{"id":"https://openalex.org/W2011487971","doi":"https://doi.org/10.1016/s0304-3991(03)00100-1","title":"Scattering of \u00c5-scale electron probes in silicon","display_name":"Scattering of \u00c5-scale electron probes in silicon","publication_year":2003,"publication_date":"2003-05-19","ids":{"openalex":"https://openalex.org/W2011487971","doi":"https://doi.org/10.1016/s0304-3991(03)00100-1","mag":"2011487971","pmid":"https://pubmed.ncbi.nlm.nih.gov/12871800"},"language":"en","primary_location":{"id":"doi:10.1016/s0304-3991(03)00100-1","doi":"https://doi.org/10.1016/s0304-3991(03)00100-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0304-3991(03)00100-1","pdf_url":null,"source":{"id":"https://openalex.org/S27731274","display_name":"Ultramicroscopy","issn_l":"0304-3991","issn":["0304-3991","1879-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ultramicroscopy","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068945274","display_name":"Christian Dwyer","orcid":"https://orcid.org/0000-0002-4093-3716","observed_orcids":["https://orcid.org/0000-0002-4093-3716"]},"institutions":[{"id":"https://openalex.org/I241749","display_name":"University of Cambridge","ror":"https://ror.org/013meh722","country_code":"GB","type":"education","lineage":["https://openalex.org/I241749"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"C. Dwyer","raw_affiliation_strings":["Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge CB2 3QZ, UK. cd269@cus.cam.ac.uk","Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge CB2 3QZ (UK)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge CB2 3QZ, UK. cd269@cus.cam.ac.uk","institution_ids":["https://openalex.org/I241749"]},{"raw_affiliation_string":"Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge CB2 3QZ (UK)","institution_ids":["https://openalex.org/I241749"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010866490","display_name":"Joanne Etheridge","orcid":"https://orcid.org/0000-0002-3199-3936","observed_orcids":["https://orcid.org/0000-0002-3199-3936"]},"institutions":[{"id":"https://openalex.org/I56590836","display_name":"Monash University","ror":"https://ror.org/02bfwt286","country_code":"AU","type":"education","lineage":["https://openalex.org/I56590836"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"J. Etheridge","raw_affiliation_strings":["School of Physics and Materials Engineering, P.O. Box 69M, Monash University, Victoria 3800, Australia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physics and Materials Engineering, P.O. Box 69M, Monash University, Victoria 3800, Australia","institution_ids":["https://openalex.org/I56590836"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5068945274"],"corresponding_institution_ids":["https://openalex.org/I241749"],"apc_list":{"value":3760,"currency":"USD","value_usd":3760},"apc_paid":null,"fwci":3.094,"has_fulltext":false,"cited_by_count":99,"citation_normalized_percentile":{"value":0.92298289,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":87,"max":98},"biblio":{"volume":"96","issue":"3-4","first_page":"343","last_page":"360"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9707000255584717,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9707000255584717,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.025499999523162842,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.001500000013038516,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electron-scattering","display_name":"electron scattering","score":0.7099999785423279},{"id":"https://openalex.org/keywords/silicon","display_name":"silicon","score":0.625},{"id":"https://openalex.org/keywords/annular-dark-field-imaging","display_name":"annular dark-field imaging","score":0.8199999928474426},{"id":"https://openalex.org/keywords/electron-energy-loss-spectroscopy","display_name":"electron energy loss spectroscopy","score":0.9049999713897705},{"id":"https://openalex.org/keywords/scanning-transmission-electron-microscopy","display_name":"scanning transmission electron microscopy","score":0.871999979019165},{"id":"https://openalex.org/keywords/crystal-orientation","display_name":"crystal orientation","score":0.7459999918937683},{"id":"https://openalex.org/keywords/probe-size","display_name":"probe size","score":0.5630000233650208},{"id":"https://openalex.org/keywords/crystal-thickness","display_name":"crystal thickness","score":0.5789999961853027},{"id":"https://openalex.org/keywords/spatial-resolution","display_name":"spatial