{"id":"https://openalex.org/W2011850673","doi":"https://doi.org/10.1364/oe.21.011448","title":"Single cuprous oxide films synthesized by radical oxidation at low temperature for PV application","display_name":"Single cuprous oxide films synthesized by radical oxidation at low temperature for PV application","publication_year":2013,"publication_date":"2013-05-03","ids":{"openalex":"https://openalex.org/W2011850673","doi":"https://doi.org/10.1364/oe.21.011448","mag":"2011850673","pmid":"https://pubmed.ncbi.nlm.nih.gov/23670001"},"language":"en","primary_location":{"id":"doi:10.1364/oe.21.011448","doi":"https://doi.org/10.1364/oe.21.011448","is_oa":true,"landing_page_url":"https://doi.org/10.1364/oe.21.011448","pdf_url":null,"source":{"id":"https://openalex.org/S178776955","display_name":"Optics Express","issn_l":"1094-4087","issn":["1094-4087"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-b","jufo-1","ki-jl-1","medline","norway-2","oarl","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics Express","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1364/oe.21.011448","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046658329","display_name":"Zhigang Zang","orcid":"https://orcid.org/0000-0003-1632-503X","observed_orcids":["https://orcid.org/0000-0003-1632-503X","https://orcid.org/0000-0002-6096-9062"]},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]},{"id":"https://openalex.org/I4405287265","display_name":"Research Institute of Electronics, Shizuoka University","ror":"https://ror.org/04mdx9d04","country_code":"JP","type":"facility","lineage":["https://openalex.org/I1298590031","https://openalex.org/I4405287265"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Zhigang Zang","raw_affiliation_strings":["Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu, Shizuoka 432-8011, Japan. zang4211@gmail.com","Research Institute of Electronics; Shizuoka University; 3-5-1 Johoku Hamamatsu Shizuoka 432-8011 Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu, Shizuoka 432-8011, Japan. zang4211@gmail.com","institution_ids":["https://openalex.org/I1298590031","https://openalex.org/I4405287265"]},{"raw_affiliation_string":"Research Institute of Electronics; Shizuoka University; 3-5-1 Johoku Hamamatsu Shizuoka 432-8011 Japan","institution_ids":["https://openalex.org/I1298590031","https://openalex.org/I4405287265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101524794","display_name":"Atsushi Nakamura","orcid":"https://orcid.org/0000-0002-5248-636X","observed_orcids":["https://orcid.org/0000-0002-5248-636X"]},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]},{"id":"https://openalex.org/I4405287265","display_name":"Research Institute of Electronics, Shizuoka University","ror":"https://ror.org/04mdx9d04","country_code":"JP","type":"facility","lineage":["https://openalex.org/I1298590031","https://openalex.org/I4405287265"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Atsushi Nakamura","raw_affiliation_strings":["Research Institute of Electronics; Shizuoka University; 3-5-1 Johoku Hamamatsu Shizuoka 432-8011 Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics; Shizuoka University; 3-5-1 Johoku Hamamatsu Shizuoka 432-8011 Japan","institution_ids":["https://openalex.org/I1298590031","https://openalex.org/I4405287265"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111573197","display_name":"Jiro Temmyo","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]},{"id":"https://openalex.org/I4405287265","display_name":"Research Institute of Electronics, Shizuoka University","ror":"https://ror.org/04mdx9d04","country_code":"JP","type":"facility","lineage":["https://openalex.org/I1298590031","https://openalex.org/I4405287265"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jiro Temmyo","raw_affiliation_strings":["Research Institute of Electronics; Shizuoka University; 3-5-1 Johoku Hamamatsu Shizuoka 432-8011 Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics; Shizuoka University; 3-5-1 Johoku Hamamatsu Shizuoka 432-8011 