{"id":"https://openalex.org/W2014957342","doi":"https://doi.org/10.1116/1.1318414","title":"Depolarization Field and Stability Considerations in Thin Ferroelectric Films","display_name":"Depolarization Field and Stability Considerations in Thin Ferroelectric Films","publication_year":1973,"publication_date":"1973-09-01","ids":{"openalex":"https://openalex.org/W2014957342","doi":"https://doi.org/10.1116/1.1318414","mag":"2014957342"},"language":"en","primary_location":{"id":"doi:10.1116/1.1318414","doi":"https://doi.org/10.1116/1.1318414","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.1318414","pdf_url":null,"source":{"id":"https://openalex.org/S52593085","display_name":"Journal of Vacuum Science and Technology","issn_l":"0022-5355","issn":["0022-5355","2331-1754"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science and Technology","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113615470","display_name":"I. P. Batra","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210085935","display_name":"IBM Research - Almaden","ror":"https://ror.org/005w8dd04","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210085935","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"I. P. Batra","raw_affiliation_strings":["IBM Research Laboratory, San Jose, California 95193"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Research Laboratory, San Jose, California 95193","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210085935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111830232","display_name":"P. W\u00fcrfel","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210085935","display_name":"IBM Research - Almaden","ror":"https://ror.org/005w8dd04","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210085935","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Wurfel","raw_affiliation_strings":["IBM Research Laboratory, San Jose, California 95193"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Research Laboratory, San Jose, California 95193","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210085935"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110355967","display_name":"B. D. Silverman","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210085935","display_name":"IBM Research - Almaden","ror":"https://ror.org/005w8dd04","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210085935","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. D. Silverman","raw_affiliation_strings":["IBM Research Laboratory, San Jose, California 95193"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Research Laboratory, San Jose, California 95193","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210085935"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6654,"has_fulltext":false,"cited_by_count":45,"citation_normalized_percentile":{"value":0.78190853,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"10","issue":"5","first_page":"687","last_page":"692"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9854000210762024,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9854000210762024,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.005799999926239252,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11878","display_name":"Solid-state spectroscopy and crystallography","score":0.00279999990016222,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ferroelectric-thin-films","display_name":"ferroelectric thin films","score":0.9330000281333923},{"id":"https://openalex.org/keywords/depolarization-field","display_name":"depolarization field","score":0.9980000257492065},{"id":"https://openalex.org/keywords/phase-stability","display_name":"phase stability","score":0.9539999961853027},{"id":"https://openalex.org/keywords/order-of-phase-transition","display_name":"order of phase transition","score":0.6489999890327454},{"id":"https://openalex.org/keywords/transition-temperature-depression","display_name":"transition temperature depression","score":0.7020000219345093},{"id":"https://openalex.org/keywords/conducting-electrodes","display_name":"conducting electrodes","score":0.6990000009536743},{"id":"https://openalex.org/keywords/semiconductor-electrodes","display_name":"semiconductor electrodes","score":0.9819999933242798},{"id":"https://openalex.org/keywords/landau-theory","display_name":"Landau theory","score":0.925000011920929},{"id":"https://openalex.org/keywords/cooperative-phenomena","display_name":"cooperative phenomena","score":0.7409999966621399}],"concepts":[{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.8705004453659058},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.7954440116882324},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.7364722490310669},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.7088709473609924},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7048075199127197},{"id":"https://openalex.org/C149288129","wikidata":"https://www.wikidata.org/wiki/Q185357","display_name":"Phase transition","level":2,"score":0.6148175597190857},{"id":"https://openalex.org/C4141045","wikidata":"https://www.wikidata.org/wiki/Q83183","display_name":"Depolarization","level":2,"score":0.5864893198013306},{"id":"https://openalex.org/C201144084","wikidata":"https://www.wikidata.org/wiki/Q1626812","display_name":"Landau theory","level":3,"score":0.5317873954772949},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.5192968249320984},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.4546043276786804},{"id":"https://openalex.org/C164154869","wikidata":"https://www.wikidata.org/wiki/Q901927","display_name":"Critical exponent","level":3,"score":0.42649465799331665},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.23025617003440857},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.18242764472961426},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.17848750948905945},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1562890112400055},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14201956987380981},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.06844437122344971},{"id":"https://openalex.org/C134018914","wikidata":"https://www.wikidata.org/wiki/Q162606","display_name":"Endocrinology","level":1,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1116/1.1318414","doi":"https://doi.org/10.1116/1.1318414","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.1318414","pdf_url":null,"source":{"id":"https://openalex.org/S52593085","display_name":"Journal of Vacuum Science and Technology","issn_l":"0022-5355","issn":["0022-5355","2331-1754"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science and Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2035699773","https://openalex.org/W2033376043","https://openalex.org/W2081280785","https://openalex.org/W2588612344","https://openalex.org/W2122908446","https://openalex.org/W1975950916","https://openalex.org/W128310269","https://openalex.org/W4246506543","https://openalex.org/W3023192685","https://openalex.org/W2053830096"],"abstract_inverted_index":{"It":[0],"is":[1,11,72,83],"shown":[2],"that":[3],"the":[4,21,42,50,54,57,66,69,89,92,102],"polarization":[5,43],"in":[6,85],"a":[7,25,33,75],"thin":[8,76],"ferroelectric":[9,26,77],"film":[10,27,37],"always":[12],"incompletely":[13],"compensated.":[14],"The":[15,95],"associated":[16],"depolarization":[17],"field":[18],"significantly":[19],"modifies":[20],"phase":[22,58,70],"stability":[23],"of":[24,28,56,68,91],"sufficiently":[29],"small":[30],"thickness.":[31],"For":[32],"slightly":[34],"conducting":[35],"ferroeletric":[36],"sandwiched":[38],"between":[39],"metallic":[40],"electrodes,":[41,64],"and":[44,99],"transition":[45,59,71],"temperature":[46],"are":[47,97],"depressed":[48],"below":[49],"bulk":[51],"values":[52],"but":[53],"order":[55,67],"remains":[60],"unchanged.":[61],"With":[62],"semiconducting":[63],"even":[65],"modified":[73],"for":[74,104],"film.":[78],"A":[79],"critical":[80],"point":[81],"exponent":[82],"calculated":[84],"each":[86],"case":[87],"within":[88],"framework":[90],"Landau":[93],"Theory.":[94],"results":[96],"compared":[98],"contrasted":[100],"with":[101],"findings":[103],"other":[105],"cooperative":[106],"phenomena.":[107]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}