{"id":"https://openalex.org/W2011843530","doi":"https://doi.org/10.1063/1.3208052","title":"Inverse geometry for grating-based x-ray phase-contrast imaging","display_name":"Inverse geometry for grating-based x-ray phase-contrast imaging","publication_year":2009,"publication_date":"2009-09-01","ids":{"openalex":"https://openalex.org/W2011843530","doi":"https://doi.org/10.1063/1.3208052","mag":"2011843530"},"language":"en","primary_location":{"id":"doi:10.1063/1.3208052","doi":"https://doi.org/10.1063/1.3208052","is_oa":true,"landing_page_url":"https://doi.org/10.1063/1.3208052","pdf_url":"https://aip.scitation.org/doi/pdf/10.1063/1.3208052","source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://aip.scitation.org/doi/pdf/10.1063/1.3208052","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026470636","display_name":"Tilman Donath","orcid":"https://orcid.org/0000-0002-0357-6385","observed_orcids":["https://orcid.org/0000-0002-0357-6385"]},"institutions":[{"id":"https://openalex.org/I2802229908","display_name":"Paul Scherrer Institute","ror":"https://ror.org/03eh3y714","country_code":"CH","type":"facility","lineage":["https://openalex.org/I2799323385","https://openalex.org/I2802229908"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Tilman Donath","raw_affiliation_strings":["Paul Scherrer Institut 1 , 5232 Villigen PSI, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Paul Scherrer Institut 1 , 5232 Villigen PSI, Switzerland","institution_ids":["https://openalex.org/I2802229908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025909859","display_name":"Michael Chabior","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael Chabior","raw_affiliation_strings":["Siemens AG 2 Corporate Technology, , 80200 M\u00fcnchen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens AG 2 Corporate Technology, , 80200 M\u00fcnchen, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022885146","display_name":"Franz Pfeiffer","orcid":"https://orcid.org/0000-0001-6665-4363","observed_orcids":["https://orcid.org/0000-0001-6665-4363"]},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Franz Pfeiffer","raw_affiliation_strings":["Technische Universit\u00e4t M\u00fcnchen 3 Department of Physik (E17), , 85748 Garching, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universit\u00e4t M\u00fcnchen 3 Department of Physik (E17), , 85748 Garching, Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007447103","display_name":"Oliver Bunk","orcid":"https://orcid.org/0000-0001-6563-4053","observed_orcids":["https://orcid.org/0000-0001-6563-4053"]},"institutions":[{"id":"https://openalex.org/I2802229908","display_name":"Paul Scherrer Institute","ror":"https://ror.org/03eh3y714","country_code":"CH","type":"facility","lineage":["https://openalex.org/I2799323385","https://openalex.org/I2802229908"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Oliver Bunk","raw_affiliation_strings":["Paul Scherrer Institut 1 , 5232 Villigen PSI, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Paul Scherrer Institut 1 , 5232 Villigen PSI, Switzerland","institution_ids":["https://openalex.org/I2802229908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064353953","display_name":"Elena F. Reznikova","orcid":"https://orcid.org/0000-0002-7277-6858","observed_orcids":["https://orcid.org/0000-0002-7277-6858"]},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Elena Reznikova","raw_affiliation_strings":["Forschungszentrum Karlsruhe 4 Institute of Microstructure Technology, , Postfach 3640, 76021 Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum Karlsruhe 4 Institute of Microstructure Technology, , Postfach 3640, 76021 Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113575998","display_name":"Juergen Mohr","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Juergen Mohr","raw_affiliation_strings":["Forschungszentrum Karlsruhe 4 Institute of Microstructure Technology, , Postfach 3640, 76021 Karlsruhe, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum Karlsruhe 4 Institute of Microstructure Technology, , Postfach 3640, 76021 Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108775843","display_name":"Eckhard Hempel","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210153902","display_name":"Siemens Healthineers (Germany)","ror":"https://ror.org/0449c4c15","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210153902"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Eckhard Hempel","raw_affiliation_strings":["Siemens AG 5 Healthcare Sector, , 91301 Forchheim, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens AG 5 Healthcare Sector, , 91301 Forchheim, Germany","institution_ids":["https://openalex.org/I4210153902"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112441721","display_name":"\u015etefan Popescu","orcid":"https://orcid.org/0009-0007-3078-7712","observed_orcids":["https://orcid.org/0009-0007-3078-7712"]},"institutions":[{"id":"https://openalex.org/I4210153902","display_name":"Siemens