resolution","score":0.8080000281333923},{"id":"https://openalex.org/keywords/atomic-structure","display_name":"atomic structure","score":0.6919999718666077}],"concepts":[{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.6305544972419739},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.5356903076171875},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.5309550166130066},{"id":"https://openalex.org/C2781285689","wikidata":"https://www.wikidata.org/wiki/Q21921428","display_name":"Crystal (programming language)","level":2,"score":0.5248599052429199},{"id":"https://openalex.org/C93038891","wikidata":"https://www.wikidata.org/wiki/Q1061524","display_name":"Intensity (physics)","level":2,"score":0.5058207511901855},{"id":"https://openalex.org/C146285849","wikidata":"https://www.wikidata.org/wiki/Q1327107","display_name":"Electron scattering","level":3,"score":0.4869316816329956},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4798969030380249},{"id":"https://openalex.org/C193016168","wikidata":"https://www.wikidata.org/wiki/Q874835","display_name":"Scanning transmission electron microscopy","level":3,"score":0.46588554978370667},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4431880712509155},{"id":"https://openalex.org/C144783951","wikidata":"https://www.wikidata.org/wiki/Q907728","display_name":"Energy filtered transmission electron microscopy","level":4,"score":0.4369380474090576},{"id":"https://openalex.org/C41999313","wikidata":"https://www.wikidata.org/wiki/Q489328","display_name":"Molecular physics","level":1,"score":0.4274744391441345},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.4248838424682617},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3997226357460022},{"id":"https://openalex.org/C93877712","wikidata":"https://www.wikidata.org/wiki/Q132560","display_name":"Electron microscope","level":2,"score":0.38698333501815796},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.36024636030197144},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2414427399635315},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.11432015895843506},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/s0304-3991(03)00100-1","doi":"https://doi.org/10.1016/s0304-3991(03)00100-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0304-3991(03)00100-1","pdf_url":null,"source":{"id":"https://openalex.org/S27731274","display_name":"Ultramicroscopy","issn_l":"0304-3991","issn":["0304-3991","1879-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ultramicroscopy","raw_type":"journal-article"},{"id":"pmid:12871800","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/12871800","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ultramicroscopy","raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320006","display_name":"Royal Society","ror":"https://ror.org/03wnrjx87"},{"id":"https://openalex.org/F4320321847","display_name":"Cambridge Commonwealth Trust","ror":"https://ror.org/05sprqy15"},{"id":"https://openalex.org/F4320321848","display_name":"Cambridge Trust","ror":"https://ror.org/05sprqy15"},{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1494756798","https://openalex.org/W1503171527","https://openalex.org/W1563717965","https://openalex.org/W1966272533","https://openalex.org/W1968610501","https://openalex.org/W1971836746","https://openalex.org/W2003879485","https://openalex.org/W2029035749","https://openalex.org/W2031153534","https://openalex.org/W2037165138","https://openalex.org/W2041912662","https://openalex.org/W2045721448","https://openalex.org/W2054034970","https://openalex.org/W2069845974","https://openalex.org/W2072850511","https://openalex.org/W2081346280","https://openalex.org/W2083705141","https://openalex.org/W2101397512","https://openalex.org/W2114093861","https://openalex.org/W2138836771","https://openalex.org/W2153389640","https://openalex.org/W2163786183","https://openalex.org/W2568517666","https://openalex.org/W4299070324"],"related_works":["https://openalex.org/W2157084312","https://openalex.org/W2313275217","https://openalex.org/W4402515366","https://openalex.org/W2056176653","https://openalex.org/W4408054343","https://openalex.org/W2753928452","https://openalex.org/W2138836771","https://openalex.org/W7131967225","https://openalex.org/W1995255247","https://openalex.org/W7052370301"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":6}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2016-06-24T00:00:00"}