{"id":"https://openalex.org/W2016242682","doi":"https://doi.org/10.1016/j.jcrysgro.2006.12.029","title":"Effect of grain size on the electrical properties of ultraviolet photodetector with ZnO/diamond film structure","display_name":"Effect of grain size on the electrical properties of ultraviolet photodetector with ZnO/diamond film structure","publication_year":2007,"publication_date":"2007-01-15","ids":{"openalex":"https://openalex.org/W2016242682","doi":"https://doi.org/10.1016/j.jcrysgro.2006.12.029","mag":"2016242682"},"language":"en","primary_location":{"id":"doi:10.1016/j.jcrysgro.2006.12.029","doi":"https://doi.org/10.1016/j.jcrysgro.2006.12.029","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.jcrysgro.2006.12.029","pdf_url":null,"source":{"id":"https://openalex.org/S10719676","display_name":"Journal of Crystal Growth","issn_l":"0022-0248","issn":["0022-0248","1873-5002"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Crystal Growth","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110342096","display_name":"Jian Min Liu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I105991555","display_name":"Jingdezhen Ceramic Institute","ror":"https://ror.org/01d0jcz74","country_code":"CN","type":"education","lineage":["https://openalex.org/I105991555"]},{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jian Min Liu","raw_affiliation_strings":["Jingdezhen Ceramic Institute, Jingdezhen Jiangxi 333001, China","School of Materials Science and Engineering, 149 yanchang Road, Shanghai University, Shanghai 200072, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jingdezhen Ceramic Institute, Jingdezhen Jiangxi 333001, China","institution_ids":["https://openalex.org/I105991555"]},{"raw_affiliation_string":"School of Materials Science and Engineering, 149 yanchang Road, Shanghai University, Shanghai 200072, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021529279","display_name":"Yi Xia","orcid":"https://orcid.org/0000-0003-1742-8452","observed_orcids":["https://orcid.org/0000-0003-1742-8452"]},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Ben Xia","raw_affiliation_strings":["School of Materials Science and Engineering, 149 yanchang Road, Shanghai University, Shanghai 200072, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, 149 yanchang Road, Shanghai University, Shanghai 200072, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110094603","display_name":"Lin Jun Wang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lin Jun Wang","raw_affiliation_strings":["School of Materials Science and Engineering, 149 yanchang Road, Shanghai University, Shanghai 200072, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, 149 yanchang Road, Shanghai University, Shanghai 200072, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Qing Feng Su","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qing Feng Su","raw_affiliation_strings":["School of Materials Science and Engineering, 149 yanchang Road, Shanghai University, Shanghai 200072, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, 149 yanchang Road, Shanghai University, Shanghai 200072, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008977864","display_name":"Wei Min Shi","orcid":"https://orcid.org/0000-0002-5427-5216","observed_orcids":["https://orcid.org/0000-0002-5427-5216"]},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Min Shi","raw_affiliation_strings":["School of Materials Science and Engineering, 149 yanchang Road, Shanghai University, Shanghai 200072, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, 149 yanchang Road, Shanghai University, Shanghai 200072, China","institution_ids":["https://openalex.org/I113940042"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5110342096"],"corresponding_institution_ids":["https://openalex.org/I105991555","https://openalex.org/I113940042"],"apc_list":{"value":3110,"currency":"USD","value_usd":3110},"apc_paid":null,"fwci":0.8594,"has_fulltext":false,"cited_by_count":47,"citation_normalized_percentile":{"value":0.69673209,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"300","issue":"2","first_page":"353","last_page":"357"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10478","display_name":"Diamond and Carbon-based Materials Research","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ultraviolet-photodetectors","display_name":"ultraviolet photodetectors","score":0.9020000100135803},{"id":"https://openalex.org/keywords/zno-thin-films","display_name":"ZnO thin films","score":0.9279999732971191},{"id":"https://openalex.org/keywords/diamond-films","display_name":"diamond films","score":0.7429999709129333},{"id":"https://openalex.org/keywords/grain-size","display_name":"grain size","score":0.7429999709129333},{"id":"https://openalex.org/keywords/c-axis-orientation","display_name":"c-axis orientation","score":0.8679999709129333},{"id":"https://openalex.org/keywords/reactive-rf-magnetron-sputtering","display_name":"reactive RF magnetron sputtering","score":0.9079999923706055},{"id":"https://openalex.org/keywords/current-voltage-characteristics","display_name":"current-voltage characteristics","score":0.8029999732971191},{"id":"https://openalex.org/keywords/dark-current","display_name":"dark current","score":0.9430000185966492},{"id":"https://openalex.org/keywords/photocurrent","display_name":"photocurrent","score":0.9980000257492065},{"id":"https://openalex.org/keywords/charge-trapping","display_name":"charge trapping","score":0.9330000281333923},{"id":"https://openalex.org/keywords/nucleation","display_name":"nucleation","score":0.5019999742507935}],"concepts":[{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.9036470651626587},{"id":"https://openalex.org/C2779845233","wikidata":"https://www.wikidata.org/wiki/Q3381567","display_name":"Photocurrent","level":2,"score":0.9002963304519653},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7499115467071533},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.7200323343276978},{"id":"https://openalex.org/C2776921476","wikidata":"https://www.wikidata.org/wiki/Q5283","display_name":"Diamond","level":2,"score":0.7184152007102966},{"id":"https://openalex.org/C2776798109","wikidata":"https://www.wikidata.org/wiki/Q11391","display_name":"Ultraviolet","level":2,"score":0.7180119752883911},{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.687324047088623},{"id":"https://openalex.org/C192191005","wikidata":"https://www.wikidata.org/wiki/Q466491","display_name":"Grain size","level":2,"score":0.5978021025657654},{"id":"https://openalex.org/C201999631","wikidata":"https://www.wikidata.org/wiki/Q2601129","display_name":"Photoconductivity","level":2,"score":0.5796204805374146},{"id":"https://openalex.org/C61048295","wikidata":"https://www.wikidata.org/wiki/Q909022","display_name":"Nucleation","level":2,"score":0.5702532529830933},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.4147171378135681},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.41046619415283203},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.3313622772693634},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.18149074912071228},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15302139520645142},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1516176462173462},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.10094684362411499},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06494659185409546},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.jcrysgro.2006.12.029","doi":"https://doi.org/10.1016/j.jcrysgro.2006.12.029","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.jcrysgro.2006.12.029","pdf_url":null,"source":{"id":"https://openalex.org/S10719676","display_name":"Journal of Crystal Growth","issn_l":"0022-0248","issn":["0022-0248","1873-5002"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Crystal Growth","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320337367","display_name":"Division of Materials Research","ror":"https://ror.org/01pc7k308"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1981311110","https://openalex.org/W1985552612","https://openalex.org/W1986170812","https://openalex.org/W1989708795","https://openalex.org/W1994776570","https://openalex.org/W2013752040","https://openalex.org/W2022295050","https://openalex.org/W2039606303","https://openalex.org/W2071025368","https://openalex.org/W2073379757","https://openalex.org/W2076599070","https://openalex.org/W2079538385","https://openalex.org/W2079823166","https://openalex.org/W2080317605","https://openalex.org/W2117007911","https://openalex.org/W2146746547","https://openalex.org/W2164517490"],"related_works":["https://openalex.org/W2366650882","https://openalex.org/W1979379965","https://openalex.org/W2065152344","https://openalex.org/W2991828681","https://openalex.org/W7161265359","https://openalex.org/W2011097136","https://openalex.org/W2094284104","https://openalex.org/W2552056954","https://openalex.org/W4417306217","https://openalex.org/W2356810038"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":5}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}