{"id":"https://openalex.org/W2010560087","doi":"https://doi.org/10.1107/s0909049513004329","title":"Interface characterization of B 4 C-based multilayers by X-ray grazing-incidence reflectivity and diffuse scattering","display_name":"Interface characterization of B 4 C-based multilayers by X-ray grazing-incidence reflectivity and diffuse scattering","publication_year":2013,"publication_date":"2013-03-20","ids":{"openalex":"https://openalex.org/W2010560087","doi":"https://doi.org/10.1107/s0909049513004329","mag":"2010560087","pmid":"https://pubmed.ncbi.nlm.nih.gov/23592624"},"language":"en","primary_location":{"id":"doi:10.1107/s0909049513004329","doi":"https://doi.org/10.1107/s0909049513004329","is_oa":true,"landing_page_url":"https://doi.org/10.1107/s0909049513004329","pdf_url":"http://journals.iucr.org/s/issues/2013/03/00/ie5089/ie5089.pdf","source":{"id":"https://openalex.org/S114484406","display_name":"Journal of Synchrotron Radiation","issn_l":"0909-0495","issn":["0909-0495","1600-5775"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-b","doyens","jufo-2","ki-jl-1","medline","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Synchrotron Radiation","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"http://journals.iucr.org/s/issues/2013/03/00/ie5089/ie5089.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025014035","display_name":"Hui Jiang","orcid":"https://orcid.org/0000-0002-4782-5072","observed_orcids":["https://orcid.org/0000-0002-4782-5072"]},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210123885","display_name":"Shanghai Institute of Applied Physics","ror":"https://ror.org/02w6gr951","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210123885"]},{"id":"https://openalex.org/I4391768149","display_name":"Shanghai Synchrotron Radiation Facility","ror":"https://ror.org/02ys41z83","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768149"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Jiang","raw_affiliation_strings":["Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Zhangheng Road 239, Pudong District, Shanghai, People's Republic of China. jianghui@sinap.ac.cn","Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Zhangheng Road 239, Pudong District, Shanghai 201204, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Zhangheng Road 239, Pudong District, Shanghai, People's Republic of China. jianghui@sinap.ac.cn","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210123885","https://openalex.org/I4391768149"]},{"raw_affiliation_string":"Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Zhangheng Road 239, Pudong District, Shanghai 201204, People's Republic of China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210123885","https://openalex.org/I4391768149"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101505542","display_name":"Zhanshan Wang","orcid":"https://orcid.org/0000-0002-2161-6934","observed_orcids":["https://orcid.org/0000-0002-2161-6934"]},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhanshan Wang","raw_affiliation_strings":["Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, People's Republic of China","Institute of Precision Optical Engineering, Department of Physics, Tongji University,#N#Shanghai 200092,#N#People?s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, People's Republic of China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"Institute of Precision Optical Engineering, Department of Physics, Tongji University,#N#Shanghai 200092,#N#People?s Republic of China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100670089","display_name":"Jingtao Zhu","orcid":"https://orcid.org/0000-0001-6666-7949","observed_orcids":["https://orcid.org/0000-0001-6666-7949"]},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingtao Zhu","raw_affiliation_strings":["Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, People's Republic of China","Institute of Precision Optical Engineering, Department of Physics, Tongji University,#N#Shanghai 200092,#N#People?s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, People's Republic of China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"Institute of Precision Optical Engineering, Department of Physics, Tongji University,#N#Shanghai 200092,#N#People?s Republic of China","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3180,"currency":"USD","value_usd":3180},"apc_paid":null,"fwci":0.8874,"has_fulltext":true,"cited_by_count":13,"citation_normalized_percentile":{"value":0.70837437,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"20","issue":"3","first_page":"449","last_page":"454"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","score":0.5454000234603882,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","score":0.5454000234603882,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.13660000264644623,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11341","display_name":"Boron and Carbon Nanomaterials Research","score":0.10970000177621841,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/w-b4c-multilayers","display_name":"W/B4C