{"id":"https://openalex.org/W2016343919","doi":"https://doi.org/10.1117/12.966145","title":"Minimization Of Fixed-Pattern Noise In An Intensified Reticon Detector System","display_name":"Minimization Of Fixed-Pattern Noise In An Intensified Reticon Detector System","publication_year":1984,"publication_date":"1984-01-09","ids":{"openalex":"https://openalex.org/W2016343919","doi":"https://doi.org/10.1117/12.966145","mag":"2016343919"},"language":"en","primary_location":{"id":"doi:10.1117/12.966145","doi":"https://doi.org/10.1117/12.966145","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.966145","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056466707","display_name":"L. E. Goad","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2801948628","display_name":"Kitt Peak National Observatory","ror":"https://ror.org/0135fch82","country_code":"US","type":"facility","lineage":["https://openalex.org/I1311060795","https://openalex.org/I1313867356","https://openalex.org/I2801948628","https://openalex.org/I4210141577"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L E. Goad","raw_affiliation_strings":["Kitt Peak National Observatory (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kitt Peak National Observatory (United States)","institution_ids":["https://openalex.org/I2801948628"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059572141","display_name":"Richard Reed","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2801948628","display_name":"Kitt Peak National Observatory","ror":"https://ror.org/0135fch82","country_code":"US","type":"facility","lineage":["https://openalex.org/I1311060795","https://openalex.org/I1313867356","https://openalex.org/I2801948628","https://openalex.org/I4210141577"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Reed","raw_affiliation_strings":["Kitt Peak National Observatory (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kitt Peak National Observatory (United States)","institution_ids":["https://openalex.org/I2801948628"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I2801948628"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18217162,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"0445","issue":null,"first_page":"176","last_page":"182"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12917","display_name":"Astronomy and Astrophysical Research","score":0.004699999932199717,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.0012000000569969416,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fixed-pattern-noise","display_name":"fixed pattern noise","score":0.9900000095367432},{"id":"https://openalex.org/keywords/image-intensifier","display_name":"image intensifier","score":0.8610000014305115},{"id":"https://openalex.org/keywords/fet-switches","display_name":"FET switches","score":0.777999997138977},{"id":"https://openalex.org/keywords/thermal-management","display_name":"thermal management","score":0.7429999709129333},{"id":"https://openalex.org/keywords/astronomical-spectroscopy","display_name":"astronomical spectroscopy","score":0.7300000190734863},{"id":"https://openalex.org/keywords/medium-resolution-spectroscopy","display_name":"medium-resolution spectroscopy","score":0.640999972820282},{"id":"https://openalex.org/keywords/readout-noise","display_name":"readout noise","score":0.49799999594688416}],"concepts":[{"id":"https://openalex.org/C2778368474","wikidata":"https://www.wikidata.org/wiki/Q5456322","display_name":"Fixed-pattern noise","level":3,"score":0.7943277955055237},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6441407203674316},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5440593957901001},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5233156681060791},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4399503469467163},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.4034052789211273},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.25562137365341187},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10830327868461609},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.966145","doi":"https://doi.org/10.1117/12.966145","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.966145","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1979812912","https://openalex.org/W1989524919","https://openalex.org/W1996002432","https://openalex.org/W2017876395","https://openalex.org/W2053297581","https://openalex.org/W2093754766","https://openalex.org/W3103744633"],"related_works":["https://openalex.org/W3025770028","https://openalex.org/W2036228775","https://openalex.org/W2005369629","https://openalex.org/W2503020548","https://openalex.org/W1003339555","https://openalex.org/W7167079462","https://openalex.org/W2781508476","https://openalex.org/W2023695310","https://openalex.org/W2908771875","https://openalex.org/W2093754766"],"abstract_inverted_index":{"An":[0],"intensified":[1],"reticon":[2,22,60,81,92,217],"scanner":[3],"has":[4],"been":[5],"developed":[6],"at":[7,34],"Kitt":[8],"Peak":[9],"National":[10],"Observatory":[11],"for":[12],"medium":[13],"resolution":[14],"astronomical":[15],"spectroscopy.":[16],"In":[17],"this":[18,224],"system,":[19],"a":[20,186,190],"dual":[21,216],"(2":[23],"x":[24],"936":[25],"pixels)":[26],"is":[27,177,218],"used":[28,119,231],"to":[29,52,120,143,153,232],"measure":[30,233],"the":[31,35,43,46,54,59,63,67,75,80,91,97,105,113,116,122,128,133,145,148,155,158,166,180,183,193,215,239,248],"light":[32],"emitted":[33],"output":[36,135],"phosphor":[37],"of":[38,45,58,66,85,104,147,185,192,214],"an":[39],"image":[40,47],"intensifier.":[41],"While":[42],"gain":[44],"tube":[48],"system":[49],"was":[50,69,108],"sufficient":[51],"render":[53],"random":[55],"readout":[56,191],"noise":[57,77,107,160,175,241],"detector":[61],"insignificant,":[62],"overall":[64],"sensitivity":[65],"instrument":[68],"initially":[70],"limited":[71],"by":[72,110,131,182],"variations":[73,87,164,237],"in":[74,90,96,157,165,210,238],"fixed-pattern":[76,106,149,159,240],"associated":[78],"with":[79,196],"readout.":[82],"The":[83,102,137,171,200,226],"elimination":[84],"these":[86],"required":[88],"modifications":[89],"clock":[93,123,138,167],"drivers":[94],"and":[95,130,203],"data":[98,181,205],"handling":[99],"techniques":[100],"used.":[101],"stabilization":[103],"accomplished":[109],"thermally":[111],"controlling":[112],"environment":[114],"surrounding":[115],"FET":[117],"switches":[118],"produce":[121],"signals":[124],"that":[125],"read":[126],"out":[127],"array,":[129],"filtering":[132],"switched":[134],"signals.":[136],"voltages":[139,168],"were":[140,169,223],"adjusted":[141],"not":[142],"minimize":[144,154],"amplitude":[146],"noise,":[150],"but":[151],"rather":[152],"variation":[156],"observed,":[161],"as":[162,220],"small":[163,236],"introduced.":[170],"resulting":[172],"large":[173],"fixed":[174],"pattern":[176],"removed":[178],"from":[179,247],"subtraction":[184],"bias":[187,201],"scan":[188],"-":[189],"array":[194],"taken":[195],"no":[197],"input":[198],"signal.":[199],"scans":[202,206],"all":[204],"are":[207,229],"1024":[208],"elements":[209],"length.":[211],"Each":[212],"portion":[213],"clocked":[219],"though":[221],"it":[222],"long.":[225],"overscan":[227],"pixels":[228],"then":[230,244],"exactly":[234],"any":[235],"which":[242],"can":[243],"be":[245],"subtracted":[246],"data.":[249]},"counts_by_year":[],"updated_date":"2026-09-21T07:43:02.447757","created_date":"2016-06-24T00:00:00"}