{"id":"https://openalex.org/W2016645271","doi":"https://doi.org/10.1109/pvsc.2013.6744411","title":"CdTe films by Elemental Vapor Transport","display_name":"CdTe films by Elemental Vapor Transport","publication_year":2013,"publication_date":"2013-06-01","ids":{"openalex":"https://openalex.org/W2016645271","doi":"https://doi.org/10.1109/pvsc.2013.6744411","mag":"2016645271"},"language":"en","primary_location":{"id":"doi:10.1109/pvsc.2013.6744411","doi":"https://doi.org/10.1109/pvsc.2013.6744411","is_oa":false,"landing_page_url":"https://doi.org/10.1109/pvsc.2013.6744411","pdf_url":null,"source":{"id":"https://openalex.org/S4210168774","display_name":"Conference record of the IEEE Photovoltaic Specialists Conference","issn_l":"0160-8371","issn":["0160-8371"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://ibn.idsi.md/vizualizare_articol/182773","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028464942","display_name":"Vaibhav G Kendre","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2613432","display_name":"University of South Florida","ror":"https://ror.org/032db5x82","country_code":"US","type":"education","lineage":["https://openalex.org/I2613432"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Kendre","raw_affiliation_strings":["Department of Electrical Engineering, University of South Florida, Tampa, FL","Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of South Florida, Tampa, FL","institution_ids":["https://openalex.org/I2613432"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#","institution_ids":["https://openalex.org/I2613432"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090637800","display_name":"V. Evani","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2613432","display_name":"University of South Florida","ror":"https://ror.org/032db5x82","country_code":"US","type":"education","lineage":["https://openalex.org/I2613432"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Evani","raw_affiliation_strings":["Department of Electrical Engineering, University of South Florida, Tampa, FL","Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of South Florida, Tampa, FL","institution_ids":["https://openalex.org/I2613432"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#","institution_ids":["https://openalex.org/I2613432"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083577016","display_name":"Mohammad Nasim Imtiaz Khan","orcid":"https://orcid.org/0000-0002-4531-5191","observed_orcids":["https://orcid.org/0000-0002-4531-5191"]},"institutions":[{"id":"https://openalex.org/I2613432","display_name":"University of South Florida","ror":"https://ror.org/032db5x82","country_code":"US","type":"education","lineage":["https://openalex.org/I2613432"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Khan","raw_affiliation_strings":["Department of Electrical Engineering, University of South Florida, Tampa, FL","Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of South Florida, Tampa, FL","institution_ids":["https://openalex.org/I2613432"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#","institution_ids":["https://openalex.org/I2613432"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108760695","display_name":"Vasilios Palekis","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2613432","display_name":"University of South Florida","ror":"https://ror.org/032db5x82","country_code":"US","type":"education","lineage":["https://openalex.org/I2613432"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Palekis","raw_affiliation_strings":["Department of Electrical Engineering, University of South Florida, Tampa, FL","Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of South Florida, Tampa, FL","institution_ids":["https://openalex.org/I2613432"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#","institution_ids":["https://openalex.org/I2613432"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071343717","display_name":"Sergiu A. Vatavu","orcid":"https://orcid.org/0000-0001-7328-126X","observed_orcids":["https://orcid.org/0000-0001-7328-126X"]},"institutions":[{"id":"https://openalex.org/I2613432","display_name":"University of South Florida","ror":"https://ror.org/032db5x82","country_code":"US","type":"education","lineage":["https://openalex.org/I2613432"]},{"id":"https://openalex.org/I29920723","display_name":"Moldova State University","ror":"https://ror.org/0475kvb92","country_code":"MD","type":"education","lineage":["https://openalex.org/I29920723"]}],"countries":["MD","US"],"is_corresponding":false,"raw_author_name":"S. Vatavu","raw_affiliation_strings":["Moldova State University, Chisinau, Republic of Moldova","Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Moldova State University, Chisinau, Republic of Moldova","institution_ids":["https://openalex.org/I29920723"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#","institution_ids":["https://openalex.org/I2613432"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006514983","display_name":"Don L. Morel","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2613432","display_name":"University of South Florida","ror":"https://ror.org/032db5x82","country_code":"US","type":"education","lineage":["https://openalex.org/I2613432"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Morel","raw_affiliation_strings":["Department of Electrical Engineering, University of South Florida, Tampa, FL","Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of South Florida, Tampa, FL","institution_ids":["https://openalex.org/I2613432"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#","institution_ids":["https://openalex.org/I2613432"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112400358","display_name":"Chris S. Ferekides","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2613432","display_name":"University of South Florida","ror":"https://ror.org/032db5x82","country_code":"US","type":"education","lineage":["https://openalex.org/I2613432"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Ferekides","raw_affiliation_strings":["University of South Florida, Tampa, FL, US","Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of South