multilayers","score":0.8270000219345093},{"id":"https://openalex.org/keywords/interface-roughness","display_name":"interface roughness","score":0.765999972820282},{"id":"https://openalex.org/keywords/interdiffusion","display_name":"interdiffusion","score":0.8640000224113464},{"id":"https://openalex.org/keywords/correlation-length","display_name":"correlation length","score":0.7279999852180481},{"id":"https://openalex.org/keywords/age-related-changes","display_name":"age-related changes","score":0.5139999985694885},{"id":"https://openalex.org/keywords/oxidation","display_name":"oxidation","score":0.7770000100135803},{"id":"https://openalex.org/keywords/layer-thickness","display_name":"layer thickness","score":0.5490000247955322},{"id":"https://openalex.org/keywords/soft-x-ray-optics","display_name":"soft X-ray optics","score":0.5410000085830688},{"id":"https://openalex.org/keywords/hard-x-ray-optics","display_name":"hard X-ray optics","score":0.9139999747276306}],"concepts":[{"id":"https://openalex.org/C55148256","wikidata":"https://www.wikidata.org/wiki/Q1382432","display_name":"X-ray reflectivity","level":3,"score":0.6658210754394531},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.6555901765823364},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.651085376739502},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.6308901309967041},{"id":"https://openalex.org/C2779328170","wikidata":"https://www.wikidata.org/wiki/Q34777","display_name":"X-ray","level":2,"score":0.6308488249778748},{"id":"https://openalex.org/C108597893","wikidata":"https://www.wikidata.org/wiki/Q663650","display_name":"Reflectivity","level":2,"score":0.6126267910003662},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5750511884689331},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5579210519790649},{"id":"https://openalex.org/C61511704","wikidata":"https://www.wikidata.org/wiki/Q1671857","display_name":"Incidence (geometry)","level":2,"score":0.5020625591278076},{"id":"https://openalex.org/C176443586","wikidata":"https://www.wikidata.org/wiki/Q5598487","display_name":"Grazing-incidence small-angle scattering","level":5,"score":0.4125415086746216},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.27776485681533813},{"id":"https://openalex.org/C76308580","wikidata":"https://www.wikidata.org/wiki/Q8041568","display_name":"X-ray Raman scattering","level":4,"score":0.10361185669898987},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C28413391","wikidata":"https://www.wikidata.org/wiki/Q785542","display_name":"Capillary number","level":3,"score":0.0},{"id":"https://openalex.org/C196806460","wikidata":"https://www.wikidata.org/wiki/Q188603","display_name":"Capillary action","level":2,"score":0.0},{"id":"https://openalex.org/C142199849","wikidata":"https://www.wikidata.org/wiki/Q3027672","display_name":"Inelastic scattering","level":3,"score":0.0}],"mesh":[{"descriptor_ui":"D001896","descriptor_name":"Boron Compounds","qualifier_ui":"Q000528","qualifier_name":"radiation effects","is_major_topic":false},{"descriptor_ui":"D001896","descriptor_name":"Boron Compounds","qualifier_ui":"Q000528","qualifier_name":"radiation effects","is_major_topic":false},{"descriptor_ui":"D001896","descriptor_name":"Boron Compounds","qualifier_ui":"Q000528","qualifier_name":"radiation effects","is_major_topic":false},{"descriptor_ui":"D001896","descriptor_name":"Boron Compounds","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":false},{"descriptor_ui":"D001896","descriptor_name":"Boron Compounds","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":false},{"descriptor_ui":"D001896","descriptor_name":"Boron Compounds","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":false},{"descriptor_ui":"D002244","descriptor_name":"Carbon","qualifier_ui":"Q000528","qualifier_name":"radiation effects","is_major_topic":false},{"descriptor_ui":"D002244","descriptor_name":"Carbon","qualifier_ui":"Q000528","qualifier_name":"radiation effects","is_major_topic":false},{"descriptor_ui":"D002244","descriptor_name":"Carbon","qualifier_ui":"Q000528","qualifier_name":"radiation effects","is_major_topic":false},{"descriptor_ui":"D002244","descriptor_name":"Carbon","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":false},{"descriptor_ui":"D002244","descriptor_name":"Carbon","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":false},{"descriptor_ui":"D002244","descriptor_name":"Carbon","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":false},{"descriptor_ui":"D004867","descriptor_name":"Equipment Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004867","descriptor_name":"Equipment Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004867","descriptor_name":"Equipment Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D007909","descriptor_name":"Lenses","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D007909","descriptor_name":"Lenses","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D007909","descriptor_name":"Lenses","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D008422","descriptor_name":"Materials Testing","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D008422","descriptor_name":"Materials