction","display_name":"large-angle convergent-beam electron diffraction","score":0.9380000233650208},{"id":"https://openalex.org/keywords/high-spatial-resolution","display_name":"high spatial resolution","score":0.7160000205039978},{"id":"https://openalex.org/keywords/si-ge-superlattices","display_name":"Si/Ge superlattices","score":0.7950000166893005},{"id":"https://openalex.org/keywords/strained-layer-superlattices","display_name":"strained-layer superlattices","score":0.9819999933242798}],"concepts":[{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.6869156360626221},{"id":"https://openalex.org/C77557913","wikidata":"https://www.wikidata.org/wiki/Q864822","display_name":"Electron diffraction","level":3,"score":0.6281764507293701},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.6062740087509155},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5996442437171936},{"id":"https://openalex.org/C50515024","wikidata":"https://www.wikidata.org/wiki/Q826582","display_name":"X-ray crystallography","level":3,"score":0.5640647411346436},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2934474050998688},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21768537163734436},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.17916518449783325}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1107/s0108767378090054","doi":"https://doi.org/10.1107/s0108767378090054","is_oa":true,"landing_page_url":"https://doi.org/10.1107/s0108767378090054","pdf_url":"http://journals.iucr.org/a/issues/1993/s1/00/a34996/a34996.pdf","source":{"id":"https://openalex.org/S150871906","display_name":"Acta Crystallographica Section A Foundations of Crystallography","issn_l":"0108-7673","issn":["0108-7673","1600-5724"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Acta Crystallographica Section A Foundations of Crystallography","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1107/s0108767378090054","doi":"https://doi.org/10.1107/s0108767378090054","is_oa":true,"landing_page_url":"https://doi.org/10.1107/s0108767378090054","pdf_url":"http://journals.iucr.org/a/issues/1993/s1/00/a34996/a34996.pdf","source":{"id":"https://openalex.org/S150871906","display_name":"Acta Crystallographica Section A Foundations of Crystallography","issn_l":"0108-7673","issn":["0108-7673","1600-5724"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Acta Crystallographica Section A Foundations of Crystallography","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2017499376.pdf","grobid_xml":"https://content.openalex.org/works/W2017499376.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7112000194","https://openalex.org/W7112264568","https://openalex.org/W7112342847","https://openalex.org/W2033107203","https://openalex.org/W2151683732","https://openalex.org/W1545045253","https://openalex.org/W7113215365","https://openalex.org/W2010215322","https://openalex.org/W3148879714","https://openalex.org/W3036814596"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}