{"id":"https://openalex.org/W2014843880","doi":"https://doi.org/10.1117/12.2061127","title":"X-ray laminography and SAXS on beryllium grades and lenses and wavefront propagation through imperfect compound refractive lenses","display_name":"X-ray laminography and SAXS on beryllium grades and lenses and wavefront propagation through imperfect compound refractive lenses","publication_year":2014,"publication_date":"2014-09-05","ids":{"openalex":"https://openalex.org/W2014843880","doi":"https://doi.org/10.1117/12.2061127","mag":"2014843880"},"language":"en","primary_location":{"id":"doi:10.1117/12.2061127","doi":"https://doi.org/10.1117/12.2061127","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2061127","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5137096724","display_name":"Thomas Roth","orcid":"https://orcid.org/0000-0003-4937-1067","observed_orcids":["https://orcid.org/0000-0003-4937-1067"]},"institutions":[{"id":"https://openalex.org/I910829146","display_name":"European X-Ray Free-Electron Laser","ror":"https://ror.org/01wp2jz98","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1305996414","https://openalex.org/I160013858","https://openalex.org/I2738703131","https://openalex.org/I2800235667","https://openalex.org/I2801876189","https://openalex.org/I2802499594","https://openalex.org/I4210087105","https://openalex.org/I4210097150","https://openalex.org/I4210124562","https://openalex.org/I4210132216","https://openalex.org/I4210140065","https://openalex.org/I4210142071","https://openalex.org/I4210155236","https://openalex.org/I4387152914","https://openalex.org/I4388482678","https://openalex.org/I910829146"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Roth","raw_affiliation_strings":["European XFEL GmbH (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"European XFEL GmbH (Germany)","institution_ids":["https://openalex.org/I910829146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013254222","display_name":"Lukas Helfen","orcid":"https://orcid.org/0000-0002-5243-2310","observed_orcids":["https://orcid.org/0000-0002-5243-2310"]},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]},{"id":"https://openalex.org/I2801997478","display_name":"European Synchrotron Radiation Facility","ror":"https://ror.org/02550n020","country_code":"FR","type":"facility","lineage":["https://openalex.org/I2801997478"]}],"countries":["DE","FR"],"is_corresponding":false,"raw_author_name":"Lukas Helfen","raw_affiliation_strings":["ESRF - The European Synchrotron (France)","Karlsruher Institut f\u00fcr Technologie (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESRF - The European Synchrotron (France)","institution_ids":["https://openalex.org/I2801997478"]},{"raw_affiliation_string":"Karlsruher Institut f\u00fcr Technologie (Germany)","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020437505","display_name":"J\u00f6rg Hallmann","orcid":"https://orcid.org/0000-0002-1996-397X","observed_orcids":["https://orcid.org/0000-0002-1996-397X"]},"institutions":[{"id":"https://openalex.org/I910829146","display_name":"European X-Ray Free-Electron Laser","ror":"https://ror.org/01wp2jz98","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1305996414","https://openalex.org/I160013858","https://openalex.org/I2738703131","https://openalex.org/I2800235667","https://openalex.org/I2801876189","https://openalex.org/I2802499594","https://openalex.org/I4210087105","https://openalex.org/I4210097150","https://openalex.org/I4210124562","https://openalex.org/I4210132216","https://openalex.org/I4210140065","https://openalex.org/I4210142071","https://openalex.org/I4210155236","https://openalex.org/I4387152914","https://openalex.org/I4388482678","https://openalex.org/I910829146"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J\u00f6rg Hallmann","raw_affiliation_strings":["European XFEL GmbH (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"European XFEL GmbH (Germany)","institution_ids":["https://openalex.org/I910829146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032512817","display_name":"Liubov Samoylova","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I910829146","display_name":"European X-Ray Free-Electron Laser","ror":"https://ror.org/01wp2jz98","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1305996414","https://openalex.org/I160013858","https://openalex.org/I2738703131","https://openalex.org/I2800235667","https://openalex.org/I2801876189","https://openalex.org/I2802499594","https://openalex.org/I4210087105","https://openalex.org/I4210097150","https://openalex.org/I4210124562","https://openalex.org/I4210132216","https://openalex.org/I4210140065","https://openalex.org/I4210142071","https://openalex.org/I4210155236","https://openalex.org/I4387152914","https://openalex.org/I4388482678","https://openalex.org/I910829146"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Liubov Samoylova","raw_affiliation_strings":["European XFEL GmbH (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"European XFEL GmbH (Germany)","institution_ids":["https://openalex.org/I910829146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068493331","display_name":"Pawe\u0142 