{"id":"https://openalex.org/W2013011623","doi":"https://doi.org/10.1063/1.1381030","title":"Detection of picosecond electrical pulses using the intrinsic Franz\u2013Keldysh effect","display_name":"Detection of picosecond electrical pulses using the intrinsic Franz\u2013Keldysh effect","publication_year":2001,"publication_date":"2001-06-25","ids":{"openalex":"https://openalex.org/W2013011623","doi":"https://doi.org/10.1063/1.1381030","mag":"2013011623"},"language":"en","primary_location":{"id":"doi:10.1063/1.1381030","doi":"https://doi.org/10.1063/1.1381030","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1381030","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5106512478","display_name":"J.\u2010F. Lampin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210123471","display_name":"Institut d'Electronique, de Micro\u00e9lectronique et de Nanotechnologie","ror":"https://ror.org/02q4res37","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I2279609970","https://openalex.org/I4210095849","https://openalex.org/I4210116330","https://openalex.org/I4210123471","https://openalex.org/I70348806","https://openalex.org/I7454413"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J. F. Lampin","raw_affiliation_strings":["Institut d\u2019Electronique et de Micro\u00e9lectronique du Nord, UMR\u2013CNRS 8520, Avenue Poincar\u00e9, B.P. 69, F-59652\u2009Villeneuve d\u2019Ascq C\u00e9dex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut d\u2019Electronique et de Micro\u00e9lectronique du Nord, UMR\u2013CNRS 8520, Avenue Poincar\u00e9, B.P. 69, F-59652\u2009Villeneuve d\u2019Ascq C\u00e9dex, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210123471"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006891714","display_name":"L. Desplanque","orcid":"https://orcid.org/0000-0002-2197-4408","observed_orcids":["https://orcid.org/0000-0002-2197-4408"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210123471","display_name":"Institut d'Electronique, de Micro\u00e9lectronique et de Nanotechnologie","ror":"https://ror.org/02q4res37","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I2279609970","https://openalex.org/I4210095849","https://openalex.org/I4210116330","https://openalex.org/I4210123471","https://openalex.org/I70348806","https://openalex.org/I7454413"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"L. Desplanque","raw_affiliation_strings":["Institut d\u2019Electronique et de Micro\u00e9lectronique du Nord, UMR\u2013CNRS 8520, Avenue Poincar\u00e9, B.P. 69, F-59652\u2009Villeneuve d\u2019Ascq C\u00e9dex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut d\u2019Electronique et de Micro\u00e9lectronique du Nord, UMR\u2013CNRS 8520, Avenue Poincar\u00e9, B.P. 69, F-59652\u2009Villeneuve d\u2019Ascq C\u00e9dex, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210123471"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057481810","display_name":"F. Mollot","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210123471","display_name":"Institut d'Electronique, de Micro\u00e9lectronique et de Nanotechnologie","ror":"https://ror.org/02q4res37","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I2279609970","https://openalex.org/I4210095849","https://openalex.org/I4210116330","https://openalex.org/I4210123471","https://openalex.org/I70348806","https://openalex.org/I7454413"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"F. Mollot","raw_affiliation_strings":["Institut d\u2019Electronique et de Micro\u00e9lectronique du Nord, UMR\u2013CNRS 8520, Avenue Poincar\u00e9, B.P. 69, F-59652\u2009Villeneuve d\u2019Ascq C\u00e9dex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut d\u2019Electronique et de Micro\u00e9lectronique du Nord, UMR\u2013CNRS 8520, Avenue Poincar\u00e9, B.P. 69, F-59652\u2009Villeneuve d\u2019Ascq C\u00e9dex, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210123471"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.403,"has_fulltext":false,"cited_by_count":52,"citation_normalized_percentile":{"value":0.87614657,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"78","issue":"26","first_page":"4103","last_page":"4105"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9639000296592712,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9639000296592712,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10566","display_name":"Laser-Matter Interactions and Applications","score":0.014000000432133675,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.004000000189989805,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/picosecond-pulses","display_name":"picosecond pulses","score":0.8320000171661377},{"id":"https://openalex.org/keywords/coplanar-transmission-lines","display_name":"coplanar transmission lines","score":0.9229999780654907},{"id":"https://openalex.org/keywords/low-temperature-grown-gaas","display_name":"low-temperature-grown GaAs","score":0.9909999966621399},{"id":"https://openalex.org/keywords/time-resolved-measurement","display_name":"time-resolved measurement","score":0.722000002861023},{"id":"https://openalex.org/keywords/terahertz-characterization","display_name":"terahertz characterization","score":0.8199999928474426}],"concepts":[{"id":"https://openalex.org/C55005982","wikidata":"https://www.wikidata.org/wiki/Q3902709","display_name":"Picosecond","level":3,"score":0.7850481271743774},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5781418681144714},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.48116621375083923},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.30360615253448486},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2612133026123047},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.07543113827705383}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1063/1.1381030","doi":"https://doi.org/10.1063/1.1381030","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1381030","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-00018479v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-00018479","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Applied Physics Letters, 2001, 78 (26), pp.4103-4105. ⟨10.1063/1.1381030⟩","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:HAL:hal-00250403v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.archives-ouvertes.fr/hal-00250403","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISSN: 0003-6951","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W654908678","https://openalex.org/W1965942542","https://openalex.org/W1968513360","https://openalex.org/W1973909602","https://openalex.org/W1989928846","https://openalex.org/W1998152332","https://openalex.org/W2003809548","https://openalex.org/W2011656523","https://openalex.org/W2013192804","https://openalex.org/W2025419181","https://openalex.org/W2034145797","https://openalex.org/W2042633989","https://openalex.org/W2045332204","https://openalex.org/W2050803803","https://openalex.org/W2061647893","https://openalex.org/W2062805029","https://openalex.org/W2066915033","https://openalex.org/W2099512983","https://openalex.org/W2102640871","https://openalex.org/W2106939387","https://openalex.org/W2162910767","https://openalex.org/W3022044502"],"related_works":["https://openalex.org/W2046865317","https://openalex.org/W2039628966","https://openalex.org/W2473726031","https://openalex.org/W4321262877","https://openalex.org/W2022186597","https://openalex.org/W2022117723","https://openalex.org/W1966457524","https://openalex.org/W2030038025","https://openalex.org/W2021039810","https://openalex.org/W4321519006"],"abstract_inverted_index":{"We":[0],"report":[1],"time-resolved":[2],"measurements":[3],"of":[4,33,54,70],"ultrafast":[5,71],"electrical":[6],"pulses":[7,35],"propagating":[8],"on":[9,24],"a":[10,25,62],"coplanar":[11],"transmission":[12],"line":[13],"using":[14],"the":[15],"intrinsic":[16],"Franz\u2013Keldysh":[17],"effect.":[18],"A":[19,50],"low-temperature-grown":[20],"GaAs":[21,26],"layer":[22],"deposited":[23],"substrate":[27],"allows":[28],"generation":[29],"and":[30],"also":[31],"detection":[32],"ps":[34,56],"via":[36],"electroabsorption":[37],"sampling":[38,48],"(EAS).":[39],"This":[40],"all-optical":[41],"method":[42],"does":[43],"not":[44],"require":[45],"any":[46],"external":[47],"probe.":[49],"typical":[51],"rise":[52],"time":[53],"1.1":[55],"has":[57],"been":[58],"measured.":[59],"EAS":[60],"is":[61],"good":[63],"candidate":[64],"for":[65],"use":[66],"in":[67],"THz":[68],"characterization":[69],"devices.":[72]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":3}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}