{"id":"https://openalex.org/W2016958650","doi":"https://doi.org/10.1109/isscc.2010.5433994","title":"A precise-tracking NBTI-degradation monitor independent of NBTI recovery effect","display_name":"A precise-tracking NBTI-degradation monitor independent of NBTI recovery effect","publication_year":2010,"publication_date":"2010-02-01","ids":{"openalex":"https://openalex.org/W2016958650","doi":"https://doi.org/10.1109/isscc.2010.5433994","mag":"2016958650"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2010.5433994","doi":"https://doi.org/10.1109/isscc.2010.5433994","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2010.5433994","pdf_url":null,"source":{"id":"https://openalex.org/S4210210374","display_name":"Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference","issn_l":"0193-6530","issn":["0193-6530","2376-8606"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075908171","display_name":"Eisuke Saneyoshi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Eisuke Saneyoshi","raw_affiliation_strings":["NEC, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111751660","display_name":"Koichi Nose","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koichi Nose","raw_affiliation_strings":["NEC, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045168120","display_name":"Masayuki Mizuno","orcid":"https://orcid.org/0000-0002-1924-9856","observed_orcids":["https://orcid.org/0000-0002-1924-9856"]},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masayuki Mizuno","raw_affiliation_strings":["NEC, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I118347220"],"apc_list":null,"apc_paid":null,"fwci":4.7057,"has_fulltext":false,"cited_by_count":37,"citation_normalized_percentile":{"value":0.95896948,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"192","last_page":"193"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.5160999894142151,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.5160999894142151,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.10239999741315842,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.10000000149011612,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nbti-degradation","display_name":"NBTI degradation","score":0.7720000147819519},{"id":"https://openalex.org/keywords/nbti-recovery","display_name":"NBTI recovery","score":0.7480000257492065},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"ring oscillator","score":0.7210000157356262},{"id":"https://openalex.org/keywords/measurement-time","display_name":"measurement time","score":0.6069999933242798}],"concepts":[{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.8054159879684448},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7362453937530518},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.5993108749389648},{"id":"https://openalex.org/C2988494973","wikidata":"https://www.wikidata.org/wiki/Q179448","display_name":"Noise immunity","level":3,"score":0.5635093450546265},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4869495630264282},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.47027307748794556},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45020925998687744},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43767303228378296},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.42519518733024597},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.35392218828201294},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3365379869937897},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2664458155632019},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24988725781440735},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2469702959060669},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.2324516773223877},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09456950426101685},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08882945775985718},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C19417346","wikidata":"https://www.wikidata.org/wiki/Q7922","display_name":"Pedagogy","level":1,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2010.5433994","doi":"https://doi.org/10.1109/isscc.2010.5433994","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2010.5433994","pdf_url":null,"source":{"id":"https://openalex.org/S4210210374","display_name":"Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference","issn_l":"0193-6530","issn":["0193-6530","2376-8606"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2083270183","https://openalex.org/W2112414127","https://openalex.org/W2124222584","https://openalex.org/W2131095522","https://openalex.org/W2159931326","https://openalex.org/W6679644487"],"related_works":["https://openalex.org/W2147862927","https://openalex.org/W1968179933","https://openalex.org/W3199581337","https://openalex.org/W2154112205","https://openalex.org/W1977755957","https://openalex.org/W2544576822","https://openalex.org/W2295369751","https://openalex.org/W4239499928","https://openalex.org/W2007579459","https://openalex.org/W2118284823"],"abstract_inverted_index":{"We":[0],"design":[1],"an":[2],"on-chip":[3],"aging":[4,40],"monitor":[5,17],"that":[6],"combines":[7],"the":[8,11,19,46],"advantages":[9],"of":[10,14,23,48],"small":[12,43],"area":[13],"a":[15,24,49],"ring-oscillator-type":[16],"and":[18,52],"short":[20,31],"measurement":[21,32],"time":[22,33],"delay-line":[25,50],"type":[26],"monitor.":[27],"It":[28],"offers":[29],"1)":[30],"(more":[34],"than":[35,38],"10x":[36],"faster":[37],"conventional":[39],"monitors,":[41],"2)":[42],"size":[44,47],"(1/6":[45],"monitor),":[51],"3)":[53],"strong":[54],"VDD":[55],"noise":[56],"immunity.":[57]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":3}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}