{"id":"https://openalex.org/W2010588982","doi":"https://doi.org/10.1016/j.polymdegradstab.2007.12.004","title":"Effects of X-ray radiation on the surface chemical composition of plasma deposited thin fluorocarbon films","display_name":"Effects of X-ray radiation on the surface chemical composition of plasma deposited thin fluorocarbon films","publication_year":2007,"publication_date":"2007-12-28","ids":{"openalex":"https://openalex.org/W2010588982","doi":"https://doi.org/10.1016/j.polymdegradstab.2007.12.004","mag":"2010588982"},"language":"en","primary_location":{"id":"doi:10.1016/j.polymdegradstab.2007.12.004","doi":"https://doi.org/10.1016/j.polymdegradstab.2007.12.004","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.polymdegradstab.2007.12.004","pdf_url":null,"source":{"id":"https://openalex.org/S10124807","display_name":"Polymer Degradation and Stability","issn_l":"0141-3910","issn":["0141-3910","1873-2321"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Polymer Degradation and Stability","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024946773","display_name":"Marcel Himmerlich","orcid":"https://orcid.org/0000-0001-8833-044X","observed_orcids":["https://orcid.org/0000-0001-8833-044X"]},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Himmerlich","raw_affiliation_strings":["Institut f\u00fcr Physik and Institut f\u00fcr Mikro- und Nanotechnologien, Technische Universit\u00e4t Ilmenau, P.O. Box 100565, 98684 Ilmenau, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Physik and Institut f\u00fcr Mikro- und Nanotechnologien, Technische Universit\u00e4t Ilmenau, P.O. Box 100565, 98684 Ilmenau, Germany","institution_ids":["https://openalex.org/I119449181"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085625191","display_name":"Vasil Yanev","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210148684","display_name":"Fraunhofer Institute for Integrated Systems and Device Technology","ror":"https://ror.org/04q5rka56","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210148684","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"V. Yanev","raw_affiliation_strings":["Fraunhofer Institut f\u00fcr Integrierte Systeme und Bauelementetechnologie, Schottkystra\u00dfe 10, 91058 Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Institut f\u00fcr Integrierte Systeme und Bauelementetechnologie, Schottkystra\u00dfe 10, 91058 Erlangen, Germany","institution_ids":["https://openalex.org/I4210148684"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076062886","display_name":"Andreas Opitz","orcid":"https://orcid.org/0000-0002-3214-8398","observed_orcids":["https://orcid.org/0000-0002-3214-8398"]},"institutions":[{"id":"https://openalex.org/I179225836","display_name":"University of Augsburg","ror":"https://ror.org/03p14d497","country_code":"DE","type":"education","lineage":["https://openalex.org/I179225836"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. Opitz","raw_affiliation_strings":["Institut f\u00fcr Physik, Universit\u00e4t Augsburg, 86153 Augsburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Physik, Universit\u00e4t Augsburg, 86153 Augsburg, Germany","institution_ids":["https://openalex.org/I179225836"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008943531","display_name":"Angela Keppler","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. Keppler","raw_affiliation_strings":["Institut f\u00fcr Physik and Institut f\u00fcr Mikro- und Nanotechnologien, Technische Universit\u00e4t Ilmenau, P.O. Box 100565, 98684 Ilmenau, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Physik and Institut f\u00fcr Mikro- und Nanotechnologien, Technische Universit\u00e4t Ilmenau, P.O. Box 100565, 98684 Ilmenau, Germany","institution_ids":["https://openalex.org/I119449181"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112816885","display_name":"Juergen A. Schaefer","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J.A. Schaefer","raw_affiliation_strings":["Institut f\u00fcr Physik and Institut f\u00fcr Mikro- und Nanotechnologien, Technische Universit\u00e4t Ilmenau, P.O. Box 100565, 98684 Ilmenau, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Physik and Institut f\u00fcr Mikro- und Nanotechnologien, Technische Universit\u00e4t Ilmenau, P.O. Box 100565, 98684 Ilmenau, Germany","institution_ids":["https://openalex.org/I119449181"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077378161","display_name":"Stefan Krischok","orcid":"https://orcid.org/0000-0002-8458-4001","observed_orcids":["https://orcid.org/0000-0002-8458-4001"]},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"S. Krischok","raw_affiliation_strings":["Institut f\u00fcr Physik and Institut f\u00fcr Mikro- und Nanotechnologien, Technische Universit\u00e4t Ilmenau, P.O. Box 100565, 98684 Ilmenau, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Physik and Institut f\u00fcr Mikro- und Nanotechnologien, Technische Universit\u00e4t Ilmenau, P.O. Box 100565, 98684 Ilmenau, Germany","institution_ids":["https://openalex.org/I119449181"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5077378161"],"corresponding_institution_ids":["https://openalex.org/I119449181"],"apc_list":{"value":4190,"currency":"USD","value_usd":4190},"apc_paid":null,"fwci":0.9492,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.70470003,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"93","issue":"3","first_page":"700","last_page":"706"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.5238999724388123,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.5238999724388123,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","score":0.3163999915122986,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12084","display_name":"Synthesis