Kwa\u015bniewski","orcid":"https://orcid.org/0000-0002-5476-4765","observed_orcids":["https://orcid.org/0000-0002-5476-4765"]},"institutions":[{"id":"https://openalex.org/I2801997478","display_name":"European Synchrotron Radiation Facility","ror":"https://ror.org/02550n020","country_code":"FR","type":"facility","lineage":["https://openalex.org/I2801997478"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Pawe\u0142 Kwa\u015bniewski","raw_affiliation_strings":["ESRF - The European Synchrotron (France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESRF - The European Synchrotron (France)","institution_ids":["https://openalex.org/I2801997478"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063422779","display_name":"B. Lengeler","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bruno Lengeler","raw_affiliation_strings":["RXOPTICS (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RXOPTICS (Germany)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035732782","display_name":"Anders L. Madsen","orcid":"https://orcid.org/0000-0001-6594-1029","observed_orcids":["https://orcid.org/0000-0001-6594-1029"]},"institutions":[{"id":"https://openalex.org/I910829146","display_name":"European X-Ray Free-Electron Laser","ror":"https://ror.org/01wp2jz98","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1305996414","https://openalex.org/I160013858","https://openalex.org/I2738703131","https://openalex.org/I2800235667","https://openalex.org/I2801876189","https://openalex.org/I2802499594","https://openalex.org/I4210087105","https://openalex.org/I4210097150","https://openalex.org/I4210124562","https://openalex.org/I4210132216","https://openalex.org/I4210140065","https://openalex.org/I4210142071","https://openalex.org/I4210155236","https://openalex.org/I4387152914","https://openalex.org/I4388482678","https://openalex.org/I910829146"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Anders Madsen","raw_affiliation_strings":["European XFEL GmbH (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"European XFEL GmbH (Germany)","institution_ids":["https://openalex.org/I910829146"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.7224,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.95830954,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"9207","issue":null,"first_page":"920702","last_page":"920702"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10559","display_name":"Particle Accelerators and Free-Electron Lasers","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/x-ray-laminography","display_name":"X-ray laminography","score":0.7649999856948853},{"id":"https://openalex.org/keywords/small-angle-x-ray-scattering","display_name":"small-angle X-ray scattering","score":0.9079999923706055},{"id":"https://openalex.org/keywords/hard-x-ray-free-electron-laser","display_name":"hard X-ray free-electron laser","score":0.8730000257492065},{"id":"https://openalex.org/keywords/wavefront-propagation","display_name":"wavefront propagation","score":0.8420000076293945},{"id":"https://openalex.org/keywords/beam-collimation","display_name":"beam collimation","score":0.6240000128746033},{"id":"https://openalex.org/keywords/wavefront-distortion","display_name":"wavefront distortion","score":0.5099999904632568}],"concepts":[{"id":"https://openalex.org/C506630978","wikidata":"https://www.wikidata.org/wiki/Q569","display_name":"Beryllium","level":2,"score":0.7822561264038086},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7585424184799194},{"id":"https://openalex.org/C165699331","wikidata":"https://www.wikidata.org/wiki/Q461533","display_name":"Wavefront","level":2,"score":0.725035548210144},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6778108477592468},{"id":"https://openalex.org/C34445779","wikidata":"https://www.wikidata.org/wiki/Q1571347","display_name":"Collimated light","level":3,"score":0.6563646793365479},{"id":"https://openalex.org/C15336307","wikidata":"https://www.wikidata.org/wiki/Q1766051","display_name":"Lens (geology)","level":2,"score":0.6173974871635437},{"id":"https://openalex.org/C35655370","wikidata":"https://www.wikidata.org/wiki/Q359639","display_name":"X-ray optics","level":3,"score":0.5219125747680664},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.45650678873062134},{"id":"https://openalex.org/C171635847","wikidata":"https://www.wikidata.org/wiki/Q406983","display_name":"Micrometer","level":2,"score":0.41578441858291626},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.3104317784309387},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.29261288046836853},{"id":"https://openalex.org/C2779328170","wikidata":"https://www.wikidata.org/wiki/Q34777","display_name":"X-ray","level":2,"score":0.24192816019058228},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1117/12.2061127","doi":"https://doi.org/10.1117/12.2061127","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2061127","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},{"id":"pmh:oai:bib-pubdb1.desy.de:206992","doi":null,"is_oa":false,"landing_page_url":"https://bib-pubdb1.desy.de/record/206992","pdf_url":null,"source":{"id":"https://openalex.org/S4306400383","display_name":"DESY