{"id":"https://openalex.org/W2010540469","doi":"https://doi.org/10.1016/j.tsf.2011.07.018","title":"Review of recent developments in amorphous oxide semiconductor thin-film transistor devices","display_name":"Review of recent developments in amorphous oxide semiconductor thin-film transistor devices","publication_year":2011,"publication_date":"2011-07-16","ids":{"openalex":"https://openalex.org/W2010540469","doi":"https://doi.org/10.1016/j.tsf.2011.07.018","mag":"2010540469"},"language":"en","primary_location":{"id":"doi:10.1016/j.tsf.2011.07.018","doi":"https://doi.org/10.1016/j.tsf.2011.07.018","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.tsf.2011.07.018","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086203646","display_name":"Joon Seok Park","orcid":"https://orcid.org/0000-0003-4001-6886","observed_orcids":["https://orcid.org/0000-0003-4001-6886"]},"institutions":[{"id":"https://openalex.org/I4399598381","display_name":"Samsung Advanced Institute of Technology (South Korea)","ror":"https://ror.org/04axnyp10","country_code":null,"type":"company","lineage":["https://openalex.org/I4399598381"]},{"id":"https://openalex.org/I89015989","display_name":"Dankook University","ror":"https://ror.org/058pdbn81","country_code":"KR","type":"education","lineage":["https://openalex.org/I89015989"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joon Seok Park","raw_affiliation_strings":["Department of Materials Science and Engineering, Dankook University, Mt.#29, Anseo-dong, Cheonan, 330-714, Republic of Korea","Display Device Laboratory, Samsung Advanced Institute of Technology (SAIT), Mt.#14-1, Nongseo-dong, Yongin, 446-712, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Dankook University, Mt.#29, Anseo-dong, Cheonan, 330-714, Republic of Korea","institution_ids":["https://openalex.org/I89015989"]},{"raw_affiliation_string":"Display Device Laboratory, Samsung Advanced Institute of Technology (SAIT), Mt.#14-1, Nongseo-dong, Yongin, 446-712, Republic of Korea","institution_ids":["https://openalex.org/I4399598381"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Joon Seok Park","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4399598381","display_name":"Samsung Advanced Institute of Technology (South Korea)","ror":"https://ror.org/04axnyp10","country_code":null,"type":"company","lineage":["https://openalex.org/I4399598381"]},{"id":"https://openalex.org/I89015989","display_name":"Dankook University","ror":"https://ror.org/058pdbn81","country_code":"KR","type":"education","lineage":["https://openalex.org/I89015989"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Joon Seok Park","raw_affiliation_strings":["Department of Materials Science and Engineering, Dankook University, Mt.#29, Anseo-dong, Cheonan, 330-714, Republic of Korea","Display Device Laboratory, Samsung Advanced Institute of Technology (SAIT), Mt.#14-1, Nongseo-dong, Yongin, 446-712, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Dankook University, Mt.#29, Anseo-dong, Cheonan, 330-714, Republic of Korea","institution_ids":["https://openalex.org/I89015989"]},{"raw_affiliation_string":"Display Device Laboratory, Samsung Advanced Institute of Technology (SAIT), Mt.#14-1, Nongseo-dong, Yongin, 446-712, Republic of Korea","institution_ids":["https://openalex.org/I4399598381"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113588165","display_name":"W. J. Maeng","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4399598381","display_name":"Samsung Advanced Institute of Technology (South Korea)","ror":"https://ror.org/04axnyp10","country_code":null,"type":"company","lineage":["https://openalex.org/I4399598381"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wan-Joo Maeng","raw_affiliation_strings":["Display Device Laboratory, Samsung Advanced Institute of Technology (SAIT), Mt.#14-1, Nongseo-dong, Yongin, 446-712, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Display Device Laboratory, Samsung Advanced Institute of Technology (SAIT), Mt.#14-1, Nongseo-dong, Yongin, 446-712, Republic of Korea","institution_ids":["https://openalex.org/I4399598381"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100611381","display_name":"Hyun\u2010Suk Kim","orcid":"https://orcid.org/0000-0003-4286-7027","observed_orcids":["https://orcid.org/0000-0003-4286-7027","https://orcid.org/0000-0001-7484-7739","https://orcid.org/0000-0003-1747-4539","https://orcid.org/0000-0002-4882-1196","https://orcid.org/0000-0001-8105-1640","https://orcid.org/0000-0002-1212-9018"]},"institutions":[{"id":"https://openalex.org/I4399598381","display_name":"Samsung Advanced Institute of Technology (South Korea)","ror":"https://ror.org/04axnyp10","country_code":null,"type":"company","lineage":["https://openalex.org/I4399598381"]},{"id":"https://openalex.org/I89015989","display_name":"Dankook University","ror":"https://ror.org/058pdbn81","country_code":"KR","type":"education","lineage":["https://openalex.org/I89015989"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyun-Suk Kim","raw_affiliation_strings":["Display Device Laboratory, Samsung Advanced Institute of Technology (SAIT), Mt.#14-1, Nongseo-dong, Yongin, 446-712, Republic of Korea","Department of Materials Science and Engineering, Dankook University, Mt.#29, Anseo-dong, Cheonan, 330-714, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Display Device Laboratory, Samsung Advanced Institute of Technology (SAIT), Mt.