{"id":"https://openalex.org/W2013195116","doi":"https://doi.org/10.1364/oe.18.011456","title":"Sensitivity increase for coating thickness determination using THz waveguides","display_name":"Sensitivity increase for coating thickness determination using THz waveguides","publication_year":2010,"publication_date":"2010-05-14","ids":{"openalex":"https://openalex.org/W2013195116","doi":"https://doi.org/10.1364/oe.18.011456","mag":"2013195116","pmid":"https://pubmed.ncbi.nlm.nih.gov/20589006"},"language":"en","primary_location":{"id":"doi:10.1364/oe.18.011456","doi":"https://doi.org/10.1364/oe.18.011456","is_oa":true,"landing_page_url":"https://doi.org/10.1364/oe.18.011456","pdf_url":null,"source":{"id":"https://openalex.org/S178776955","display_name":"Optics Express","issn_l":"1094-4087","issn":["1094-4087"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-b","jufo-1","ki-jl-1","medline","norway-2","oarl","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics Express","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1364/oe.18.011456","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074975457","display_name":"Michael Theuer","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I115475287","display_name":"Oklahoma State University","ror":"https://ror.org/01g9vbr38","country_code":"US","type":"education","lineage":["https://openalex.org/I115475287"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Theuer","raw_affiliation_strings":["1Oklahoma State University, School of Electrical & Computer Engineering, Stillwater, OK 74078, USA","Oklahoma State University, School of Electrical and Computer Engineering , Stillwater, OK 74078 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"1Oklahoma State University, School of Electrical & Computer Engineering, Stillwater, OK 74078, USA","institution_ids":["https://openalex.org/I115475287"]},{"raw_affiliation_string":"Oklahoma State University, School of Electrical and Computer Engineering , Stillwater, OK 74078 USA","institution_ids":["https://openalex.org/I115475287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055887732","display_name":"R. Beigang","orcid":"https://orcid.org/0000-0002-4394-2730","observed_orcids":["https://orcid.org/0000-0002-4394-2730"]},"institutions":[{"id":"https://openalex.org/I4210088263","display_name":"Fraunhofer Institute for Physical Measurement Techniques","ror":"https://ror.org/004n2nr09","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210088263","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"R. Beigang","raw_affiliation_strings":["Fraunhofer Institute for Physical Measurement Techniques, Department of Terahertz Measurement and Systems, 67663 Kaiserslautern, Rhineland-Palatinate, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Physical Measurement Techniques, Department of Terahertz Measurement and Systems, 67663 Kaiserslautern, Rhineland-Palatinate, Germany","institution_ids":["https://openalex.org/I4210088263"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075084290","display_name":"D. Grischkowsky","orcid":"https://orcid.org/0000-0001-6460-7512","observed_orcids":["https://orcid.org/0000-0001-6460-7512"]},"institutions":[{"id":"https://openalex.org/I115475287","display_name":"Oklahoma State University","ror":"https://ror.org/01g9vbr38","country_code":"US","type":"education","lineage":["https://openalex.org/I115475287"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Grischkowsky","raw_affiliation_strings":["Oklahoma State University, School of Electrical and Computer Engineering , Stillwater, OK 74078 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Oklahoma State University, School of Electrical and Computer Engineering , Stillwater, OK 74078 USA","institution_ids":["https://openalex.org/I115475287"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2270,"currency":"USD","value_usd":2270},"apc_paid":{"value":2270,"currency":"USD","value_usd":2270},"fwci":2.6957,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.89590354,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"18","issue":"11","first_page":"11456","last_page":"11456"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/terahertz-waveguides","display_name":"terahertz waveguides","score":0.8330000042915344},{"id":"https://openalex.org/keywords/coating-thickness-measurement","display_name":"coating thickness measurement","score":0.7599999904632568},{"id":"https://openalex.org/keywords/layer-thickness-measurement","display_name":"layer thickness measurement","score":0.8190000057220459},{"id":"https://openalex.org/keywords/sensitivity-enhancement","display_name":"sensitivity enhancement","score":0.6980000138282776},{"id":"https://openalex.org/keywords/filling-factor","display_name":"filling factor","score":0.6980000138282776},{"id":"https://openalex.org/keywords/time-domain-spectroscopy","display_name":"time-domain