Publication Database (PUBDB) (Deutsches Elektronen-Synchrotron)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I2801876189","host_organization_name":"Deutsches Elektronen-Synchrotron DESY","host_organization_lineage":["https://openalex.org/I2801876189"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX<br/>SPIE Optical Engineering + Applications, San Diego, California, 2014-08-17 - 2014-08-17","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:xfel.tind.io:220","doi":null,"is_oa":false,"landing_page_url":"http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1904516","pdf_url":null,"source":{"id":"https://openalex.org/S7407053418","display_name":"European XFEL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I910829146","host_organization_name":"European X-Ray Free-Electron Laser","host_organization_lineage":["https://openalex.org/I910829146"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://xfel.tind.io/record/220","raw_type":"Text"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320887","display_name":"European Synchrotron Radiation Facility","ror":"https://ror.org/02550n020"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1533271328","https://openalex.org/W1556175291","https://openalex.org/W1604284211","https://openalex.org/W1649479756","https://openalex.org/W1964055326","https://openalex.org/W1995428024","https://openalex.org/W2004715111","https://openalex.org/W2008997351","https://openalex.org/W2013706206","https://openalex.org/W2014391799","https://openalex.org/W2015232206","https://openalex.org/W2020616936","https://openalex.org/W2021172500","https://openalex.org/W2022669958","https://openalex.org/W2026946641","https://openalex.org/W2046092121","https://openalex.org/W2047698578","https://openalex.org/W2050757502","https://openalex.org/W2054747370","https://openalex.org/W2059293573","https://openalex.org/W2076931917","https://openalex.org/W2080057049","https://openalex.org/W2084143989","https://openalex.org/W2094716469","https://openalex.org/W2100957184","https://openalex.org/W2147141517","https://openalex.org/W2252849043","https://openalex.org/W6636917146","https://openalex.org/W6652605397"],"related_works":["https://openalex.org/W2994881720","https://openalex.org/W2789462014","https://openalex.org/W7098861182","https://openalex.org/W3103381396","https://openalex.org/W2100957184","https://openalex.org/W2027703099","https://openalex.org/W2977587455","https://openalex.org/W1986677724","https://openalex.org/W1620898614","https://openalex.org/W1965057791"],"abstract_inverted_index":{"Hard":[0],"X-ray":[1,74,104],"free":[2],"electron":[3],"lasers":[4],"provide":[5],"almost":[6],"fully":[7],"transverse":[8],"coherent":[9],"X-rays.":[10],"Though":[11],"the":[12,36,50,53,59,70,73,82,138,144,149,167,181,202,207,210,213,217,227,232],"natural":[13],"divergence":[14],"of":[15,52,72,85,90,95,110,204,212],"these":[16,65,101],"X-rays":[17],"is":[18,56,116,165,224],"a":[19,77,108,117],"few":[20],"micro-radians,":[21],"they":[22],"still":[23],"need":[24],"to":[25,33,49,76,122,136,173,200,220],"be":[26,40],"collimated":[27],"or":[28,61],"focused":[29],"while":[30],"traveling":[31],"up":[32],"1km":[34],"towards":[35],"sample.":[37],"This":[38,164],"can":[39],"done":[41],"with":[42,178],"beryllium":[43,87,145,157],"compound":[44],"refractive":[45],"lenses":[46,93],"(CRLs).":[47],"Due":[48],"coherence":[51],"beam,":[54],"it":[55],"important":[57],"that":[58],"impurities":[60],"granular":[62,141],"boundaries":[63,142],"in":[64,143,180,198,206],"CRLs":[66,208],"do":[67],"not":[68,166],"distort":[69],"wavefront":[71,195,211],"beam":[75],"measurable":[78],"extend.":[79],"We":[80],"measured":[81],"SAXS":[83],"signal":[84],"various":[86],"grades":[88,158],"and":[89,140,222],"2D":[91],"parabolic":[92],"made":[94],"IF-1":[96],"beryllium.":[97],"Then,":[98],"we":[99,193],"imaged":[100],"samples":[102,175],"using":[103],"computed":[105,123],"laminography":[106,115],"at":[107,129],"resolution":[109],"around":[111],"1":[112],"micrometer.":[113],"Computed":[114],"3D":[118],"imaging":[119],"technique":[120],"similar":[121],"tomography,":[124],"but":[125],"particularly":[126],"adapted":[127],"for":[128,156,169],"extended":[130],"objects.":[131],"These":[132],"measurements":[133],"are":[134,153,176],"used":[135],"characterize":[137],"voids":[139,177,205,233],"samples.":[146],"Boundaries":[147],"between":[148],"former":[150],"powder":[151,161],"particles":[152],"easily":[154],"seen":[155],"produced":[159],"via":[160],"metallurgy":[162],"methods.":[163],"case":[168],"cast":[170],"ingots.":[171],"Common":[172],"all":[174],"diameters":[179],"10":[182],"micrometer":[183],"range":[184],"as":[185,187],"well":[186],"smaller":[188],"sized,":[189],"denser":[190],"impurities.":[191],"Finally,":[192],"use":[194],"propagation":[196],"simulations":[197],"order":[199],"analyze":[201],"effect":[203],"on":[209],"XFEL":[214],"beam.":[215],"If":[216],"distance":[218],"\"lens":[219],"focus":[221],"sample\"":[223],"large":[225],"enough,":[226],"diffraction":[228],"patterns":[229],"emerging":[230],"from":[231],"smoothen":[234],"out.":[235]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}