{"id":"https://openalex.org/W2010595644","doi":"https://doi.org/10.1364/ao.44.007191","title":"Multilayer silicon cavity mirrors for the far-infrared p-Ge laser","display_name":"Multilayer silicon cavity mirrors for the far-infrared p-Ge laser","publication_year":2005,"publication_date":"2005-11-20","ids":{"openalex":"https://openalex.org/W2010595644","doi":"https://doi.org/10.1364/ao.44.007191","mag":"2010595644","pmid":"https://pubmed.ncbi.nlm.nih.gov/16318192"},"language":"en","primary_location":{"id":"doi:10.1364/ao.44.007191","doi":"https://doi.org/10.1364/ao.44.007191","is_oa":false,"landing_page_url":"https://doi.org/10.1364/ao.44.007191","pdf_url":null,"source":{"id":"https://openalex.org/S4210211917","display_name":"Applied Optics","issn_l":"0003-6935","issn":["0003-6935","1539-4522","1540-8981","1559-128X","2155-3165"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["anvur-scientific","dongbi-c","jufo-1","medline","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Optics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://stars.library.ucf.edu/facultybib2000/5150","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069621040","display_name":"Todd W. Du Bosq","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Todd W. Du Bosq","raw_affiliation_strings":["Department of Physics, University of Central Florida, Orlando, Florida 32816, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Central Florida, Orlando, Florida 32816, USA","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111733705","display_name":"Andrey V. Muravjov","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Andrey V. Muravjov","raw_affiliation_strings":["T. W. Du Bosq, A. V. Muravjov, and R. E. Peale (rep@physics.ucf.edu) are with the Department of Physics, University of Central Florida, Orlando, Florida 32816"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"T. W. Du Bosq, A. V. Muravjov, and R. E. Peale (rep@physics.ucf.edu) are with the Department of Physics, University of Central Florida, Orlando, Florida 32816","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006485603","display_name":"Robert E. Peale","orcid":"https://orcid.org/0000-0002-7527-1257","observed_orcids":["https://orcid.org/0000-0002-7527-1257"]},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Robert E. Peale","raw_affiliation_strings":["T. W. Du Bosq, A. V. Muravjov, and R. E. Peale (rep@physics.ucf.edu) are with the Department of Physics, University of Central Florida, Orlando, Florida 32816"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"T. W. Du Bosq, A. V. Muravjov, and R. E. Peale (rep@physics.ucf.edu) are with the Department of Physics, University of Central Florida, Orlando, Florida 32816","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111915888","display_name":"Chris J. Fredricksen","orcid":"https://orcid.org/0009-0003-4531-7378","observed_orcids":["https://orcid.org/0009-0003-4531-7378"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Christopher J. Fredricksen","raw_affiliation_strings":["C. J. Fredricksen is with Zaubertek, Incorporated, 1809 East Broadway Street, Oviedo, Florida 32765"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"C. J. Fredricksen is with Zaubertek, Incorporated, 1809 East Broadway Street, Oviedo, Florida 32765","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5006485603","https://openalex.org/A5069621040","https://openalex.org/A5111733705"],"corresponding_institution_ids":["https://openalex.org/I106165777"],"apc_list":null,"apc_paid":null,"fwci":0.567,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.63585509,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":94},"biblio":{"volume":"44","issue":"33","first_page":"7191","last_page":"7191"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.8417999744415283,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.8417999744415283,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.038100000470876694,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.030400000512599945,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multilayer-mirrors","display_name":"multilayer mirrors","score":0.9319999814033508},{"id":"https://openalex.org/keywords/far-infrared-optics","display_name":"far-infrared optics","score":0.7649999856948853},{"id":"https://openalex.org/keywords/high-reflectivity","display_name":"high reflectivity","score":0.6790000200271606},{"id":"https://openalex.org/keywords/free-carrier-absorption","display_name":"free carrier