{"id":"https://openalex.org/W2010068023","doi":"https://doi.org/10.1016/s0022-3697(02)00167-1","title":"Preparation and characterization of electrodeposited Sb 2 Se 3 thin films from non-aqueous media","display_name":"Preparation and characterization of electrodeposited Sb 2 Se 3 thin films from non-aqueous media","publication_year":2002,"publication_date":"2002-10-01","ids":{"openalex":"https://openalex.org/W2010068023","doi":"https://doi.org/10.1016/s0022-3697(02)00167-1","mag":"2010068023"},"language":"en","primary_location":{"id":"doi:10.1016/s0022-3697(02)00167-1","doi":"https://doi.org/10.1016/s0022-3697(02)00167-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0022-3697(02)00167-1","pdf_url":null,"source":{"id":"https://openalex.org/S171512606","display_name":"Journal of Physics and Chemistry of Solids","issn_l":"0022-3697","issn":["0022-3697","1879-2553"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Physics and Chemistry of Solids","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045915654","display_name":"Appasaheb P. Torane","orcid":"https://orcid.org/0000-0002-6689-9624","observed_orcids":["https://orcid.org/0000-0002-6689-9624"]},"institutions":[{"id":"https://openalex.org/I141641110","display_name":"Shivaji University","ror":"https://ror.org/01bsn4x02","country_code":"IN","type":"education","lineage":["https://openalex.org/I141641110"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"A.P Torane","raw_affiliation_strings":["Thin Film Physics Laboratory, Department of Physics, Shivaji University, Kolhapur 416 004, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thin Film Physics Laboratory, Department of Physics, Shivaji University, Kolhapur 416 004, India","institution_ids":["https://openalex.org/I141641110"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090727657","display_name":"Chandrakant H. Bhosale","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I141641110","display_name":"Shivaji University","ror":"https://ror.org/01bsn4x02","country_code":"IN","type":"education","lineage":["https://openalex.org/I141641110"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"C.H Bhosale","raw_affiliation_strings":["Thin Film Physics Laboratory, Department of Physics, Shivaji University, Kolhapur 416 004, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thin Film Physics Laboratory, Department of Physics, Shivaji University, Kolhapur 416 004, India","institution_ids":["https://openalex.org/I141641110"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5090727657"],"corresponding_institution_ids":["https://openalex.org/I141641110"],"apc_list":{"value":3230,"currency":"USD","value_usd":3230},"apc_paid":null,"fwci":0.6878,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.71257864,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"63","issue":"10","first_page":"1849","last_page":"1855"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.0017999999690800905,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sb2se3-thin-films","display_name":"Sb2Se3 thin films","score":0.9480000138282776},{"id":"https://openalex.org/keywords/sb2se3","display_name":"Sb2Se3","score":0.9150000214576721},{"id":"https://openalex.org/keywords/electrodeposition","display_name":"electrodeposition","score":0.9649999737739563},{"id":"https://openalex.org/keywords/nonaqueous-electrolytes","display_name":"non-aqueous electrolytes","score":0.9039999842643738},{"id":"https://openalex.org/keywords/antimony-trichloride","display_name":"antimony trichloride","score":0.7519999742507935},{"id":"https://openalex.org/keywords/selenium-dioxide","display_name":"selenium dioxide","score":0.9909999966621399},{"id":"https://openalex.org/keywords/fluorine-doped-tin-oxide-substrate","display_name":"fluorine-doped tin oxide substrate","score":0.7940000295639038},{"id":"https://openalex.org/keywords/stainless-steel-substrate","display_name":"stainless steel substrate","score":0.9810000061988831},{"id":"https://openalex.org/keywords/polycrystalline-films","display_name":"polycrystalline films","score":0.8320000171661377},{"id":"https://openalex.org/keywords/grain-size","display_name":"grain size","score":0.9390000104904175},{"id":"https://openalex.org/keywords/optical-band-gap","display_name":"optical band gap","score":0.9760000109672546},{"id":"https://openalex.org/keywords/indirect-transitions","display_name":"indirect transitions","score":0.5120000243186951},{"id":"https://openalex.org/keywords/polarization-curves","display_name":"polarization curves","score":0.7229999899864197}],"concepts":[{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.7280483245849609},{"id":"https://openalex.org/C137637335","wikidata":"https://www.wikidata.org/wiki/Q899604","display_name":"Crystallite","level":2,"score":0.7233000993728638},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.7219765782356262},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6623873114585876},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.6613357067108154},{"id":"https://openalex.org/C2780924660","wikidata":"https://www.wikidata.org/wiki/Q205123","display_name":"Tin oxide","level":3,"score":0.6326565742492676},{"id":"https://openalex.org/C184651966","wikidata":"https://www.wikidata.org/wiki/Q906356","display_name":"Aqueous solution","level":2,"score":0.5546287894248962},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5028712153434753},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.4493539333343506},{"id":"https://openalex.org/C50792271","wikidata":"https://www.wikidata.org/wiki/Q332846","display_name":"Absorption edge","level":3,"score":0.4472452700138092},{"id":"https://openalex.org/C192191005","wikidata":"https://www.wikidata.org/wiki/Q466491","display_name":"Grain size","level":2,"score":0.44049182534217834},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.4124760627746582},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.3725375533103943},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2511790692806244},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1784142553806305},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.16336190700531006},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.15849778056144714},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.11150661110877991},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.05013880133628845},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0022-3697(02)00167-1","doi":"https://doi.org/10.1016/s0022-3697(02)00167-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0022-3697(02)00167-1","pdf_url":null,"source":{"id":"https://openalex.org/S171512606","display_name":"Journal of Physics and Chemistry of Solids","issn_l":"0022-3697","issn":["0022-3697","1879-2553"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Physics and Chemistry of Solids","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1965901207","https://openalex.org/W1967447368","https://openalex.org/W1979508740","https://openalex.org/W1986898206","https://openalex.org/W1992406465","https://openalex.org/W2014751280","https://openalex.org/W2039121209","https://openalex.org/W2042151485","https://openalex.org/W2042324846","https://openalex.org/W2047274734","https://openalex.org/W2052408214","https://openalex.org/W2055888389","https://openalex.org/W2059070915","https://openalex.org/W2067252600","https://openalex.org/W2093270355","https://openalex.org/W6606355994"],"related_works":["https://openalex.org/W2003104916","https://openalex.org/W1965472763","https://openalex.org/W1987634934","https://openalex.org/W4292541042","https://openalex.org/W2017313135","https://openalex.org/W2023310727","https://openalex.org/W1991182416","https://openalex.org/W1965901207","https://openalex.org/W1970492525","https://openalex.org/W2945628252"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}