{"id":"https://openalex.org/W2014010346","doi":"https://doi.org/10.1109/iedm.2011.6131657","title":"Advanced channel engineering achieving aggressive reduction of VT variation for ultra-low-power applications","display_name":"Advanced channel engineering achieving aggressive reduction of VT variation for ultra-low-power applications","publication_year":2011,"publication_date":"2011-12-01","ids":{"openalex":"https://openalex.org/W2014010346","doi":"https://doi.org/10.1109/iedm.2011.6131657","mag":"2014010346"},"language":"en","primary_location":{"id":"doi:10.1109/iedm.2011.6131657","doi":"https://doi.org/10.1109/iedm.2011.6131657","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iedm.2011.6131657","pdf_url":null,"source":{"id":"https://openalex.org/S4210168112","display_name":"Technical digest - International Electron Devices Meeting/Technical digest","issn_l":"0163-1918","issn":["0163-1918","2156-017X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 International Electron Devices Meeting","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113626762","display_name":"K. Fujita","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},{"id":"https://openalex.org/I4405284546","display_name":"Fujitsu Semiconductor (Japan)","ror":"https://ror.org/03rxn7c50","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4405284546"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Fujita","raw_affiliation_strings":["Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","institution_ids":["https://openalex.org/I4405284546"]},{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000418602","display_name":"Y. Torii","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},{"id":"https://openalex.org/I4405284546","display_name":"Fujitsu Semiconductor (Japan)","ror":"https://ror.org/03rxn7c50","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4405284546"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Torii","raw_affiliation_strings":["Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","institution_ids":["https://openalex.org/I4405284546"]},{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082353237","display_name":"Mitsuaki Hori","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},{"id":"https://openalex.org/I4405284546","display_name":"Fujitsu Semiconductor (Japan)","ror":"https://ror.org/03rxn7c50","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4405284546"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Hori","raw_affiliation_strings":["Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","institution_ids":["https://openalex.org/I4405284546"]},{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063334466","display_name":"Jungwoo Oh","orcid":"https://orcid.org/0000-0002-6065-6250","observed_orcids":["https://orcid.org/0000-0002-6065-6250"]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},{"id":"https://openalex.org/I4405284546","display_name":"Fujitsu Semiconductor (Japan)","ror":"https://ror.org/03rxn7c50","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4405284546"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"J. Oh","raw_affiliation_strings":["Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","institution_ids":["https://openalex.org/I4405284546"]},{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043208867","display_name":"L. Shifren","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"L. Shifren","raw_affiliation_strings":["Suvolta Inc., Los Gatos, CA, USA","Suvolta Inc., 130 Knowles Drive, Los Gatos, California 95032, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Suvolta Inc., Los Gatos, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Suvolta Inc., 130 Knowles Drive, Los Gatos, California 95032, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077642267","display_name":"P. Ranade","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P. Ranade","raw_affiliation_strings":["Suvolta Inc., Los Gatos, CA, USA","Suvolta Inc., 130 Knowles Drive, Los Gatos, California 95032, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Suvolta Inc., Los Gatos, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Suvolta Inc., 130 Knowles Drive, Los Gatos, California 95032, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"M. Nakagawa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405284546","display_name":"Fujitsu Semiconductor (Japan)","ror":"https://ror.org/03rxn7c50","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4405284546"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Nakagawa","raw_affiliation_strings":["Fujitsu Semiconductor Limited, Akiruno, Tokyo, Japan","50 Fuchigami, Akiruno Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Limited, Akiruno, Tokyo, Japan","institution_ids":["https://openalex.org/I4405284546"]},{"raw_affiliation_string":"50 Fuchigami, Akiruno Tokyo, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"K. Okabe","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},{"id":"https://openalex.org/I4405284546","display_name":"Fujitsu Semiconductor (Japan)","ror":"https://ror.org/03rxn7c50","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4405284546"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Okabe","raw_affiliation_strings":["Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","institution_ids":["https://openalex.org/I4405284546"]},{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112090169","display_name":"Takushi Miyake","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},{"id":"https://openalex.org/I4405284546","display_name":"Fujitsu Semiconductor (Japan)","ror":"https://ror.org/03rxn7c50","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4405284546"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Miyake","raw_affiliation_strings":["Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","institution_ids":["https://openalex.org/I4405284546"]},{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088593794","display_name":"K. Ohkoshi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},{"id":"https://openalex.org/I4405284546","display_name":"Fujitsu Semiconductor (Japan)","ror":"https://ror.org/03rxn7c50","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4405284546"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Ohkoshi","raw_affiliation_strings":["Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","institution_ids":["https://openalex.org/I4405284546"]},{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026795290","display_name":"M. Kuramae","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},{"id":"https://openalex.org/I4405284546","display_name":"Fujitsu Semiconductor (Japan)","ror":"https://ror.org/03rxn7c50","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4405284546"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Kuramae","raw_affiliation_strings":["Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","institution_ids":["https://openalex.org/I4405284546"]},{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060888275","display_name":"Toshihiko