#14-1, Nongseo-dong, Yongin, 446-712, Republic of Korea","institution_ids":["https://openalex.org/I4399598381"]},{"raw_affiliation_string":"Department of Materials Science and Engineering, Dankook University, Mt.#29, Anseo-dong, Cheonan, 330-714, Republic of Korea","institution_ids":["https://openalex.org/I89015989"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071947816","display_name":"Jin\u2010Seong Park","orcid":"https://orcid.org/0000-0002-9070-5666","observed_orcids":["https://orcid.org/0000-0002-9070-5666"]},"institutions":[{"id":"https://openalex.org/I89015989","display_name":"Dankook University","ror":"https://ror.org/058pdbn81","country_code":"KR","type":"education","lineage":["https://openalex.org/I89015989"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jin-Seong Park","raw_affiliation_strings":["Department of Materials Science and Engineering, Dankook University, Mt.#29, Anseo-dong, Cheonan, 330-714, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Dankook University, Mt.#29, Anseo-dong, Cheonan, 330-714, Republic of Korea","institution_ids":["https://openalex.org/I89015989"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071947816","display_name":"Jin\u2010Seong Park","orcid":"https://orcid.org/0000-0002-9070-5666","observed_orcids":["https://orcid.org/0000-0002-9070-5666"]},"institutions":[{"id":"https://openalex.org/I89015989","display_name":"Dankook University","ror":"https://ror.org/058pdbn81","country_code":"KR","type":"education","lineage":["https://openalex.org/I89015989"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jin-Seong Park","raw_affiliation_strings":["Department of Materials Science and Engineering, Dankook University, Mt.#29, Anseo-dong, Cheonan, 330-714, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Dankook University, Mt.#29, Anseo-dong, Cheonan, 330-714, Republic of Korea","institution_ids":["https://openalex.org/I89015989"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5071947816"],"corresponding_institution_ids":["https://openalex.org/I4399598381","https://openalex.org/I89015989"],"apc_list":{"value":3120,"currency":"USD","value_usd":3120},"apc_paid":null,"fwci":43.2154,"has_fulltext":false,"cited_by_count":1075,"citation_normalized_percentile":{"value":0.9989224,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"520","issue":"6","first_page":"1679","last_page":"1693"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/amorphous-oxide-semiconductors","display_name":"amorphous oxide semiconductors","score":0.9959999918937683},{"id":"https://openalex.org/keywords/thin-film-transistors","display_name":"thin-film transistors","score":0.9860000014305115},{"id":"https://openalex.org/keywords/field-effect-mobility","display_name":"field-effect mobility","score":0.671999990940094},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"threshold voltage","score":0.996999979019165},{"id":"https://openalex.org/keywords/subthreshold-swing","display_name":"subthreshold swing","score":1.0},{"id":"https://openalex.org/keywords/device-stability","display_name":"device stability","score":0.8930000066757202},{"id":"https://openalex.org/keywords/device-degradation-mechanisms","display_name":"device degradation mechanisms","score":0.6010000109672546},{"id":"https://openalex.org/keywords/light-induced-degradation","display_name":"light-induced degradation","score":0.6100000143051147},{"id":"https://openalex.org/keywords/gate-dielectric","display_name":"gate dielectric","score":0.8939999938011169},{"id":"https://openalex.org/keywords/active-matrix-liquid-crystal-displays","display_name":"active matrix liquid crystal displays","score":0.8790000081062317},{"id":"https://openalex.org/keywords/active-matrix-oled","display_name":"active-matrix OLED","score":0.8560000061988831},{"id":"https://openalex.org/keywords/flexible-displays","display_name":"flexible displays","score":0.7289999723434448},{"id":"https://openalex.org/keywords/information-storage","display_name":"information storage","score":0.7379999756813049},{"id":"https://openalex.org/keywords/non-vacuum-deposition","display_name":"non-vacuum deposition","score":0.796999990940094}],"concepts":[{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.8265062570571899},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.7729840278625488},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7611702680587769},{"id":"https://openalex.org/C101050124","wikidata":"https://www.wikidata.org/wiki/Q527747","display_name":"AMOLED","level":5,"score":0.710635781288147},{"id":"https://openalex.org/C70201059","wikidata":"https://www.wikidata.org/wiki/Q3142195","display_name":"Active matrix","level":4,"score":0.6991524696350098},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5420123338699341},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.5054965019226074},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.4846239984035492},{"id":"https://openalex.org/C162743726","wikidata":"https://www.wikidata.org/wiki/Q7115642","display_name":"Oxide thin-film transistor","level":4,"score":0.47896865010261536},{"id":"https://openalex.org/C56052488","wikidata":"https://www.wikidata.org/wiki/Q103382","display_name":"Amorphous