{"id":"https://openalex.org/W2016648221","doi":"https://doi.org/10.1063/1.1150115","title":"Direct scanning tunneling microscope detection of laser induced ultrasonic pulses with nanometer resolution","display_name":"Direct scanning tunneling microscope detection of laser induced ultrasonic pulses with nanometer resolution","publication_year":1999,"publication_date":"1999-12-01","ids":{"openalex":"https://openalex.org/W2016648221","doi":"https://doi.org/10.1063/1.1150115","mag":"2016648221"},"language":"en","primary_location":{"id":"doi:10.1063/1.1150115","doi":"https://doi.org/10.1063/1.1150115","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1150115","pdf_url":null,"source":{"id":"https://openalex.org/S31010182","display_name":"Review of Scientific Instruments","issn_l":"0034-6748","issn":["0034-6748","1089-7623","1527-2400"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","medline","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Review of Scientific Instruments","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091268668","display_name":"Johann Jersch","orcid":"https://orcid.org/0009-0002-8913-3311","observed_orcids":["https://orcid.org/0009-0002-8913-3311"]},"institutions":[{"id":"https://openalex.org/I63274643","display_name":"FH M\u00fcnster University of Applied Sciences","ror":"https://ror.org/00pv45a02","country_code":"DE","type":"education","lineage":["https://openalex.org/I63274643"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J. Jersch","raw_affiliation_strings":["Lasercenter FH Muenster (LFM), FB Physikalische Technik, D-48565\u2009Steinfurt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lasercenter FH Muenster (LFM), FB Physikalische Technik, D-48565\u2009Steinfurt, Germany","institution_ids":["https://openalex.org/I63274643"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060275495","display_name":"Frank Demming","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I63274643","display_name":"FH M\u00fcnster University of Applied Sciences","ror":"https://ror.org/00pv45a02","country_code":"DE","type":"education","lineage":["https://openalex.org/I63274643"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"F. Demming","raw_affiliation_strings":["Lasercenter FH Muenster (LFM), FB Physikalische Technik, D-48565\u2009Steinfurt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lasercenter FH Muenster (LFM), FB Physikalische Technik, D-48565\u2009Steinfurt, Germany","institution_ids":["https://openalex.org/I63274643"]}]},{"author_position":"middle","author":{"id":null,"display_name":"I. Fedotov","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I63274643","display_name":"FH M\u00fcnster University of Applied Sciences","ror":"https://ror.org/00pv45a02","country_code":"DE","type":"education","lineage":["https://openalex.org/I63274643"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"I. Fedotov","raw_affiliation_strings":["Lasercenter FH Muenster (LFM), FB Physikalische Technik, D-48565\u2009Steinfurt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lasercenter FH Muenster (LFM), FB Physikalische Technik, D-48565\u2009Steinfurt, Germany","institution_ids":["https://openalex.org/I63274643"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010418185","display_name":"Klaus Dickmann","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I63274643","display_name":"FH M\u00fcnster University of Applied Sciences","ror":"https://ror.org/00pv45a02","country_code":"DE","type":"education","lineage":["https://openalex.org/I63274643"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"K. Dickmann","raw_affiliation_strings":["Lasercenter FH Muenster (LFM), FB Physikalische Technik, D-48565\u2009Steinfurt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lasercenter FH Muenster (LFM), FB Physikalische Technik, D-48565\u2009Steinfurt, Germany","institution_ids":["https://openalex.org/I63274643"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I63274643"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.16278087,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"70","issue":"12","first_page":"4579","last_page":"4581"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.7724999785423279,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.7724999785423279,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.10769999772310257,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.036400001496076584,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/laser-ultrasonics","display_name":"laser ultrasonics","score":0.8379999995231628},{"id":"https://openalex.org/keywords/scanning-tunneling-microscopy","display_name":"scanning tunneling microscopy","score":0.7860000133514404},{"id":"https://openalex.org/keywords/nanosecond-laser-pulses","display_name":"nanosecond laser