{"id":"https://openalex.org/W2011983172","doi":"https://doi.org/10.1109/iedm.1978.189467","title":"Characterization of a 32\u00d732 InSb hybrid IR focal plane","display_name":"Characterization of a 32\u00d732 InSb hybrid IR focal plane","publication_year":1978,"publication_date":"1978-01-01","ids":{"openalex":"https://openalex.org/W2011983172","doi":"https://doi.org/10.1109/iedm.1978.189467","mag":"2011983172"},"language":"en","primary_location":{"id":"doi:10.1109/iedm.1978.189467","doi":"https://doi.org/10.1109/iedm.1978.189467","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iedm.1978.189467","pdf_url":null,"source":{"id":"https://openalex.org/S4210168112","display_name":"Technical digest - International Electron Devices Meeting/Technical digest","issn_l":"0163-1918","issn":["0163-1918","2156-017X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"1978 International Electron Devices Meeting","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090814324","display_name":"William J. Parrish","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"W.J. Parrish","raw_affiliation_strings":["Santa Barbara Research Center, Goleta, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Santa Barbara Research Center, Goleta, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066856748","display_name":"F.J. Renda","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"F.J. Renda","raw_affiliation_strings":["Santa Barbara Research Center, Goleta, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Santa Barbara Research Center, Goleta, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"N.L. Ray","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4388891881","display_name":"Hughes Aircraft (United States)","ror":"https://ror.org/0431d2d16","country_code":"US","type":"company","lineage":["https://openalex.org/I4388891881"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N.L. Ray","raw_affiliation_strings":["Hughes Aircraft Company, Canoga Park, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hughes Aircraft Company, Canoga Park, CA, USA","institution_ids":["https://openalex.org/I4388891881"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071420234","display_name":"Dale G. Maeding","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4388891881","display_name":"Hughes Aircraft (United States)","ror":"https://ror.org/0431d2d16","country_code":"US","type":"company","lineage":["https://openalex.org/I4388891881"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.G. Maeding","raw_affiliation_strings":["Carlsbad Research Center, Hughes Aircraft Company, Carlsbad, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Carlsbad Research Center, Hughes Aircraft Company, Carlsbad, CA, USA","institution_ids":["https://openalex.org/I4388891881"]}]},{"author_position":"middle","author":{"id":null,"display_name":"R.E. Eck","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R.E. Eck","raw_affiliation_strings":["Santa Barbara Research Center, Goleta, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Santa Barbara Research Center, Goleta, CA, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":null,"display_name":"J.R. Toman","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J.R. Toman","raw_affiliation_strings":["Santa Barbara Research Center, Goleta, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Santa Barbara Research Center, Goleta, CA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.14762443,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"513","last_page":"516"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/indium-antimonide","display_name":"indium antimonide","score":0.902999997138977},{"id":"https://openalex.org/keywords/infrared-detectors","display_name":"infrared detectors","score":0.7310000061988831}],"concepts":[{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.7123277187347412},{"id":"https://openalex.org/C17825722","wikidata":"https://www.wikidata.org/wiki/Q17285","display_name":"Plane (geometry)","level":2,"score":0.44873860478401184},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.442155659198761},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4349293112754822},{"id":"https://openalex.org/C2781299968","wikidata":"https://www.wikidata.org/wiki/Q7601922","display_name":"Focal Plane Arrays","level":3,"score":0.4229186475276947},{"id":"https://openalex.org/C138395690","wikidata":"https://www.wikidata.org/wiki/Q376733","display_name":"Cardinal point","level":2,"score":0.3945235013961792},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.39056596159935},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.32656919956207275},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.32031571865081787},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16362622380256653},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.15216901898384094}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iedm.1978.189467","doi":"https://doi.org/10.1109/iedm.1978.189467","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iedm.1978.189467","pdf_url":null,"source":{"id":"https://openalex.org/S4210168112","display_name":"Technical digest - International Electron Devices Meeting/Technical digest","issn_l":"0163-1918","issn":["0163-1918","2156-017X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"1978 International Electron Devices Meeting","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2095333236"],"related_works":["https://openalex.org/W2095333236","https://openalex.org/W1965878964","https://openalex.org/W2101041816","https://openalex.org/W2322230628","https://openalex.org/W2007508804","https://openalex.org/W1968790399","https://openalex.org/W2094137669","https://openalex.org/W2016525673","https://openalex.org/W2092730630","https://openalex.org/W2083697598"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2016-06-24T00:00:00"}