{"id":"https://openalex.org/W2014411945","doi":"https://doi.org/10.1117/12.862547","title":"Electrical and optical characterization of InAs/GaSb-based nBn IR detector","display_name":"Electrical and optical characterization of InAs/GaSb-based nBn IR detector","publication_year":2010,"publication_date":"2010-08-17","ids":{"openalex":"https://openalex.org/W2014411945","doi":"https://doi.org/10.1117/12.862547","mag":"2014411945"},"language":"en","primary_location":{"id":"doi:10.1117/12.862547","doi":"https://doi.org/10.1117/12.862547","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.862547","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111411916","display_name":"Vincent M. Cowan","orcid":"https://orcid.org/0000-0002-5898-3156","observed_orcids":["https://orcid.org/0000-0002-5898-3156"]},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vincent M. Cowan","raw_affiliation_strings":["Air Force Research Lab, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Lab, United States","institution_ids":["https://openalex.org/I1280414376"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035364698","display_name":"Christian Paul Morath","orcid":"https://orcid.org/0000-0001-5838-9301","observed_orcids":["https://orcid.org/0000-0001-5838-9301"]},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Christian P. Morath","raw_affiliation_strings":["Air Force Research Lab, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Lab, United States","institution_ids":["https://openalex.org/I1280414376"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010439384","display_name":"Seth M. Swift","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seth M. Swift","raw_affiliation_strings":["Air Force Research Lab, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Lab, United States","institution_ids":["https://openalex.org/I1280414376"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066968071","display_name":"Paul D. LeVan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Paul D. LeVan","raw_affiliation_strings":["Air Force Research Lab, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Lab, United States","institution_ids":["https://openalex.org/I1280414376"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Stephen Myers","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stephen Myers","raw_affiliation_strings":["Univ. of New Mexico (United States)","University of New Mexico,, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of New Mexico (United States)","institution_ids":["https://openalex.org/I169521973"]},{"raw_affiliation_string":"University of New Mexico,, United States","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013781588","display_name":"Elena A. Plis","orcid":"https://orcid.org/0000-0002-1055-5654","observed_orcids":["https://orcid.org/0000-0002-1055-5654"]},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Elena Plis","raw_affiliation_strings":["Univ. of New Mexico (United States)","University of New Mexico,, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of New Mexico (United States)","institution_ids":["https://openalex.org/I169521973"]},{"raw_affiliation_string":"University of New Mexico,, United States","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015117032","display_name":"Sanjay Krishna","orcid":"https://orcid.org/0000-0002-3889-4893","observed_orcids":["https://orcid.org/0000-0002-3889-4893"]},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanjay Krishna","raw_affiliation_strings":["Univ. of New Mexico (United States)","University of New Mexico,, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of New Mexico (United States)","institution_ids":["https://openalex.org/I169521973"]},{"raw_affiliation_string":"University of New Mexico,, United States","institution_ids":["https://openalex.org/I169521973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8556,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.66921385,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":93},"biblio":{"volume":"7780","issue":null,"first_page":"778006","last_page":"778006"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dark-current","display_name":"dark current","score":0.8650000095367432},{"id":"https://openalex.org/keywords/generation-recombination-current","display_name":"generation-recombination current","score":0.9819999933242798},{"id":"https://openalex.org/keywords/diffusion-current","display_name":"diffusion current","score":0.8149999976158142},{"id":"https://openalex.org/keywords/surface-leakage-current","display_name":"surface leakage current","score":0.8640000224113464},{"id":"https://openalex.org/keywords/activation-energy","display_name":"activation energy","score":0.6990000009536743},{"id":"https://openalex.org/keywords/electrical-characterization","display_name":"electrical characterization","score":0.46799999475479126},{"id":"https://openalex.org/keywords/optical-response","display_name":"optical response","score":0.9290000200271606},{"id":"https://openalex.org/keywords/low-temperature-operation","display_name":"low-temperature operation","score":0.48899999260902405}],"concepts":[{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.8237743377685547},{"id":"https://openalex.org/C2778959120","wikidata":"https://www.wikidata.org/wiki/Q422717","display_name":"Mercury cadmium