pulses","score":0.8500000238418579},{"id":"https://openalex.org/keywords/tip-sample-separation","display_name":"tip-sample separation","score":0.5770000219345093},{"id":"https://openalex.org/keywords/ultrasonic-velocity-measurement","display_name":"ultrasonic velocity measurement","score":0.8930000066757202},{"id":"https://openalex.org/keywords/glass-rods","display_name":"glass rods","score":0.6970000267028809}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7883632183074951},{"id":"https://openalex.org/C81288441","wikidata":"https://www.wikidata.org/wiki/Q20736125","display_name":"Ultrasonic sensor","level":2,"score":0.6830097436904907},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.6650843620300293},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6126419305801392},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.5825251340866089},{"id":"https://openalex.org/C51141536","wikidata":"https://www.wikidata.org/wiki/Q838801","display_name":"Nanosecond","level":3,"score":0.5782344341278076},{"id":"https://openalex.org/C6518042","wikidata":"https://www.wikidata.org/wiki/Q175646","display_name":"Scanning tunneling microscope","level":2,"score":0.5704787969589233},{"id":"https://openalex.org/C2781117724","wikidata":"https://www.wikidata.org/wiki/Q4674694","display_name":"Acoustic microscopy","level":3,"score":0.484004944562912},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.47741949558258057},{"id":"https://openalex.org/C55143465","wikidata":"https://www.wikidata.org/wiki/Q7577411","display_name":"Spin polarized scanning tunneling microscopy","level":4,"score":0.43378400802612305},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.3912826180458069},{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.30032700300216675},{"id":"https://openalex.org/C194577767","wikidata":"https://www.wikidata.org/wiki/Q1651687","display_name":"Scanning tunneling spectroscopy","level":3,"score":0.26446986198425293},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.14893168210983276},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11674574017524719},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.11122101545333862}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.1150115","doi":"https://doi.org/10.1063/1.1150115","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1150115","pdf_url":null,"source":{"id":"https://openalex.org/S31010182","display_name":"Review of Scientific Instruments","issn_l":"0034-6748","issn":["0034-6748","1089-7623","1527-2400"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","medline","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Review of Scientific Instruments","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1534355710","https://openalex.org/W1968164082","https://openalex.org/W1978252638","https://openalex.org/W1982213213","https://openalex.org/W2010823194","https://openalex.org/W2014256580","https://openalex.org/W2023337054","https://openalex.org/W2031384720","https://openalex.org/W2039316357","https://openalex.org/W2056896394","https://openalex.org/W2080854678","https://openalex.org/W2083052465"],"related_works":["https://openalex.org/W1975896435","https://openalex.org/W2164205581","https://openalex.org/W1964751187","https://openalex.org/W2054668054","https://openalex.org/W1982892217","https://openalex.org/W2010823194","https://openalex.org/W2035248460","https://openalex.org/W4415005067","https://openalex.org/W2034376579","https://openalex.org/W2010829117"],"abstract_inverted_index":{"We":[0],"show":[1],"the":[2,99],"use":[3],"of":[4,20,52,77,85,98],"scanning":[5],"tunneling":[6,44],"microscope":[7],"(STM)":[8],"with":[9,73],"a":[10,78,93],"self-designed":[11],"wide-bandwidth":[12],"current":[13],"preamplifier":[14],"(50":[15],"MHz)":[16],"for":[17],"direct":[18],"registration":[19,70],"ultrasonic":[21,37,55,86],"pulses":[22,27],"induced":[23],"by":[24,36],"nanosecond":[25],"laser":[26,49,103],"in":[28,32,43,57,71,83,102],"substrate.":[29],"The":[30],"changes":[31],"tip\u2013sample":[33],"separation":[34],"caused":[35],"vibrations":[38],"are":[39],"seen":[40],"as":[41],"perturbations":[42],"current.":[45],"At":[46],"moderate":[47],"incident":[48],"pulse":[50],"energy":[51],"1\u20132":[53],"mJ":[54],"waves":[56],"glass":[58],"rod":[59],"and":[60,96],"silica":[61],"wafer":[62],"were":[63],"observed.":[64],"This":[65],"wide-band":[66],"signal,":[67],"low":[68],"noise":[69],"addition":[72],"nanometer":[74,94],"spatial":[75],"resolution":[76],"STM":[79],"opens":[80],"new":[81],"possibilities":[82],"investigations":[84],"near-field":[87],"distribution,":[88],"elastic":[89],"material":[90],"properties":[91],"on":[92],"scale,":[95],"measurements":[97],"ultrasound":[100],"velocity":[101],"ultrasonics.":[104]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-14T16:39:01.820549","created_date":"2016-06-24T00:00:00"}