{"id":"https://openalex.org/W2016273879","doi":"https://doi.org/10.1016/0031-9163(66)90234-4","title":"The formation of channelling patterns on the surface of ion bombarded silicon","display_name":"The formation of channelling patterns on the surface of ion bombarded silicon","publication_year":1966,"publication_date":"1966-10-01","ids":{"openalex":"https://openalex.org/W2016273879","doi":"https://doi.org/10.1016/0031-9163(66)90234-4","mag":"2016273879"},"language":"en","primary_location":{"id":"doi:10.1016/0031-9163(66)90234-4","doi":"https://doi.org/10.1016/0031-9163(66)90234-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0031-9163(66)90234-4","pdf_url":null,"source":{"id":"https://openalex.org/S4210170198","display_name":"Physics Letters","issn_l":"0031-9163","issn":["0031-9163","1873-2410"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001984820","display_name":"R.S. Nelson","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R.S. Nelson","raw_affiliation_strings":["Metallurgy Division, A.E.R.E., Harwell, Berks.USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Metallurgy Division, A.E.R.E., Harwell, Berks.USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091897918","display_name":"D.J. Mazey","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D.J. Mazey","raw_affiliation_strings":["Metallurgy Division, A.E.R.E., Harwell, Berks.USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Metallurgy Division, A.E.R.E., Harwell, Berks.USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003913926","display_name":"M. D. Matthews","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M.D. Matthews","raw_affiliation_strings":["Metallurgy Division, A.E.R.E., Harwell, Berks.USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Metallurgy Division, A.E.R.E., Harwell, Berks.USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021074555","display_name":"D.F. Holloway","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D.F. Holloway","raw_affiliation_strings":["Metallurgy Division, A.E.R.E., Harwell, Berks.USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Metallurgy Division, A.E.R.E., Harwell, Berks.USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.7976,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.91733333,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":null,"biblio":{"volume":"23","issue":"1","first_page":"18","last_page":"19"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12762","display_name":"Crystallography and Radiation Phenomena","score":0.002300000051036477,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12506","display_name":"Nuclear materials and radiation effects","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ion-channeling","display_name":"ion channeling","score":0.9359999895095825},{"id":"https://openalex.org/keywords/ion-bombardment","display_name":"ion bombardment","score":0.828000009059906},{"id":"https://openalex.org/keywords/silicon","display_name":"silicon","score":0.7260000109672546},{"id":"https://openalex.org/keywords/amorphization","display_name":"amorphization","score":0.7540000081062317},{"id":"https://openalex.org/keywords/surface-patterning","display_name":"surface patterning","score":0.5619999766349792},{"id":"https://openalex.org/keywords/ion-range","display_name":"ion range","score":0.5580000281333923},{"id":"https://openalex.org/keywords/amorphous-layer-formation","display_name":"amorphous layer formation","score":0.5419999957084656}],"concepts":[{"id":"https://openalex.org/C2781028716","wikidata":"https://www.wikidata.org/wiki/Q900607","display_name":"Channelling","level":3,"score":0.9329207539558411},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.7907634973526001},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.7360955476760864},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.6936342716217041},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.5236403942108154},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.49463388323783875},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.4248616695404053},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.14501044154167175},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.07695662975311279},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0031-9163(66)90234-4","doi":"https://doi.org/10.1016/0031-9163(66)90234-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0031-9163(66)90234-4","pdf_url":null,"source":{"id":"https://openalex.org/S4210170198","display_name":"Physics Letters","issn_l":"0031-9163","issn":["0031-9163","1873-2410"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Physics Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2003959608","https://openalex.org/W2037190170","https://openalex.org/W2039892655","https://openalex.org/W2042471641","https://openalex.org/W2054909304","https://openalex.org/W2083261651"],"related_works":["https://openalex.org/W2027281312","https://openalex.org/W2066939577","https://openalex.org/W2000487423","https://openalex.org/W2026370944","https://openalex.org/W2037126243","https://openalex.org/W1514859796","https://openalex.org/W1972696539","https://openalex.org/W2138308674","https://openalex.org/W2046133314","https://openalex.org/W2024600501"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2016-06-24T00:00:00"}
