{"id":"https://openalex.org/W2009649362","doi":"https://doi.org/10.1016/0304-3991(86)90176-2","title":"Small particles in the field of industrial supported catalysts","display_name":"Small particles in the field of industrial supported catalysts","publication_year":1986,"publication_date":"1986-01-01","ids":{"openalex":"https://openalex.org/W2009649362","doi":"https://doi.org/10.1016/0304-3991(86)90176-2","mag":"2009649362"},"language":"en","primary_location":{"id":"doi:10.1016/0304-3991(86)90176-2","doi":"https://doi.org/10.1016/0304-3991(86)90176-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0304-3991(86)90176-2","pdf_url":null,"source":{"id":"https://openalex.org/S27731274","display_name":"Ultramicroscopy","issn_l":"0304-3991","issn":["0304-3991","1879-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ultramicroscopy","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113527180","display_name":"EDOUARD F. FREUND","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I265217849","display_name":"IFP \u00c9nergies nouvelles","ror":"https://ror.org/03gcbhc33","country_code":"FR","type":"facility","lineage":["https://openalex.org/I265217849"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Edouard Freund","raw_affiliation_strings":["D\u00e9partement de Physique et Analyses, Institut Fran\u00e7ais du P\u00e9trole, BP 311, F-92506 Rueil-Malmaison C\u00e9dex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"D\u00e9partement de Physique et Analyses, Institut Fran\u00e7ais du P\u00e9trole, BP 311, F-92506 Rueil-Malmaison C\u00e9dex, France","institution_ids":["https://openalex.org/I265217849"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007250861","display_name":"J. R. Lynch","orcid":"https://orcid.org/0000-0002-6438-0300","observed_orcids":["https://orcid.org/0000-0002-6438-0300"]},"institutions":[{"id":"https://openalex.org/I265217849","display_name":"IFP \u00c9nergies nouvelles","ror":"https://ror.org/03gcbhc33","country_code":"FR","type":"facility","lineage":["https://openalex.org/I265217849"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"John Lynch","raw_affiliation_strings":["D\u00e9partement de Physique et Analyses, Institut Fran\u00e7ais du P\u00e9trole, BP 311, F-92506 Rueil-Malmaison C\u00e9dex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"D\u00e9partement de Physique et Analyses, Institut Fran\u00e7ais du P\u00e9trole, BP 311, F-92506 Rueil-Malmaison C\u00e9dex, France","institution_ids":["https://openalex.org/I265217849"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007629130","display_name":"R. Szymanski","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I265217849","display_name":"IFP \u00c9nergies nouvelles","ror":"https://ror.org/03gcbhc33","country_code":"FR","type":"facility","lineage":["https://openalex.org/I265217849"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Raymond Szymanski","raw_affiliation_strings":["D\u00e9partement de Physique et Analyses, Institut Fran\u00e7ais du P\u00e9trole, BP 311, F-92506 Rueil-Malmaison C\u00e9dex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"D\u00e9partement de Physique et Analyses, Institut Fran\u00e7ais du P\u00e9trole, BP 311, F-92506 Rueil-Malmaison C\u00e9dex, France","institution_ids":["https://openalex.org/I265217849"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I265217849"],"apc_list":{"value":3760,"currency":"USD","value_usd":3760},"apc_paid":null,"fwci":0.8678,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.70618557,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"20","issue":"1-2","first_page":"107","last_page":"118"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.7103999853134155,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.7103999853134155,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.22200000286102295,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10192","display_name":"Catalytic Processes in Materials Science","score":0.053300000727176666,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/supported-catalysts","display_name":"supported catalysts","score":0.8840000033378601},{"id":"https://openalex.org/keywords/small-particles","display_name":"small particles","score":0.6650000214576721},{"id":"https://openalex.org/keywords/high-surface-area-supports","display_name":"high surface area supports","score":0.6000000238418579},{"id":"https://openalex.org/keywords/metal-nanoparticles","display_name":"metal nanoparticles","score":0.453000009059906},{"id":"https://openalex.org/keywords/electron-energy-loss-spectroscopy","display_name":"electron