solid","level":2,"score":0.45726239681243896},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.4348646104335785},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.32391810417175293},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.30008837580680847},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26738500595092773},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10136237740516663},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08137774467468262},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.tsf.2011.07.018","doi":"https://doi.org/10.1016/j.tsf.2011.07.018","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.tsf.2011.07.018","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"score":0.5199999809265137,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":109,"referenced_works":["https://openalex.org/W1508995360","https://openalex.org/W1558526312","https://openalex.org/W1558833794","https://openalex.org/W1792983667","https://openalex.org/W1964064684","https://openalex.org/W1965811934","https://openalex.org/W1966940769","https://openalex.org/W1969443209","https://openalex.org/W1970044136","https://openalex.org/W1970757654","https://openalex.org/W1974213698","https://openalex.org/W1975835369","https://openalex.org/W1976250511","https://openalex.org/W1977599560","https://openalex.org/W1979230434","https://openalex.org/W1981386148","https://openalex.org/W1982593481","https://openalex.org/W1982968328","https://openalex.org/W1984419254","https://openalex.org/W1985936082","https://openalex.org/W1986329993","https://openalex.org/W1989649360","https://openalex.org/W1994777322","https://openalex.org/W1998922674","https://openalex.org/W1998956803","https://openalex.org/W1999589524","https://openalex.org/W2000690793","https://openalex.org/W2001013657","https://openalex.org/W2001338596","https://openalex.org/W2003443718","https://openalex.org/W2004658473","https://openalex.org/W2005631730","https://openalex.org/W2007256358","https://openalex.org/W2007702712","https://openalex.org/W2008362094","https://openalex.org/W2010411840","https://openalex.org/W2011160719","https://openalex.org/W2017458487","https://openalex.org/W2019553276","https://openalex.org/W2019910167","https://openalex.org/W2022662296","https://openalex.org/W2023578107","https://openalex.org/W2025450084","https://openalex.org/W2027746336","https://openalex.org/W2033778357","https://openalex.org/W2033787147","https://openalex.org/W2035397082","https://openalex.org/W2035759921","https://openalex.org/W2036486254","https://openalex.org/W2038313135","https://openalex.org/W2038945638","https://openalex.org/W2038957825","https://openalex.org/W2040144037","https://openalex.org/W2040179822","https://openalex.org/W2045741766","https://openalex.org/W2046115642","https://openalex.org/W2046384765","https://openalex.org/W2046791610","https://openalex.org/W2048040425","https://openalex.org/W2049817780","https://openalex.org/W2050699371","https://openalex.org/W2054082830","https://openalex.org/W2054170609","https://openalex.org/W2056365772","https://openalex.org/W2057510492","https://openalex.org/W2057673430","https://openalex.org/W2064970263","https://openalex.org/W2065038191","https://openalex.org/W2070696418","https://openalex.org/W2071518930","https://openalex.org/W2073755268","https://openalex.org/W2074303377","https://openalex.org/W2076714269","https://openalex.org/W2077411632","https://openalex.org/W2078624450","https://openalex.org/W2082759558","https://openalex.org/W2084165843","https://openalex.org/W2084390736","https://openalex.org/W2087277752","https://openalex.org/W2087752284","https://openalex.org/W2088363317","https://openalex.org/W2090240411","https://openalex.org/W2090737533","https://openalex.org/W2092426063","https://openalex.org/W2092884628","https://openalex.org/W2103546822","https://openalex.org/W2105186215","https://openalex.org/W2111856850","https://openalex.org/W2115119476","https://openalex.org/W2128583000","https://openalex.org/W2130208263","https://openalex.org/W2131559039","https://openalex.org/W2131716975","https://openalex.org/W2133993524","https://openalex.org/W2134960271","https://openalex.org/W2135414230","https://openalex.org/W2139841420","https://openalex.org/W2142575002","https://openalex.org/W2142910748","https://openalex.org/W2149075549","https://openalex.org/W2149305553","https://openalex.org/W2149343064","https://openalex.org/W2150277089","https://openalex.org/W2150558698","https://openalex.org/W2152503093","https://openalex.org/W2153690855","https://openalex.org/W2167814308","https://openalex.org/W3103879185","https://openalex.org/W3145101554"],"related_works":["https://openalex.org/W2897698314","https://openalex.org/W2902151727","https://openalex.org/W2799295168","https://openalex.org/W2978736898","https://openalex.org/W2102874782","https://openalex.org/W2043741144","https://openalex.org/W1911608470","https://openalex.org/W2529114786","https://openalex.org/W1580385727","https://openalex.org/W2155399297"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":45},{"year":2025,"cited_by_count":68},{"year":2024,"cited_by_count":65},{"year":2023,"cited_by_count":56},{"year":2022,"cited_by_count":67},{"year":2021,"cited_by_count":74},{"year":2020,"cited_by_count":60},{"year":2019,"cited_by_count":93},{"year":2018,"cited_by_count":76},{"year":2017,"cited_by_count":83},{"year":2016,"cited_by_count":89},{"year":2015,"cited_by_count":105},{"year":2014,"cited_by_count":110},{"year":2013,"cited_by_count":67},{"year":2012,"cited_by_count":16}],"updated_date":"2026-10-18T09:31:52.927876","created_date":"2025-10-10T00:00:00"}