spectroscopy","score":0.6150000095367432}],"concepts":[{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.846944272518158},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8220958709716797},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.8121200799942017},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.581436276435852},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5540119409561157},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.5409499406814575},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.49811458587646484},{"id":"https://openalex.org/C77887725","wikidata":"https://www.wikidata.org/wiki/Q17157147","display_name":"Terahertz spectroscopy and technology","level":3,"score":0.4941728413105011},{"id":"https://openalex.org/C2781448156","wikidata":"https://www.wikidata.org/wiki/Q1570182","display_name":"Coating","level":2,"score":0.4575991928577423},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.4509522318840027},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4442009925842285},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08352619409561157},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[{"descriptor_ui":"D000327","descriptor_name":"Adsorption","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004867","descriptor_name":"Equipment Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D012031","descriptor_name":"Refractometry","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D012680","descriptor_name":"Sensitivity and Specificity","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017076","descriptor_name":"Computer-Aided Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019544","descriptor_name":"Equipment Failure Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D055068","descriptor_name":"Terahertz Spectroscopy","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true}],"locations_count":4,"locations":[{"id":"doi:10.1364/oe.18.011456","doi":"https://doi.org/10.1364/oe.18.011456","is_oa":true,"landing_page_url":"https://doi.org/10.1364/oe.18.011456","pdf_url":null,"source":{"id":"https://openalex.org/S178776955","display_name":"Optics Express","issn_l":"1094-4087","issn":["1094-4087"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-b","jufo-1","ki-jl-1","medline","norway-2","oarl","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics Express","raw_type":"journal-article"},{"id":"pmid:20589006","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/20589006","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics express","raw_type":"Evaluation Study"},{"id":"pmh:oai:fraunhofer.de:N-133983","doi":null,"is_oa":true,"landing_page_url":"http://publica.fraunhofer.de/documents/N-133983.html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400801","display_name":"Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Fraunhofer IPM","raw_type":"Journal Article"},{"id":"pmh:oai:publica.fraunhofer.de:publica/221751","doi":null,"is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/221751","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"journal article"}],"best_oa_location":{"id":"doi:10.1364/oe.18.011456","doi":"https://doi.org/10.1364/oe.18.011456","is_oa":true,"landing_page_url":"https://doi.org/10.1364/oe.18.011456","pdf_url":null,"source":{"id":"https://openalex.org/S178776955","display_name":"Optics Express","issn_l":"1094-4087","issn":["1094-4087"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-b","jufo-1","ki-jl-1","medline","norway-2","oarl","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1968804223","https://openalex.org/W1979360851","https://openalex.org/W2000220152","https://openalex.org/W2020596798","https://openalex.org/W2051321294","https://openalex.org/W2070291622","https://openalex.org/W2126442445","https://openalex.org/W2126462704","https://openalex.org/W2137621154","https://openalex.org/W2152542512","https://openalex.org/W2520049440","https://openalex.org/W4230089336"],"related_works":["https://openalex.org/W2103450698","https://openalex.org/W1522322086","https://openalex.org/W1992911170","https://openalex.org/W2015580685","https://openalex.org/W2090372387","https://openalex.org/W4405172296","https://openalex.org/W2027429022","https://openalex.org/W4212861712","https://openalex.org/W3010388642","https://openalex.org/W1970083544"],"abstract_inverted_index":{"We":[0],"report":[1],"on":[2],"layer":[3,38,71],"thickness":[4,9,39],"determination":[5],"down":[6,73],"to":[7,18,52,57,74],"a":[8,36,53,58,78],"of":[10,46,60,70,77],"2.5":[11],"microns":[12],"using":[13,41],"terahertz":[14],"waveguide":[15],"spectroscopy.":[16],"Compared":[17],"typical":[19],"single-pass":[20],"transmission":[21],"measurements":[22],"in":[23],"the":[24,27,42,47,63,67],"time":[25],"domain,":[26],"effective":[28],"THz":[29,48,79],"pulse":[30],"delay":[31],"is":[32],"considerably":[33],"increased":[34],"for":[35,62],"given":[37],"by":[40],"high":[43],"filling":[44],"factor":[45,59],"waveguide.":[49],"This":[50],"corresponds":[51],"sensitivity":[54],"increase":[55],"up":[56],"50":[61],"measured":[64],"delay,":[65],"allowing":[66],"direct":[68],"measurement":[69],"thicknesses":[72],"below":[75],"hundredths":[76],"wavelength.":[80]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":6}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}