absorption","score":0.8659999966621399},{"id":"https://openalex.org/keywords/cavity-mirrors","display_name":"cavity mirrors","score":0.546999990940094}],"concepts":[{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7921946048736572},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7840522527694702},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.771103024482727},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.6906601190567017},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.6078914403915405},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.5692129731178284},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.544213593006134},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5255930423736572},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.4286065697669983},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06688699126243591}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1364/ao.44.007191","doi":"https://doi.org/10.1364/ao.44.007191","is_oa":false,"landing_page_url":"https://doi.org/10.1364/ao.44.007191","pdf_url":null,"source":{"id":"https://openalex.org/S4210211917","display_name":"Applied Optics","issn_l":"0003-6935","issn":["0003-6935","1539-4522","1540-8981","1559-128X","2155-3165"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["anvur-scientific","dongbi-c","jufo-1","medline","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Optics","raw_type":"journal-article"},{"id":"pmid:16318192","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/16318192","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied optics","raw_type":"Journal Article"},{"id":"pmh:oai:stars.library.ucf.edu:facultybib2000-6149","doi":null,"is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/facultybib2000/5150","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","vabb-shw"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Faculty Bibliography 2000s","raw_type":"text"},{"id":"pmh:oai:stars.library.ucf.edu:scopus2000-4536","doi":null,"is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/scopus2000/3537","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","vabb-shw"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus Export 2000s","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:stars.library.ucf.edu:facultybib2000-6149","doi":null,"is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/facultybib2000/5150","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","vabb-shw"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Faculty Bibliography 2000s","raw_type":"text"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1550105752","https://openalex.org/W1972905540","https://openalex.org/W1979900997","https://openalex.org/W2031011687","https://openalex.org/W2042989574","https://openalex.org/W2063746131","https://openalex.org/W2067229155","https://openalex.org/W2118184001","https://openalex.org/W2257511720"],"related_works":["https://openalex.org/W1972905540","https://openalex.org/W2067229155","https://openalex.org/W1987038557","https://openalex.org/W2118184001","https://openalex.org/W2034555825","https://openalex.org/W2057190617","https://openalex.org/W2042989574","https://openalex.org/W2034646128","https://openalex.org/W2035267827","https://openalex.org/W2060827179"],"abstract_inverted_index":{"Multilayer":[0],"mirrors":[1],"capable":[2],"of":[3,37,44,46,97],">":[4],"99.9%":[5,34],"reflectivity":[6,35,98],"in":[7],"the":[8,38,42,50,92],"far":[9],"infrared":[10],"(70-200":[11],"microm":[12],"wavelengths)":[13],"were":[14,72],"constructed":[15],"using":[16],"thin":[17],"silicon":[18,47,59],"etalons":[19],"separated":[20],"by":[21],"empty":[22],"gaps.":[23],"Calculations":[24],"indicate":[25],"that":[26],"only":[27],"three":[28],"periods":[29],"are":[30],"required":[31],"to":[32,67],"produce":[33],"because":[36],"large":[39],"difference":[40],"between":[41],"index":[43],"refraction":[45],"(3.384)":[48],"and":[49],"vacuum":[51],"(1).":[52],"The":[53,82],"mirror":[54,84,90],"was":[55,85,102],"assembled":[56],"from":[57],"high-purity":[58],"wafers,":[60],"with":[61,75],"resistivity":[62],"over":[63],"4000":[64],"omega":[65],"cm":[66],"reduce":[68],"free-carrier":[69],"absorption.":[70],"Wafers":[71],"double-side":[73],"polished":[74],"faces":[76],"parallel":[77],"within":[78],"10":[79],"arc":[80],"sec.":[81],"multilayer":[83],"demonstrated":[86],"as":[87],"a":[88],"cavity":[89],"for":[91],"far-infrared":[93],"p-Ge":[94],"laser.":[95],"Dependence":[96],"on":[99],"design":[100],"accuracy":[101],"considered.":[103]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}