Mori","orcid":"https://orcid.org/0000-0003-0421-2740","observed_orcids":["https://orcid.org/0000-0003-0421-2740"]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},{"id":"https://openalex.org/I4405284546","display_name":"Fujitsu Semiconductor (Japan)","ror":"https://ror.org/03rxn7c50","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4405284546"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Mori","raw_affiliation_strings":["Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","institution_ids":["https://openalex.org/I4405284546"]},{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014145082","display_name":"T. Tsuruta","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405284546","display_name":"Fujitsu Semiconductor (Japan)","ror":"https://ror.org/03rxn7c50","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4405284546"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Tsuruta","raw_affiliation_strings":["Fujitsu Semiconductor Limited, Akiruno, Tokyo, Japan","50 Fuchigami, Akiruno Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Limited, Akiruno, Tokyo, Japan","institution_ids":["https://openalex.org/I4405284546"]},{"raw_affiliation_string":"50 Fuchigami, Akiruno Tokyo, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"S. Thompson","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Thompson","raw_affiliation_strings":["Suvolta Inc., Los Gatos, CA, USA","Suvolta Inc., 130 Knowles Drive, Los Gatos, California 95032, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Suvolta Inc., Los Gatos, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Suvolta Inc., 130 Knowles Drive, Los Gatos, California 95032, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014709414","display_name":"Taiji Ema","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},{"id":"https://openalex.org/I4405284546","display_name":"Fujitsu Semiconductor (Japan)","ror":"https://ror.org/03rxn7c50","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349","https://openalex.org/I4405284546"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Ema","raw_affiliation_strings":["Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Limited, Kuwana, Mie, Japan","institution_ids":["https://openalex.org/I4405284546"]},{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., 1500 Mizono, Tado, Kuwana Mi\u00e9, Japan","institution_ids":["https://openalex.org/I2252096349"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":10.1859,"has_fulltext":false,"cited_by_count":59,"citation_normalized_percentile":{"value":0.99065899,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"32.3.1","last_page":"32.3.4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.6172000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.6172000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.3765000104904175,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.002400000113993883,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/threshold-voltage-variation","display_name":"threshold voltage variation","score":0.9419999718666077},{"id":"https://openalex.org/keywords/ultra-low-power-circuits","display_name":"ultra-low-power circuits","score":0.5680000185966492},{"id":"https://openalex.org/keywords/65-nm-cmos","display_name":"65 nm CMOS","score":0.8349999785423279},{"id":"https://openalex.org/keywords/low-temperature-processing","display_name":"low-temperature processing","score":0.6470000147819519},{"id":"https://openalex.org/keywords/transistor-matching","display_name":"transistor matching","score":0.7260000109672546}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5222421884536743},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4815657436847687},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.4744071662425995},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4645514190196991},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3786296248435974},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34566396474838257},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.32591933012008667},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31481653451919556},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.20717743039131165},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17273855209350586},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16438370943069458},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.15149930119514465},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06951406598091125},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iedm.2011.6131657","doi":"https://doi.org/10.1109/iedm.2011.6131657","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iedm.2011.6131657","pdf_url":null,"source":{"id":"https://openalex.org/S4210168112","display_name":"Technical digest - International Electron Devices Meeting/Technical digest","issn_l":"0163-1918","issn":["0163-1918","2156-017X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 International Electron Devices Meeting","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1889226263","https://openalex.org/W2107529859","https://openalex.org/W2111993105","https://openalex.org/W2112602631","https://openalex.org/W2114131053","https://openalex.org/W2123949733","https://openalex.org/W2125347149","https://openalex.org/W2132421515","https://openalex.org/W2161648718","https://openalex.org/W2163739201","https://openalex.org/W6639680632"],"related_works":["https://openalex.org/W2070767174","https://openalex.org/W2044955139","https://openalex.org/W2037445273","https://openalex.org/W2755540390","https://openalex.org/W1588173615","https://openalex.org/W1543119659","https://openalex.org/W2016820881","https://openalex.org/W7062271973","https://openalex.org/W3140860963","https://openalex.org/W2540572138"],"abstract_inverted_index":{"We":[0],"have":[1],"achieved":[2],"aggressive":[3],"reduction":[4,44],"of":[5,45,69],"VTvariation":[6,46],"and":[7,38,65],"VDD-minby":[8],"a":[9],"sophisticated":[10],"planar":[11],"bulk":[12],"MOSFET":[13],"named":[14],"\u2018Deeply":[15],"Depleted":[16],"Channel":[17],"\u2122":[18],"(DDC)\u2019.":[19],"The":[20,42],"DDC":[21],"transistor":[22],"has":[23,49],"been":[24,50],"successfully":[25],"integrated":[26],"into":[27],"an":[28],"existing":[29],"65nm":[30],"CMOS":[31],"platform":[32],"by":[33,52],"combining":[34],"layered":[35],"channel":[36],"formation":[37],"low":[39],"temperature":[40],"processing.":[41],"2x":[43,57],"in":[47,59],"65nm-node":[48],"demonstrated":[51],"matching":[53],"SRAM":[54,60,71],"pair":[55],"transistors,":[56],"improvement":[58],"static":[61],"noise":[62],"margin":[63],"(SNM)":[64],"300":[66],"mV":[67],"VDD-minreduction":[68],"576Kb":[70],"macros":[72],"to":[73],"0.425":[74],"V":[75],"using":[76],"conventional":[77],"6T":[78],"cell":[79],"layout.":[80]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":9},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":14},{"year":2013,"cited_by_count":9},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}