{"id":"https://openalex.org/W2017299041","doi":"https://doi.org/10.1007/s10854-007-9512-1","title":"Study of the degradation of AlGaAs-based high-power laser bars: V defects","display_name":"Study of the degradation of AlGaAs-based high-power laser bars: V defects","publication_year":2007,"publication_date":"2007-12-06","ids":{"openalex":"https://openalex.org/W2017299041","doi":"https://doi.org/10.1007/s10854-007-9512-1","mag":"2017299041"},"language":"en","primary_location":{"id":"doi:10.1007/s10854-007-9512-1","doi":"https://doi.org/10.1007/s10854-007-9512-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10854-007-9512-1","pdf_url":null,"source":{"id":"https://openalex.org/S189509794","display_name":"Journal of Materials Science Materials in Electronics","issn_l":"0957-4522","issn":["0957-4522","1573-482X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Materials Science: Materials in Electronics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027780236","display_name":"A. Mart\u00edn\u2010Mart\u00edn","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I108103353","display_name":"Universidad de Valladolid","ror":"https://ror.org/01fvbaw18","country_code":"ES","type":"education","lineage":["https://openalex.org/I108103353"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"A. Mart\u00edn-Mart\u00edn","raw_affiliation_strings":["F\u00edsica Te\u00f3rica, At\u00f3mica y Optica, Facultad de Ciencias, 47011, Valladolid, Spain","Facultad de Ciencias"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"F\u00edsica Te\u00f3rica, At\u00f3mica y Optica, Facultad de Ciencias, 47011, Valladolid, Spain","institution_ids":["https://openalex.org/I108103353"]},{"raw_affiliation_string":"Facultad de Ciencias","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054473790","display_name":"M. Avella","orcid":"https://orcid.org/0000-0002-7813-491X","observed_orcids":["https://orcid.org/0000-0002-7813-491X"]},"institutions":[{"id":"https://openalex.org/I108103353","display_name":"Universidad de Valladolid","ror":"https://ror.org/01fvbaw18","country_code":"ES","type":"education","lineage":["https://openalex.org/I108103353"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Avella","raw_affiliation_strings":["F\u00edsica de la Materia Condensada, ETSII, 47011, Valladolid, Spain","ETSII"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"F\u00edsica de la Materia Condensada, ETSII, 47011, Valladolid, Spain","institution_ids":["https://openalex.org/I108103353"]},{"raw_affiliation_string":"ETSII","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069988968","display_name":"Matthieu Pommi\u00e8s","orcid":"https://orcid.org/0000-0001-5953-7169","observed_orcids":["https://orcid.org/0000-0001-5953-7169"]},"institutions":[{"id":"https://openalex.org/I108103353","display_name":"Universidad de Valladolid","ror":"https://ror.org/01fvbaw18","country_code":"ES","type":"education","lineage":["https://openalex.org/I108103353"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Pommi\u00e8s","raw_affiliation_strings":["F\u00edsica de la Materia Condensada, ETSII, 47011, Valladolid, Spain","ETSII"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"F\u00edsica de la Materia Condensada, ETSII, 47011, Valladolid, Spain","institution_ids":["https://openalex.org/I108103353"]},{"raw_affiliation_string":"ETSII","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010169168","display_name":"J. Jim\u00e9nez","orcid":"https://orcid.org/0000-0001-6079-332X","observed_orcids":["https://orcid.org/0000-0001-6079-332X","https://orcid.org/0000-0003-2141-2699"]},"institutions":[{"id":"https://openalex.org/I108103353","display_name":"Universidad de Valladolid","ror":"https://ror.org/01fvbaw18","country_code":"ES","type":"education","lineage":["https://openalex.org/I108103353"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Jim\u00e9nez","raw_affiliation_strings":["F\u00edsica de la Materia Condensada, ETSII, 47011, Valladolid, Spain","ETSII"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"F\u00edsica de la Materia Condensada, ETSII, 47011, Valladolid, Spain","institution_ids":["https://openalex.org/I108103353"]},{"raw_affiliation_string":"ETSII","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113558245","display_name":"M. P. I\u00f1iguez","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I108103353","display_name":"Universidad de Valladolid","ror":"https://ror.org/01fvbaw18","country_code":"ES","type":"education","lineage":["https://openalex.org/I108103353"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"M. P. I\u00f1iguez","raw_affiliation_strings":["F\u00edsica Te\u00f3rica, At\u00f3mica y Optica, Facultad de Ciencias, 47011, Valladolid, Spain","Facultad de Ciencias"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"F\u00edsica Te\u00f3rica, At\u00f3mica y Optica, Facultad de Ciencias, 47011, Valladolid, Spain","institution_ids":["https://openalex.org/I108103353"]},{"raw_affiliation_string":"Facultad de Ciencias","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073483380","display_name":"Myriam Oudart","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Oudart","raw_affiliation_strings":["Alcatel-Thales 3-5lab, RD 128, 91767, Palaiseau, France","Alcatel-Thales 3-5lab"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Alcatel-Thales 