energy loss spectroscopy","score":0.9990000128746033},{"id":"https://openalex.org/keywords/microdiffraction","display_name":"microdiffraction","score":0.8690000176429749},{"id":"https://openalex.org/keywords/surface-composition","display_name":"surface composition","score":0.625}],"concepts":[{"id":"https://openalex.org/C31033462","wikidata":"https://www.wikidata.org/wiki/Q3058182","display_name":"Microanalysis","level":2,"score":0.7669514417648315},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.6427133083343506},{"id":"https://openalex.org/C161790260","wikidata":"https://www.wikidata.org/wiki/Q82264","display_name":"Catalysis","level":2,"score":0.6164191365242004},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5736545920372009},{"id":"https://openalex.org/C177562468","wikidata":"https://www.wikidata.org/wiki/Q182893","display_name":"Dispersion (optics)","level":2,"score":0.5460616946220398},{"id":"https://openalex.org/C140205800","wikidata":"https://www.wikidata.org/wiki/Q5860","display_name":"Carbon fibers","level":3,"score":0.5226828455924988},{"id":"https://openalex.org/C121029787","wikidata":"https://www.wikidata.org/wiki/Q902877","display_name":"Field electron emission","level":3,"score":0.4669443368911743},{"id":"https://openalex.org/C178187954","wikidata":"https://www.wikidata.org/wiki/Q902328","display_name":"Electron energy loss spectroscopy","level":3,"score":0.4543728530406952},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.4441484808921814},{"id":"https://openalex.org/C2909214062","wikidata":"https://www.wikidata.org/wiki/Q911272","display_name":"Electron probe microanalysis","level":3,"score":0.4385010600090027},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4332973062992096},{"id":"https://openalex.org/C155672457","wikidata":"https://www.wikidata.org/wiki/Q61231","display_name":"Nanoparticle","level":2,"score":0.4299713373184204},{"id":"https://openalex.org/C544153396","wikidata":"https://www.wikidata.org/wiki/Q11426","display_name":"Metal","level":2,"score":0.42311790585517883},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.4143447279930115},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.4129577875137329},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.407473623752594},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.34958913922309875},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.25897151231765747},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2515581250190735},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1597159504890442},{"id":"https://openalex.org/C146088050","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Transmission electron microscopy","level":2,"score":0.1550188660621643},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.15148407220840454},{"id":"https://openalex.org/C104779481","wikidata":"https://www.wikidata.org/wiki/Q50707","display_name":"Composite number","level":2,"score":0.0867963433265686},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07791048288345337},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0668933093547821},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.06192368268966675},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0304-3991(86)90176-2","doi":"https://doi.org/10.1016/0304-3991(86)90176-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0304-3991(86)90176-2","pdf_url":null,"source":{"id":"https://openalex.org/S27731274","display_name":"Ultramicroscopy","issn_l":"0304-3991","issn":["0304-3991","1879-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","ki-jl-1","medline","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ultramicroscopy","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W608466123","https://openalex.org/W1146692588","https://openalex.org/W1553206457","https://openalex.org/W2007179625","https://openalex.org/W2065859514","https://openalex.org/W2089423703","https://openalex.org/W2149460485","https://openalex.org/W2480530080","https://openalex.org/W2912572921","https://openalex.org/W4300005878"],"related_works":["https://openalex.org/W2326356229","https://openalex.org/W2481695551","https://openalex.org/W302156889","https://openalex.org/W3036012618","https://openalex.org/W3036910206","https://openalex.org/W1988694392","https://openalex.org/W2501017572","https://openalex.org/W2021011506","https://openalex.org/W3040166404","https://openalex.org/W3036864980"],"abstract_inverted_index":null,"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-13T10:08:12.033832","created_date":"2016-06-24T00:00:00"}