{"id":"https://openalex.org/W2012296579","doi":"https://doi.org/10.1063/1.2746407","title":"Band gap energy modifications observed in trivalent In substituted nanocrystalline SnO2","display_name":"Band gap energy modifications observed in trivalent In substituted nanocrystalline SnO2","publication_year":2007,"publication_date":"2007-06-04","ids":{"openalex":"https://openalex.org/W2012296579","doi":"https://doi.org/10.1063/1.2746407","mag":"2012296579"},"language":"en","primary_location":{"id":"doi:10.1063/1.2746407","doi":"https://doi.org/10.1063/1.2746407","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.2746407","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://stars.library.ucf.edu/facultybib2000/7069","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045187012","display_name":"Christina Drake","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Drake","raw_affiliation_strings":["University of Central Florida Surface Engineering and Nanotechnology Facility (SNF) Laboratory, , 4000 Central Florida Blvd., Orlando, Florida 32826; Advanced Materials Processing and Analysis Center, , 4000 Central Florida Blvd., Orlando, Florida 32826; Mechanical Materials and Aerospace Engineering, , Eng 1, Room No. 381, 4000 Central Florida Blvd., Orlando, Florida 32826; and Nanoscience and Technology Center, , 4000 Central Florida Blvd., Orlando, Florida 32826"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Central Florida Surface Engineering and Nanotechnology Facility (SNF) Laboratory, , 4000 Central Florida Blvd., Orlando, Florida 32826; Advanced Materials Processing and Analysis Center, , 4000 Central Florida Blvd., Orlando, Florida 32826; Mechanical Materials and Aerospace Engineering, , Eng 1, Room No. 381, 4000 Central Florida Blvd., Orlando, Florida 32826; and Nanoscience and Technology Center, , 4000 Central Florida Blvd., Orlando, Florida 32826","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026168431","display_name":"Sudipta Seal","orcid":"https://orcid.org/0000-0002-0963-3344","observed_orcids":["https://orcid.org/0000-0002-0963-3344"]},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Seal","raw_affiliation_strings":["University of Central Florida Surface Engineering and Nanotechnology Facility (SNF) Laboratory, , 4000 Central Florida Blvd., Orlando, Florida 32826; Advanced Materials Processing and Analysis Center, , 4000 Central Florida Blvd., Orlando, Florida 32826; Mechanical Materials and Aerospace Engineering, , Eng 1, Room No. 381, 4000 Central Florida Blvd., Orlando, Florida 32826; and Nanoscience and Technology Center, , 4000 Central Florida Blvd., Orlando, Florida 32826"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Central Florida Surface Engineering and Nanotechnology Facility (SNF) Laboratory, , 4000 Central Florida Blvd., Orlando, Florida 32826; Advanced Materials Processing and Analysis Center, , 4000 Central Florida Blvd., Orlando, Florida 32826; Mechanical Materials and Aerospace Engineering, , Eng 1, Room No. 381, 4000 Central Florida Blvd., Orlando, Florida 32826; and Nanoscience and Technology Center, , 4000 Central Florida Blvd., Orlando, Florida 32826","institution_ids":["https://openalex.org/I106165777"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I106165777"],"apc_list":null,"apc_paid":null,"fwci":1.8916,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":{"value":0.85249963,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"90","issue":"23","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9833999872207642,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9833999872207642,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.011099999770522118,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13104","display_name":"Chemical and Physical Properties of Materials","score":0.002400000113993883,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tin-oxide","display_name":"tin oxide","score":0.6159999966621399},{"id":"https://openalex.org/keywords/sno2-nanocrystals","display_name":"SnO2 nanocrystals","score":0.7820000052452087},{"id":"https://openalex.org/keywords/indium-doping","display_name":"indium doping","score":0.9700000286102295},{"id":"https://openalex.org/keywords/optical-band-gap","display_name":"optical band gap","score":0.9869999885559082},{"id":"https://openalex.org/keywords/calcination-temperature","display_name":"calcination temperature","score":0.8679999709129333},{"id":"https://openalex.org/keywords/hydrogen-sensing","display_name":"hydrogen detection","score":0.9380000233650208},{"id":"https://openalex.org/keywords/oxygen-vacancies","display_name":"oxygen vacancies","score":0.8769999742507935},{"id":"https://openalex.org/keywords/band-bending","display_name":"band bending","score":0.9169999957084656}],"concepts":[{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.821889340877533},{"id":"https://openalex.org/C140676511","wikidata":"https://www.wikidata.org/wiki/Q6964018","display_name":"Nanocrystalline