and properties of polymers","score":0.027000000700354576,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fluorocarbon-thin-films","display_name":"fluorocarbon thin films","score":0.9129999876022339},{"id":"https://openalex.org/keywords/x-ray-irradiation","display_name":"X-ray irradiation","score":0.8100000023841858},{"id":"https://openalex.org/keywords/plasma-polymerization","display_name":"plasma polymerization","score":0.6439999938011169},{"id":"https://openalex.org/keywords/defluorination","display_name":"defluorination","score":0.7990000247955322},{"id":"https://openalex.org/keywords/surface-composition","display_name":"surface composition","score":0.9629999995231628},{"id":"https://openalex.org/keywords/surface-charging","display_name":"surface charging","score":0.7429999709129333},{"id":"https://openalex.org/keywords/si-111","display_name":"Si(111)","score":0.6980000138282776},{"id":"https://openalex.org/keywords/binding-energy-shifts","display_name":"binding energy shift","score":0.7480000257492065},{"id":"https://openalex.org/keywords/surface-conductivity","display_name":"surface conductivity","score":0.6050000190734863}],"concepts":[{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.892187237739563},{"id":"https://openalex.org/C2776875633","wikidata":"https://www.wikidata.org/wiki/Q425094","display_name":"Fluorocarbon","level":2,"score":0.8231532573699951},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.5921035408973694},{"id":"https://openalex.org/C521977710","wikidata":"https://www.wikidata.org/wiki/Q81163","display_name":"Polymer","level":2,"score":0.5411396026611328},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.5344656705856323},{"id":"https://openalex.org/C149849071","wikidata":"https://www.wikidata.org/wiki/Q1263816","display_name":"Chemical composition","level":2,"score":0.5127056837081909},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4877072274684906},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.4763110876083374},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.4672996997833252},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.45681843161582947},{"id":"https://openalex.org/C124681953","wikidata":"https://www.wikidata.org/wiki/Q339062","display_name":"Decomposition","level":2,"score":0.43540656566619873},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.37705737352371216},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.3565254211425781},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1662023961544037},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.12713414430618286},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.12378385663032532},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10621452331542969},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05940696597099304},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1016/j.polymdegradstab.2007.12.004","doi":"https://doi.org/10.1016/j.polymdegradstab.2007.12.004","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.polymdegradstab.2007.12.004","pdf_url":null,"source":{"id":"https://openalex.org/S10124807","display_name":"Polymer Degradation and Stability","issn_l":"0141-3910","issn":["0141-3910","1873-2321"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Polymer Degradation and Stability","raw_type":"journal-article"},{"id":"pmh:oai:fraunhofer.de:N-74089","doi":null,"is_oa":false,"landing_page_url":"http://publica.fraunhofer.de/documents/N-74089.html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400801","display_name":"Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Fraunhofer IISB","raw_type":"Journal Article"},{"id":"pmh:oai:publica.fraunhofer.de:publica/215711","doi":null,"is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/215711","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"journal article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W58786639","https://openalex.org/W118743065","https://openalex.org/W122585544","https://openalex.org/W609933390","https://openalex.org/W1557681670","https://openalex.org/W1560057897","https://openalex.org/W1600280553","https://openalex.org/W1606689051","https://openalex.org/W1965864680","https://openalex.org/W1968186055","https://openalex.org/W1988294996","https://openalex.org/W2000425774","https://openalex.org/W2004622429","https://openalex.org/W2023165503","https://openalex.org/W2029123970","https://openalex.org/W2031359912","https://openalex.org/W2033205968","https://openalex.org/W2050443743","https://openalex.org/W2056733727","https://openalex.org/W2072729899","https://openalex.org/W2073009434","https://openalex.org/W2084171005","https://openalex.org/W2090985691","https://openalex.org/W2106603672","https://openalex.org/W2141864726","https://openalex.org/W2148588248","https://openalex.org/W2160146506","https://openalex.org/W2340970135","https://openalex.org/W2739299270","https://openalex.org/W2994450964","https://openalex.org/W4210881876","https://openalex.org/W7204107776"],"related_works":["https://openalex.org/W2019043735","https://openalex.org/W1963620339","https://openalex.org/W2075905791","https://openalex.org/W1964376516","https://openalex.org/W1968186055","https://openalex.org/W1488956189","https://openalex.org/W1988395517","https://openalex.org/W2063942908","https://openalex.org/W2029123970","https://openalex.org/W2073009434"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}