{"id":"https://openalex.org/W2015035686","doi":"https://doi.org/10.1016/j.sse.2010.11.010","title":"Optimization of SiGe bandgap-based circuits for up to 300\u00b0C operation","display_name":"Optimization of SiGe bandgap-based circuits for up to 300\u00b0C operation","publication_year":2010,"publication_date":"2010-12-23","ids":{"openalex":"https://openalex.org/W2015035686","doi":"https://doi.org/10.1016/j.sse.2010.11.010","mag":"2015035686"},"language":"en","primary_location":{"id":"doi:10.1016/j.sse.2010.11.010","doi":"https://doi.org/10.1016/j.sse.2010.11.010","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.sse.2010.11.010","pdf_url":null,"source":{"id":"https://openalex.org/S77418581","display_name":"Solid-State Electronics","issn_l":"0038-1101","issn":["0038-1101","1879-2405"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid-State Electronics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050355353","display_name":"Dylan Thomas","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.B. Thomas","raw_affiliation_strings":["School of Electrical and Computer Engineering, 777 Atlantic Dr., NW, Georgia Institute of Technology, Atlanta, GA 30332, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, 777 Atlantic Dr., NW, Georgia Institute of Technology, Atlanta, GA 30332, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029389730","display_name":"Laleh Najafizadeh","orcid":"https://orcid.org/0000-0002-6658-4112","observed_orcids":["https://orcid.org/0000-0002-6658-4112"]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. Najafizadeh","raw_affiliation_strings":["School of Electrical and Computer Engineering, 777 Atlantic Dr., NW, Georgia Institute of Technology, Atlanta, GA 30332, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, 777 Atlantic Dr., NW, Georgia Institute of Technology, Atlanta, GA 30332, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073899315","display_name":"John D. Cressler","orcid":"https://orcid.org/0000-0001-8268-5135","observed_orcids":["https://orcid.org/0000-0001-8268-5135"]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"J.D. Cressler","raw_affiliation_strings":["School of Electrical and Computer Engineering, 777 Atlantic Dr., NW, Georgia Institute of Technology, Atlanta, GA 30332, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, 777 Atlantic Dr., NW, Georgia Institute of Technology, Atlanta, GA 30332, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054295528","display_name":"Kurt A. Moen","orcid":"https://orcid.org/0000-0001-7697-8636","observed_orcids":["https://orcid.org/0000-0001-7697-8636"]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.A. Moen","raw_affiliation_strings":["School of Electrical and Computer Engineering, 777 Atlantic Dr., NW, Georgia Institute of Technology, Atlanta, GA 30332, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, 777 Atlantic Dr., NW, Georgia Institute of Technology, Atlanta, GA 30332, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080853734","display_name":"Nelson E. Lourenco","orcid":"https://orcid.org/0000-0003-4094-5749","observed_orcids":["https://orcid.org/0000-0003-4094-5749"]},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Lourenco","raw_affiliation_strings":["School of Electrical and Computer Engineering, 777 Atlantic Dr., NW, Georgia Institute of Technology, Atlanta, GA 30332, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, 777 Atlantic Dr., NW, Georgia Institute of Technology, Atlanta, GA 30332, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5073899315"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":{"value":2410,"currency":"USD","value_usd":2410},"apc_paid":null,"fwci":0.5665,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.67699958,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"56","issue":"1","first_page":"47","last_page":"55"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.8711000084877014,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.8711000084877014,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.0835999995470047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.014100000262260437,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sige-bicmos","display_name":"SiGe BiCMOS","score":0.824999988079071},{"id":"https://openalex.org/keywords/bandgap-reference","display_name":"bandgap reference","score":0.7580000162124634},{"id":"https://openalex.org/keywords/temperature-sensors","display_name":"temperature sensors","score":0.7730000019073486},{"id":"https://openalex.org/keywords/device-reliability","display_name":"device reliability","score":0.6150000095367432},{"id":"https://openalex.org/keywords/temperature-compensation","display_name":"temperature compensation","score":0.4180000126361847}],"concepts":[{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.8763262033462524},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6757330298423767},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5979098677635193},{"id":"https://openalex.org/C2780389399","wikidata":"https://www.wikidata.org/wiki/Q367849","display_name":"Silicon-germanium","level":3,"score":0.5794619917869568},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.5667577385902405},{"id":"https://openalex.org/C62427370","wikidata":"https://www.wikidata.org/wiki/Q173416","display_name":"BiCMOS","level":4,"score":0.5564137101173401},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5524033904075623},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5296525359153748},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4983062744140625},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.4923757314682007},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48122453689575195},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4790436029434204},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4423843026161194},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.4359784424304962},{"id":"https://openalex.org/C131321042","wikidata":"https://www.wikidata.org/wiki/Q656685","display_name":"Operating temperature","level":2,"score":0.4119046628475189},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3318454623222351},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16739392280578613},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15324634313583374},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.144124835729599},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.06751903891563416},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.sse.2010.11.010","doi":"https://doi.org/10.1016/j.sse.2010.11.010","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.sse.2010.11.010","pdf_url":null,"source":{"id":"https://openalex.org/S77418581","display_name":"Solid-State Electronics","issn_l":"0038-1101","issn":["0038-1101","1879-2405"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid-State Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306101","display_name":"National Aeronautics and Space Administration","ror":"https://ror.org/027ka1x80"},{"id":"https://openalex.org/F4320309904","display_name":"Auburn University","ror":"https://ror.org/02v80fc35"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W580773257","https://openalex.org/W1557929451","https://openalex.org/W1586361588","https://openalex.org/W1603304134","https://openalex.org/W1914592835","https://openalex.org/W1995305876","https://openalex.org/W2001252627","https://openalex.org/W2024752911","https://openalex.org/W2047649702","https://openalex.org/W2055542674","https://openalex.org/W2075053969","https://openalex.org/W2085042863","https://openalex.org/W2096609204","https://openalex.org/W2098356164","https://openalex.org/W2104473406","https://openalex.org/W2106355163","https://openalex.org/W2113207317","https://openalex.org/W2131034512","https://openalex.org/W2141346938","https://openalex.org/W2146255617","https://openalex.org/W2167766197","https://openalex.org/W2481320349","https://openalex.org/W2799268206","https://openalex.org/W2999009107","https://openalex.org/W4247586331"],"related_works":["https://openalex.org/W7100625454","https://openalex.org/W2513104916","https://openalex.org/W2252295759","https://openalex.org/W1987796861","https://openalex.org/W2570649094","https://openalex.org/W2016193932","https://openalex.org/W2999009107","https://openalex.org/W2903401989","https://openalex.org/W2515250255","https://openalex.org/W1495029191"],"abstract_inverted_index":null,"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2016-06-24T00:00:00"}