telluride","level":3,"score":0.789844274520874},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.7601721286773682},{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.6934096813201904},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6861199140548706},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.6134703755378723},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6128028631210327},{"id":"https://openalex.org/C2781249499","wikidata":"https://www.wikidata.org/wiki/Q418807","display_name":"Gallium antimonide","level":3,"score":0.4897639751434326},{"id":"https://openalex.org/C2781300407","wikidata":"https://www.wikidata.org/wiki/Q418583","display_name":"Indium arsenide","level":3,"score":0.48302707076072693},{"id":"https://openalex.org/C131321042","wikidata":"https://www.wikidata.org/wiki/Q656685","display_name":"Operating temperature","level":2,"score":0.4793189764022827},{"id":"https://openalex.org/C105382558","wikidata":"https://www.wikidata.org/wiki/Q332431","display_name":"Superlattice","level":2,"score":0.475683331489563},{"id":"https://openalex.org/C126231374","wikidata":"https://www.wikidata.org/wiki/Q1061298","display_name":"Operability","level":2,"score":0.44389113783836365},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4379289150238037},{"id":"https://openalex.org/C510052550","wikidata":"https://www.wikidata.org/wiki/Q422819","display_name":"Gallium arsenide","level":2,"score":0.36899417638778687},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2370460331439972},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16188758611679077},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14968353509902954},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.08640354871749878},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.862547","doi":"https://doi.org/10.1117/12.862547","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.862547","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320338279","display_name":"Air Force Office of Scientific Research","ror":"https://ror.org/011e9bt93"},{"id":"https://openalex.org/F4320338294","display_name":"Air Force Research Laboratory","ror":"https://ror.org/02e2egq70"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2544993803","https://openalex.org/W2073052302","https://openalex.org/W2147423866","https://openalex.org/W2060486902","https://openalex.org/W2058204498","https://openalex.org/W2973005962","https://openalex.org/W1965209478","https://openalex.org/W4404178057","https://openalex.org/W4391032897","https://openalex.org/W2996086164"],"abstract_inverted_index":{"Over":[0],"the":[1,5,90,98,102,126,158,184,188,192,196,202,206,223,231,235],"last":[2],"several":[3,40],"years":[4],"development":[6],"of":[7,129,133,163,168,187,205,216],"type-II":[8],"Strained":[9],"Layer":[10],"Superlattice":[11],"(SLS)":[12],"infrared":[13],"photodetectors":[14],"has":[15,57,117],"yielded":[16],"devices":[17],"that":[18,34,60,110],"may":[19],"offer":[20],"plausible":[21],"alternative":[22],"technology":[23,109],"to":[24,84,120,229],"conventional":[25,61],"mercury":[26],"cadmium":[27],"telluride":[28],"(MCT)-based":[29],"photodetectors.":[30],"Prevailing":[31],"theory":[32],"predicts":[33],"SLS-based":[35],"detector":[36,166,209],"technologies":[37],"will":[38],"have":[39,67],"potential":[41],"advantages":[42,128,132],"over":[43,135,212,222],"MCT":[44,136],"technologies,":[45],"including":[46],"lower":[47],"dark":[48,69,87,122],"currents":[49],"and":[50,63,71,94,142,160,174,191],"higher":[51],"operating":[52,217],"temperatures.":[53],"However,":[54],"experimentally":[55],"it":[56],"been":[58,118],"found":[59],"p-on-n":[62],"n-on-p":[64],"SLS":[65,134,171],"detectors":[66],"high":[68,86],"current":[70,88,93,194,220],"thus,":[72],"do":[73],"not":[74],"reach":[75],"theoretically":[76],"predicted":[77],"performance":[78],"benchmarks.":[79],"The":[80],"two":[81],"prevailing":[82],"contributors":[83],"this":[85],"are":[89],"generation-recombination":[91],"(GR)":[92],"surface":[95],"leakage":[96],"currents,":[97],"latter":[99],"resulting":[100],"from":[101],"mesa":[103],"sidewall":[104],"exposure.":[105],"A":[106],"recently":[107],"emerging":[108],"utilizes":[111],"a":[112,146,213],"uni-polar":[113],"barrier":[114,180],"design":[115],"nBn":[116,165,197,208],"shown":[119],"reduce":[121],"current,":[123,190],"while":[124],"keeping":[125],"inherent":[127],"SLS.":[130],"Specific":[131],"include":[137,183],"wavelength":[138],"tunability,":[139],"improved":[140],"uniformity,":[141],"operability":[143],"potentially":[144],"at":[145,210],"reduced":[147],"manufacturing":[148],"cost.":[149],"This":[150],"report":[151],"presents":[152],"some":[153],"recent":[154],"experimental":[155],"findings":[156],"for":[157,195],"electrical":[159],"optical":[161,203],"response":[162,204],"an":[164,169,178],"composed":[167],"InAs/GaSb":[170,207],"absorber":[172],"(n)":[173,176],"contacts":[175],"with":[177],"AlGaSb":[179],"(B).":[181],"Results":[182],"intrinsic":[185],"determination":[186],"diffusion":[189],"GR":[193],"device.":[198],"Also":[199],"presented":[200],"is":[201],"77K":[211],"broad":[214],"range":[215,226],"biases.":[218],"Dark":[219],"measurements":[221],"10K-300K":[224],"temperature":[225],"were":[227],"undertaken":[228],"extract":[230],"activation":[232],"energies":[233],"in":[234],"heterostructure.":[236]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}