Healthineers (Germany)","ror":"https://ror.org/0449c4c15","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210153902"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stefan Popescu","raw_affiliation_strings":["Siemens AG 5 Healthcare Sector, , 91301 Forchheim, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens AG 5 Healthcare Sector, , 91301 Forchheim, Germany","institution_ids":["https://openalex.org/I4210153902"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003877075","display_name":"Martin Hoheisel","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210153902","display_name":"Siemens Healthineers (Germany)","ror":"https://ror.org/0449c4c15","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210153902"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Martin Hoheisel","raw_affiliation_strings":["Siemens AG 5 Healthcare Sector, , 91301 Forchheim, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens AG 5 Healthcare Sector, , 91301 Forchheim, Germany","institution_ids":["https://openalex.org/I4210153902"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087617508","display_name":"M. Schuster","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Manfred Schuster","raw_affiliation_strings":["Siemens AG 2 Corporate Technology, , 80200 M\u00fcnchen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens AG 2 Corporate Technology, , 80200 M\u00fcnchen, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103438155","display_name":"Joachim Baumann","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Joachim Baumann","raw_affiliation_strings":["Siemens AG 2 Corporate Technology, , 80200 M\u00fcnchen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens AG 2 Corporate Technology, , 80200 M\u00fcnchen, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020632738","display_name":"Christian D\u00e1vid","orcid":"https://orcid.org/0000-0002-2953-1265","observed_orcids":["https://orcid.org/0000-0002-2953-1265"]},"institutions":[{"id":"https://openalex.org/I2802229908","display_name":"Paul Scherrer Institute","ror":"https://ror.org/03eh3y714","country_code":"CH","type":"facility","lineage":["https://openalex.org/I2799323385","https://openalex.org/I2802229908"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Christian David","raw_affiliation_strings":["Paul Scherrer Institut 1 , 5232 Villigen PSI, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Paul Scherrer Institut 1 , 5232 Villigen PSI, Switzerland","institution_ids":["https://openalex.org/I2802229908"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":6.7091,"has_fulltext":true,"cited_by_count":181,"citation_normalized_percentile":{"value":0.97148874,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"106","issue":"5","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/x-ray-phase-contrast-imaging","display_name":"X-ray phase contrast imaging","score":0.9890000224113464},{"id":"https://openalex.org/keywords/grating-interferometry","display_name":"grating interferometry","score":0.8330000042915344},{"id":"https://openalex.org/keywords/phase-gratings","display_name":"phase gratings","score":0.6909999847412109},{"id":"https://openalex.org/keywords/angular-sensitivity","display_name":"angular sensitivity","score":0.8700000047683716},{"id":"https://openalex.org/keywords/sample-position","display_name":"sample position","score":0.621999979019165},{"id":"https://openalex.org/keywords/computed-tomography","display_name":"computed tomography","score":0.9229999780654907},{"id":"https://openalex.org/keywords/polychromatic-x-ray-source","display_name":"polychromatic X-ray source","score":0.8700000047683716},{"id":"https://openalex.org/keywords/grating-fabrication","display_name":"grating fabrication","score":0.7720000147819519}],"concepts":[{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.881873369216919},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7941561937332153},{"id":"https://openalex.org/C23576306","wikidata":"https://www.wikidata.org/wiki/Q17004698","display_name":"Astronomical interferometer","level":3,"score":0.7127723693847656},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.633793294429779},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.6088714003562927},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.5981006026268005},{"id":"https://openalex.org/C58640550","wikidata":"https://www.wikidata.org/wiki/Q7180908","display_name":"Phase-contrast imaging","level":3,"score":0.5860190391540527},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.5451239347457886},{"id":"https://openalex.org/C207467116","wikidata":"https://www.wikidata.org/wiki/Q4385666","display_name":"Inverse","level":2,"score":0.5357863903045654},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.5042790174484253},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4723542630672455},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.42143136262893677},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.2373996376991272},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13054874539375305},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.09244045615196228},{"id":"https://openalex.org/C151193507","wikidata":"https://www.wikidata.org/wiki/Q898815","display_name":"Phase