{"id":"https://openalex.org/W2016509723","doi":"https://doi.org/10.1109/redw.2013.6658216","title":"Specific Characterization for Destructive Single Event Effects on GaAs Power P-HEMT MMIC","display_name":"Specific Characterization for Destructive Single Event Effects on GaAs Power P-HEMT MMIC","publication_year":2013,"publication_date":"2013-07-01","ids":{"openalex":"https://openalex.org/W2016509723","doi":"https://doi.org/10.1109/redw.2013.6658216","mag":"2016509723"},"language":"en","primary_location":{"id":"doi:10.1109/redw.2013.6658216","doi":"https://doi.org/10.1109/redw.2013.6658216","is_oa":false,"landing_page_url":"https://doi.org/10.1109/redw.2013.6658216","pdf_url":null,"source":{"id":"https://openalex.org/S7407087333","display_name":"IEEE Radiation Effects Data Workshop (REDW)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE Radiation Effects Data Workshop (REDW)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055859471","display_name":"R. Marec","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4400009052","display_name":"Thales Alenia Space (France)","ror":"https://ror.org/05gz77z03","country_code":"FR","type":"company","lineage":["https://openalex.org/I2802798279","https://openalex.org/I4210140930","https://openalex.org/I4400009052"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"R. Marec","raw_affiliation_strings":["Thales Alenia Space, Toulouse, France","[Thales Al\u00e9nia Space, Toulouse, France]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Alenia Space, Toulouse, France","institution_ids":["https://openalex.org/I4400009052"]},{"raw_affiliation_string":"[Thales Al\u00e9nia Space, Toulouse, France]","institution_ids":["https://openalex.org/I4400009052"]}]},{"author_position":"middle","author":{"id":null,"display_name":"A. Bensoussan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4400009052","display_name":"Thales Alenia Space (France)","ror":"https://ror.org/05gz77z03","country_code":"FR","type":"company","lineage":["https://openalex.org/I2802798279","https://openalex.org/I4210140930","https://openalex.org/I4400009052"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Bensoussan","raw_affiliation_strings":["Thales Alenia Space, Toulouse, France","[Thales Al\u00e9nia Space, Toulouse, France]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Alenia Space, Toulouse, France","institution_ids":["https://openalex.org/I4400009052"]},{"raw_affiliation_string":"[Thales Al\u00e9nia Space, Toulouse, France]","institution_ids":["https://openalex.org/I4400009052"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107007587","display_name":"Jean\u2010Luc Muraro","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4400009052","display_name":"Thales Alenia Space (France)","ror":"https://ror.org/05gz77z03","country_code":"FR","type":"company","lineage":["https://openalex.org/I2802798279","https://openalex.org/I4210140930","https://openalex.org/I4400009052"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J. L. Muraro","raw_affiliation_strings":["Thales Alenia Space, Toulouse, France","[Thales Al\u00e9nia Space, Toulouse, France]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Alenia Space, Toulouse, France","institution_ids":["https://openalex.org/I4400009052"]},{"raw_affiliation_string":"[Thales Al\u00e9nia Space, Toulouse, France]","institution_ids":["https://openalex.org/I4400009052"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069382033","display_name":"L. Fern\u00e1ndez Portal","orcid":"https://orcid.org/0000-0002-5103-5532","observed_orcids":["https://orcid.org/0000-0002-5103-5532"]},"institutions":[{"id":"https://openalex.org/I4400009052","display_name":"Thales Alenia Space (France)","ror":"https://ror.org/05gz77z03","country_code":"FR","type":"company","lineage":["https://openalex.org/I2802798279","https://openalex.org/I4210140930","https://openalex.org/I4400009052"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"L. Portal","raw_affiliation_strings":["Thales Alenia Space, Toulouse, France","[Thales Al\u00e9nia Space, Toulouse, France]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Alenia Space, Toulouse, France","institution_ids":["https://openalex.org/I4400009052"]},{"raw_affiliation_string":"[Thales Al\u00e9nia Space, Toulouse, France]","institution_ids":["https://openalex.org/I4400009052"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034388591","display_name":"P. Calvel","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4400009052","display_name":"Thales Alenia Space (France)","ror":"https://ror.org/05gz77z03","country_code":"FR","type":"company","lineage":["https://openalex.org/I2802798279","https://openalex.org/I4210140930","https://openalex.org/I4400009052"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Calvel","raw_affiliation_strings":["Thales Alenia Space, Toulouse, France","[Thales Al\u00e9nia Space, Toulouse, France]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Alenia Space, Toulouse, France","institution_ids":["https://openalex.org/I4400009052"]},{"raw_affiliation_string":"[Thales Al\u00e9nia Space, Toulouse, France]","institution_ids":["https://openalex.org/I4400009052"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077788728","display_name":"C. Barillot","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4400009052","display_name":"Thales Alenia Space (France)","ror":"https://ror.org/05gz77z03","country_code":"FR","type":"company","lineage":["https://openalex.org/I2802798279","https://openalex.org/I4210140930","https://openalex.org/I4400009052"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Barillot","raw_affiliation_strings":["Thales Alenia Space, Toulouse, France","[Thales Al\u00e9nia Space, Toulouse, France]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Alenia Space, Toulouse, France","institution_ids":["https://openalex.org/I4400009052"]},{"raw_affiliation_string":"[Thales Al\u00e9nia Space, Toulouse, France]","institution_ids":["https://openalex.org/I4400009052"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028995804","display_name":"Marie-Genevi\u00e8ve P\u00e9richaud","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4400009052","display_name":"Thales Alenia Space (France)","ror":"https://ror.org/05gz77z03","country_code":"FR","type":"company","lineage":["https://openalex.org/I2802798279","https://openalex.org/I4210140930","https://openalex.org/I4400009052"]},{"id":"https://openalex.org/I44377176","display_name":"European Space Research and Technology Centre","ror":"https://ror.org/03h3jqn23","country_code":"NL","type":"government","lineage":["https://openalex.org/I2801994115","https://openalex.org/I44377176"]}],"countries":["FR","NL"],"is_corresponding":false,"raw_author_name":"M. G. Perichaud","raw_affiliation_strings":["Thales Alenia Space, Toulouse, France","Eur. Space Agency - ESA/ESTEC, Noordwijk, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales Alenia Space, Toulouse, France","institution_ids":["https://openalex.org/I4400009052"]},{"raw_affiliation_string":"Eur. Space Agency - ESA/ESTEC, Noordwijk, Netherlands","institution_ids":["https://openalex.org/I44377176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114101179","display_name":"L. Marchand","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2801994115","display_name":"European Space Agency","ror":"https://ror.org/03wd9za21","country_code":"FR","type":"nonprofit","lineage":["https://openalex.org/I2801994115"]},{"id":"https://openalex.org/I44377176","display_name":"European Space Research and Technology Centre","ror":"https://ror.org/03h3jqn23","country_code":"NL","type":"government","lineage":["https://openalex.org/I2801994115","https://openalex.org/I44377176"]}],"countries":["FR","NL"],"is_corresponding":false,"raw_author_name":"L. Marchand","raw_affiliation_strings":["European Space Agency (ESA/ESTEC), Noordwijk, The Netherlands","Eur. Space Agency - ESA/ESTEC, Noordwijk, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"European Space Agency (ESA/ESTEC), Noordwijk, The Netherlands","institution_ids":["https://openalex.org/I2801994115","https://openalex.org/I44377176"]},{"raw_affiliation_string":"Eur. Space Agency - ESA/ESTEC, Noordwijk, Netherlands","institution_ids":["https://openalex.org/I44377176"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023791394","display_name":"G Vignon","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Vignon","raw_affiliation_strings":["Tests and Radiation, Toulouse, France","Tests & Radiat., TRAD, Toulouse, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tests and Radiation, Toulouse, France","institution_ids":[]},{"raw_affiliation_string":"Tests & Radiat., TRAD, Toulouse, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4073,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.49594287,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/single-event-effects","display_name":"single event effects","score":0.9789999723434448},{"id":"https://openalex.org/keywords/mmic","display_name":"MMIC","score":0.9810000061988831},{"id":"https://openalex.org/keywords/heavy-ion-irradiation","display_name":"heavy ion irradiation","score":0.746999979019165},{"id":"https://openalex.org/keywords/radiation-hardness","display_name":"radioresistance","score":0.6380000114440918},{"id":"https://openalex.org/keywords/spacecraft-electronics","display_name":"space electronics","score":0.3330000042915344}],"concepts":[{"id":"https://openalex.org/C162057924","wikidata":"https://www.wikidata.org/wiki/Q1617706","display_name":"High-electron-mobility transistor","level":4,"score":0.909066915512085},{"id":"https://openalex.org/C128450285","wikidata":"https://www.wikidata.org/wiki/Q1945036","display_name":"Monolithic microwave integrated circuit","level":4,"score":0.8672624230384827},{"id":"https://openalex.org/C510052550","wikidata":"https://www.wikidata.org/wiki/Q422819","display_name":"Gallium arsenide","level":2,"score":0.6481636762619019},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.6353625059127808},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.49458858370780945},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4879312217235565},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.48271486163139343},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.45278945565223694},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3889137804508209},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3517991602420807},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30339711904525757},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19807308912277222},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1931626796722412},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1680409014225006},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06290870904922485},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/redw.2013.6658216","doi":"https://doi.org/10.1109/redw.2013.6658216","is_oa":false,"landing_page_url":"https://doi.org/10.1109/redw.2013.6658216","pdf_url":null,"source":{"id":"https://openalex.org/S7407087333","display_name":"IEEE Radiation Effects Data Workshop (REDW)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE Radiation Effects Data Workshop (REDW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1979229228","https://openalex.org/W1982783383","https://openalex.org/W2005418167","https://openalex.org/W2081395519","https://openalex.org/W2119707430","https://openalex.org/W2121582336","https://openalex.org/W2135970268","https://openalex.org/W2154328796","https://openalex.org/W2160276178","https://openalex.org/W2162395343","https://openalex.org/W2996272576"],"related_works":["https://openalex.org/W1982774841","https://openalex.org/W1995894754","https://openalex.org/W2940850485","https://openalex.org/W7146427070","https://openalex.org/W4404741098","https://openalex.org/W1950404485","https://openalex.org/W2003737410","https://openalex.org/W1567087733","https://openalex.org/W2604377171","https://openalex.org/W4385337804"],"abstract_inverted_index":{"Specific":[0],"Single":[1],"Event":[2],"Effects":[3],"characterization":[4],"based":[5],"on":[6],"RF":[7],"and":[8],"worst":[9],"case":[10],"DC":[11],"conditions":[12],"are":[13,25],"used":[14],"to":[15],"demonstrate":[16],"that":[17],"two":[18],"European":[19],"GaAs":[20],"power":[21],"P-HEMT":[22],"MMIC":[23],"processes":[24],"safe":[26],"under":[27],"heavy":[28],"ions.":[29]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2016-06-24T00:00:00"}