{"id":"https://openalex.org/W2010071338","doi":"https://doi.org/10.1016/s0168-9002(98)01054-7","title":"Inspection of small multi-layered plastic tubing during extrusion, using low-energy X-ray beams","display_name":"Inspection of small multi-layered plastic tubing during extrusion, using low-energy X-ray beams","publication_year":1999,"publication_date":"1999-02-01","ids":{"openalex":"https://openalex.org/W2010071338","doi":"https://doi.org/10.1016/s0168-9002(98)01054-7","mag":"2010071338"},"language":"en","primary_location":{"id":"doi:10.1016/s0168-9002(98)01054-7","doi":"https://doi.org/10.1016/s0168-9002(98)01054-7","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0168-9002(98)01054-7","pdf_url":null,"source":{"id":"https://openalex.org/S145630073","display_name":"Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment","issn_l":"0168-9002","issn":["0168-9002","1872-9576"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110092226","display_name":"C.J. Armentrout","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C Armentrout","raw_affiliation_strings":["Pilot Industries, Inc., Dexter, MI 48130, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pilot Industries, Inc., Dexter, MI 48130, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036590873","display_name":"T Basinger","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"T Basinger","raw_affiliation_strings":["Pilot Industries, Inc., Dexter, MI 48130, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pilot Industries, Inc., Dexter, MI 48130, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"J Beyer","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J Beyer","raw_affiliation_strings":["Pilot Industries, Inc., Dexter, MI 48130, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pilot Industries, Inc., Dexter, MI 48130, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024273210","display_name":"B Colesa","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"B Colesa","raw_affiliation_strings":["Pilot Industries, Inc., Dexter, MI 48130, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pilot Industries, Inc., Dexter, MI 48130, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056671777","display_name":"P Olsztyn","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P Olsztyn","raw_affiliation_strings":["Pilot Industries, Inc., Dexter, MI 48130, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pilot Industries, Inc., Dexter, MI 48130, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004456730","display_name":"Kira Smith","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K Smith","raw_affiliation_strings":["Pilot Industries, Inc., Dexter, MI 48130, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pilot Industries, Inc., Dexter, MI 48130, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005260793","display_name":"C. F. Strandberg","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C Strandberg","raw_affiliation_strings":["Pilot Industries, Inc., Dexter, MI 48130, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pilot Industries, Inc., Dexter, MI 48130, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"D Sullivan","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D Sullivan","raw_affiliation_strings":["Pilot Industries, Inc., Dexter, MI 48130, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pilot Industries, Inc., Dexter, MI 48130, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":null,"display_name":"J Thomson","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J Thomson","raw_affiliation_strings":["Pilot Industries, Inc., Dexter, MI 48130, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pilot Industries, Inc., Dexter, MI 48130, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2620,"currency":"USD","value_usd":2620},"apc_paid":null,"fwci":1.3268,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.77637116,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"422","issue":"1-3","first_page":"964","last_page":"968"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9018999934196472,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9018999934196472,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.02329999953508377,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.021299999207258224,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/x-ray-inspection","display_name":"X-ray inspection","score":0.6010000109672546},{"id":"https://openalex.org/keywords/extrusion","display_name":"extrusion","score":0.5460000038146973},{"id":"https://openalex.org/keywords/defect-detection","display_name":"defect detection","score":0.6359999775886536},{"id":"https://openalex.org/keywords/dimensional-metrology","display_name":"dimensional metrology","score":0.9150000214576721},{"id":"https://openalex.org/keywords/real-time-inspection","display_name":"real-time inspection","score":0.6420000195503235},{"id":"https://openalex.org/keywords/image-intensifier","display_name":"image intensifier","score":0.6700000166893005}],"concepts":[{"id":"https://openalex.org/C2778958987","wikidata":"https://www.wikidata.org/wiki/Q139143","display_name":"Extrusion","level":2,"score":0.6588876843452454},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5935750007629395},{"id":"https://openalex.org/C17504453","wikidata":"https://www.wikidata.org/wiki/Q861692","display_name":"Image intensifier","level":2,"score":0.5788246393203735},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.5133151412010193},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.461318701505661},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.4458011984825134},{"id":"https://openalex.org/C2776221354","wikidata":"https://www.wikidata.org/wiki/Q144893","display_name":"ETFE","level":3,"score":0.42400503158569336},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.4175393581390381},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.3617454171180725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2702353000640869},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2516408860683441},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09474539756774902},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0168-9002(98)01054-7","doi":"https://doi.org/10.1016/s0168-9002(98)01054-7","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0168-9002(98)01054-7","pdf_url":null,"source":{"id":"https://openalex.org/S145630073","display_name":"Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment","issn_l":"0168-9002","issn":["0168-9002","1872-9576"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.4943999946117401,"display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2058628440","https://openalex.org/W2079858286","https://openalex.org/W2092746313"],"related_works":["https://openalex.org/W1491937018","https://openalex.org/W7005882228","https://openalex.org/W7052287192","https://openalex.org/W4252923590","https://openalex.org/W2009249339","https://openalex.org/W4247133853","https://openalex.org/W4407308003","https://openalex.org/W3168348173","https://openalex.org/W3034169861","https://openalex.org/W44393355"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2016-06-24T00:00:00"}