Japan","institution_ids":["https://openalex.org/I1298590031","https://openalex.org/I4405287265"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2270,"currency":"USD","value_usd":2270},"apc_paid":{"value":2270,"currency":"USD","value_usd":2270},"fwci":18.5675,"has_fulltext":false,"cited_by_count":411,"citation_normalized_percentile":{"value":0.99714659,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":100},"biblio":{"volume":"21","issue":"9","first_page":"11448","last_page":"11448"},"is_retracted":true,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11907","display_name":"Copper-based nanomaterials and applications","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11907","display_name":"Copper-based nanomaterials and applications","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.0012000000569969416,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cu2o-thin-films","display_name":"Cu2O thin films","score":0.902999997138977},{"id":"https://openalex.org/keywords/free-radical-oxidation","display_name":"free radical oxidation","score":0.7839999794960022},{"id":"https://openalex.org/keywords/nitrogen-plasma-treatment","display_name":"nitrogen plasma treatment","score":0.9470000267028809},{"id":"https://openalex.org/keywords/rf-power","display_name":"RF power","score":0.8330000042915344},{"id":"https://openalex.org/keywords/low-temperature-synthesis","display_name":"low-temperature synthesis","score":0.8519999980926514},{"id":"https://openalex.org/keywords/optical-band-gap","display_name":"optical band gap","score":0.7390000224113464},{"id":"https://openalex.org/keywords/hole-concentration","display_name":"hole concentration","score":0.7089999914169312},{"id":"https://openalex.org/keywords/electrical-resistivity","display_name":"electrical resistivity","score":0.847000002861023},{"id":"https://openalex.org/keywords/photovoltaic-devices","display_name":"photovoltaic devices","score":0.5230000019073486},{"id":"https://openalex.org/keywords/c-plane-sapphire-substrate","display_name":"c-plane sapphire substrate","score":0.8600000143051147},{"id":"https://openalex.org/keywords/111-preferred-orientation","display_name":"(111) preferred orientation","score":0.8820000290870667}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7644046545028687},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.6224754452705383},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.5812299847602844},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.5805935859680176},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.5710729360580444},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5682253837585449},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.536528468132019},{"id":"https://openalex.org/C2780064504","wikidata":"https://www.wikidata.org/wiki/Q127583","display_name":"Sapphire","level":3,"score":0.5078070759773254},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.5028607249259949},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.46580013632774353},{"id":"https://openalex.org/C537208039","wikidata":"https://www.wikidata.org/wiki/Q627","display_name":"Nitrogen","level":2,"score":0.4409509301185608},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.328930139541626},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.25668710470199585},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1463465690612793},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.13196656107902527},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.10167691111564636},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09290918707847595},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[{"descriptor_ui":"D003300","descriptor_name":"Copper","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":true},{"descriptor_ui":"D003460","descriptor_name":"Crystallization","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D005609","descriptor_name":"Free Radicals","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D008422","descriptor_name":"Materials Testing","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D008567","descriptor_name":"Membranes, Artificial","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D010084","descriptor_name":"Oxidation-Reduction","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D012666","descriptor_name":"Semiconductors","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D013696","descriptor_name":"Temperature","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D053758","descriptor_name":"Nanoparticles","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":true}],"locations_count":2,"locations":[{"id":"doi:10.1364/oe.21.011448","doi":"https://doi.org/10.1364/oe.21.011448","is_oa":true,"landing_page_url":"https://doi.org/10.1364/oe.21.011448","pdf_url":null,"source":{"id":"https://openalex.org/S178776955","display_name":"Optics