{"id":"https://openalex.org/W2010690307","doi":"https://doi.org/10.1016/s1359-6462(02)00146-x","title":"Electrical properties of MgO\u2013ZrO2 insulation coatings on Ag and AgMg/Bi-2212 tapes for magnet technology","display_name":"Electrical properties of MgO\u2013ZrO2 insulation coatings on Ag and AgMg/Bi-2212 tapes for magnet technology","publication_year":2002,"publication_date":"2002-09-01","ids":{"openalex":"https://openalex.org/W2010690307","doi":"https://doi.org/10.1016/s1359-6462(02)00146-x","mag":"2010690307"},"language":"en","primary_location":{"id":"doi:10.1016/s1359-6462(02)00146-x","doi":"https://doi.org/10.1016/s1359-6462(02)00146-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s1359-6462(02)00146-x","pdf_url":null,"source":{"id":"https://openalex.org/S105962883","display_name":"Scripta Materialia","issn_l":"1359-6462","issn":["1359-6462","1872-8456"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-3","norway-2","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Scripta Materialia","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112663450","display_name":"Erdal \u00c7elik","orcid":"https://orcid.org/0000-0002-5922-5488","observed_orcids":["https://orcid.org/0000-0002-5922-5488"]},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]},{"id":"https://openalex.org/I193615760","display_name":"Dokuz Eyl\u00fcl University","ror":"https://ror.org/00dbd8b73","country_code":"TR","type":"education","lineage":["https://openalex.org/I193615760"]},{"id":"https://openalex.org/I4210132808","display_name":"National High Magnetic Field Laboratory","ror":"https://ror.org/03s53g630","country_code":"US","type":"facility","lineage":["https://openalex.org/I103163165","https://openalex.org/I1311060795","https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I33213144","https://openalex.org/I4210120050","https://openalex.org/I4210132808"]}],"countries":["TR","US"],"is_corresponding":true,"raw_author_name":"Erdal Celik","raw_affiliation_strings":["Department of Metallurgical and Materials Engineering, Dokuz Eylul University, Bornova, Izmir 35100, Turkey","National High Magnetic Field Laboratory-FSU, 1800 E. Paul Dirac Drive, Tallahassee, FL 32310, USA","Superconductivity Research Laboratory, ISTEC, 2-4-1 Mutsuno, Atsuta-ku, Nagoya 456-8587, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Metallurgical and Materials Engineering, Dokuz Eylul University, Bornova, Izmir 35100, Turkey","institution_ids":["https://openalex.org/I193615760"]},{"raw_affiliation_string":"National High Magnetic Field Laboratory-FSU, 1800 E. Paul Dirac Drive, Tallahassee, FL 32310, USA","institution_ids":["https://openalex.org/I103163165","https://openalex.org/I4210132808"]},{"raw_affiliation_string":"Superconductivity Research Laboratory, ISTEC, 2-4-1 Mutsuno, Atsuta-ku, Nagoya 456-8587, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016325893","display_name":"\u0130brahim Halil Mutlu","orcid":"https://orcid.org/0000-0003-1643-4332","observed_orcids":["https://orcid.org/0000-0003-1643-4332"]},"institutions":[{"id":"https://openalex.org/I80538482","display_name":"Harran University","ror":"https://ror.org/057qfs197","country_code":"TR","type":"education","lineage":["https://openalex.org/I80538482"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Ibrahim H. Mutlu","raw_affiliation_strings":["Department of Physics, Harran University, Sanliurfa 63300, Turkey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Harran University, Sanliurfa 63300, Turkey","institution_ids":["https://openalex.org/I80538482"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023811728","display_name":"Y.S. Has\u00e7i\u00e7ek","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]},{"id":"https://openalex.org/I4210132808","display_name":"National High Magnetic Field Laboratory","ror":"https://ror.org/03s53g630","country_code":"US","type":"facility","lineage":["https://openalex.org/I103163165","https://openalex.org/I1311060795","https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I33213144","https://openalex.org/I4210120050","https://openalex.org/I4210132808"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yusuf S. Hascicek","raw_affiliation_strings":["National High Magnetic Field Laboratory-FSU, 1800 E. Paul Dirac Drive, Tallahassee, FL 32310, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National High Magnetic Field Laboratory-FSU, 1800 E. Paul Dirac Drive, Tallahassee, FL 