{"id":"https://openalex.org/W2013337024","doi":"https://doi.org/10.1063/1.3334727","title":"Modification of magnetic properties through the control of growth orientation and epitaxial strain in SrRuO3 thin films","display_name":"Modification of magnetic properties through the control of growth orientation and epitaxial strain in SrRuO3 thin films","publication_year":2010,"publication_date":"2010-03-08","ids":{"openalex":"https://openalex.org/W2013337024","doi":"https://doi.org/10.1063/1.3334727","mag":"2013337024"},"language":"en","primary_location":{"id":"doi:10.1063/1.3334727","doi":"https://doi.org/10.1063/1.3334727","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.3334727","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060171785","display_name":"B.W. Lee","orcid":"https://orcid.org/0000-0001-7424-425X","observed_orcids":["https://orcid.org/0000-0001-7424-425X"]},"institutions":[{"id":"https://openalex.org/I83436808","display_name":"Hankuk University of Foreign Studies","ror":"https://ror.org/051q2m369","country_code":"KR","type":"education","lineage":["https://openalex.org/I83436808"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"B. W. Lee","raw_affiliation_strings":["Hankuk University of Foreign Studies Department of Physics, , Yongin 449-791, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hankuk University of Foreign Studies Department of Physics, , Yongin 449-791, Republic of Korea","institution_ids":["https://openalex.org/I83436808"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102012149","display_name":"Chang Uk Jung","orcid":"https://orcid.org/0000-0002-9192-1184","observed_orcids":["https://orcid.org/0000-0002-9192-1184"]},"institutions":[{"id":"https://openalex.org/I83436808","display_name":"Hankuk University of Foreign Studies","ror":"https://ror.org/051q2m369","country_code":"KR","type":"education","lineage":["https://openalex.org/I83436808"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"C. U. Jung","raw_affiliation_strings":["Hankuk University of Foreign Studies Department of Physics, , Yongin 449-791, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hankuk University of Foreign Studies Department of Physics, , Yongin 449-791, Republic of Korea","institution_ids":["https://openalex.org/I83436808"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I83436808"],"apc_list":null,"apc_paid":null,"fwci":1.1195,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.74923171,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":97},"biblio":{"volume":"96","issue":"10","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.9336000084877014,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.9336000084877014,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10886","display_name":"Multiferroics and related materials","score":0.029200000688433647,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10607","display_name":"Magnetic and transport properties of perovskites and related materials","score":0.025299999862909317,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/srruo3-thin-films","display_name":"SrRuO3 thin films","score":0.9610000252723694},{"id":"https://openalex.org/keywords/growth-direction","display_name":"growth orientation","score":0.6259999871253967},{"id":"https://openalex.org/keywords/epitaxial-strain","display_name":"epitaxial strain","score":0.9990000128746033},{"id":"https://openalex.org/keywords/magnetic-properties","display_name":"magnetic properties","score":0.9129999876022339},{"id":"https://openalex.org/keywords/srtio3-110-substrate","display_name":"SrTiO3 (110) substrate","score":0.9139999747276306},{"id":"https://openalex.org/keywords/buffer-layer","display_name":"buffer layer","score":0.7450000047683716},{"id":"https://openalex.org/keywords/cahfo3","display_name":"CaHfO3","score":0.7760000228881836},{"id":"https://openalex.org/keywords/structural-distortion","display_name":"structural distortion","score":0.875},{"id":"https://openalex.org/keywords/ruthenium-oxide","display_name":"ruthenium oxide","score":0.5519999861717224}],"concepts":[{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.7983839511871338},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7535730600357056},{"id":"https://openalex.org/C37243968","wikidata":"https://www.wikidata.org/wiki/Q648961","display_name":"Orthorhombic crystal system","level":3,"score":0.7398725748062134},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.6281557083129883},{"id":"https://openalex.org/C16345878","wikidata":"https://www.wikidata.org/wiki/Q107472979","display_name":"Orientation (vector space)","level":2,"score":0.48669272661209106},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.44885632395744324},{"id":"https://openalex.org/C2778022156","wikidata":"https://www.wikidata.org/wiki/Q576145","display_name":"Strain (injury)","level":2,"score":0.4426080286502838},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.4058187007904053},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3200562596321106},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.28054842352867126},{"id":"https://openalex.org/C115624301","wikidata":"https://www.wikidata.org/wiki/Q895901","display_name":"Crystal structure","level":2,"score":0.2389143705368042},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.19547152519226074},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.3334727","doi":"https://doi.org/10.1063/1.3334727","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.3334727","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1977928563","https://openalex.org/W1988766904","https://openalex.org/W2001281239","https://openalex.org/W2007809712","https://openalex.org/W2016834906","https://openalex.org/W2017444484","https://openalex.org/W2035664282","https://openalex.org/W2036601908","https://openalex.org/W2069698966","https://openalex.org/W2075963295","https://openalex.org/W2150452548","https://openalex.org/W2241100365"],"related_works":["https://openalex.org/W2078277179","https://openalex.org/W71458628","https://openalex.org/W2776639242","https://openalex.org/W3018207358","https://openalex.org/W7095160718","https://openalex.org/W2214505330","https://openalex.org/W2016834906","https://openalex.org/W1482294466","https://openalex.org/W2326903509","https://openalex.org/W2001281239"],"abstract_inverted_index":{"We":[0],"studied":[1],"the":[2,5,9,19,92,96],"correlation":[3],"between":[4],"magnetic":[6,84],"properties":[7,85],"and":[8,60,79],"structural":[10,93],"modifications":[11],"in":[12,24],"SrRuO3":[13,25,42,55,97],"thin":[14,26,98],"films.":[15,99],"Previous":[16],"results":[17],"on":[18,44,72],"control":[20],"of":[21,70,95],"growth":[22,37,62],"orientation":[23],"film":[27,43],"have":[28],"been":[29],"rather":[30],"limited.":[31],"For":[32],"example,":[33],"only":[34],"orthorhombic":[35],"a-axis":[36],"could":[38],"be":[39],"obtained":[40],"for":[41],"SrTiO3":[45,73],"(110)":[46,74],"substrates.":[47],"Here":[48],"we":[49],"were":[50,86],"able":[51],"to":[52,88],"obtain":[53],"various":[54],"films":[56],"with":[57,67,91],"(100)o,":[58],"(010)o,":[59],"(111)o":[61],"orientations,":[63],"as":[64,66],"well":[65],"different":[68],"amount":[69],"strain":[71],"substrates":[75],"by":[76],"using":[77],"(Ca,Sr)SnO3":[78],"CaHfO3":[80],"buffer":[81],"layers.":[82],"The":[83],"found":[87],"change":[89],"systematically":[90],"distortion":[94]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2026-09-26T08:19:03.415552","created_date":"2016-06-24T00:00:00"}