{"id":"https://openalex.org/W2016708276","doi":"https://doi.org/10.1007/s10765-008-0385-1","title":"Uncertainty Budgets for Calibration of Radiation Thermometers below the Silver Point","display_name":"Uncertainty Budgets for Calibration of Radiation Thermometers below the Silver Point","publication_year":2008,"publication_date":"2008-02-29","ids":{"openalex":"https://openalex.org/W2016708276","doi":"https://doi.org/10.1007/s10765-008-0385-1","mag":"2016708276"},"language":"en","primary_location":{"id":"doi:10.1007/s10765-008-0385-1","doi":"https://doi.org/10.1007/s10765-008-0385-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10765-008-0385-1","pdf_url":null,"source":{"id":"https://openalex.org/S101466443","display_name":"International Journal of Thermophysics","issn_l":"0195-928X","issn":["0195-928X","1572-9567"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Thermophysics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"P. Saunders","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4387153315","display_name":"Measurement Standards Laboratory of New Zealand","ror":"https://ror.org/04022gq47","country_code":"NZ","type":"government","lineage":["https://openalex.org/I4387153315"]},{"id":"https://openalex.org/I4387155704","display_name":"Industrial Research Limited","ror":"https://ror.org/011bwkg92","country_code":null,"type":"government","lineage":["https://openalex.org/I150510651","https://openalex.org/I4210126329","https://openalex.org/I4387155704"]}],"countries":["NZ"],"is_corresponding":true,"raw_author_name":"P. Saunders","raw_affiliation_strings":["Measurement Standards Laboratory of New Zealand (MSL), Industrial Research Ltd, P.O. Box 31-310, Lower Hutt, New Zealand","Industrial Research Ltd"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Measurement Standards Laboratory of New Zealand (MSL), Industrial Research Ltd, P.O. Box 31-310, Lower Hutt, New Zealand","institution_ids":["https://openalex.org/I4387153315","https://openalex.org/I4387155704"]},{"raw_affiliation_string":"Industrial Research Ltd","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108086092","display_name":"Joachim Fischer","orcid":"https://orcid.org/0009-0008-0796-0828","observed_orcids":["https://orcid.org/0009-0008-0796-0828"]},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J. Fischer","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany","Physikalisch Technische Bundesanstalt (PTB)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]},{"raw_affiliation_string":"Physikalisch Technische Bundesanstalt (PTB)","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040050988","display_name":"M. Sadli","orcid":"https://orcid.org/0000-0001-8792-4115","observed_orcids":["https://orcid.org/0000-0001-8792-4115"]},"institutions":[{"id":"https://openalex.org/I124158823","display_name":"Conservatoire National des Arts et M\u00e9tiers","ror":"https://ror.org/0175hh227","country_code":"FR","type":"education","lineage":["https://openalex.org/I124158823","https://openalex.org/I4210134562"]},{"id":"https://openalex.org/I4405258865","display_name":"Laboratoire commun de m\u00e9trologie","ror":"https://ror.org/01atqpz53","country_code":"FR","type":"facility","lineage":["https://openalex.org/I124158823","https://openalex.org/I4210107682","https://openalex.org/I4210134562","https://openalex.org/I4405258865"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Sadli","raw_affiliation_strings":["Conservatoire national des arts et m\u00e9tiers/Institut National de M\u00e9trologie (LNE-INM/CNAM), La Plaine-Saint-Denis, France","Conservatoire national des arts et m\u00e9tiers/Institut National de M\u00e9trologie (LNE-INM/CNAM)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Conservatoire national des arts et m\u00e9tiers/Institut National de M\u00e9trologie (LNE-INM/CNAM), La Plaine-Saint-Denis, France","institution_ids":["https://openalex.org/I124158823","https://openalex.org/I4405258865"]},{"raw_affiliation_string":"Conservatoire national des arts et m\u00e9tiers/Institut National de M\u00e9trologie (LNE-INM/CNAM)","institution_ids":["https://openalex.org/I124158823","https://openalex.org/I4405258865"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028437279","display_name":"M. Battuello","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Battuello","raw_affiliation_strings":["Istituto Nazionale di Ricerca Metrologica (INRiM), Turin, Italy","Istituto Nazionale di Ricerca Metrologica (INRiM)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Istituto Nazionale di Ricerca Metrologica (INRiM), Turin, Italy","institution_ids":["https://openalex.org/I4210136559"]},{"raw_affiliation_string":"Istituto Nazionale di Ricerca Metrologica (INRiM)","institution_ids":["https://openalex.org/I4210136559"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048150850","display_name":"C. W. Park","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"C. W. Park","raw_affiliation_strings":["Korea