Testing","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D008422","descriptor_name":"Materials Testing","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D012031","descriptor_name":"Refractometry","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D012031","descriptor_name":"Refractometry","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D012031","descriptor_name":"Refractometry","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D012542","descriptor_name":"Scattering, Radiation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D012542","descriptor_name":"Scattering, Radiation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D012542","descriptor_name":"Scattering, Radiation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D014965","descriptor_name":"X-Rays","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D014965","descriptor_name":"X-Rays","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D014965","descriptor_name":"X-Rays","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D019544","descriptor_name":"Equipment Failure Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019544","descriptor_name":"Equipment Failure Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019544","descriptor_name":"Equipment Failure Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false}],"locations_count":2,"locations":[{"id":"doi:10.1107/s0909049513004329","doi":"https://doi.org/10.1107/s0909049513004329","is_oa":true,"landing_page_url":"https://doi.org/10.1107/s0909049513004329","pdf_url":"http://journals.iucr.org/s/issues/2013/03/00/ie5089/ie5089.pdf","source":{"id":"https://openalex.org/S114484406","display_name":"Journal of Synchrotron Radiation","issn_l":"0909-0495","issn":["0909-0495","1600-5775"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-b","doyens","jufo-2","ki-jl-1","medline","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Synchrotron Radiation","raw_type":"journal-article"},{"id":"pmid:23592624","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/23592624","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of synchrotron radiation","raw_type":"Journal Article"}],"best_oa_location":{"id":"doi:10.1107/s0909049513004329","doi":"https://doi.org/10.1107/s0909049513004329","is_oa":true,"landing_page_url":"https://doi.org/10.1107/s0909049513004329","pdf_url":"http://journals.iucr.org/s/issues/2013/03/00/ie5089/ie5089.pdf","source":{"id":"https://openalex.org/S114484406","display_name":"Journal of Synchrotron Radiation","issn_l":"0909-0495","issn":["0909-0495","1600-5775"],"is_oa":false,"is_in_doaj":true,"is_core":true,"listed_in":["cwts-core","doaj","dongbi-b","doyens","jufo-2","ki-jl-1","medline","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Synchrotron Radiation","raw_type":"journal-article"},"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2010560087.pdf","grobid_xml":"https://content.openalex.org/works/W2010560087.grobid-xml"},"referenced_works_count":16,"referenced_works":["https://openalex.org/W2002269452","https://openalex.org/W2007419241","https://openalex.org/W2010588891","https://openalex.org/W2032514945","https://openalex.org/W2033894958","https://openalex.org/W2042324574","https://openalex.org/W2061615592","https://openalex.org/W2063632490","https://openalex.org/W2068847642","https://openalex.org/W2071339262","https://openalex.org/W2075920970","https://openalex.org/W2085224209","https://openalex.org/W2086529087","https://openalex.org/W2090962914","https://openalex.org/W2102010757","https://openalex.org/W2123716591"],"related_works":["https://openalex.org/W2773975951","https://openalex.org/W4299568554","https://openalex.org/W2082785086","https://openalex.org/W4281550286","https://openalex.org/W2034804708","https://openalex.org/W4254261035","https://openalex.org/W2025534104","https://openalex.org/W1983149726","https://openalex.org/W3184382008","https://openalex.org/W1988690340"],"abstract_inverted_index":{"B4C-based":[0,30,94],"multilayers":[1,31,49,53,69],"have":[2],"important":[3],"applications":[4],"for":[5,44,88],"soft":[6],"to":[7,25],"hard":[8],"X-rays.":[9],"In":[10],"this":[11],"paper,":[12],"X-ray":[13],"grazing-incidence":[14],"reflectivity":[15],"and":[16,47,58,67,73,75,91],"diffuse":[17],"scattering,":[18],"combining":[19],"various":[20],"analysis":[21],"methods,":[22],"were":[23,50],"used":[24],"characterize":[26],"the":[27,55,81],"structure":[28,76],"of":[29,65,93],"including":[32],"layer":[33],"thickness,":[34],"density,":[35],"interfacial":[36],"roughness,":[37],"interdiffusion,":[38],"correlation":[39],"length,":[40],"etc.":[41],"Quantitative":[42],"results":[43],"W/B4C,":[45],"Mo/B4C":[46,68],"La/B4C":[48,66],"compared.":[51],"W/B4C":[52],"show":[54],"sharpest":[56],"interfaces":[57],"most":[59],"stable":[60],"structures.":[61],"The":[62],"roughness":[63],"replications":[64],"are":[70,78],"not":[71],"strong,":[72],"oxidations":[74],"expansions":[77],"found":[79],"in":[80],"aging":[82],"process.":[83],"This":[84],"work":[85],"provides":[86],"guidance":[87],"future":[89],"fabrication":[90],"characterization":[92],"multilayers.":[95]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}