{"id":"https://openalex.org/W2012174752","doi":"https://doi.org/10.1063/1.336243","title":"Characterization of high-purity Si-doped molecular beam epitaxial GaAs","display_name":"Characterization of high-purity Si-doped molecular beam epitaxial GaAs","publication_year":1985,"publication_date":"1985-12-15","ids":{"openalex":"https://openalex.org/W2012174752","doi":"https://doi.org/10.1063/1.336243","mag":"2012174752"},"language":"en","primary_location":{"id":"doi:10.1063/1.336243","doi":"https://doi.org/10.1063/1.336243","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.336243","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027432825","display_name":"Brian J. Skromme","orcid":"https://orcid.org/0000-0002-1856-474X","observed_orcids":["https://orcid.org/0000-0002-1856-474X"]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. J. Skromme","raw_affiliation_strings":["Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085107169","display_name":"Sukanta Bose","orcid":"https://orcid.org/0000-0002-0699-9658","observed_orcids":["https://orcid.org/0000-0002-0699-9658"]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. S. Bose","raw_affiliation_strings":["Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023168318","display_name":"B. Lee","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. Lee","raw_affiliation_strings":["Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102095948","display_name":"T. S. Low","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. S. Low","raw_affiliation_strings":["Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060772357","display_name":"T. R. Lepkowski","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. R. Lepkowski","raw_affiliation_strings":["Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081956158","display_name":"R. Y. Dejule","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Y. DeJule","raw_affiliation_strings":["Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048939777","display_name":"G. E. Stillman","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. E. Stillman","raw_affiliation_strings":["Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Research Laboratory, Materials Research Laboratory and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101921180","display_name":"James C. M. Hwang","orcid":"https://orcid.org/0000-0002-9738-0411","observed_orcids":["https://orcid.org/0000-0002-9738-0411"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. C. M. Hwang","raw_affiliation_strings":["Bell Laboratories, Murray Hill, New Jersey 07974","Lucent"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bell Laboratories, Murray Hill, New Jersey 07974","institution_ids":[]},{"raw_affiliation_string":"Lucent","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":8.2154,"has_fulltext":false,"cited_by_count":98,"citation_normalized_percentile":{"value":0.98473789,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":87,"max":97},"biblio":{"volume":"58","issue":"12","first_page":"4685","last_page":"4702"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.899399995803833,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.899399995803833,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.03620000183582306,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.026000000536441803,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/si-doped-gaas","display_name":"Si-doped GaAs","score":0.8029999732971191},{"id":"https://openalex.org/keywords/molecular-beam-epitaxy","display_name":"molecular beam epitaxy","score":0.8569999933242798},{"id":"https://openalex.org/keywords/high-purity-semiconductors","display_name":"high-purity semiconductors","score":0.7350000143051147},{"id":"https://openalex.org/keywords/sulfur-donors","display_name":"sulfur donors","score":0.6060000061988831},{"id":"https://openalex.org/keywords/carbon-acceptors","display_name":"carbon acceptors","score":0.9869999885559082},{"id":"https://openalex.org/keywords/residual-impurities","display_name":"residual impurities","score":0.4970000088214874},{"id":"https://openalex.org/keywords/carrier-concentration","display_name":"carrier concentration","score":0.5740000009536743},{"id":"https://openalex.org/keywords/photoluminescence","display_name":"photoluminescence","score":0.8130000233650208},{"id":"https://openalex.org/keywords/deep-level-transient-spectroscopy","display_name":"deep level transient