Express","issn_l":"1094-4087","issn":["1094-4087"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-b","jufo-1","ki-jl-1","medline","norway-2","oarl","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics Express","raw_type":"journal-article"},{"id":"pmid:23670001","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/23670001","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics express","raw_type":"Journal Article"}],"best_oa_location":{"id":"doi:10.1364/oe.21.011448","doi":"https://doi.org/10.1364/oe.21.011448","is_oa":true,"landing_page_url":"https://doi.org/10.1364/oe.21.011448","pdf_url":null,"source":{"id":"https://openalex.org/S178776955","display_name":"Optics Express","issn_l":"1094-4087","issn":["1094-4087"],"is_oa":true,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-b","jufo-1","ki-jl-1","medline","norway-2","oarl","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.75}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1982546013","https://openalex.org/W1982916197","https://openalex.org/W1984778773","https://openalex.org/W1992099331","https://openalex.org/W2014872896","https://openalex.org/W2020352641","https://openalex.org/W2022314961","https://openalex.org/W2024489624","https://openalex.org/W2038307326","https://openalex.org/W2038716323","https://openalex.org/W2057862826","https://openalex.org/W2064329547","https://openalex.org/W2064428037","https://openalex.org/W2079169279","https://openalex.org/W2086462662","https://openalex.org/W2088676886","https://openalex.org/W2095179513","https://openalex.org/W2143287920"],"related_works":["https://openalex.org/W2043985383","https://openalex.org/W2031913703","https://openalex.org/W2982579866","https://openalex.org/W2000457089","https://openalex.org/W2022314961","https://openalex.org/W2537882817","https://openalex.org/W1972023487","https://openalex.org/W2020751317","https://openalex.org/W2756005845","https://openalex.org/W4391874208"],"abstract_inverted_index":{"Cuprous":[0],"oxide":[1],"(Cu(2)O)":[2],"films":[3,35,103,124],"synthesis":[4],"by":[5],"radical":[6],"oxidation":[7],"with":[8,40,125,136],"nitrogen":[9,45],"(N(2))":[10,46],"plasma":[11,47,62,97],"treatment":[12,63],"and":[13,84,147],"different":[14],"RF":[15,112,126],"power":[16,113,127],"at":[17],"low":[18],"temperature":[19],"(500":[20],"\u00b0C)":[21],"are":[22],"studied":[23],"in":[24],"this":[25],"paper.":[26],"X-ray":[27],"diffraction":[28],"measurements":[29],"show":[30,131],"that":[31,108],"synthesized":[32],"Cu(2)O":[33,102,110,123],"thin":[34],"grow":[36],"on":[37,122],"c-sapphire":[38],"substrate":[39],"preferred":[41],"(111)":[42],"orientation.":[43],"With":[44],"treatment,":[48,98],"the":[49,74,85,99],"optical":[50],"bandgap":[51],"energy":[52],"is":[53,65,77,87,104],"increased":[54,66,78],"from":[55,67,79,89],"1.69":[56],"to":[57,70,81,91,107],"2.42":[58],"eV,":[59],"when":[60],"N(2)":[61,96],"time":[64],"0":[68,129],"min":[69],"40":[71],"min.":[72],"Although":[73],"hole":[75],"density":[76],"10(14)":[80],"10(15)":[82],"cm(-3)":[83],"resistivity":[86],"decreased":[88],"1879":[90],"780":[92],"\u03a9":[93],"cm":[94],"after":[95],"performance":[100],"of":[101,109,114,128,139,144,151],"poorer":[105],"compared":[106],"using":[111],"0.":[115],"The":[116],"fabricated":[117],"ZnO/Cu(2)O":[118],"solar":[119],"cells":[120],"based":[121],"W":[130],"a":[132,137,148],"good":[133],"rectifying":[134],"behavior":[135],"efficiency":[138],"0.02%,":[140],"an":[141],"open-circuit":[142],"voltage":[143],"0.1":[145],"V,":[146],"fill":[149],"factor":[150],"24%.":[152]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":10},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":10},{"year":2019,"cited_by_count":37},{"year":2018,"cited_by_count":75},{"year":2017,"cited_by_count":117},{"year":2016,"cited_by_count":59},{"year":2015,"cited_by_count":46},{"year":2014,"cited_by_count":30},{"year":2013,"cited_by_count":4}],"updated_date":"2026-10-31T12:09:11.096373","created_date":"2016-06-24T00:00:00"}