{"id":"https://openalex.org/W2017246168","doi":"https://doi.org/10.1016/j.jcrysgro.2014.08.021","title":"Minority-carrier lifetime and defect content of n-type silicon grown by the noncontact crucible method","display_name":"Minority-carrier lifetime and defect content of n-type silicon grown by the noncontact crucible method","publication_year":2014,"publication_date":"2014-08-29","ids":{"openalex":"https://openalex.org/W2017246168","doi":"https://doi.org/10.1016/j.jcrysgro.2014.08.021","mag":"2017246168"},"language":"en","primary_location":{"id":"doi:10.1016/j.jcrysgro.2014.08.021","doi":"https://doi.org/10.1016/j.jcrysgro.2014.08.021","is_oa":true,"landing_page_url":"https://doi.org/10.1016/j.jcrysgro.2014.08.021","pdf_url":"https://www.sciencedirect.com/science/article/am/pii/S0022024814005971","source":{"id":"https://openalex.org/S10719676","display_name":"Journal of Crystal Growth","issn_l":"0022-0248","issn":["0022-0248","1873-5002"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Journal of Crystal Growth","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://www.sciencedirect.com/science/article/am/pii/S0022024814005971","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040236350","display_name":"Maulid Mohamed Kivambe","orcid":"https://orcid.org/0000-0002-7460-8305","observed_orcids":["https://orcid.org/0000-0002-7460-8305"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Maulid Kivambe","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA 02139, USA","Massachusetts Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA 02139, USA","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Massachusetts Institute of Technology","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110019756","display_name":"Douglas Michael Powell","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Douglas M. Powell","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA 02139, USA","Massachusetts Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA 02139, USA","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Massachusetts Institute of Technology","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033136241","display_name":"Sergio Castellanos","orcid":"https://orcid.org/0000-0003-3935-6701","observed_orcids":["https://orcid.org/0000-0003-3935-6701"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sergio Castellanos","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA 02139, USA","Massachusetts Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA 02139, USA","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Massachusetts Institute of Technology","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102800391","display_name":"Mallory Ann Jensen","orcid":"https://orcid.org/0000-0002-5353-0780","observed_orcids":["https://orcid.org/0000-0002-5353-0780"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mallory Ann Jensen","raw_affiliation_strings":["Massachusetts Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064015921","display_name":"Ashley E. Morishige","orcid":"https://orcid.org/0000-0001-9352-8741","observed_orcids":["https://orcid.org/0000-0001-9352-8741"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ashley E. Morishige","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA 02139, USA","Massachusetts Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA 02139, USA","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Massachusetts Institute of Technology","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102116980","display_name":"Kazuo Nakajima","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kazuo Nakajima","raw_affiliation_strings":["FUTURE-PV Innovation, Machiike-dai 2-2-9, Koriyama, Fukushima 963-0215, Japan","FUTURE-PV Innovation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FUTURE-PV Innovation, Machiike-dai 2-2-9, Koriyama, Fukushima 963-0215, Japan","institution_ids":[]},{"raw_affiliation_string":"FUTURE-PV Innovation","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048639723","display_name":"Kohei Morishita","orcid":"https://orcid.org/0000-0003-3242-4230","observed_orcids":["https://orcid.org/0000-0003-3242-4230"]},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kohei Morishita","raw_affiliation_strings":["Graduate School of Engineering, Kyoto University, Yoshida, Sakyo-ku, Kyoto 606-8501, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Kyoto University, Yoshida, Sakyo-ku, Kyoto 606-8501, Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108480312","display_name":"Ryota Murai","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ryota Murai","raw_affiliation_strings":["FUTURE-PV Innovation, Machiike-dai 2-2-9, Koriyama, Fukushima 963-0215, Japan","FUTURE-PV Innovation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FUTURE-PV Innovation, Machiike-dai 