Florida, Tampa, FL, US","institution_ids":["https://openalex.org/I2613432"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA#TAB#","institution_ids":["https://openalex.org/I2613432"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8153,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.61074561,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.6894999742507935,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.6894999742507935,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.30809998512268066,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cdte-thin-films","display_name":"CdTe thin films","score":0.9810000061988831},{"id":"https://openalex.org/keywords/copper-incorporation","display_name":"copper incorporation","score":0.6209999918937683},{"id":"https://openalex.org/keywords/defect-complexes","display_name":"defect complexes","score":0.781000018119812},{"id":"https://openalex.org/keywords/n-type-and-p-type-doping","display_name":"n-type and p-type doping","score":0.8180000185966492},{"id":"https://openalex.org/keywords/electrical-conductivity","display_name":"electrical conductivity","score":0.7590000033378601},{"id":"https://openalex.org/keywords/photoluminescence","display_name":"photoluminescence","score":0.9300000071525574},{"id":"https://openalex.org/keywords/film-orientation","display_name":"film orientation","score":0.5329999923706055},{"id":"https://openalex.org/keywords/film-density","display_name":"film density","score":0.335999995470047}],"concepts":[{"id":"https://openalex.org/C6110044","wikidata":"https://www.wikidata.org/wiki/Q4118086","display_name":"Cadmium telluride photovoltaics","level":2,"score":0.9312967658042908},{"id":"https://openalex.org/C85080765","wikidata":"https://www.wikidata.org/wiki/Q614893","display_name":"Photoluminescence","level":2,"score":0.7387364506721497},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6949738264083862},{"id":"https://openalex.org/C57410435","wikidata":"https://www.wikidata.org/wiki/Q505668","display_name":"Chemical vapor deposition","level":2,"score":0.6027205586433411},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.582334041595459},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.5673575401306152},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.5534685254096985},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.5517475605010986},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.5163237452507019},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.42903757095336914},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.39393338561058044},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.26976990699768066},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.19473585486412048},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0840781033039093},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C2816523","wikidata":"https://www.wikidata.org/wiki/Q180184","display_name":"Sediment","level":2,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/pvsc.2013.6744411","doi":"https://doi.org/10.1109/pvsc.2013.6744411","is_oa":false,"landing_page_url":"https://doi.org/10.1109/pvsc.2013.6744411","pdf_url":null,"source":{"id":"https://openalex.org/S4210168774","display_name":"Conference record of the IEEE Photovoltaic Specialists Conference","issn_l":"0160-8371","issn":["0160-8371"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","raw_type":"proceedings-article"},{"id":"pmh:oai:ibn.idsi.md:182773","doi":null,"is_oa":true,"landing_page_url":"https://ibn.idsi.md/vizualizare_articol/182773","pdf_url":null,"source":null,"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Photovoltaic Specialists Conference (PVSC) (Edi\u021bia 39)","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:ibn.idsi.md:182773","doi":null,"is_oa":true,"landing_page_url":"https://ibn.idsi.md/vizualizare_articol/182773","pdf_url":null,"source":null,"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Photovoltaic Specialists Conference (PVSC) (Edi\u021bia 39)","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1918673032","https://openalex.org/W1970790477","https://openalex.org/W1996907220","https://openalex.org/W2020521333","https://openalex.org/W2075106702","https://openalex.org/W2098006793","https://openalex.org/W2139586606"],"related_works":["https://openalex.org/W2019271907","https://openalex.org/W4390189266","https://openalex.org/W2049081052","https://openalex.org/W2740480709","https://openalex.org/W2208019451","https://openalex.org/W2939035881","https://openalex.org/W2017786429","https://openalex.org/W4417473407","https://openalex.org/W7204901889","https://openalex.org/W2061041287"],"abstract_inverted_index":{"The":[0,15],"electro-optical":[1],"properties":[2],"of":[3,26,34,52,78,94,107],"CdTe":[4,27,108],"films":[5,125],"deposited":[6],"by":[7,115],"Elemental":[8],"Vapor":[9],"Transport":[10],"(EVT)":[11],"are":[12],"being":[13],"investigated.":[14],"EVT":[16],"process,":[17],"unlike":[18],"most":[19],"processes":[20],"currently":[21],"used":[22,47,70],"for":[23,31],"the":[24,32,42,50,67,72,76,87,92,105,123],"deposition":[25,73],"thin":[28],"films,":[29],"allows":[30],"creation":[33],"excess":[35,38],"Cd":[36],"or":[37,113,118],"Te":[39,117],"conditions":[40,120],"during":[41,71],"deposition,":[43],"which":[44],"can":[45,109],"be":[46,110,130],"to":[48,129],"influence":[49],"formation":[51,93],"defects":[53],"and":[54,133],"improve":[55],"doping":[56],"in":[57,80,97],"CdTe.":[58,81,98],"Using":[59],"resistivity":[60],"measurements,":[61],"it":[62],"has":[63],"been":[64,127],"demonstrated":[65],"that":[66,86,104],"Cd/Te":[68,88],"ratio":[69,89],"process":[74],"influences":[75,91],"incorporation":[77],"Cu":[79],"Photoluminescence":[82],"measurements":[83],"have":[84,126],"shown":[85],"also":[90],"defect":[95],"complexes":[96],"Junctions":[99],"formed":[100],"with":[101],"CdS":[102],"suggest":[103],"conductivity":[106],"adjusted":[111],"p-":[112],"n-type":[114],"creating":[116],"Cd-rich":[119],"respectively.":[121],"Structurally,":[122],"EVT-CdTe":[124],"found":[128],"densely":[131],"packed":[132],"highly":[134],"oriented.":[135]},"counts_by_year":[{"year":2018,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2016-06-24T00:00:00"}