32310, USA","institution_ids":["https://openalex.org/I103163165","https://openalex.org/I4210132808"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5112663450"],"corresponding_institution_ids":["https://openalex.org/I103163165","https://openalex.org/I193615760","https://openalex.org/I4210132808"],"apc_list":{"value":3220,"currency":"USD","value_usd":3220},"apc_paid":null,"fwci":1.1899,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.77285864,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"47","issue":"5","first_page":"315","last_page":"320"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11808","display_name":"Superconducting Materials and Applications","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10132","display_name":"Advanced ceramic materials synthesis","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2503","display_name":"Ceramics and Composites"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/high-temperature-superconductors","display_name":"high-temperature superconductors","score":0.7160000205039978},{"id":"https://openalex.org/keywords/dielectric-constant","display_name":"dielectric constant","score":0.9010000228881836},{"id":"https://openalex.org/keywords/high-voltage-breakdown","display_name":"high-voltage breakdown","score":0.8880000114440918},{"id":"https://openalex.org/keywords/sol-gel-coatings","display_name":"sol-gel coatings","score":0.7020000219345093},{"id":"https://openalex.org/keywords/alkoxide-precursors","display_name":"alkoxide precursors","score":0.9200000166893005},{"id":"https://openalex.org/keywords/coating-thickness","display_name":"coating thickness","score":0.5680000185966492},{"id":"https://openalex.org/keywords/epoxy-resin","display_name":"epoxy resin","score":0.7710000276565552}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.92704838514328},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.7127366065979004},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.7117602825164795},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.6720557808876038},{"id":"https://openalex.org/C166595027","wikidata":"https://www.wikidata.org/wiki/Q143983","display_name":"Epoxy","level":2,"score":0.6149925589561462},{"id":"https://openalex.org/C2781448156","wikidata":"https://www.wikidata.org/wiki/Q1570182","display_name":"Coating","level":2,"score":0.5563242435455322},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.49345269799232483},{"id":"https://openalex.org/C70401718","wikidata":"https://www.wikidata.org/wiki/Q343241","display_name":"Dielectric strength","level":3,"score":0.4768570363521576},{"id":"https://openalex.org/C91066073","wikidata":"https://www.wikidata.org/wiki/Q1417868","display_name":"Dielectric loss","level":3,"score":0.4275773763656616},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3354042172431946},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15792840719223022},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1045924723148346},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/s1359-6462(02)00146-x","doi":"https://doi.org/10.1016/s1359-6462(02)00146-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s1359-6462(02)00146-x","pdf_url":null,"source":{"id":"https://openalex.org/S105962883","display_name":"Scripta Materialia","issn_l":"1359-6462","issn":["1359-6462","1872-8456"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-3","norway-2","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Scripta Materialia","raw_type":"journal-article"},{"id":"pmh:a762ba9b-25a1-4be6-987f-0baa7efb884e","doi":null,"is_oa":false,"landing_page_url":"https://avesis.aybu.edu.tr/publication/details/a762ba9b-25a1-4be6-987f-0baa7efb884e/oai","pdf_url":null,"source":{"id":"https://openalex.org/S7407055213","display_name":"AYBU AVESIS","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332377","display_name":"Goddard Space Flight Center","ror":"https://ror.org/0171mag52"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1671839863","https://openalex.org/W1967153064","https://openalex.org/W1979753012","https://openalex.org/W1998964957","https://openalex.org/W2005985028","https://openalex.org/W2028360763","https://openalex.org/W2031033315","https://openalex.org/W2046138940","https://openalex.org/W2046465716","https://openalex.org/W2049243969","https://openalex.org/W2070680198","https://openalex.org/W2124639433","https://openalex.org/W2140293030","https://openalex.org/W2151287538","https://openalex.org/W2153081734","https://openalex.org/W3157843320"],"related_works":["https://openalex.org/W7132311648","https://openalex.org/W2124639433","https://openalex.org/W2065508458","https://openalex.org/W2154289179","https://openalex.org/W2034356582","https://openalex.org/W1646731937","https://openalex.org/W2005985028","https://openalex.org/W1671839863","https://openalex.org/W2053741611","https://openalex.org/W2054349995"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2016-06-24T00:00:00"}