2-2-9, Koriyama, Fukushima 963-0215, Japan","institution_ids":[]},{"raw_affiliation_string":"FUTURE-PV Innovation","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085344547","display_name":"Tonio Buonassisi","orcid":"https://orcid.org/0000-0001-8345-4937","observed_orcids":["https://orcid.org/0000-0001-8345-4937"]},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Tonio Buonassisi","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA 02139, USA","Massachusetts Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA 02139, USA","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Massachusetts Institute of Technology","institution_ids":["https://openalex.org/I63966007"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5040236350","https://openalex.org/A5085344547"],"corresponding_institution_ids":["https://openalex.org/I63966007"],"apc_list":{"value":3110,"currency":"USD","value_usd":3110},"apc_paid":null,"fwci":4.3131,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.94626132,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":100},"biblio":{"volume":"407","issue":null,"first_page":"31","last_page":"36"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11087","display_name":"Solidification and crystal growth phenomena","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/minority-carrier-lifetime","display_name":"minority carrier lifetime","score":0.8870000243186951},{"id":"https://openalex.org/keywords/point-defects","display_name":"point defects","score":0.6840000152587891},{"id":"https://openalex.org/keywords/n-type-silicon","display_name":"n-type silicon","score":0.8270000219345093},{"id":"https://openalex.org/keywords/gettering","display_name":"gettering","score":0.7609999775886536},{"id":"https://openalex.org/keywords/chromium-extraction","display_name":"chromium extraction","score":0.8149999976158142},{"id":"https://openalex.org/keywords/dislocation-density","display_name":"dislocation density","score":0.9729999899864197},{"id":"https://openalex.org/keywords/recombination-centers","display_name":"recombination centers","score":0.5230000019073486},{"id":"https://openalex.org/keywords/photovoltaic-silicon","display_name":"photovoltaic silicon","score":0.7519999742507935},{"id":"https://openalex.org/keywords/solar-cell-efficiency","display_name":"solar cell efficiency","score":0.5550000071525574}],"concepts":[{"id":"https://openalex.org/C125099081","wikidata":"https://www.wikidata.org/wiki/Q935396","display_name":"Getter","level":2,"score":0.9464991092681885},{"id":"https://openalex.org/C2778547858","wikidata":"https://www.wikidata.org/wiki/Q83893","display_name":"Ingot","level":3,"score":0.9036114811897278},{"id":"https://openalex.org/C71987851","wikidata":"https://www.wikidata.org/wiki/Q7216430","display_name":"Impurity","level":2,"score":0.7829849720001221},{"id":"https://openalex.org/C120500152","wikidata":"https://www.wikidata.org/wiki/Q5189793","display_name":"Crucible (geodemography)","level":2,"score":0.7625643014907837},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.7488234043121338},{"id":"https://openalex.org/C198865614","wikidata":"https://www.wikidata.org/wiki/Q5046374","display_name":"Carrier lifetime","level":3,"score":0.6739827990531921},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.6568771004676819},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6347166895866394},{"id":"https://openalex.org/C2780080961","wikidata":"https://www.wikidata.org/wiki/Q176282","display_name":"Deep-level transient spectroscopy","level":3,"score":0.588961124420166},{"id":"https://openalex.org/C159122135","wikidata":"https://www.wikidata.org/wiki/Q737571","display_name":"Dislocation","level":2,"score":0.5435876250267029},{"id":"https://openalex.org/C164675345","wikidata":"https://www.wikidata.org/wiki/Q898226","display_name":"Crystallographic defect","level":2,"score":0.49782371520996094},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.47846031188964844},{"id":"https://openalex.org/C2779667780","wikidata":"https://www.wikidata.org/wiki/Q18206302","display_name":"Crystalline silicon","level":3,"score":0.44885560870170593},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3181855082511902},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.2601919174194336},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2554713487625122},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.24904662370681763},{"id":"https://openalex.org/C2780026712","wikidata":"https://www.wikidata.org/wiki/Q37756","display_name":"Alloy","level":2,"score":0.11886090040206909},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.08874750137329102},{"id":"https://openalex.org/C147597530","wikidata":"https://www.wikidata.org/wiki/Q369472","display_name":"Computational chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.jcrysgro.2014.08.021","doi":"https://doi.org/10.1016/j.jcrysgro.2014.08.021","is_oa":true,"landing_page_url":"https://doi.org/10.1016/j.jcrysgro.2014.08.021","pdf_url":"https://www.sciencedirect.com/science/article/am/pii/S0022024814005971","source":{"id":"https://openalex.org/S10719676","display_name":"Journal of Crystal Growth","issn_l":"0022-0248","issn":["0022-0248","1873-5002"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Journal of Crystal Growth","raw_type":"journal-article"},{"id":"pmh:oai:osti.gov:1367763","doi":null,"is_oa":false,"landing_page_url":"https://www.osti.gov/biblio/1367763","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"doi:10.1016/j.jcrysgro.2014.08.021","doi":"https://doi.org/10.1016/j.jcrysgro.2014.08.021","is_oa":true,"landing_page_url":"https://doi.org/10.1016/j.jcrysgro.2014.08.021","pdf_url":"https://www.sciencedirect.com/science/article/am/pii/S0022024814005971","source":{"id":"https://openalex.org/S10719676","display_name":"Journal of Crystal Growth","issn_l":"0022-0248","issn":["0022-0248","1873-5002"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Journal of Crystal Growth","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G426311843","display_name":null,"funder_award_id":"DE-AC- 02-06CH11357","funder_id":"https://openalex.org/F4320337480","funder_display_name":"Basic Energy Sciences"},{"id":"https://openalex.org/G78394265","display_name":null,"funder_award_id":"EEC\u20101041895","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"},{"id":"https://openalex.org/G825080086","display_name":null,"funder_award_id":"ECS- 0335765","funder_id":"https://openalex.org/F4320333566","funder_display_name":"National Defense Science and Engineering Graduate"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320306078","display_name":"U.S. Department of Defense","ror":"https://ror.org/0447fe631"},{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320320912","display_name":"Ministry of Education, Culture, Sports, Science and Technology","ror":"https://ror.org/048rj2z13"},{"id":"https://openalex.org/F4320332359","display_name":"Office of Science","ror":"https://ror.org/00mmn6b08"},{"id":"https://openalex.org/F4320333566","display_name":"National Defense Science and Engineering Graduate","ror":null},{"id":"https://openalex.org/F4320334789","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19"},{"id":"https://openalex.org/F4320337480","display_name":"Basic Energy Sciences","ror":"https://ror.org/05mg91w61"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":47,"referenced_works":["https://openalex.org/W631847441","https://openalex.org/W1488560980","https://openalex.org/W1927715230","https://openalex.org/W1927916085","https://openalex.org/W1963849736","https://openalex.org/W1966512396","https://openalex.org/W1970315719","https://openalex.org/W1973528911","https://openalex.org/W1981381517","https://openalex.org/W1987472044","https://openalex.org/W1996921162","https://openalex.org/W1997270643","https://openalex.org/W2000251836","https://openalex.org/W2003478585","https://openalex.org/W2007962692","https://openalex.org/W2013180643","https://openalex.org/W2013716885","https://openalex.org/W2016254522","https://openalex.org/W2020106264","https://openalex.org/W2028850795","https://openalex.org/W2030741020","https://openalex.org/W2031540899","https://openalex.org/W2037228604","https://openalex.org/W2037252281","https://openalex.org/W2037461305","https://openalex.org/W2038464570","https://openalex.org/W2047642949","https://openalex.org/W2051485386","https://openalex.org/W2051757654","https://openalex.org/W2053439557","https://openalex.org/W2053872893","https://openalex.org/W2062046372","https://openalex.org/W2067372090","https://openalex.org/W2070687134","https://openalex.org/W2076666366","https://openalex.org/W2078140681","https://openalex.org/W2080157262","https://openalex.org/W2081731179","https://openalex.org/W2087555866","https://openalex.org/W2088564420","https://openalex.org/W2093832247","https://openalex.org/W2099084623","https://openalex.org/W2109166097","https://openalex.org/W2121598961","https://openalex.org/W2124841936","https://openalex.org/W2129275977","https://openalex.org/W2161907742"],"related_works":["https://openalex.org/W2032748473","https://openalex.org/W2900279438","https://openalex.org/W7062107168","https://openalex.org/W2093832247","https://openalex.org/W4249356163","https://openalex.org/W2254360867","https://openalex.org/W1481584772","https://openalex.org/W2301022791","https://openalex.org/W4389522649","https://openalex.org/W1965248888"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":4},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":14},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2}],"updated_date":"2026-11-11T12:16:26.678958","created_date":"2016-06-24T00:00:00"}