{"id":"https://openalex.org/W2012764060","doi":"https://doi.org/10.1109/edm.2010.5568673","title":"Researching of adaptation methods of optoelectronic ignition center detection devices","display_name":"Researching of adaptation methods of optoelectronic ignition center detection devices","publication_year":2010,"publication_date":"2010-06-01","ids":{"openalex":"https://openalex.org/W2012764060","doi":"https://doi.org/10.1109/edm.2010.5568673","mag":"2012764060"},"language":"en","primary_location":{"id":"doi:10.1109/edm.2010.5568673","doi":"https://doi.org/10.1109/edm.2010.5568673","is_oa":false,"landing_page_url":"https://doi.org/10.1109/edm.2010.5568673","pdf_url":null,"source":{"id":"https://openalex.org/S4306423212","display_name":"International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009270600","display_name":"Ekaterina V. Berestova","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I11549877","display_name":"Altai State Technical University","ror":"https://ror.org/0389pzc90","country_code":"RU","type":"education","lineage":["https://openalex.org/I11549877"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Ekaterina V. Berestova","raw_affiliation_strings":["Biysk Technological Institute, Altai State Technical University, Biysk, Russia","Biysk Technological Institute (branch), Altai State Technical University after I.I. Polzunov, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Biysk Technological Institute, Altai State Technical University, Biysk, Russia","institution_ids":["https://openalex.org/I11549877"]},{"raw_affiliation_string":"Biysk Technological Institute (branch), Altai State Technical University after I.I. Polzunov, Russia","institution_ids":["https://openalex.org/I11549877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012133590","display_name":"\u0421\u0435\u0440\u0433\u0435\u0439 \u0410\u043b\u0435\u043a\u0441\u0430\u043d\u0434\u0440\u043e\u0432\u0438\u0447 \u0422\u0435\u0440\u0435\u043d\u0442\u044c\u0435\u0432","orcid":"https://orcid.org/0000-0002-6989-9769","observed_orcids":["https://orcid.org/0000-0002-6989-9769"]},"institutions":[{"id":"https://openalex.org/I11549877","display_name":"Altai State Technical University","ror":"https://ror.org/0389pzc90","country_code":"RU","type":"education","lineage":["https://openalex.org/I11549877"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Sergey A. Terentiev","raw_affiliation_strings":["Biysk Technological Institute, Altai State Technical University, Biysk, Russia","Biysk Technological Institute (branch), Altai State Technical University after I.I. Polzunov, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Biysk Technological Institute, Altai State Technical University, Biysk, Russia","institution_ids":["https://openalex.org/I11549877"]},{"raw_affiliation_string":"Biysk Technological Institute (branch), Altai State Technical University after I.I. Polzunov, Russia","institution_ids":["https://openalex.org/I11549877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022712047","display_name":"Andrey N. Pavlov","orcid":"https://orcid.org/0000-0001-6099-1174","observed_orcids":["https://orcid.org/0000-0001-6099-1174"]},"institutions":[{"id":"https://openalex.org/I11549877","display_name":"Altai State Technical University","ror":"https://ror.org/0389pzc90","country_code":"RU","type":"education","lineage":["https://openalex.org/I11549877"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Andrey N. Pavlov","raw_affiliation_strings":["Biysk Technological Institute, Altai State Technical University, Biysk, Russia","Biysk Technological Institute (branch), Altai State Technical University after I.I. Polzunov, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Biysk Technological Institute, Altai State Technical University, Biysk, Russia","institution_ids":["https://openalex.org/I11549877"]},{"raw_affiliation_string":"Biysk Technological Institute (branch), Altai State Technical University after I.I. Polzunov, Russia","institution_ids":["https://openalex.org/I11549877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021028782","display_name":"Oksana Y. Yakusheva","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I11549877","display_name":"Altai State Technical University","ror":"https://ror.org/0389pzc90","country_code":"RU","type":"education","lineage":["https://openalex.org/I11549877"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Oksana Yu. Yakusheva","raw_affiliation_strings":["Biysk Technological Institute, Altai State Technical University, Biysk, Russia","Biysk Technological Institute (branch), Altai State Technical University after I.I. Polzunov, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Biysk