3-5lab, RD 128, 91767, Palaiseau, France","institution_ids":[]},{"raw_affiliation_string":"Alcatel-Thales 3-5lab","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090070147","display_name":"Julien Nagle","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Nagle","raw_affiliation_strings":["Thales Research and Technology, RD 128, 91767, Palaiseau, France","Thales Research and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Research and Technology, RD 128, 91767, Palaiseau, France","institution_ids":[]},{"raw_affiliation_string":"Thales Research and Technology","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5113558245"],"corresponding_institution_ids":["https://openalex.org/I108103353"],"apc_list":{"value":3990,"currency":"USD","value_usd":3990},"apc_paid":null,"fwci":0.6107,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.70595929,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":95},"biblio":{"volume":"19","issue":"S1","first_page":"140","last_page":"144"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","score":0.0010000000474974513,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/high-power-semiconductor-lasers","display_name":"high-power semiconductor lasers","score":0.8690000176429749},{"id":"https://openalex.org/keywords/laser-induced-degradation","display_name":"laser degradation","score":0.6729999780654907},{"id":"https://openalex.org/keywords/v-defects","display_name":"V-defects","score":0.5849999785423279},{"id":"https://openalex.org/keywords/aging-test","display_name":"aging test","score":0.6499999761581421},{"id":"https://openalex.org/keywords/thermal-stress","display_name":"thermal stress","score":0.6990000009536743},{"id":"https://openalex.org/keywords/thermomechanical-properties","display_name":"thermomechanical properties","score":0.8109999895095825},{"id":"https://openalex.org/keywords/finite-element-analysis","display_name":"finite element analysis","score":0.7950000166893005},{"id":"https://openalex.org/keywords/cathodoluminescence","display_name":"cathodoluminescence","score":0.7960000038146973}],"concepts":[{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.7897472381591797},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7671974301338196},{"id":"https://openalex.org/C139861200","wikidata":"https://www.wikidata.org/wiki/Q369794","display_name":"Cathodoluminescence","level":3,"score":0.70423424243927},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6344524025917053},{"id":"https://openalex.org/C43122875","wikidata":"https://www.wikidata.org/wiki/Q5428522","display_name":"Facet (psychology)","level":4,"score":0.6329606175422668},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.6272997260093689},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5520336627960205},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5100610852241516},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.448616623878479},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.4431784152984619},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4287717342376709},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.4169953465461731},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.35788261890411377},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.22797569632530212},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12265604734420776},{"id":"https://openalex.org/C148869448","wikidata":"https://www.wikidata.org/wiki/Q184240","display_name":"Luminescence","level":2,"score":0.07289248704910278},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C77805123","wikidata":"https://www.wikidata.org/wiki/Q161272","display_name":"Social psychology","level":1,"score":0.0},{"id":"https://openalex.org/C187288502","wikidata":"https://www.wikidata.org/wiki/Q641118","display_name":"Personality","level":2,"score":0.0},{"id":"https://openalex.org/C2865642","wikidata":"https://www.wikidata.org/wiki/Q378132","display_name":"Big Five personality traits","level":3,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10854-007-9512-1","doi":"https://doi.org/10.1007/s10854-007-9512-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10854-007-9512-1","pdf_url":null,"source":{"id":"https://openalex.org/S189509794","display_name":"Journal of Materials Science Materials in Electronics","issn_l":"0957-4522","issn":["0957-4522","1573-482X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Materials Science: Materials in Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1974993480","https://openalex.org/W2005963437","https://openalex.org/W2024423338","https://openalex.org/W2024749963","https://openalex.org/W2037253892","https://openalex.org/W2055561746","https://openalex.org/W2055641349","https://openalex.org/W2068189734","https://openalex.org/W2073865070","https://openalex.org/W2114633326"],"related_works":["https://openalex.org/W1976223968","https://openalex.org/W2122132277","https://openalex.org/W2069814018","https://openalex.org/W2068189734","https://openalex.org/W2099306630","https://openalex.org/W2005963437","https://openalex.org/W2051820351","https://openalex.org/W2029611624","https://openalex.org/W2154058954","https://openalex.org/W2093341603"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-10-13T10:08:12.033832","created_date":"2016-06-24T00:00:00"}