material","level":2,"score":0.791784405708313},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.7070002555847168},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6781889200210571},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.5782781839370728},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.5746057629585266},{"id":"https://openalex.org/C19181183","wikidata":"https://www.wikidata.org/wiki/Q4854235","display_name":"Band bending","level":2,"score":0.5609444975852966},{"id":"https://openalex.org/C125469278","wikidata":"https://www.wikidata.org/wiki/Q806380","display_name":"Electronic band structure","level":2,"score":0.4684237241744995},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.45888715982437134},{"id":"https://openalex.org/C45206210","wikidata":"https://www.wikidata.org/wiki/Q2415817","display_name":"Nanoscopic scale","level":2,"score":0.4464527666568756},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.43517494201660156},{"id":"https://openalex.org/C7082614","wikidata":"https://www.wikidata.org/wiki/Q849523","display_name":"Calcination","level":3,"score":0.43201565742492676},{"id":"https://openalex.org/C177909632","wikidata":"https://www.wikidata.org/wiki/Q2033925","display_name":"Semimetal","level":3,"score":0.417277991771698},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.27671343088150024},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.22879010438919067},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.19389650225639343},{"id":"https://openalex.org/C161790260","wikidata":"https://www.wikidata.org/wiki/Q82264","display_name":"Catalysis","level":2,"score":0.11030435562133789},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.08601692318916321},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07402685284614563},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1063/1.2746407","doi":"https://doi.org/10.1063/1.2746407","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.2746407","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},{"id":"pmh:oai:stars.library.ucf.edu:facultybib2000-8068","doi":null,"is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/facultybib2000/7069","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","vabb-shw"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Faculty Bibliography 2000s","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:stars.library.ucf.edu:facultybib2000-8068","doi":null,"is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/facultybib2000/7069","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","vabb-shw"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Faculty Bibliography 2000s","raw_type":"text"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1504650269","https://openalex.org/W1621975381","https://openalex.org/W1758948713","https://openalex.org/W1966862371","https://openalex.org/W1979757553","https://openalex.org/W1987655462","https://openalex.org/W1998637901","https://openalex.org/W1999235570","https://openalex.org/W2000816376","https://openalex.org/W2002403389","https://openalex.org/W2023566922","https://openalex.org/W2028441690","https://openalex.org/W2055836077","https://openalex.org/W2056599460","https://openalex.org/W2059876848","https://openalex.org/W2069942452","https://openalex.org/W2087762670","https://openalex.org/W2088868054","https://openalex.org/W2088950292","https://openalex.org/W2091126274","https://openalex.org/W2094048921","https://openalex.org/W2127092598","https://openalex.org/W2139095730","https://openalex.org/W2166572042","https://openalex.org/W2992773534"],"related_works":["https://openalex.org/W1998637901","https://openalex.org/W2801278277","https://openalex.org/W4368374249","https://openalex.org/W2385159713","https://openalex.org/W4409684427","https://openalex.org/W2071667129","https://openalex.org/W2610320866","https://openalex.org/W1865378238","https://openalex.org/W4322619689","https://openalex.org/W3021535320"],"abstract_inverted_index":{"The":[0,36],"effect":[1],"of":[2,11,18,33,59],"In":[3],"doping":[4],"concentration":[5],"on":[6],"the":[7,23,27,57,64,72],"optical":[8],"band":[9,24,37,68],"gap":[10,25,38],"nano-SnO2":[12],"is":[13],"investigated":[14],"as":[15],"a":[16],"function":[17],"calcination":[19],"temperature.":[20],"Changes":[21],"in":[22,63],"explain":[26],"room":[28],"temperature":[29],"H2":[30],"gas":[31],"sensing":[32],"doped":[34],"nano-SnO2.":[35],"was":[39],"found":[40],"to":[41],"be":[42,54],"lower":[43],"than":[44],"those":[45],"reported":[46],"for":[47],"SnO2":[48],"(3.6eV)":[49],"from":[50],"2.55to3.43eV":[51],"and":[52,67],"may":[53],"explained":[55],"by":[56],"presence":[58],"nonequilibrium":[60],"oxygen":[61],"vacancies":[62],"oxide":[65],"lattice":[66],"bending":[69],"effects":[70],"at":[71],"nanoscale.":[73]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":3}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2016-06-24T00:00:00"}