{"id":"https://openalex.org/W2012081236","doi":"https://doi.org/10.1109/iccsee.2012.367","title":"Researches of Test Nodes Selection of Analog Circuit","display_name":"Researches of Test Nodes Selection of Analog Circuit","publication_year":2012,"publication_date":"2012-03-01","ids":{"openalex":"https://openalex.org/W2012081236","doi":"https://doi.org/10.1109/iccsee.2012.367","mag":"2012081236"},"language":"en","primary_location":{"id":"doi:10.1109/iccsee.2012.367","doi":"https://doi.org/10.1109/iccsee.2012.367","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccsee.2012.367","pdf_url":null,"source":{"id":"https://openalex.org/S4363608809","display_name":"International Conference on Computer Science and Electronics Engineering (ICCSEE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 International Conference on Computer Science and Electronics Engineering","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032241410","display_name":"Qingyao Xu","orcid":"https://orcid.org/0009-0008-9917-6597","observed_orcids":["https://orcid.org/0009-0008-9917-6597"]},"institutions":[{"id":"https://openalex.org/I4210122191","display_name":"Ordnance Engineering College","ror":"https://ror.org/02mn08y26","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122191"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qing-yao Xu","raw_affiliation_strings":["Ordnance Eng. Coll., Shijiazhuang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ordnance Eng. Coll., Shijiazhuang, China","institution_ids":["https://openalex.org/I4210122191"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016547997","display_name":"Shaohui Cui","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210122191","display_name":"Ordnance Engineering College","ror":"https://ror.org/02mn08y26","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122191"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shao-hui Cui","raw_affiliation_strings":["Ordnance Eng. Coll., Shijiazhuang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ordnance Eng. Coll., Shijiazhuang, China","institution_ids":["https://openalex.org/I4210122191"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080723288","display_name":"Han Lu-jie","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210122191","display_name":"Ordnance Engineering College","ror":"https://ror.org/02mn08y26","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122191"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lu-jie Han","raw_affiliation_strings":["Ordnance Eng. Coll., Shijiazhuang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ordnance Eng. Coll., Shijiazhuang, China","institution_ids":["https://openalex.org/I4210122191"]}]},{"author_position":"last","author":{"id":null,"display_name":"Shi-jie Deng","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210122191","display_name":"Ordnance Engineering College","ror":"https://ror.org/02mn08y26","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122191"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shi-jie Deng","raw_affiliation_strings":["Ordnance Eng. Coll., Shijiazhuang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ordnance Eng. Coll., Shijiazhuang, China","institution_ids":["https://openalex.org/I4210122191"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210122191"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09030193,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"29","issue":null,"first_page":"16","last_page":"19"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.7064999938011169,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.7064999938011169,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12391","display_name":"Artificial Immune Systems Applications","score":0.28049999475479126,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.0066999997943639755,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/analog-circuit-testing","display_name":"analog circuit testing","score":0.875},{"id":"https://openalex.org/keywords/circuit-diagnosis","display_name":"circuit diagnosis","score":0.781000018119812},{"id":"https://openalex.org/keywords/test-cost-reduction","display_name":"test cost reduction","score":0.746999979019165},{"id":"https://openalex.org/keywords/fault-diagnosis","display_name":"fault diagnosis","score":0.5080000162124634}],"concepts":[{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.7464354634284973},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6301442980766296},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.599513053894043},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.501107931137085},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.49954748153686523},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.4768872559070587},{"id":"https://openalex.org/C26490066","wikidata":"https://www.wikidata.org/wiki/Q17006835","display_name":"Circuit extraction","level":4,"score":0.4558722674846649},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.360846608877182},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.34664541482925415},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2637856602668762},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24139192700386047},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.22772333025932312},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15242066979408264},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccsee.2012.367","doi":"https://doi.org/10.1109/iccsee.2012.367","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccsee.2012.367","pdf_url":null,"source":{"id":"https://openalex.org/S4363608809","display_name":"International Conference on Computer Science and Electronics Engineering (ICCSEE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 International Conference on Computer Science and Electronics Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2094897492","https://openalex.org/W2349003704","https://openalex.org/W2384834052"],"related_works":["https://openalex.org/W2384834052","https://openalex.org/W2079086922","https://openalex.org/W2004946476","https://openalex.org/W2371400724","https://openalex.org/W2069692980","https://openalex.org/W2096280374","https://openalex.org/W4317716242","https://openalex.org/W2350171522","https://openalex.org/W7095099043","https://openalex.org/W2364822588"],"abstract_inverted_index":{"Test":[0],"nodes":[1,24,32],"selection":[2,25,33,43],"of":[3,20,27,35,58,65],"analog":[4,28,36],"circuit":[5,12,37,71],"has":[6],"great":[7],"significance":[8],"on":[9,39],"fast,":[10],"accurate":[11],"diagnosis,":[13],"reduce":[14],"test":[15,23,31,59],"cost.":[16],"For":[17],"the":[18,21,54,63],"lack":[19],"current":[22],"method":[26,34,52,67],"circuit,":[29],"a":[30],"based":[38],"chaos":[40],"immune":[41],"clone":[42],"optimization":[44],"algorithm":[45],"is":[46,68],"presented":[47,69],"in":[48],"this":[49,66],"paper.":[50],"This":[51],"improves":[53],"efficiency":[55],"and":[56],"accuracy":[57],"node":[60],"selection.":[61],"Finally":[62],"validity":[64],"through":[70],"simulation.":[72]},"counts_by_year":[],"updated_date":"2026-10-05T09:50:58.205359","created_date":"2016-06-24T00:00:00"}