contrast microscopy","level":2,"score":0.06148076057434082},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1063/1.3208052","doi":"https://doi.org/10.1063/1.3208052","is_oa":true,"landing_page_url":"https://doi.org/10.1063/1.3208052","pdf_url":"https://aip.scitation.org/doi/pdf/10.1063/1.3208052","source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},{"id":"pmh:oai:dora:psi_17457","doi":null,"is_oa":true,"landing_page_url":"https://www.dora.lib4ri.ch/psi/item/psi:17457","pdf_url":"https://www.dora.lib4ri.ch/psi/dload/psi:17457/PDF/view","source":{"id":"https://openalex.org/S4306402574","display_name":"DORA PSI (Paul Scherrer Institute)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I2802229908","host_organization_name":"Paul Scherrer Institute","host_organization_lineage":["https://openalex.org/I2802229908"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Applied Physics","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1063/1.3208052","doi":"https://doi.org/10.1063/1.3208052","is_oa":true,"landing_page_url":"https://doi.org/10.1063/1.3208052","pdf_url":"https://aip.scitation.org/doi/pdf/10.1063/1.3208052","source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"},{"id":"https://openalex.org/F4320324241","display_name":"Munich-Centre for Advanced Photonics","ror":"https://ror.org/04j4kfb22"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2011843530.pdf","grobid_xml":"https://content.openalex.org/works/W2011843530.grobid-xml"},"referenced_works_count":17,"referenced_works":["https://openalex.org/W1531765914","https://openalex.org/W1968876579","https://openalex.org/W1972976109","https://openalex.org/W1974177413","https://openalex.org/W1984026658","https://openalex.org/W2001118182","https://openalex.org/W2006832922","https://openalex.org/W2025100489","https://openalex.org/W2025185489","https://openalex.org/W2029351341","https://openalex.org/W2046110307","https://openalex.org/W2048284433","https://openalex.org/W2050565643","https://openalex.org/W2078352228","https://openalex.org/W2084265296","https://openalex.org/W2126722841","https://openalex.org/W2129317743"],"related_works":["https://openalex.org/W1980750198","https://openalex.org/W3117188971","https://openalex.org/W7018271718","https://openalex.org/W4313855478","https://openalex.org/W1978666231","https://openalex.org/W2056086079","https://openalex.org/W2010279879","https://openalex.org/W2008361312","https://openalex.org/W2147371586","https://openalex.org/W4393375941"],"abstract_inverted_index":{"Phase-contrast":[0],"imaging":[1],"using":[2],"conventional":[3,82],"polychromatic":[4],"x-ray":[5,16],"sources":[6],"and":[7,13,34,56,70,80,100],"grating":[8,29,54],"interferometers":[9],"has":[10],"been":[11],"developed":[12],"demonstrated":[14],"for":[15,31,53,57,76],"energies":[17],"up":[18],"to":[19,113],"60":[20],"keV.":[21],"Here,":[22],"we":[23,92,140],"conduct":[24],"an":[25,142],"analysis":[26],"of":[27,60,87,131],"possible":[28],"configurations":[30],"this":[32],"technique":[33],"present":[35],"further":[36],"geometrical":[37],"arrangements":[38,96],"not":[39],"considered":[40],"so":[41],"far.":[42],"An":[43],"inverse":[44,79,143],"interferometer":[45],"geometry":[46,144],"is":[47,105,111],"investigated":[48,109],"that":[49,94,101],"offers":[50],"significant":[51],"advantages":[52],"fabrication":[55],"the":[58,61,72,78,81,88,102,108,114,121,124,134,146,150],"application":[59],"method":[62],"in":[63,129],"computed":[64],"tomography":[65],"(CT)":[66],"scanners.":[67],"We":[68,118],"derive":[69],"measure":[71],"interferometer\u2019s":[73,115],"angular":[74],"sensitivity":[75,104],"both":[77,95],"configuration":[83],"as":[84],"a":[85],"function":[86],"sample":[89,125,147],"position.":[90],"Thereby,":[91],"show":[93],"are":[97],"equally":[98],"sensitive":[99],"highest":[103],"obtained,":[106],"when":[107],"object":[110],"close":[112],"phase":[116,135,151],"grating.":[117,136,152],"also":[119],"discuss":[120],"question":[122],"whether":[123],"should":[126],"be":[127],"placed":[128],"front":[130],"or":[132],"behind":[133,149],"For":[137],"CT":[138],"applications,":[139],"propose":[141],"with":[145],"position":[148]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":18},{"year":2021,"cited_by_count":17},{"year":2020,"cited_by_count":23},{"year":2019,"cited_by_count":15},{"year":2018,"cited_by_count":10},{"year":2017,"cited_by_count":12},{"year":2016,"cited_by_count":8},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":13},{"year":2013,"cited_by_count":8},{"year":2012,"cited_by_count":6}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}