{"id":"https://openalex.org/W2015359237","doi":"https://doi.org/10.1007/s11664-012-2178-3","title":"Measurement of Thermal Conductivity Using Steady-State Isothermal Conditions and Validation by Comparison with Thermoelectric Device Performance","display_name":"Measurement of Thermal Conductivity Using Steady-State Isothermal Conditions and Validation by Comparison with Thermoelectric Device Performance","publication_year":2012,"publication_date":"2012-07-05","ids":{"openalex":"https://openalex.org/W2015359237","doi":"https://doi.org/10.1007/s11664-012-2178-3","mag":"2015359237"},"language":"en","primary_location":{"id":"doi:10.1007/s11664-012-2178-3","doi":"https://doi.org/10.1007/s11664-012-2178-3","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s11664-012-2178-3","pdf_url":"https://link.springer.com/content/pdf/10.1007/s11664-012-2178-3.pdf","source":{"id":"https://openalex.org/S127985767","display_name":"Journal of Electronic Materials","issn_l":"0361-5235","issn":["0361-5235","0381-5235","1543-186X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Materials","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://link.springer.com/content/pdf/10.1007/s11664-012-2178-3.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021916303","display_name":"Patrick Taylor","orcid":"https://orcid.org/0009-0005-9133-6654","observed_orcids":["https://orcid.org/0009-0005-9133-6654","https://orcid.org/0009-0003-6511-6442","https://orcid.org/0000-0002-9391-0972"]},"institutions":[{"id":"https://openalex.org/I166416128","display_name":"DEVCOM Army Research Laboratory","ror":"https://ror.org/011hc8f90","country_code":"US","type":"government","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I166416128","https://openalex.org/I2802705668","https://openalex.org/I4210154437"]},{"id":"https://openalex.org/I4210088792","display_name":"United States Army","ror":"https://ror.org/00afsp483","country_code":"US","type":"government","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I4210088792"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Patrick J. Taylor","raw_affiliation_strings":["Sensors and Electron Devices Directorate, US Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA","US Army Research Laboratory ,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sensors and Electron Devices Directorate, US Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA","institution_ids":["https://openalex.org/I166416128"]},{"raw_affiliation_string":"US Army Research Laboratory ,","institution_ids":["https://openalex.org/I166416128","https://openalex.org/I4210088792"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026119458","display_name":"Jay R. Maddux","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I166416128","display_name":"DEVCOM Army Research Laboratory","ror":"https://ror.org/011hc8f90","country_code":"US","type":"government","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I166416128","https://openalex.org/I2802705668","https://openalex.org/I4210154437"]},{"id":"https://openalex.org/I4210088792","display_name":"United States Army","ror":"https://ror.org/00afsp483","country_code":"US","type":"government","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I4210088792"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jay R. Maddux","raw_affiliation_strings":["Sensors and Electron Devices Directorate, US Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA","US Army Research Laboratory ,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sensors and Electron Devices Directorate, US Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA","institution_ids":["https://openalex.org/I166416128"]},{"raw_affiliation_string":"US Army Research Laboratory ,","institution_ids":["https://openalex.org/I166416128","https://openalex.org/I4210088792"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041927576","display_name":"Parvez N. Uppal","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I166416128","display_name":"DEVCOM Army Research Laboratory","ror":"https://ror.org/011hc8f90","country_code":"US","type":"government","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I166416128","https://openalex.org/I2802705668","https://openalex.org/I4210154437"]},{"id":"https://openalex.org/I4210088792","display_name":"United States Army","ror":"https://ror.org/00afsp483","country_code":"US","type":"government","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I4210088792"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Parvez N. Uppal","raw_affiliation_strings":["Sensors and Electron Devices Directorate, US Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA","US Army Research Laboratory ,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sensors and Electron Devices Directorate, US Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA","institution_ids":["https://openalex.org/I166416128"]},{"raw_affiliation_string":"US Army Research Laboratory ,","institution_ids":["https://openalex.org/I166416128","https://openalex.org/I4210088792"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5021916303"],"corresponding_institution_ids":["https://openalex.org/I166416128","https://openalex.org/I4210088792"],"apc_list":{"value":3390,"currency":"USD","value_usd":3390},"apc_paid":null,"fwci":0.6519,"has_fulltext":true,"cited_by_count":11,"citation_normalized_percentile":{"value":0.61720649,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"41","issue":"9","first_page":"2307","last_page":"2312"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9057999849319458,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.9057999849319458,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11277","display_name":"Thermal properties of materials","score":0.09139999747276306,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thermal-conductivity-measurement","display_name":"thermal conductivity measurement","score":0.9980000257492065},{"id":"https://openalex.org/keywords/peltier-effect","display_name":"Peltier effect","score":0.9750000238418579},{"id":"https://openalex.org/keywords/thermoelectric-devices","display_name":"thermoelectric devices","score":0.7689999938011169},{"id":"https://openalex.org/keywords/seebeck-coefficient","display_name":"Seebeck coefficient","score":0.8230000138282776}],"concepts":[{"id":"https://openalex.org/C97346530","wikidata":"https://www.wikidata.org/wiki/Q487005","display_name":"Thermal conductivity","level":2,"score":0.8491394519805908},{"id":"https://openalex.org/C63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","level":2,"score":0.7917971611022949},{"id":"https://openalex.org/C133347239","wikidata":"https://www.wikidata.org/wiki/Q486921","display_name":"Isothermal process","level":2,"score":0.7206488251686096},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6559696793556213},{"id":"https://openalex.org/C112625512","wikidata":"https://www.wikidata.org/wiki/Q1091448","display_name":"Seebeck coefficient","level":3,"score":0.6468552350997925},{"id":"https://openalex.org/C207365445","wikidata":"https://www.wikidata.org/wiki/Q15020929","display_name":"Thermoelectric materials","level":3,"score":0.607876181602478},{"id":"https://openalex.org/C128458982","wikidata":"https://www.wikidata.org/wiki/Q18891486","display_name":"Thermoelectric cooling","level":3,"score":0.5920059084892273},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.5091151595115662},{"id":"https://openalex.org/C8171440","wikidata":"https://www.wikidata.org/wiki/Q903414","display_name":"Steady state (chemistry)","level":2,"score":0.4961646497249603},{"id":"https://openalex.org/C102232406","wikidata":"https://www.wikidata.org/wiki/Q7783035","display_name":"Thermal conductivity measurement","level":3,"score":0.47531014680862427},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.43768173456192017},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3601606488227844},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.23643016815185547},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.18704766035079956},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11860013008117676},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11664-012-2178-3","doi":"https://doi.org/10.1007/s11664-012-2178-3","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s11664-012-2178-3","pdf_url":"https://link.springer.com/content/pdf/10.1007/s11664-012-2178-3.pdf","source":{"id":"https://openalex.org/S127985767","display_name":"Journal of Electronic Materials","issn_l":"0361-5235","issn":["0361-5235","0381-5235","1543-186X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Materials","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1007/s11664-012-2178-3","doi":"https://doi.org/10.1007/s11664-012-2178-3","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s11664-012-2178-3","pdf_url":"https://link.springer.com/content/pdf/10.1007/s11664-012-2178-3.pdf","source":{"id":"https://openalex.org/S127985767","display_name":"Journal of Electronic Materials","issn_l":"0361-5235","issn":["0361-5235","0381-5235","1543-186X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Materials","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"},{"id":"https://openalex.org/F4320332815","display_name":"Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2015359237.pdf","grobid_xml":"https://content.openalex.org/works/W2015359237.grobid-xml"},"referenced_works_count":11,"referenced_works":["https://openalex.org/W1580825693","https://openalex.org/W1976119157","https://openalex.org/W2024985766","https://openalex.org/W2058437007","https://openalex.org/W2075346939","https://openalex.org/W2081802878","https://openalex.org/W2084681491","https://openalex.org/W2089497920","https://openalex.org/W2103840303","https://openalex.org/W4214605262","https://openalex.org/W6600238479"],"related_works":["https://openalex.org/W2018276437","https://openalex.org/W2071277887","https://openalex.org/W2084681491","https://openalex.org/W2169634597","https://openalex.org/W1979060494","https://openalex.org/W2030949230","https://openalex.org/W115444892","https://openalex.org/W1979167804","https://openalex.org/W4377694838","https://openalex.org/W2242002606"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}