{"id":"https://openalex.org/W2014965397","doi":"https://doi.org/10.1063/1.355330","title":"Electron traps in InGaP grown by gas source molecular beam epitaxy","display_name":"Electron traps in InGaP grown by gas source molecular beam epitaxy","publication_year":1993,"publication_date":"1993-07-15","ids":{"openalex":"https://openalex.org/W2014965397","doi":"https://doi.org/10.1063/1.355330","mag":"2014965397"},"language":"en","primary_location":{"id":"doi:10.1063/1.355330","doi":"https://doi.org/10.1063/1.355330","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.355330","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023554909","display_name":"H.S. Kim","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. S. Kim","raw_affiliation_strings":["Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523","institution_ids":["https://openalex.org/I92446798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110015088","display_name":"Michael J. Hafich","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. J. Hafich","raw_affiliation_strings":["Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523","institution_ids":["https://openalex.org/I92446798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033573043","display_name":"Gary A. Patrizi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. A. Patrizi","raw_affiliation_strings":["Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523","institution_ids":["https://openalex.org/I92446798"]}]},{"author_position":"middle","author":{"id":null,"display_name":"A. Nanda","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Nanda","raw_affiliation_strings":["Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523","institution_ids":["https://openalex.org/I92446798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068957817","display_name":"T. J. Vogt","orcid":"https://orcid.org/0009-0009-9962-9928","observed_orcids":["https://orcid.org/0009-0009-9962-9928"]},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. J. Vogt","raw_affiliation_strings":["Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523","institution_ids":["https://openalex.org/I92446798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108710643","display_name":"Lawrence M. Woods","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. M. Woods","raw_affiliation_strings":["Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523","institution_ids":["https://openalex.org/I92446798"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112700598","display_name":"Gary Y. Robinson","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. Y. Robinson","raw_affiliation_strings":["Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Optoelectronic Computing Systems and Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado 80523","institution_ids":["https://openalex.org/I92446798"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I92446798"],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":0.9822,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.71034616,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":96},"biblio":{"volume":"74","issue":"2","first_page":"1431","last_page":"1433"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.8838000297546387,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.8838000297546387,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.06019999831914902,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.013000000268220901,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ingap","display_name":"InGaP","score":0.8360000252723694},{"id":"https://openalex.org/keywords/electron-traps","display_name":"electron traps","score":0.9660000205039978},{"id":"https://openalex.org/keywords/deep-level-transient-spectroscopy","display_name":"deep level transient spectroscopy","score":0.875},{"id":"https://openalex.org/keywords/gas-source-molecular-beam-epitaxy","display_name":"gas source molecular beam epitaxy","score":0.9300000071525574},{"id":"https://openalex.org/keywords/n-type-semiconductors","display_name":"n-type semiconductors","score":0.7350000143051147},{"id":"https://openalex.org/keywords/capture-barrier","display_name":"capture barrier","score":0.8880000114440918},{"id":"https://openalex.org/keywords/silicon-doping","display_name":"silicon doping","score":0.7229999899864197},{"id":"https://openalex.org/keywords/oxygen-contamination","display_name":"oxygen contamination","score":0.9729999899864197},{"id":"https://openalex.org/keywords/trap-concentration","display_name":"trap concentration","score":0.7749999761581421}],"concepts":[{"id":"https://openalex.org/C3792809","wikidata":"https://www.wikidata.org/wiki/Q898542","display_name":"Molecular beam epitaxy","level":4,"score":0.7655683755874634},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.6510303616523743},{"id":"https://openalex.org/C2780080961","wikidata":"https://www.wikidata.org/wiki/Q176282","display_name":"Deep-level transient spectroscopy","level":3,"score":0.6011006236076355},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5510028004646301},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.50384920835495},{"id":"https://openalex.org/C143873397","wikidata":"https://www.wikidata.org/wiki/Q1755716","display_name":"Penning trap","level":3,"score":0.499528169631958},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.4370741546154022},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.42983976006507874},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.3787168860435486},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.3502006530761719},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.27855512499809265},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.19637957215309143},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.12879809737205505},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.355330","doi":"https://doi.org/10.1063/1.355330","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.355330","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1963886451","https://openalex.org/W1968879099","https://openalex.org/W1972163456","https://openalex.org/W2005146062","https://openalex.org/W2011441771","https://openalex.org/W2012605798","https://openalex.org/W2041598379","https://openalex.org/W2063589789","https://openalex.org/W2069309851","https://openalex.org/W2074318622","https://openalex.org/W2074980664","https://openalex.org/W2094797112","https://openalex.org/W2141703082"],"related_works":["https://openalex.org/W1980624450","https://openalex.org/W2167378475","https://openalex.org/W2067388666","https://openalex.org/W2077997328","https://openalex.org/W2012795389","https://openalex.org/W2084817959","https://openalex.org/W7095355860","https://openalex.org/W2040599458","https://openalex.org/W1985470680","https://openalex.org/W2027781802"],"abstract_inverted_index":{"Deep-level":[0],"transient":[1],"spectroscopy":[2],"has":[3],"been":[4],"used":[5],"to":[6,74,83,87],"characterize":[7],"n-type":[8],"In0.48Ga0.52P":[9],"grown":[10],"by":[11],"gas-source":[12],"molecular":[13],"beam":[14],"epitaxy.":[15],"Only":[16],"one":[17],"electron":[18],"trap":[19,64],"was":[20,52,60,66,72],"detected":[21],"in":[22,90],"both":[23],"unintentionally":[24],"doped":[25],"and":[26,55,71,86],"Si-doped":[27],"material,":[28],"with":[29,37],"the":[30,48,56,91],"thermal":[31],"emission":[32,49],"energy":[33,51,59],"barrier":[34,50,58],"varying":[35],"somewhat":[36],"measurement":[38],"conditions.":[39],"For":[40],"a":[41],"bias":[42],"pulse":[43],"duration":[44],"of":[45,77],"10":[46],"ms,":[47],"0.24\u00b10.03":[53],"eV":[54],"capture":[57],"0.06\u00b10.02":[61],"eV.":[62],"The":[63],"concentration":[65],"less":[67],"than":[68],"3\u00d71014":[69],"cm\u22123":[70,85],"found":[73],"be":[75],"independent":[76],"Si":[78],"doping":[79],"for":[80],"concentrations":[81],"up":[82],"4\u00d71018":[84],"oxygen":[88],"contamination":[89],"range":[92],"(0.5\u20131.5)\u00d71018":[93],"cm\u22123.":[94]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-10-01T08:54:57.152042","created_date":"2016-06-24T00:00:00"}