{"id":"https://openalex.org/W2014583091","doi":"https://doi.org/10.1117/12.246840","title":"Deposition of conventional and gradient optical coatings by ECR plasma-enhanced chemical vapor deposition","display_name":"Deposition of conventional and gradient optical coatings by ECR plasma-enhanced chemical vapor deposition","publication_year":1996,"publication_date":"1996-08-19","ids":{"openalex":"https://openalex.org/W2014583091","doi":"https://doi.org/10.1117/12.246840","mag":"2014583091"},"language":"en","primary_location":{"id":"doi:10.1117/12.246840","doi":"https://doi.org/10.1117/12.246840","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.246840","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052833091","display_name":"Pavel V. Bulkin","orcid":"https://orcid.org/0000-0001-5591-3470","observed_orcids":["https://orcid.org/0000-0001-5591-3470"]},"institutions":[{"id":"https://openalex.org/I142476485","display_name":"\u00c9cole Polytechnique","ror":"https://ror.org/05hy3tk52","country_code":"FR","type":"education","lineage":["https://openalex.org/I142476485","https://openalex.org/I4210145102"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Pavel V. Bulkin","raw_affiliation_strings":["Rand Afrikaans Univ. (South Africa)  and Ecole Polytechnique (France) (France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rand Afrikaans Univ. (South Africa)  and Ecole Polytechnique (France) (France)","institution_ids":["https://openalex.org/I142476485"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046828644","display_name":"Pieter L. Swart","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Pieter L. Swart","raw_affiliation_strings":["Rand Afrikaans Univ. (South Africa)","Rand Afrikaans University, South Africa"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rand Afrikaans Univ. (South Africa)","institution_ids":[]},{"raw_affiliation_string":"Rand Afrikaans University, South Africa","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108465140","display_name":"Beatrys M. Lacquet","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Beatrys M. Lacquet","raw_affiliation_strings":["Rand Afrikaans Univ. (South Africa)","Rand Afrikaans University, South Africa"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rand Afrikaans Univ. (South Africa)","institution_ids":[]},{"raw_affiliation_string":"Rand Afrikaans University, South Africa","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111557922","display_name":"Anatoli A. Chtcherbakov","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Anatoli A. Chtcherbakov","raw_affiliation_strings":["Rand Afrikaans Univ. (South Africa)","Rand Afrikaans University, South Africa"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rand Afrikaans Univ. (South Africa)","institution_ids":[]},{"raw_affiliation_string":"Rand Afrikaans University, South Africa","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.3953,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.86254296,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"2776","issue":null,"first_page":"126","last_page":"126"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electron-cyclotron-resonance-plasma","display_name":"electron cyclotron resonance plasma","score":0.8949999809265137},{"id":"https://openalex.org/keywords/plasma-enhanced-chemical-vapor-deposition","display_name":"plasma-enhanced chemical vapor deposition","score":0.9319999814033508},{"id":"https://openalex.org/keywords/optical-interference-coatings","display_name":"interference coatings","score":0.7480000257492065},{"id":"https://openalex.org/keywords/rugate-filters","display_name":"rugate filters","score":0.7080000042915344},{"id":"https://openalex.org/keywords/antireflection-coatings","display_name":"antireflection coatings","score":0.9700000286102295},{"id":"https://openalex.org/keywords/silicon-oxynitride","display_name":"silicon oxynitride","score":0.8050000071525574},{"id":"https://openalex.org/keywords/refractive-index-profile","display_name":"refractive index profile","score":0.7979999780654907},{"id":"https://openalex.org/keywords/multilayer-coatings","display_name":"multilayer coatings","score":0.7089999914169312},{"id":"https://openalex.org/keywords/optical-constants","display_name":"optical constants","score":0.765999972820282}],"concepts":[{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.807071328163147},{"id":"https://openalex.org/C57410435","wikidata":"https://www.wikidata.org/wiki/Q505668","display_name":"Chemical vapor deposition","level":2,"score":0.756019115447998},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7321243286132812},{"id":"https://openalex.org/C175361016","wikidata":"https://www.wikidata.org/wiki/Q245591","display_name":"Electron cyclotron resonance","level":3,"score":0.7043801546096802},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.6351990103721619},{"id":"https://openalex.org/C38347018","wikidata":"https://www.wikidata.org/wiki/Q905958","display_name":"Plasma-enhanced chemical vapor deposition","level":3,"score":0.5412554144859314},{"id":"https://openalex.org/C71597924","wikidata":"https://www.wikidata.org/wiki/Q2890543","display_name":"Optical coating","level":3,"score":0.5116934776306152},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.48700767755508423},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.4852616488933563},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.4395981431007385},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.4242340326309204},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4240036606788635},{"id":"https://openalex.org/C145738678","wikidata":"https://www.wikidata.org/wiki/Q4364316","display_name":"Plasma processing","level":3,"score":0.4197959303855896},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.38457804918289185},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.149713397026062},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1372394859790802},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2816523","wikidata":"https://www.wikidata.org/wiki/Q180184","display_name":"Sediment","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1117/12.246840","doi":"https://doi.org/10.1117/12.246840","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.246840","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00915379v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-00915379","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Developments in Optical Component Coatings, 1996, United Kingdom. pp.126","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1964445894","https://openalex.org/W1965892542","https://openalex.org/W1965977099","https://openalex.org/W1971214381","https://openalex.org/W1979583573","https://openalex.org/W2015690115","https://openalex.org/W2022412733","https://openalex.org/W2029363537","https://openalex.org/W2030212236","https://openalex.org/W2040494460","https://openalex.org/W2064240280","https://openalex.org/W2066251287","https://openalex.org/W2068499173","https://openalex.org/W2073011681","https://openalex.org/W2076165976","https://openalex.org/W2083840698","https://openalex.org/W2091376655","https://openalex.org/W2093723522","https://openalex.org/W2109834745","https://openalex.org/W2132241801","https://openalex.org/W2164280110","https://openalex.org/W2284722334","https://openalex.org/W3162752772"],"related_works":["https://openalex.org/W2093723522","https://openalex.org/W2474268074","https://openalex.org/W2020149492","https://openalex.org/W2021920081","https://openalex.org/W2086694395","https://openalex.org/W2008633515","https://openalex.org/W3049511316","https://openalex.org/W1977049788","https://openalex.org/W2040494460","https://openalex.org/W2001552974"],"abstract_inverted_index":{"The":[0,46],"computer-controlled":[1],"electron":[2],"cyclotron":[3],"resonance":[4],"plasma":[5],"enhanced":[6],"chemical":[7],"vapor":[8],"deposition":[9],"of":[10,17,48,56],"SiOxNy":[11],"was":[12,50],"used":[13],"for":[14],"the":[15,57],"manufacturing":[16],"optical":[18,35,54],"interference":[19,36],"coatings":[20,43,49],"with":[21],"inhomogeneous":[22],"and":[23,38],"traditional":[24],"multilayer":[25],"refractive":[26,40],"index":[27,41],"profiles.":[28],"Such":[29],"complex":[30],"structures":[31],"as":[32],"triple-band":[33],"rugate":[34],"filters":[37],"graded":[39],"antireflection":[42],"were":[44],"grown.":[45],"design":[47],"performed":[51],"using":[52],"measured":[53],"constants":[55],"SiOxNy-system.":[58]},"counts_by_year":[{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-25T09:29:13.331239","created_date":"2016-06-24T00:00:00"}