spectroscopy","score":0.9200000166893005},{"id":"https://openalex.org/keywords/capacitance-voltage-measurements","display_name":"capacitance-voltage measurements","score":0.8450000286102295},{"id":"https://openalex.org/keywords/hall-effect","display_name":"Hall effect","score":0.7710000276565552},{"id":"https://openalex.org/keywords/electron-traps","display_name":"electron traps","score":0.7940000295639038},{"id":"https://openalex.org/keywords/compensation","display_name":"compensation","score":0.33000001311302185},{"id":"https://openalex.org/keywords/acceptor-levels","display_name":"acceptor levels","score":0.4020000100135803}],"concepts":[{"id":"https://openalex.org/C2779892579","wikidata":"https://www.wikidata.org/wiki/Q912138","display_name":"Acceptor","level":2,"score":0.7668743133544922},{"id":"https://openalex.org/C3792809","wikidata":"https://www.wikidata.org/wiki/Q898542","display_name":"Molecular beam epitaxy","level":4,"score":0.7633490562438965},{"id":"https://openalex.org/C85080765","wikidata":"https://www.wikidata.org/wiki/Q614893","display_name":"Photoluminescence","level":2,"score":0.6626747250556946},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.659420371055603},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.5991629362106323},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.5481968522071838},{"id":"https://openalex.org/C134112204","wikidata":"https://www.wikidata.org/wiki/Q10656","display_name":"Hall effect","level":3,"score":0.5039247870445251},{"id":"https://openalex.org/C2780080961","wikidata":"https://www.wikidata.org/wiki/Q176282","display_name":"Deep-level transient spectroscopy","level":3,"score":0.503882110118866},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.48679253458976746},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.4725346863269806},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.45602840185165405},{"id":"https://openalex.org/C106782819","wikidata":"https://www.wikidata.org/wiki/Q6501076","display_name":"Electron mobility","level":2,"score":0.4320540428161621},{"id":"https://openalex.org/C68709404","wikidata":"https://www.wikidata.org/wiki/Q1134475","display_name":"Flux (metallurgy)","level":2,"score":0.41666731238365173},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.3743411898612976},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.2994519770145416},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2586837410926819},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.10040214657783508},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10018843412399292},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.336243","doi":"https://doi.org/10.1063/1.336243","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.336243","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":57,"referenced_works":["https://openalex.org/W1966134562","https://openalex.org/W1968730124","https://openalex.org/W1970749547","https://openalex.org/W1972005765","https://openalex.org/W1977326930","https://openalex.org/W1979355857","https://openalex.org/W1980047396","https://openalex.org/W1980518236","https://openalex.org/W1981052211","https://openalex.org/W1986720144","https://openalex.org/W1996877314","https://openalex.org/W1999255657","https://openalex.org/W1999477799","https://openalex.org/W2005363657","https://openalex.org/W2005677227","https://openalex.org/W2006095301","https://openalex.org/W2007108379","https://openalex.org/W2009040410","https://openalex.org/W2010166488","https://openalex.org/W2012485837","https://openalex.org/W2017796898","https://openalex.org/W2018857963","https://openalex.org/W2020219560","https://openalex.org/W2020916599","https://openalex.org/W2024328275","https://openalex.org/W2025208259","https://openalex.org/W2025679378","https://openalex.org/W2031231891","https://openalex.org/W2035403592","https://openalex.org/W2037122206","https://openalex.org/W2037825731","https://openalex.org/W2038701583","https://openalex.org/W2042458326","https://openalex.org/W2044082890","https://openalex.org/W2045220818","https://openalex.org/W2046433353","https://openalex.org/W2046469654","https://openalex.org/W2049465049","https://openalex.org/W2053058942","https://openalex.org/W2055475593","https://openalex.org/W2058287733","https://openalex.org/W2063401095","https://openalex.org/W2067209489","https://openalex.org/W2068502236","https://openalex.org/W2069044665","https://openalex.org/W2072853157","https://openalex.org/W2075854157","https://openalex.org/W2077507009","https://openalex.org/W2079421378","https://openalex.org/W2082419772","https://openalex.org/W2083960985","https://openalex.org/W2084707283","https://openalex.org/W2087041196","https://openalex.org/W2089483365","https://openalex.org/W2091126680","https://openalex.org/W2092598216","https://openalex.org/W2112353550"],"related_works":["https://openalex.org/W2087041196","https://openalex.org/W2051871905","https://openalex.org/W1626705227","https://openalex.org/W2031955002","https://openalex.org/W2020916599","https://openalex.org/W2035466442","https://openalex.org/W2057644889","https://openalex.org/W2001371228","https://openalex.org/W2023265475","https://openalex.org/W2044082890"],"abstract_inverted_index":{"High-purity,":[0],"lightly":[1],"Si-doped":[2],"(\u03bc77\u223c70":[3],"000\u2013126":[4],"000":[5],"cm2/V":[6],"s":[7],"and":[8,24,33,46,81,118,190,224,250,253,273,281,322,330],"n77\u223c2\u20138\u00d71014":[9],"cm\u22123)":[10],"molecular":[11],"beam":[12],"epitaxy":[13],"(MBE)":[14],"GaAs":[15],"layers":[16],"have":[17],"been":[18],"characterized":[19],"using":[20,108,131,208],"variable-temperature":[21],"Hall":[22],"effect":[23],"C-V":[25,332],"measurements,":[26],"photothermal":[27],"ionization":[28],"spectroscopy,":[29],"low-temperature":[30],"photoluminescence":[31],"(PL),":[32],"deep":[34],"level":[35],"transient":[36],"spectroscopy":[37],"(DLTS).":[38],"The":[39,95,123,145,168,213,293],"spectroscopic":[40],"measurements":[41,257,333],"of":[42,71,112,147,164,177,234,241,248,339],"the":[43,50,77,86,136,142,151,156,165,175,186,196,209,222,232,246,264,267,300,310,327,331],"residual":[44,73,91,187],"donors":[45,75,189,280],"acceptors":[47,192],"indicate":[48],"that":[49,155,180,263,309],"pronounced":[51,106],"increase":[52,96,137],"in":[53,85,97,201,205,221,243,266,275,299,326],"carrier":[54,98],"concentration":[55,89,99,126,149,171,338],"which":[56,114,304],"is":[57,103,138,172,229,291,297],"observed":[58,200,325],"with":[59,100,128,141,245],"increasing":[60],"As":[61,78,101,129,133,152,157,211],"flux":[62,102,130],"(for":[63],"a":[64,235,335],"constant":[65],"Ga":[66],"flux)":[67],"results":[68],"from":[69,76,83],"incorporation":[70],"additional":[72,120],"S":[74,117,188],"source":[79,111,153,158],"material,":[80],"not":[82],"reductions":[84],"Si":[87,169],"acceptor":[88,93,125,170,286],"or":[90],"C":[92,124,148,166,191,314],"concentration.":[94],"considerably":[104],"more":[105,306],"when":[107],"an":[109],"alternative":[110,143],"As,":[113],"introduces":[115],"both":[116],"3":[119],"donor":[121],"species.":[122],"increases":[127],"either":[132],"source,":[134],"although":[135],"much":[139],"stronger":[140],"source.":[144,212],"dependence":[146],"on":[150],"implies":[154],"itself":[159],"contributes":[160],"at":[161,282],"least":[162,283],"part":[163],"background.":[167],"negligible":[173],"for":[174,195],"range":[176,270],"growth":[178],"conditions":[179],"were":[181],"used.":[182],"Close":[183],"compensation":[184],"between":[185,237],"may":[193,312],"account":[194],"high":[197],"resistivity":[198],"previously":[199],"undoped":[202],"samples":[203],"grown":[204],"this":[206],"system":[207],"purer":[210],"PL":[214,256],"data":[215],"exhibit":[216],"very":[217],"weak":[218],"\u2018\u2018defect\u2019\u2019-related":[219],"emissions":[220],"1.504\u20131.512":[223],"1.466\u20131.482":[225,268],"eV":[226,269],"ranges;":[227],"evidence":[228],"presented":[230],"supporting":[231],"existence":[233],"correlation":[236],"these":[238],"two":[239],"sets":[240],"peaks,":[242],"agreement":[244],"work":[247],"Briones":[249],"Collins.":[251],"Temperature":[252],"excitation":[254],"intensity-dependent":[255],"are":[258,271,324],"used":[259],"to":[260],"demonstrate":[261],"conclusively":[262],"peaks":[265],"donor-to-acceptor":[272],"band-to-acceptor":[274],"nature,":[276],"involving":[277],"normal":[278],"shallow":[279],"four":[284],"different":[285],"levels":[287],"whose":[288],"exact":[289],"origin":[290],"unknown.":[292],"\u2018\u2018defect\u2019\u2019":[294],"peak":[295],"intensity":[296],"larger":[298],"less":[301],"pure":[302],"material":[303],"contains":[305],"C,":[307],"implying":[308],"\u2018\u2018defects\u2019\u2019":[311],"be":[313],"related.":[315],"Several":[316],"electron":[317],"traps":[318],"including":[319],"M1,":[320],"M3,":[321],"M4":[323],"DLTS":[328],"spectra,":[329],"give":[334],"total":[336],"trap":[337],"\u223c3\u00d71013":[340],"cm\u22123.":[341]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}