{"id":"https://openalex.org/W2010197741","doi":"https://doi.org/10.1109/emceurope.2012.6396856","title":"Time-domain test for material electromagnetic pulse shielding effectiveness based on shielding black-box windows method","display_name":"Time-domain test for material electromagnetic pulse shielding effectiveness based on shielding black-box windows method","publication_year":2012,"publication_date":"2012-09-01","ids":{"openalex":"https://openalex.org/W2010197741","doi":"https://doi.org/10.1109/emceurope.2012.6396856","mag":"2010197741"},"language":"en","primary_location":{"id":"doi:10.1109/emceurope.2012.6396856","doi":"https://doi.org/10.1109/emceurope.2012.6396856","is_oa":false,"landing_page_url":"https://doi.org/10.1109/emceurope.2012.6396856","pdf_url":null,"source":{"id":"https://openalex.org/S4363605869","display_name":"International Symposium on Electromagnetic Compatibility - EMC Europe (EMC Europe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101780741","display_name":"Xiang Chen","orcid":"https://orcid.org/0009-0001-5638-7254","observed_orcids":["https://orcid.org/0009-0001-5638-7254"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xiang Chen","raw_affiliation_strings":["Electrostatic & Electromagnetic Protection Institute, Mechanical Engineering College, Shijiazhuang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrostatic & Electromagnetic Protection Institute, Mechanical Engineering College, Shijiazhuang, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056096084","display_name":"Chen Yong-guang","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yong-guang Chen","raw_affiliation_strings":["Electrostatic & Electromagnetic Protection Institute, Mechanical Engineering College, Shijiazhuang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrostatic & Electromagnetic Protection Institute, Mechanical Engineering College, Shijiazhuang, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4063,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.4955579,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"5","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9750999808311462,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9750999808311462,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","score":0.023099999874830246,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12299","display_name":"Radiation Shielding Materials Analysis","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-pulse-shielding","display_name":"electromagnetic pulse shielding","score":0.7480000257492065},{"id":"https://openalex.org/keywords/shielding-effectiveness","display_name":"shielding effectiveness","score":0.9670000076293945},{"id":"https://openalex.org/keywords/black-box-method","display_name":"black box method","score":0.6190000176429749},{"id":"https://openalex.org/keywords/box-size","display_name":"box size","score":0.6710000038146973},{"id":"https://openalex.org/keywords/window-size","display_name":"window size","score":0.9419999718666077},{"id":"https://openalex.org/keywords/material-conductivity","display_name":"material conductivity","score":0.7820000052452087}],"concepts":[{"id":"https://openalex.org/C149712133","wikidata":"https://www.wikidata.org/wiki/Q332774","display_name":"Anechoic chamber","level":2,"score":0.8585073947906494},{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.8166460990905762},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.737209677696228},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5642945170402527},{"id":"https://openalex.org/C14589660","wikidata":"https://www.wikidata.org/wiki/Q64122","display_name":"Electromagnetic pulse","level":2,"score":0.539136528968811},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.5092519521713257},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.47133731842041016},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.43625447154045105},{"id":"https://openalex.org/C184880428","wikidata":"https://www.wikidata.org/wiki/Q1417308","display_name":"Finite-difference time-domain method","level":2,"score":0.41314393281936646},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39168721437454224},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3530140519142151},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2971706986427307},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26090919971466064},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2210889458656311},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.17776751518249512},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1543484926223755},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14602228999137878},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/emceurope.2012.6396856","doi":"https://doi.org/10.1109/emceurope.2012.6396856","is_oa":false,"landing_page_url":"https://doi.org/10.1109/emceurope.2012.6396856","pdf_url":null,"source":{"id":"https://openalex.org/S4363605869","display_name":"International Symposium on Electromagnetic Compatibility - EMC Europe (EMC Europe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1545151717","https://openalex.org/W2097573906","https://openalex.org/W2113166368","https://openalex.org/W2113698125","https://openalex.org/W2139246891","https://openalex.org/W2144310933","https://openalex.org/W2361348448"],"related_works":["https://openalex.org/W2364445058","https://openalex.org/W2352133016","https://openalex.org/W2031678235","https://openalex.org/W2162306796","https://openalex.org/W2146150172","https://openalex.org/W2376673858","https://openalex.org/W4386893733","https://openalex.org/W2079187009","https://openalex.org/W2377474799","https://openalex.org/W2361348448"],"abstract_inverted_index":{"In":[0],"order":[1,99],"to":[2,100,127,140],"remedy":[3],"the":[4,31,44,66,76,105,108,118,129,142],"deficiencies":[5],"of":[6,10,14,30,33,37,46,56,65,68,78,92,107,110,120,132,146],"time-domain":[7,28],"test":[8,29,41,47,69],"methods":[9],"shielding":[11,130],"effectiveness":[12],"(SE)":[13],"materials":[15,87,134,147],"in":[16,61,96,98],"common":[17],"use,":[18],"a":[19],"method":[20,109,119],"called":[21],"windowed":[22,111,121],"semi-anechoic":[23,112,122],"box":[24,49,123],"is":[25,59,94],"used":[26,126],"for":[27,104,135],"SE":[32,74],"materials.":[34],"The":[35,63,114],"impact":[36,64],"such":[38],"factors":[39],"on":[40,71],"results":[42,115],"as":[43],"position":[45,67],"points,":[48],"size,":[50,52],"window":[51],"thickness":[53],"and":[54,75,85,139],"conductivity":[55],"materials,":[57],"etc.,":[58],"analyzed":[60,95],"frequency-domain.":[62],"point":[70],"peak":[72],"ratio":[73,77],"electromagnetic":[79],"pulse":[80],"(EMP)":[81],"rise":[82,90],"time":[83,91],"unloaded":[84],"loaded":[86],"against":[88,148],"different":[89,133],"EMP":[93],"time-domain,":[97],"get":[101],"some":[102],"recommendations":[103],"use":[106],"box.":[113],"show":[116],"that":[117],"can":[124],"be":[125],"distinguish":[128],"performance":[131,145],"each":[136],"frequency":[137],"component":[138],"evaluate":[141],"overall":[143],"protection":[144],"EMP.":[149]},"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}