{"id":"https://openalex.org/W2017441145","doi":"https://doi.org/10.1016/0030-4018(74)90364-2","title":"Laser heterodyne measurement of small arbitrary displacements","display_name":"Laser heterodyne measurement of small arbitrary displacements","publication_year":1974,"publication_date":"1974-04-01","ids":{"openalex":"https://openalex.org/W2017441145","doi":"https://doi.org/10.1016/0030-4018(74)90364-2","mag":"2017441145"},"language":"en","primary_location":{"id":"doi:10.1016/0030-4018(74)90364-2","doi":"https://doi.org/10.1016/0030-4018(74)90364-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0030-4018(74)90364-2","pdf_url":null,"source":{"id":"https://openalex.org/S186881120","display_name":"Optics Communications","issn_l":"0030-4018","issn":["0030-4018","1873-0310"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics Communications","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017673942","display_name":"Yuhki Ohtsuka","orcid":"https://orcid.org/0000-0003-3275-3130","observed_orcids":["https://orcid.org/0000-0003-3275-3130"]},"institutions":[{"id":"https://openalex.org/I205349734","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702","country_code":"JP","type":"education","lineage":["https://openalex.org/I205349734"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Ohtsuka","raw_affiliation_strings":["Department of Engineering Science, Faculty of Engineering, Hokkaido University, Sapporo, Japan","Department of Engineering Science, Faculty of Engineering, Hokkaido University, Sapporo, #N#Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Engineering Science, Faculty of Engineering, Hokkaido University, Sapporo, Japan","institution_ids":["https://openalex.org/I205349734"]},{"raw_affiliation_string":"Department of Engineering Science, Faculty of Engineering, Hokkaido University, Sapporo, #N#Japan","institution_ids":["https://openalex.org/I205349734"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049330404","display_name":"Iwao Sasaki","orcid":"https://orcid.org/0009-0008-3507-9122","observed_orcids":["https://orcid.org/0009-0008-3507-9122"]},"institutions":[{"id":"https://openalex.org/I205349734","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702","country_code":"JP","type":"education","lineage":["https://openalex.org/I205349734"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"I. Sasaki","raw_affiliation_strings":["Department of Engineering Science, Faculty of Engineering, Hokkaido University, Sapporo, Japan","Department of Engineering Science, Faculty of Engineering, Hokkaido University, Sapporo, #N#Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Engineering Science, Faculty of Engineering, Hokkaido University, Sapporo, Japan","institution_ids":["https://openalex.org/I205349734"]},{"raw_affiliation_string":"Department of Engineering Science, Faculty of Engineering, Hokkaido University, Sapporo, #N#Japan","institution_ids":["https://openalex.org/I205349734"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I205349734"],"apc_list":{"value":2600,"currency":"USD","value_usd":2600},"apc_paid":null,"fwci":2.4016,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.85843621,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"10","issue":"4","first_page":"362","last_page":"365"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.8300999999046326,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.8300999999046326,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.04569999873638153,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.030899999663233757,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/laser-heterodyne-detection","display_name":"laser heterodyne detection","score":0.8769999742507935},{"id":"https://openalex.org/keywords/displacement-measurement","display_name":"displacement measurement","score":0.8050000071525574},{"id":"https://openalex.org/keywords/random-motion","display_name":"random motion","score":0.8420000076293945},{"id":"https://openalex.org/keywords/sinusoidal-motion","display_name":"sinusoidal motion","score":0.6140000224113464}],"concepts":[{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.8462696075439453},{"id":"https://openalex.org/C189809214","wikidata":"https://www.wikidata.org/wiki/Q829522","display_name":"Beat (acoustics)","level":2,"score":0.6524877548217773},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.6479145884513855},{"id":"https://openalex.org/C2780497637","wikidata":"https://www.wikidata.org/wiki/Q16938394","display_name":"Heterodyne (poetry)","level":2,"score":0.547595202922821},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5305004119873047},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.5039040446281433},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4907420873641968},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4353449046611786},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.43179336190223694},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34813249111175537},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.24862346053123474},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.11703318357467651},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0030-4018(74)90364-2","doi":"https://doi.org/10.1016/0030-4018(74)90364-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0030-4018(74)90364-2","pdf_url":null,"source":{"id":"https://openalex.org/S186881120","display_name":"Optics Communications","issn_l":"0030-4018","issn":["0030-4018","1873-0310"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics Communications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1970772024","https://openalex.org/W1983252833","https://openalex.org/W1986354772","https://openalex.org/W1993870199","https://openalex.org/W2003794135","https://openalex.org/W2013982917","https://openalex.org/W2036431976","https://openalex.org/W2058790484","https://openalex.org/W4243138808"],"related_works":["https://openalex.org/W2152675849","https://openalex.org/W2061896582","https://openalex.org/W1997502924","https://openalex.org/W1993870199","https://openalex.org/W2773952976","https://openalex.org/W1592482356","https://openalex.org/W1614226154","https://openalex.org/W4248216999","https://openalex.org/W2906903228","https://openalex.org/W1966428540"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2016-06-24T00:00:00"}