Research Institute of Standards and Science (KRISS), Daejeon, South Korea","Korea Research Institute of Standards and Science (KRISS)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Research Institute of Standards and Science (KRISS), Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]},{"raw_affiliation_string":"Korea Research Institute of Standards and Science (KRISS)","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018466471","display_name":"Z. Yuan","orcid":"https://orcid.org/0009-0006-0967-3983","observed_orcids":["https://orcid.org/0009-0006-0967-3983"]},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Z. Yuan","raw_affiliation_strings":["National Institute of Metrology (NIM), Beijing, China","National Institute of Metrology (NIM)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology (NIM), Beijing, China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":"National Institute of Metrology (NIM)","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073904978","display_name":"Howard W. Yoon","orcid":"https://orcid.org/0000-0002-8999-9441","observed_orcids":["https://orcid.org/0000-0002-8999-9441"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Yoon","raw_affiliation_strings":["National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA","NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (NIST)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (NIST)","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":null,"display_name":"W. Li","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2801096481","display_name":"Standards, Productivity and Innovation Board","ror":"https://ror.org/02capbb49","country_code":"SG","type":"government","lineage":["https://openalex.org/I2801096481"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"W. Li","raw_affiliation_strings":["Standards, Productivity and Innovation Board (NMC/SPRING), Singapore, Singapore","Standards, Productivity and Innovation Board (NMC/SPRING)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Standards, Productivity and Innovation Board (NMC/SPRING), Singapore, Singapore","institution_ids":["https://openalex.org/I2801096481"]},{"raw_affiliation_string":"Standards, Productivity and Innovation Board (NMC/SPRING)","institution_ids":["https://openalex.org/I2801096481"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009432644","display_name":"Eric Ham","orcid":"https://orcid.org/0000-0002-5857-1936","observed_orcids":["https://orcid.org/0000-0002-5857-1936"]},"institutions":[{"id":"https://openalex.org/I4210143670","display_name":"NMi Certin B.V.","ror":"https://ror.org/053xpwt63","country_code":"NL","type":"other","lineage":["https://openalex.org/I4210143670"]},{"id":"https://openalex.org/I4210164637","display_name":"VSL National Metrology Institute","ror":"https://ror.org/05ap1vt50","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210164637"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"E. van der Ham","raw_affiliation_strings":["Nederlands Meetinstituut/Van Swinden Laboratorium B.V. (NMi/VSL), Delft, The Netherlands","Nederlands Meetinstituut/Van Swinden Laboratorium B.V. (NMi/VSL)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nederlands Meetinstituut/Van Swinden Laboratorium B.V. (NMi/VSL), Delft, The Netherlands","institution_ids":["https://openalex.org/I4210143670","https://openalex.org/I4210164637"]},{"raw_affiliation_string":"Nederlands Meetinstituut/Van Swinden Laboratorium B.V. (NMi/VSL)","institution_ids":["https://openalex.org/I4210143670","https://openalex.org/I4210164637"]}]},{"author_position":"middle","author":{"id":null,"display_name":"F. Sakuma","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"F. Sakuma","raw_affiliation_strings":["National Metrology Institute of Japan, AIST (NMIJ/AIST), Tsukuba, Japan","National Metrology Institute of Japan, AIST (NMIJ/AIST)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, AIST (NMIJ/AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, AIST (NMIJ/AIST)","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085142595","display_name":"Juntaro Ishii","orcid":"https://orcid.org/0000-0002-4650-7216","observed_orcids":["https://orcid.org/0000-0002-4650-7216"]},"institutions":[{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"J. Ishii","raw_affiliation_strings":["National Metrology Institute of Japan, AIST (NMIJ/AIST), Tsukuba, Japan","National Metrology Institute of Japan, AIST (NMIJ/AIST)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, AIST (NMIJ/AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, AIST (NMIJ/AIST)","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005584328","display_name":"M. J. Ballico","orcid":"https://orcid.org/0000-0001-7165-8916","observed_orcids":["https://orcid.org/0000-0001-7165-8916"]},"institutions":[{"id":"https://openalex.org/I1319171921","display_name":"National