{"id":"https://openalex.org/W2012250218","doi":"https://doi.org/10.1143/jjap.42.l1006","title":"Fabrication of Full High-TcSuperconducting YBa2Cu3O7-xTrilayer Junctions Using a Polishing Technique","display_name":"Fabrication of Full High-TcSuperconducting YBa2Cu3O7-xTrilayer Junctions Using a Polishing Technique","publication_year":2003,"publication_date":"2003-08-15","ids":{"openalex":"https://openalex.org/W2012250218","doi":"https://doi.org/10.1143/jjap.42.l1006","mag":"2012250218"},"language":"en","primary_location":{"id":"doi:10.1143/jjap.42.l1006","doi":"https://doi.org/10.1143/jjap.42.l1006","is_oa":false,"landing_page_url":"https://doi.org/10.1143/jjap.42.l1006","pdf_url":null,"source":{"id":"https://openalex.org/S143744711","display_name":"Japanese Journal of Applied Physics","issn_l":"0021-4922","issn":["0021-4922","1347-4065"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Japanese Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Ken'ichi Kuroda","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ken'ichi Kuroda","raw_affiliation_strings":["Advanced Technology R&D Center, Mitsubishi Electric Corporation, Amagasaki 661-8661, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Technology R&D Center, Mitsubishi Electric Corporation, Amagasaki 661-8661, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111649993","display_name":"Yukihiko Wada","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukihiko Wada","raw_affiliation_strings":["Advanced Technology R&D Center, Mitsubishi Electric Corporation, Amagasaki 661-8661, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Technology R&D Center, Mitsubishi Electric Corporation, Amagasaki 661-8661, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075307261","display_name":"Tetsuya Takami","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuya Takami","raw_affiliation_strings":["Advanced Technology R&D Center, Mitsubishi Electric Corporation, Amagasaki 661-8661, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Technology R&D Center, Mitsubishi Electric Corporation, Amagasaki 661-8661, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110090494","display_name":"Tatsuo Ozeki","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tatsuo Ozeki","raw_affiliation_strings":["Advanced Technology R&D Center, Mitsubishi Electric Corporation, Amagasaki 661-8661, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Technology R&D Center, Mitsubishi Electric Corporation, Amagasaki 661-8661, Japan","institution_ids":["https://openalex.org/I4210133125"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210133125"],"apc_list":{"value":2210,"currency":"USD","value_usd":2210},"apc_paid":null,"fwci":0.1929,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.6462948,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"42","issue":"Part 2, No. 8B","first_page":"L1006","last_page":"L1008"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.7411999702453613,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.7411999702453613,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10037","display_name":"Physics of Superconductivity and Magnetism","score":0.1525000035762787,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","score":0.09480000287294388,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/yba2cu3o7-delta","display_name":"YBa2Cu3O7-\u03b4","score":0.8730000257492065},{"id":"https://openalex.org/keywords/high-temperature-superconductors","display_name":"high-temperature superconductors","score":0.8360000252723694},{"id":"https://openalex.org/keywords/polishing-techniques","display_name":"polishing techniques","score":0.8700000047683716},{"id":"https://openalex.org/keywords/critical-current-density","display_name":"critical current density","score":0.8259999752044678},{"id":"https://openalex.org/keywords/resistively-shunted-junction-model","display_name":"resistively shunted junction model","score":0.7170000076293945},{"id":"https://openalex.org/keywords/current-voltage-characteristics","display_name":"current-voltage characteristics","score":0.8100000023841858},{"id":"https://openalex.org/keywords/superconducting-quantum-interference-devices","display_name":"superconducting quantum interference devices","score":0.8700000047683716},{"id":"https://openalex.org/keywords/thin-film-fabrication","display_name":"thin film fabrication","score":0.42100000381469727}],"concepts":[{"id":"https://openalex.org/C138113353","wikidata":"https://www.wikidata.org/wiki/Q611639","display_name":"Polishing","level":2,"score":0.8335802555084229},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.7923799753189087},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7783467173576355},{"id":"https://openalex.org/C12038964","wikidata":"https://www.wikidata.org/wiki/Q764228","display_name":"Josephson effect","level":3,"score":0.7533378601074219},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.6543576121330261},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4970398247241974},{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.4920055568218231},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4900768995285034},{"id":"https://openalex.org/C2987373456","wikidata":"https://www.wikidata.org/wiki/Q5186713","display_name":"Critical current","level":3,"score":0.4723561704158783},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.40886855125427246},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.22271797060966492},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.19608131051063538},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1143/jjap.42.l1006","doi":"https://doi.org/10.1143/jjap.42.l1006","is_oa":false,"landing_page_url":"https://doi.org/10.1143/jjap.42.l1006","pdf_url":null,"source":{"id":"https://openalex.org/S143744711","display_name":"Japanese Journal of Applied Physics","issn_l":"0021-4922","issn":["0021-4922","1347-4065"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Japanese Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2039641214","https://openalex.org/W1981942100","https://openalex.org/W2153154685","https://openalex.org/W2572018388","https://openalex.org/W3163307316","https://openalex.org/W2093145636","https://openalex.org/W2070286180","https://openalex.org/W2091324790","https://openalex.org/W2049134016","https://openalex.org/W2089984167"],"abstract_inverted_index":{"We":[0],"have":[1,27,88],"successfully":[2],"fabricated":[3],"full":[4],"high-":[5],"T":[6],"c":[7],"superconducting":[8,137],"YBa":[9],"2":[10,17,129],"Cu":[11,18],"3":[12,19],"O":[13,20],"7-":[14,21],"x":[15,22],"(YBCO)/PrBa":[16],"(PBCO)/YBCO":[23],"trilayer":[24],"junctions,":[25],"which":[26],"a":[28,34,44,59,121],"simple":[29],"device":[30],"structure,":[31],"such":[32],"as":[33],"Pb-alloy-based":[35],"Josephson":[36],"tunneling":[37],"junction.":[38],"It":[39],"has":[40,141],"been":[41,89,142],"demonstrated":[42],"that":[43],"polishing":[45,77],"technique":[46],"is":[47,55],"extremely":[48],"useful":[49],"in":[50,57],"the":[51,64,67,71,76,79,84,92,106,134],"fabrication":[52],"process:":[53],"it":[54],"effective":[56],"smoothing":[58],"coarse":[60],"surface":[61],"and":[62,83,100],"gentling":[63],"slopes":[65],"of":[66,94,108,126,136],"edges,":[68],"or":[69],"decreasing":[70],"slope":[72],"angles.":[73],"Owing":[74],"to":[75],"technique,":[78],"PBCO":[80],"barrier":[81],"layer":[82,87],"upper":[85],"YBCO":[86],"notably":[90],"thinned:":[91],"thicknesses":[93],"these":[95],"layers":[96],"are":[97],"10":[98],"nm":[99],"250":[101],"nm,":[102],"respectively.":[103],"Junctions":[104],"with":[105,120],"dimensions":[107],"5":[109,112],"\u00b5m":[110,113],"\u00d7":[111],"showed":[114],"resistively":[115],"shunted":[116],"junction-like":[117],"current-voltage":[118],"curves":[119],"typical":[122],"critical":[123],"current":[124],"density":[125],"110":[127],"A/cm":[128],"at":[130],"4.2":[131],"K.":[132],"Furthermore,":[133],"operation":[135],"quantum":[138],"interference":[139],"devices":[140],"demonstrated.":[143]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-14T16:39:01.820549","created_date":"2016-06-24T00:00:00"}