Technological Institute, Altai State Technical University, Biysk, Russia","institution_ids":["https://openalex.org/I11549877"]},{"raw_affiliation_string":"Biysk Technological Institute (branch), Altai State Technical University after I.I. Polzunov, Russia","institution_ids":["https://openalex.org/I11549877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077183375","display_name":"Eugene V. Sypin","orcid":"https://orcid.org/0000-0002-3711-5931","observed_orcids":["https://orcid.org/0000-0002-3711-5931"]},"institutions":[{"id":"https://openalex.org/I11549877","display_name":"Altai State Technical University","ror":"https://ror.org/0389pzc90","country_code":"RU","type":"education","lineage":["https://openalex.org/I11549877"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Eugene V. Sypin","raw_affiliation_strings":["Biysk Technological Institute, Altai State Technical University, Biysk, Russia","Biysk Technological Institute (branch), Altai State Technical University after I.I. Polzunov, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Biysk Technological Institute, Altai State Technical University, Biysk, Russia","institution_ids":["https://openalex.org/I11549877"]},{"raw_affiliation_string":"Biysk Technological Institute (branch), Altai State Technical University after I.I. Polzunov, Russia","institution_ids":["https://openalex.org/I11549877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I11549877"],"apc_list":null,"apc_paid":null,"fwci":0.4269,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.46644755,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"403","last_page":"405"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9765999913215637,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9765999913215637,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12597","display_name":"Fire Detection and Safety Systems","score":0.013000000268220901,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14091","display_name":"Industrial and Mining Safety","score":0.0034000000450760126,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ignition-safety","display_name":"ignition safety","score":0.4790000021457672}],"concepts":[{"id":"https://openalex.org/C139807058","wikidata":"https://www.wikidata.org/wiki/Q352374","display_name":"Adaptation (eye)","level":2,"score":0.7175444960594177},{"id":"https://openalex.org/C159063594","wikidata":"https://www.wikidata.org/wiki/Q248382","display_name":"Ignition system","level":2,"score":0.6146447658538818},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5843918323516846},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5360937714576721},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.49268704652786255},{"id":"https://openalex.org/C2779463800","wikidata":"https://www.wikidata.org/wiki/Q5062222","display_name":"Center (category theory)","level":2,"score":0.4416132867336273},{"id":"https://openalex.org/C12713177","wikidata":"https://www.wikidata.org/wiki/Q1900281","display_name":"Perspective (graphical)","level":2,"score":0.4220521152019501},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38771820068359375},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19890499114990234},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13940536975860596},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.11886847019195557},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0864572525024414},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.05464324355125427},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/edm.2010.5568673","doi":"https://doi.org/10.1109/edm.2010.5568673","is_oa":false,"landing_page_url":"https://doi.org/10.1109/edm.2010.5568673","pdf_url":null,"source":{"id":"https://openalex.org/S4306423212","display_name":"International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2053083619","https://openalex.org/W1980964711","https://openalex.org/W2014650726","https://openalex.org/W1975510931","https://openalex.org/W2058968202","https://openalex.org/W2102902222","https://openalex.org/W2147722806","https://openalex.org/W1498971989","https://openalex.org/W4403255568","https://openalex.org/W7132477444"],"abstract_inverted_index":{"The":[0],"paper":[1],"analyzes":[2],"various":[3],"methods":[4],"for":[5,29],"adaptation":[6],"of":[7,19,25],"optoelectronic":[8,27],"devices":[9],"and":[10,14,22],"considers":[11],"their":[12],"advantages":[13],"disadvantages":[15],"from":[16],"the":[17,26],"perspective":[18],"more":[20],"effective":[21],"safe":[23],"operation":[24],"device":[28],"ignition":[30],"center":[31],"detection.":[32]},"counts_by_year":[],"updated_date":"2026-10-29T09:56:32.521200","created_date":"2016-06-24T00:00:00"}