Measurement Institute","ror":"https://ror.org/03be3fb73","country_code":"AU","type":"government","lineage":["https://openalex.org/I1319171921","https://openalex.org/I2801453606","https://openalex.org/I4387156119"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"M. Ballico","raw_affiliation_strings":["National Measurement Institute of Australia (NMIA), Lindfield, Australia","National Measurement Institute of Australia (NMIA)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Measurement Institute of Australia (NMIA), Lindfield, Australia","institution_ids":["https://openalex.org/I1319171921"]},{"raw_affiliation_string":"National Measurement Institute of Australia (NMIA)","institution_ids":["https://openalex.org/I1319171921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019530092","display_name":"Graham Machin","orcid":"https://orcid.org/0000-0002-8864-6951","observed_orcids":["https://orcid.org/0000-0002-8864-6951"]},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"G. Machin","raw_affiliation_strings":["National Physical Laboratory (NPL), Teddington, UK","National Physical Laboratory, NPL"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Physical Laboratory (NPL), Teddington, UK","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"National Physical Laboratory, NPL","institution_ids":["https://openalex.org/I134421475"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009140765","display_name":"Nigel P. Fox","orcid":"https://orcid.org/0000-0001-9616-1359","observed_orcids":["https://orcid.org/0000-0001-9616-1359"]},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"N. Fox","raw_affiliation_strings":["National Physical Laboratory (NPL), Teddington, UK","National Physical Laboratory, NPL"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Physical Laboratory (NPL), Teddington, UK","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"National Physical Laboratory, NPL","institution_ids":["https://openalex.org/I134421475"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073733360","display_name":"J\u00f6rg Hollandt","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J. Hollandt","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany","Physikalisch Technische Bundesanstalt (PTB)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]},{"raw_affiliation_string":"Physikalisch Technische Bundesanstalt (PTB)","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007098908","display_name":"M. S. Matveyev","orcid":"https://orcid.org/0000-0002-4423-0161","observed_orcids":["https://orcid.org/0000-0002-4423-0161"]},"institutions":[{"id":"https://openalex.org/I4210102191","display_name":"D.I. Mendeleyev Institute for Metrology","ror":"https://ror.org/017c99632","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210102191"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"M. Matveyev","raw_affiliation_strings":["D.I. Mendeleyev Institute for Metrology, Rostekhregulirovaniye of Russia (VNIIM), St Petersburg, Russia","Rostekhregulirovaniye of Russia (VNIIM)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"D.I. Mendeleyev Institute for Metrology, Rostekhregulirovaniye of Russia (VNIIM), St Petersburg, Russia","institution_ids":["https://openalex.org/I4210102191"]},{"raw_affiliation_string":"Rostekhregulirovaniye of Russia (VNIIM)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032634688","display_name":"Pieter Bloembergen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"P. Bloembergen","raw_affiliation_strings":["National Metrology Institute of Japan, AIST (NMIJ/AIST), Tsukuba, Japan","National Metrology Institute of Japan, AIST (NMIJ/AIST)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, AIST (NMIJ/AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, AIST (NMIJ/AIST)","institution_ids":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001921336","display_name":"Sevilay Ugur","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Ugur","raw_affiliation_strings":["TEKNOYAD, Kemal Nehrozoglu Cad. GOSB Technopark, Gebze, Kocaeli, Turkey","TEKNOYAD, Kemal Nehrozoglu Cad. GOSB Technopark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TEKNOYAD, Kemal Nehrozoglu Cad. GOSB Technopark, Gebze, Kocaeli, Turkey","institution_ids":[]},{"raw_affiliation_string":"TEKNOYAD, Kemal Nehrozoglu Cad. GOSB Technopark","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":13,"institutions_distinct_count":17,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4387153315","https://openalex.org/I4387155704"],"apc_list":{"value":3390,"currency":"USD","value_usd":3390},"apc_paid":null,"fwci":10.254,"has_fulltext":false,"cited_by_count":73,"citation_normalized_percentile":{"value":0.97994812,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"29","issue":"3","first_page":"1066","last_page":"1083"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.0012000000569969416,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/radiation-thermometers","display_name":"radiation thermometers","score":0.8209999799728394},{"id":"https://openalex.org/keywords/uncertainty-budget","display_name":"uncertainty budget","score":0.6790000200271606},{"id":"https://openalex.org/keywords/blackbody-calibration","display_name":"blackbody calibration","score":0.8349999785423279},{"id":"https://openalex.org/keywords/error-propagation","display_name":"error propagation","score":0.6700000166893005},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"temperature measurement","score":0.4399999976158142}],"concepts":[{"id":"https://openalex.org/C157909335","wikidata":"https://www.wikidata.org/wiki/Q900097","display_name":"Black-body radiation","level":3,"score":0.8084033131599426},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7697238922119141},{"id":"https://openalex.org/C132459708","wikidata":"https://www.wikidata.org/wiki/Q744069","display_name":"Extrapolation","level":2,"score":0.7662640810012817},{"id":"https://openalex.org/C137800194","wikidata":"https://www.wikidata.org/wiki/Q11713455","display_name":"Interpolation (computer graphics)","level":3,"score":0.685632586479187},{"id":"https://openalex.org/C2777155165","wikidata":"https://www.wikidata.org/wiki/Q646","display_name":"Thermometer","level":2,"score":0.6134948134422302},{"id":"https://openalex.org/C193451744","wikidata":"https://www.wikidata.org/wiki/Q264647","display_name":"Thermodynamic temperature","level":2,"score":0.5977963805198669},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.5270422101020813},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.48942509293556213},{"id":"https://openalex.org/C165063935","wikidata":"https://www.wikidata.org/wiki/Q907684","display_name":"International Temperature Scale of 1990","level":3,"score":0.47020986676216125},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4637162685394287},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4484541118144989},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.42307764291763306},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.42045435309410095},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4065094590187073},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3722832202911377},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.34134364128112793},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2585839033126831},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2398824691772461},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1857818067073822},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.10532602667808533},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08674561977386475},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C104114177","wikidata":"https://www.wikidata.org/wiki/Q79782","display_name":"Motion (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10765-008-0385-1","doi":"https://doi.org/10.1007/s10765-008-0385-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10765-008-0385-1","pdf_url":null,"source":{"id":"https://openalex.org/S101466443","display_name":"International Journal of Thermophysics","issn_l":"0195-928X","issn":["0195-928X","1572-9567"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Thermophysics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W580487502","https://openalex.org/W1486736496","https://openalex.org/W1557548823","https://openalex.org/W1970710559","https://openalex.org/W1974135118","https://openalex.org/W1977306633","https://openalex.org/W1989481996","https://openalex.org/W1993944992","https://openalex.org/W1997221099","https://openalex.org/W2022024913","https://openalex.org/W2026264823","https://openalex.org/W2027035387","https://openalex.org/W2036798780","https://openalex.org/W2047983306","https://openalex.org/W2049725230","https://openalex.org/W2050887295","https://openalex.org/W2053708330","https://openalex.org/W2054834516","https://openalex.org/W2062411017","https://openalex.org/W2066270569","https://openalex.org/W2075309119","https://openalex.org/W2083715077","https://openalex.org/W2091995556","https://openalex.org/W3127594710","https://openalex.org/W6600248585","https://openalex.org/W6605869293","https://openalex.org/W6610688178","https://openalex.org/W6613402858","https://openalex.org/W6614944343"],"related_works":["https://openalex.org/W2165159898","https://openalex.org/W2745992097","https://openalex.org/W2508762055","https://openalex.org/W2115686148","https://openalex.org/W2054372037","https://openalex.org/W1986340372","https://openalex.org/W1623046753","https://openalex.org/W2086496147","https://openalex.org/W1166259238","https://openalex.org/W2087946175"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":10},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":3}],"updated_date":"2026-10-14T16:39:01.820549","created_date":"2025-10-10T00:00:00"}